S3FT9MH/S3FT9MV/S3FT9MG 16-bit RISC Microcontroller for Smart Card with optional Secure RSA and ECC Library

Certificate details

Status archived
Valid from 29.01.2016
Valid until 29.01.2021
Scheme πŸ‡«πŸ‡· FR
Manufacturer Samsung Electronics Co., Ltd. / Trusted Labs
Category ICs, Smart Cards and Smart Card-Related Devices and Systems
Security level ASE_TSS.2, EAL6+
Protection profiles

Certificate

certificate could not be downloaded, no link is available.

Certification report

Extracted keywords

Symmetric Algorithms
AES, DES
Asymmetric Algorithms
ECC
Randomness
DTRNG
Engines
TORNADO

Vendor
Samsung

Security level
EAL 6, EAL4, EAL7, ITSEC E6 ElevΓ©
Security Assurance Requirements (SAR)
ADV_SPM.1, ADV_INT.3, ADV_ARC, ADV_FSP, ADV_IMP, ADV_INT, ADV_SPM, ADV_TDS, AGD_OPE, AGD_PRE, ALC_FLR, ALC_CMC, ALC_CMS, ALC_DEL, ALC_DVS, ALC_LCD, ALC_TAT, ATE_COV, ATE_DPT, ATE_FUN, ATE_IND, AVA_VAN, AVA_VAN.5, ASE_TSS.2, ASE_CCL, ASE_ECD, ASE_INT, ASE_OBJ, ASE_REQ, ASE_SPD, ASE_TSS
Protection profiles
BSI-CC-PP-0084-2014, BSI-CC-PP- 0084-2014
Certificates
ANSSI-CC-2015/66
Evaluation facilities
CESTI, CEA - LETI, CEA-LETI, Trusted Labs

Standards
AIS31, AIS 31, CCMB-2012-09-001, CCMB-2012-09-002, CCMB-2012-09-003, CCMB-2012-09-004

Frontpage

Certificate ID ## ANSSI-CC-2015/66
Certified item ### S3FT9MH/S3FT9MV/S3FT9MG 16-bit RISC Microcontroller for Smart Card with optional Secure RSA and ECC Library
Certification lab ### EAL 6 augmentΓ© ASE_TSS.2 #### Trusted Labs 5, rue du Baillage 78000 Versailles, France ### Samsung Electronics Co. Ltd. 17 Floor, B-Tower, 1-1, Samsungjeonja-ro Hwaseong-si, Gyeonggi-do 445-330, CorΓ©e du Sud CEA - LETI 17 rue des martyrs, 38054 Grenoble Cedex 9, France
Developer #### Samsung Electronics Co. Ltd. 17 Floor, B-Tower, 1-1, Samsungjeonja-ro Hwaseong-si, Gyeonggi-do 445-330 CorΓ©e du Sud Commanditaire

Cross-references

Incoming
  • 2015-30-INF-1650 - archived - KONA2 D2320N ePassport [BAC configuration] version 01 revision 03 patch 00
  • 2015-31-INF-1653 - archived - KONA2 D2320N ePassport [EAC configuration] version 01 revision 03 patch 00
  • ANSSI-CC-2016/59 - archived - S3FT9MH/S3FT9MV/S3FT9MG 16-bit RISC Microcontroller for Smart Card with optional Secure RSA and ECC Library including specific IC Dedicated Software

Security target

Extracted keywords

Symmetric Algorithms
AES, DES, Triple-DES, TDES, TDEA, HMAC
Asymmetric Algorithms
RSA-CRT, ECDH, ECDSA, ECC, Diffie-Hellman, DSA
Hash functions
SHA1, SHA224, SHA256, SHA384, SHA512
Schemes
Key Agreement
Randomness
DTRNG, TRNG, RNG, RND
Engines
TORNADO
Block cipher modes
ECB

CPLC
IC Version
Vendor
Samsung

Security level
EAL6, EAL 4, EAL6+, EAL 5, EAL6 augmented, EAL 4 augmented, EAL 5 augmented
Claims
O.RSA, O.ECC, O.RND, O.TDES, O.SHA, O.AES, O.MEM_ACCESS, T.RND
Security Assurance Requirements (SAR)
ADV_ARC, ADV_FSP, ADV_IMP, ADV_ARC.1, ADV_SPM.1, ADV_FSP.5, ADV_IMP.2, ADV_INT.3, ADV_TDS.5, ADV_FSP.4, AGD_OPE, AGD_PRE, AGD_OPE.1, AGD_PRE.1, ALC_DVS.2, ALC_DEL, ALC_DVS, ALC_CMS, ALC_CMC, ALC_CMC.5, ALC_CMS.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ALC_CMS.4, ATE_COV, ATE_COV.3, ATE_DPT.3, ATE_FUN.2, ATE_IND.2, AVA_VAN.5, AVA_VAN, APE_ECD, ASE_TSS.2, ASE_CCL.1, ASE_ECD.1, ASE_INT.1, ASE_OBJ.2, ASE_REQ.2, ASE_SPD.1, ASE_REQ.1
Security Functional Requirements (SFR)
FAU_SAS, FAU_GEN, FAU_SAS.1, FAU_SAS.1.1, FAU_GEN.1, FCS_RNG, FCS_RNG.1, FCS_RNG.1.1, FCS_RNG.1.2, FCS_COP.1, FCS_COP, FCS_CKM.1, FCS_CKM.4, FCS_CKM, FCS_CKM.2, FDP_SDC, FDP_ACF, FDP_SDC.1, FDP_SDI, FDP_SDI.2, FDP_ITT.1, FDP_ITT.1.1, FDP_ACC.1, FDP_IFC.1, FDP_IFC.1.1, FDP_IFF.1, FDP_ACF.1, FDP_ACC.1.1, FDP_ACF.1.1, FDP_ACF.1.2, FDP_ACF.1.3, FDP_ACF.1.4, FDP_ITC.1, FDP_ITC.2, FDP_UCT.1, FDP_UCT.1.1, FDP_UIT.1, FDP_UIT.1.1, FDP_UIT.1.2, FDP_ACC, FDP_SDI.1, FDP_IFC, FDP_ITT, FIA_API, FIA_API.1, FIA_API.1.1, FMT_LIM, FMT_LIM.1, FMT_LIM.2, FMT_LIM.1.1, FMT_LIM.2.1, FMT_MSA.3, FMT_MSA.1, FMT_MSA.3.1, FMT_MSA.3.2, FMT_SMR.1, FMT_SMF.1, FMT_MSA.1.1, FMT_SMF.1.1, FMT_CKM.4, FMT_MSA, FMT_SMF, FPT_FLS.1, FPT_FLS.1.1, FPT_PHP.3, FPT_PHP.3.1, FPT_PHP, FPT_ITT.1, FPT_ITT.1.1, FPT_FLS, FPT_ITT, FRU_FLT.2, FRU_FLT.1, FRU_FLT.2.1, FRU_FLT, FTP_ITC.1, FTP_ITC.1.1, FTP_ITC.1.2, FTP_ITC.1.3, FTP_TRP.1
Protection profiles
BSI-CC-PP-0084, BSI-PP-0084, BSI-CC-PP-00842014, BSI-CCPP-0084-2014

Side-channel analysis
Leak-Inherent, Physical Probing, physical probing, Physical probing, side-channel, DPA, physical tampering, Malfunction, malfunction, reverse engineering

Standards
FIPS PUB 180-3, FIPS197, FIPS 197, BSI-AIS31, AIS31, CCMB-2012-09-001, CCMB-2012-09-002, CCMB-2012-09-003, CCMB-2012-09-004

Automated analysis

Automated inference - use with caution

All attributes shown in this section (e.g., links between certificates, products, vendors, and known CVEs) are generated by automated heuristics and have not been reviewed by humans. These methods can produce false positives or false negatives and should not be treated as definitive without independent verification. This applies equally to the Cross-references section below. If you want to know more about how this data is computed and how reliable it is, see our documentation on automated analysis. If you believe any information here is inaccurate or harmful, please submit feedback.

Certificate ID

ANSSI-CC-2015/66

Extracted SARs

ADV_ARC.1, ADV_FSP.5, ADV_IMP.2, ADV_INT.3, ADV_SPM.1, ADV_TDS.5, AGD_OPE.1, AGD_PRE.1, ALC_CMC.5, ALC_CMS.5, ALC_DEL.1, ALC_DVS.2, ALC_LCD.1, ALC_TAT.3, ASE_CCL.1, ASE_ECD.1, ASE_INT.1, ASE_OBJ.2, ASE_REQ.2, ASE_SPD.1, ASE_TSS.2, ATE_COV.3, ATE_DPT.3, ATE_FUN.2, ATE_IND.2, AVA_VAN.5

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Cross-references

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Raw data

{
  "_type": "sec_certs.sample.cc.CCCertificate",
  "category": "ICs, Smart Cards and Smart Card-Related Devices and Systems",
  "cert_link": null,
  "dgst": "bbbc83c221639664",
  "heuristics": {
    "_type": "sec_certs.sample.cc_eucc_common.Heuristics",
    "annotated_references": null,
    "cert_id": "ANSSI-CC-2015/66",
    "cert_lab": [
      "###"
    ],
    "cpe_matches": null,
    "direct_transitive_cves": null,
    "eal": "EAL6+",
    "extracted_sars": {
      "_type": "Set",
      "elements": [
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ALC_CMS",
          "level": 5
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "AGD_PRE",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ATE_DPT",
          "level": 3
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ADV_IMP",
          "level": 2
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ADV_SPM",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ALC_TAT",
          "level": 3
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ATE_FUN",
          "level": 2
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ALC_LCD",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ASE_OBJ",
          "level": 2
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ADV_TDS",
          "level": 5
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ALC_CMC",
          "level": 5
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ADV_ARC",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ATE_COV",
          "level": 3
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ADV_INT",
          "level": 3
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ASE_TSS",
          "level": 2
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ASE_REQ",
          "level": 2
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ALC_DVS",
          "level": 2
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "AGD_OPE",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ASE_ECD",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ALC_DEL",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ASE_SPD",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "AVA_VAN",
          "level": 5
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ADV_FSP",
          "level": 5
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ATE_IND",
          "level": 2
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ASE_INT",
          "level": 1
        },
        {
          "_type": "sec_certs.sample.sar.SAR",
          "family": "ASE_CCL",
          "level": 1
        }
      ]
    },
    "extracted_versions": {
      "_type": "Set",
      "elements": [
        "16"
      ]
    },
    "indirect_transitive_cves": null,
    "next_certificates": null,
    "prev_certificates": null,
    "protection_profiles": {
      "_type": "Set",
      "elements": [
        "cf0f01bcd7be3e9c"
      ]
    },
    "related_cves": null,
    "report_references": {
      "_type": "sec_certs.sample.certificate.References",
      "directly_referenced_by": {
        "_type": "Set",
        "elements": [
          "2015-31-INF-1653",
          "ANSSI-CC-2016/59",
          "2015-30-INF-1650"
        ]
      },
      "directly_referencing": null,
      "indirectly_referenced_by": {
        "_type": "Set",
        "elements": [
          "ANSSI-CC-2016/59",
          "ANSSI-CC-2018/57v2",
          "ANSSI-CC-2018/32",
          "ANSSI-CC-2019/07",
          "2015-30-INF-1650",
          "ANSSI-CC-2018/53",
          "2015-31-INF-1653",
          "ANSSI-CC-2017/24",
          "ANSSI-CC-2018/56",
          "ANSSI-CC-2018/32v2",
          "ANSSI-CC-2018/58",
          "ANSSI-CC-2018/57",
          "ANSSI-CC-2018/56v2",
          "ANSSI-CC-2018/33",
          "ANSSI-CC-2018/58v2",
          "ANSSI-CC-2019/31"
        ]
      },
      "indirectly_referencing": null
    },
    "scheme_data": null,
    "st_references": {
      "_type": "sec_certs.sample.certificate.References",
      "directly_referenced_by": null,
      "directly_referencing": null,
      "indirectly_referenced_by": null,
      "indirectly_referencing": null
    },
    "verified_cpe_matches": null
  },
  "maintenance_updates": {
    "_type": "Set",
    "elements": []
  },
  "manufacturer": "Samsung Electronics Co., Ltd. / Trusted Labs",
  "manufacturer_web": "https://www.samsung.com",
  "name": "S3FT9MH/S3FT9MV/S3FT9MG 16-bit RISC Microcontroller for Smart Card with optional Secure RSA and ECC Library",
  "not_valid_after": "2021-01-29",
  "not_valid_before": "2016-01-29",
  "pdf_data": {
    "_type": "sec_certs.sample.cc_eucc_common.PdfData",
    "cert_filename": null,
    "cert_frontpage": null,
    "cert_keywords": null,
    "cert_metadata": null,
    "report_filename": "ANSSI-CC-2015_66fr.pdf",
    "report_frontpage": {
      "FR": {
        "cc_security_level": "",
        "cc_version": "### Crit\u00e8res Communs version 3.1 r\u00e9vision 4",
        "cert_id": "## ANSSI-CC-2015/66",
        "cert_item": "### S3FT9MH/S3FT9MV/S3FT9MG 16-bit RISC Microcontroller for Smart Card with optional Secure RSA and ECC Library",
        "cert_item_version": "S3FT9MH/S3FT9MV/S3FT9MG_rev0_SW10-49-70-10-10_GU111-14-004-12-19-11-19-14-20-04 Conformit\u00e9 \u00e0 un profil de protection ### Security IC Platform Protection Profile with Augmentation Packages, version 1.0, certifi\u00e9 BSI-CC-PP-0084-2014 le 19 f\u00e9vrier 2014 avec conformit\u00e9 \u00e0 \u0027Package 1: Loader dedicated for usage in Secured Environment only\u0027 \u0027Package 2: Loader dedicated for usage by authorized users only",
        "cert_lab": "### EAL 6 augment\u00e9 ASE_TSS.2 #### Trusted Labs 5, rue du Baillage 78000 Versailles, France ### Samsung Electronics Co. Ltd. 17 Floor, B-Tower, 1-1, Samsungjeonja-ro Hwaseong-si, Gyeonggi-do 445-330, Cor\u00e9e du Sud CEA - LETI 17 rue des martyrs, 38054 Grenoble Cedex 9, France",
        "developer": "#### Samsung Electronics Co. Ltd. 17 Floor, B-Tower, 1-1, Samsungjeonja-ro Hwaseong-si, Gyeonggi-do 445-330 Cor\u00e9e du Sud Commanditaire",
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          "R\u00e9f\u00e9rence du rapport de certification(.+)Nom du produit(.+)Conformit\u00e9 \u00e0 un profil de protection(.+)Crit\u00e8res d\u0027\u00e9valuation et version(.+)Niveau d\u0027\u00e9valuation(.+)D\u00e9veloppeurs(.+)Centre d\u0027\u00e9valuation(.+)Accords de reconnaissance applicables",
          "R\u00e9f\u00e9rence du rapport de certification(.+)Nom du produit(.+)R\u00e9f\u00e9rence/version du produit(.+)Crit\u00e8res d\u0027\u00e9valuation et version(.+)Niveau d\u0027\u00e9valuation(.+)D\u00e9veloppeurs(.+)Centre d\u0027\u00e9valuation(.+)Accords de reconnaissance applicables"
        ],
        "ref_protection_profiles": ""
      }
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          "ITSEC E6 Elev\u00e9": 1
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      "/Creator": "PDFCreator Version 1.2.1",
      "/Keywords": "",
      "/ModDate": "",
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          "EAL 4 augmented": 1,
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          "EAL6": 5,
          "EAL6 augmented": 1,
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      "/SourceModified": "D:20160106075238",
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