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NXP MF3D(H)x3
Certificate details
| Status | active |
|---|---|
| Valid from | 10.03.2023 |
| Valid until | 10.03.2028 |
| Scheme | ๐ณ๐ฑ NL |
| Manufacturer | NXP Semiconductors |
| Category | ICs, Smart Cards and Smart Card-Related Devices and Systems |
| Security level | AVA_VAN.5, EAL5+, ALC_DVS.2 |
| Protection profiles | |
| Maintenance updates | Assurance Continuity Maintenance Report MF3D(H)x3 (10.06.2020) Certification report Security target |
Certificate
Extracted keywords
Vendor
NXP SemiconductorsSecurity level
EAL 5, EAL2, EAL 7, EAL 5 augmentedClaims
R.LSecurity Assurance Requirements (SAR)
ALC_DVS.2, ALC_FLR.3, AVA_VAN.5Protection profiles
BSI-CC-PP- 0084-2014Certificates
CC-23-0011955Evaluation facilities
SGS, SGS Brightsight, BrightsightCertification report
Extracted keywords
Symmetric Algorithms
AES, DES, Triple-DES, 3DES, CMACRandomness
RNGBlock cipher modes
CBCVendor
NXP Semiconductors, NXPSecurity level
EAL4, EAL5, EAL5+, EAL 5, EAL5 augmented, EAL 5 augmentedSecurity Assurance Requirements (SAR)
ADV_IMP, ALC_DVS.2, AVA_VAN.5Protection profiles
BSI-CC-PP-0084-2014Certificates
NSCIB-CC-0011955-CR2Evaluation facilities
SGS, SGS Brightsight, BrightsightSide-channel analysis
side channel, JIL, JIL-AAPS, JIL-AMStandards
AIS 31Frontpage
| Certificate ID | NSCIB-CC-0011955-CR2 |
|---|---|
| Certified item | MF3D(H)x3 |
| Certification lab | SGS Brightsight B.V. |
| Developer | NXP Semiconductors Germany GmbH |
Security target
Extracted keywords
Symmetric Algorithms
AES, DES, Triple-DES, TDES, TDEA, CMACSchemes
MACRandomness
RND, RNGBlock cipher modes
CBCVendor
NXP Semiconductors, NXPSecurity level
EAL5, EAL4, EAL5 augmentedClaims
O.RND, O.MAC, T.RND, ASecurity Assurance Requirements (SAR)
ADV_ARC.1, ADV_FSP.5, ADV_IMP.1, ADV_INT.2, ADV_TDS.4, ADV_FSP, ADV_FSP.4, AGD_OPE.1, AGD_PRE.1, ALC_DVS.2, ALC_CMC.4, ALC_CMS.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.2, ALC_CMS, ALC_CMS.4, ATE_COV.2, ATE_DPT.3, ATE_FUN.1, ATE_IND.2, AVA_VAN.5, ASE_INT.1, ASE_CCL.1, ASE_SPD.1, ASE_OBJ.2, ASE_ECD.1, ASE_REQ.2, ASE_TSS.1Security Functional Requirements (SFR)
FAU_SAS.1, FAU_SAS.1.1, FCS_RNG.1, FCS_RNG, FCS_COP, FCS_CKM.1, FCS_CKM.4, FCS_COP.1, FCS_CKM, FCS_CKM.2, FDP_ETC.3, FDP_ETC, FDP_SDC.1, FDP_ETC.3.1, FDP_ETC.3.2, FDP_ETC.3.3, FDP_ETC.1, FDP_ETC.2, FDP_SDC.1.1, FDP_SDI.2, FDP_SDI.1, FDP_SDI.2.1, FDP_SDI.2.2, FDP_ACC, FDP_ACF.1, FDP_ACC.1, FDP_ACF, FDP_ITC, FDP_IFC.1, FDP_ITC.2, FDP_ITC.1, FDP_ROL, FDP_ROL.1, FDP_ITT.1, FIA_UID.1, FIA_UAU, FIA_UAU.1, FIA_UAU.2, FIA_UAU.3, FIA_UAU.5, FIA_UID, FIA_UID.2, FMT_LIM.1, FMT_LIM.2, FMT_MSA.3, FMT_MSA, FMT_SMR.1, FMT_SMF.1, FMT_MSA.1, FMT_MTD, FMT_MTD.1, FMT_SMF, FMT_SMR, FPR_UNL, FPR_UNL.1, FPT_TDC.1, FPT_TDC, FPT_RPL, FPT_RPL.1, FPT_FLS.1, FPT_ITT.1, FPT_PHP.3, FRU_FLT.2, FTP_ITC.1, FTP_TRP.1, FTP_TRPProtection profiles
BSI-CC-PP-0084-2014Certificates
NSCIB-CC-0011955Side-channel analysis
Leak-Inherent, Physical Probing, Malfunction, malfunction, fault injectionStandards
FIPS PUB 197, FIPS PUB 46-3, NIST SP 800-67, NIST SP 800-38A, NIST SP 800-38B, AIS31, CCMB-2017-04-001, CCMB-2017-04-002, CCMB-2017-04-003, CCMB-2017-04-004Automated analysis
Automated inference - use with caution
All attributes shown in this section (e.g., links between certificates, products, vendors, and known CVEs) are generated by automated heuristics and have not been reviewed by humans. These methods can produce false positives or false negatives and should not be treated as definitive without independent verification. This applies equally to the Cross-references section below. If you want to know more about how this data is computed and how reliable it is, see our documentation on automated analysis. If you believe any information here is inaccurate or harmful, please submit feedback.Certificate ID
NSCIB-CC-23-0011955-CRExtracted SARs
ADV_ARC.1, ADV_FSP.5, ADV_IMP.1, ADV_INT.2, ADV_TDS.4, AGD_OPE.1, AGD_PRE.1, ALC_CMC.4, ALC_CMS.5, ALC_DEL.1, ALC_DVS.2, ALC_LCD.1, ALC_TAT.2, ASE_CCL.1, ASE_ECD.1, ASE_INT.1, ASE_OBJ.2, ASE_REQ.2, ASE_SPD.1, ASE_TSS.1, ATE_COV.2, ATE_DPT.3, ATE_FUN.1, ATE_IND.2, AVA_VAN.5Cross-references
No references are available for this certificate.
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The certificate data changed.
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The certificate data changed.
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The certificate data changed.
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The certificate data changed.
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The certificate data changed.
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The certificate data changed.
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The certificate data changed.
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The certificate data changed.
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The certificate data changed.
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The certificate was first processed.
{
"_type": "sec_certs.sample.cc.CCCertificate",
"category": "ICs, Smart Cards and Smart Card-Related Devices and Systems",
"cert_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-23-0011955-Cert.pdf",
"dgst": "5bc20fdb39f6806f",
"heuristics": {
"_type": "sec_certs.sample.cc_eucc_common.Heuristics",
"annotated_references": null,
"cert_id": "NSCIB-CC-23-0011955-CR",
"cert_lab": [
""
],
"cpe_matches": null,
"direct_transitive_cves": null,
"eal": "EAL5+",
"extracted_sars": {
"_type": "Set",
"elements": [
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_LCD",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ASE_CCL",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AGD_PRE",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_TAT",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_COV",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_FSP",
"level": 5
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_CMS",
"level": 5
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ASE_TSS",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_FUN",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_DEL",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ASE_ECD",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_IMP",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ASE_OBJ",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_DPT",
"level": 3
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_ARC",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_INT",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AGD_OPE",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ASE_INT",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_IND",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AVA_VAN",
"level": 5
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_CMC",
"level": 4
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_DVS",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_TDS",
"level": 4
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ASE_SPD",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ASE_REQ",
"level": 2
}
]
},
"extracted_versions": {
"_type": "Set",
"elements": [
"-"
]
},
"indirect_transitive_cves": null,
"next_certificates": null,
"prev_certificates": null,
"protection_profiles": {
"_type": "Set",
"elements": [
"cf0f01bcd7be3e9c"
]
},
"related_cves": null,
"report_references": {
"_type": "sec_certs.sample.certificate.References",
"directly_referenced_by": null,
"directly_referencing": null,
"indirectly_referenced_by": null,
"indirectly_referencing": null
},
"scheme_data": null,
"st_references": {
"_type": "sec_certs.sample.certificate.References",
"directly_referenced_by": null,
"directly_referencing": null,
"indirectly_referenced_by": null,
"indirectly_referencing": null
},
"verified_cpe_matches": null
},
"maintenance_updates": {
"_type": "Set",
"elements": [
{
"_type": "sec_certs.sample.cc.CCCertificate.MaintenanceReport",
"maintenance_date": "2020-06-10",
"maintenance_report_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0011955-MA.pdf",
"maintenance_st_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0011955-STv2.1.pdf",
"maintenance_title": "Assurance Continuity Maintenance Report MF3D(H)x3"
}
]
},
"manufacturer": "NXP Semiconductors",
"manufacturer_web": "https://www.nxp.com/",
"name": "NXP MF3D(H)x3",
"not_valid_after": "2028-03-10",
"not_valid_before": "2023-03-10",
"pdf_data": {
"_type": "sec_certs.sample.cc_eucc_common.PdfData",
"cert_filename": "NSCIB-CC-23-0011955-Cert.pdf",
"cert_frontpage": null,
"cert_keywords": {
"asymmetric_crypto": {},
"cc_cert_id": {
"NL": {
"CC-23-0011955": 1
}
},
"cc_claims": {
"R": {
"R.L": 1
}
},
"cc_protection_profile_id": {
"BSI": {
"BSI-CC-PP- 0084-2014": 1
}
},
"cc_sar": {
"ALC": {
"ALC_DVS.2": 1,
"ALC_FLR.3": 2
},
"AVA": {
"AVA_VAN.5": 1
}
},
"cc_security_level": {
"EAL": {
"EAL 5": 1,
"EAL 5 augmented": 1,
"EAL 7": 1,
"EAL2": 1
}
},
"cc_sfr": {},
"certification_process": {},
"cipher_mode": {},
"cplc_data": {},
"crypto_engine": {},
"crypto_library": {},
"crypto_protocol": {},
"crypto_scheme": {},
"device_model": {},
"ecc_curve": {},
"eval_facility": {
"BrightSight": {
"Brightsight": 1
},
"SGS": {
"SGS": 1,
"SGS Brightsight": 1
}
},
"hash_function": {},
"ic_data_group": {},
"javacard_api_const": {},
"javacard_packages": {},
"javacard_version": {},
"os_name": {},
"pq_crypto": {},
"randomness": {},
"side_channel_analysis": {},
"standard_id": {
"ISO": {
"ISO/IEC 15408-1": 1,
"ISO/IEC 15408-2": 1,
"ISO/IEC 15408-3": 1,
"ISO/IEC 18045": 2
}
},
"symmetric_crypto": {},
"technical_report_id": {},
"tee_name": {},
"tls_cipher_suite": {},
"vendor": {
"NXP": {
"NXP Semiconductors": 1
}
},
"vulnerability": {}
},
"cert_metadata": {
"/Author": "kruitr",
"/CreationDate": "D:20230327140529+02\u002700\u0027",
"/Creator": "Bullzip PDF Printer (11.10.0.2761)",
"/ModDate": "D:20230327140754+02\u002700\u0027",
"/Producer": "PDF Printer / www.bullzip.com / FPG / TUV Rheinland Service GmbH",
"/Title": "Microsoft Word - NSCIB-CC-23-0011955-Cert.doc",
"pdf_file_size_bytes": 270416,
"pdf_hyperlinks": {
"_type": "Set",
"elements": []
},
"pdf_is_encrypted": false,
"pdf_number_of_pages": 1
},
"report_filename": "NSCIB-CC-23-0011955-CR.pdf",
"report_frontpage": {
"NL": {
"cert_id": "NSCIB-CC-0011955-CR2",
"cert_item": "MF3D(H)x3",
"cert_lab": " SGS Brightsight B.V.",
"developer": "NXP Semiconductors Germany GmbH"
}
},
"report_keywords": {
"asymmetric_crypto": {},
"cc_cert_id": {
"NL": {
"NSCIB-CC-0011955-CR2": 11
}
},
"cc_claims": {},
"cc_protection_profile_id": {
"BSI": {
"BSI-CC-PP-0084-2014": 1
}
},
"cc_sar": {
"ADV": {
"ADV_IMP": 2
},
"ALC": {
"ALC_DVS.2": 2
},
"AVA": {
"AVA_VAN.5": 3
}
},
"cc_security_level": {
"EAL": {
"EAL 5": 1,
"EAL 5 augmented": 1,
"EAL4": 1,
"EAL5": 1,
"EAL5 augmented": 1,
"EAL5+": 1
}
},
"cc_sfr": {},
"certification_process": {},
"cipher_mode": {
"CBC": {
"CBC": 2
}
},
"cplc_data": {},
"crypto_engine": {},
"crypto_library": {},
"crypto_protocol": {},
"crypto_scheme": {},
"device_model": {},
"ecc_curve": {},
"eval_facility": {
"BrightSight": {
"Brightsight": 3
},
"SGS": {
"SGS": 3,
"SGS Brightsight": 3
}
},
"hash_function": {},
"ic_data_group": {},
"javacard_api_const": {},
"javacard_packages": {},
"javacard_version": {},
"os_name": {},
"pq_crypto": {},
"randomness": {
"RNG": {
"RNG": 1
}
},
"side_channel_analysis": {
"SCA": {
"side channel": 1
},
"other": {
"JIL": 2,
"JIL-AAPS": 1,
"JIL-AM": 1
}
},
"standard_id": {
"BSI": {
"AIS 31": 1
}
},
"symmetric_crypto": {
"AES_competition": {
"AES": {
"AES": 4
}
},
"DES": {
"3DES": {
"3DES": 1,
"Triple-DES": 1
},
"DES": {
"DES": 2
}
},
"constructions": {
"MAC": {
"CMAC": 1
}
}
},
"technical_report_id": {},
"tee_name": {},
"tls_cipher_suite": {},
"vendor": {
"NXP": {
"NXP": 1,
"NXP Semiconductors": 3
}
},
"vulnerability": {}
},
"report_metadata": {
"/Author": "Microsoft Office User",
"/CreationDate": "D:20230323080816+00\u002700\u0027",
"/Creator": "Microsoft\u00ae Word 2021",
"/ModDate": "D:20230323080816+00\u002700\u0027",
"/Producer": "Microsoft\u00ae Word 2021",
"/Title": "Certification Report",
"pdf_file_size_bytes": 200963,
"pdf_hyperlinks": {
"_type": "Set",
"elements": [
"http://www.tuv.com/nl",
"mailto:[email protected]",
"https://www.sogis.eu/",
"http://www.commoncriteriaportal.org/"
]
},
"pdf_is_encrypted": false,
"pdf_number_of_pages": 11
},
"st_filename": "NSCIB-CC-23-0011955-STLite_v24.pdf",
"st_frontpage": null,
"st_keywords": {
"asymmetric_crypto": {},
"cc_cert_id": {
"NL": {
"NSCIB-CC-0011955": 1
}
},
"cc_claims": {
"A": {
"A": 1
},
"O": {
"O.MAC": 7,
"O.RND": 1
},
"T": {
"T.RND": 1
}
},
"cc_protection_profile_id": {
"BSI": {
"BSI-CC-PP-0084-2014": 2
}
},
"cc_sar": {
"ADV": {
"ADV_ARC.1": 1,
"ADV_FSP": 3,
"ADV_FSP.4": 3,
"ADV_FSP.5": 11,
"ADV_IMP.1": 1,
"ADV_INT.2": 1,
"ADV_TDS.4": 1
},
"AGD": {
"AGD_OPE.1": 1,
"AGD_PRE.1": 1
},
"ALC": {
"ALC_CMC.4": 1,
"ALC_CMS": 3,
"ALC_CMS.4": 3,
"ALC_CMS.5": 5,
"ALC_DEL.1": 1,
"ALC_DVS.2": 3,
"ALC_LCD.1": 1,
"ALC_TAT.2": 1
},
"ASE": {
"ASE_CCL.1": 1,
"ASE_ECD.1": 1,
"ASE_INT.1": 1,
"ASE_OBJ.2": 1,
"ASE_REQ.2": 1,
"ASE_SPD.1": 1,
"ASE_TSS.1": 1
},
"ATE": {
"ATE_COV.2": 1,
"ATE_DPT.3": 1,
"ATE_FUN.1": 1,
"ATE_IND.2": 1
},
"AVA": {
"AVA_VAN.5": 3
}
},
"cc_security_level": {
"EAL": {
"EAL4": 2,
"EAL5": 7,
"EAL5 augmented": 2
}
},
"cc_sfr": {
"FAU": {
"FAU_SAS.1": 7,
"FAU_SAS.1.1": 1
},
"FCS": {
"FCS_CKM": 31,
"FCS_CKM.1": 7,
"FCS_CKM.2": 2,
"FCS_CKM.4": 7,
"FCS_COP": 24,
"FCS_COP.1": 5,
"FCS_RNG": 14,
"FCS_RNG.1": 5
},
"FDP": {
"FDP_ACC": 12,
"FDP_ACC.1": 10,
"FDP_ACF": 9,
"FDP_ACF.1": 6,
"FDP_ETC": 17,
"FDP_ETC.1": 1,
"FDP_ETC.2": 1,
"FDP_ETC.3": 10,
"FDP_ETC.3.1": 1,
"FDP_ETC.3.2": 1,
"FDP_ETC.3.3": 1,
"FDP_IFC.1": 6,
"FDP_ITC": 11,
"FDP_ITC.1": 6,
"FDP_ITC.2": 11,
"FDP_ITT.1": 3,
"FDP_ROL": 8,
"FDP_ROL.1": 2,
"FDP_SDC.1": 7,
"FDP_SDC.1.1": 1,
"FDP_SDI.1": 1,
"FDP_SDI.2": 6,
"FDP_SDI.2.1": 1,
"FDP_SDI.2.2": 1
},
"FIA": {
"FIA_UAU": 25,
"FIA_UAU.1": 1,
"FIA_UAU.2": 1,
"FIA_UAU.3": 2,
"FIA_UAU.5": 2,
"FIA_UID": 10,
"FIA_UID.1": 5,
"FIA_UID.2": 1
},
"FMT": {
"FMT_LIM.1": 4,
"FMT_LIM.2": 4,
"FMT_MSA": 17,
"FMT_MSA.1": 3,
"FMT_MSA.3": 3,
"FMT_MTD": 8,
"FMT_MTD.1": 1,
"FMT_SMF": 13,
"FMT_SMF.1": 5,
"FMT_SMR": 12,
"FMT_SMR.1": 7
},
"FPR": {
"FPR_UNL": 8,
"FPR_UNL.1": 1
},
"FPT": {
"FPT_FLS.1": 4,
"FPT_ITT.1": 3,
"FPT_PHP.3": 3,
"FPT_RPL": 11,
"FPT_RPL.1": 2,
"FPT_TDC": 9,
"FPT_TDC.1": 4
},
"FRU": {
"FRU_FLT.2": 2
},
"FTP": {
"FTP_ITC.1": 1,
"FTP_TRP": 17,
"FTP_TRP.1": 8
}
},
"certification_process": {},
"cipher_mode": {
"CBC": {
"CBC": 4
}
},
"cplc_data": {},
"crypto_engine": {},
"crypto_library": {},
"crypto_protocol": {},
"crypto_scheme": {
"MAC": {
"MAC": 24
}
},
"device_model": {},
"ecc_curve": {},
"eval_facility": {},
"hash_function": {},
"ic_data_group": {},
"javacard_api_const": {},
"javacard_packages": {},
"javacard_version": {},
"os_name": {},
"pq_crypto": {},
"randomness": {
"RNG": {
"RND": 2,
"RNG": 15
}
},
"side_channel_analysis": {
"FI": {
"Malfunction": 3,
"fault injection": 3,
"malfunction": 1
},
"SCA": {
"Leak-Inherent": 2,
"Physical Probing": 2
}
},
"standard_id": {
"BSI": {
"AIS31": 1
},
"CC": {
"CCMB-2017-04-001": 2,
"CCMB-2017-04-002": 2,
"CCMB-2017-04-003": 2,
"CCMB-2017-04-004": 2
},
"FIPS": {
"FIPS PUB 197": 2,
"FIPS PUB 46-3": 1
},
"NIST": {
"NIST SP 800-38A": 2,
"NIST SP 800-38B": 1,
"NIST SP 800-67": 2
}
},
"symmetric_crypto": {
"AES_competition": {
"AES": {
"AES": 27
}
},
"DES": {
"3DES": {
"TDEA": 1,
"TDES": 2,
"Triple-DES": 6
},
"DES": {
"DES": 8
}
},
"constructions": {
"MAC": {
"CMAC": 6
}
}
},
"technical_report_id": {},
"tee_name": {},
"tls_cipher_suite": {},
"vendor": {
"NXP": {
"NXP": 96,
"NXP Semiconductors": 30
}
},
"vulnerability": {}
},
"st_metadata": {
"/Author": "NXP B.V.",
"/CreationDate": "D:20230105131916+01\u002700\u0027",
"/Creator": "DITA Open Toolkit 3.3.1",
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