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S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2
Certificate details
| Status | archived |
|---|---|
| Valid from | 01.07.2008 |
| Valid until | 01.09.2019 |
| Scheme | π©πͺ DE |
| Manufacturer | Samsung Electronics Co., Ltd. |
| Category | ICs, Smart Cards and Smart Card-Related Devices and Systems |
| Security level | AVA_VLA.4, EAL5+, ALC_DVS.2, AVA_MSU.3 |
| Maintenance updates | S3CC9LC 16-bit RISC Microcontroller for Smart Card Version: Revision 8 (27.02.2009) Certification report Security target |
| S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 5 (08.01.2009) Certification report Security target | |
| S3CC9L5 16-bit RISC Microcontroller for Smart Card, Revision 1 (18.08.2008) Certification report Security target | |
| S3CC9LA 16-bit RISC Microcontroller for Smart Card, Revision 0 (10.07.2008) Certification report Security target |
Certificate
certificate could not be downloaded, no link is available.
Certification report
Extracted keywords
Symmetric Algorithms
AES, DES, Triple-DESAsymmetric Algorithms
ECDSARandomness
RNGEngines
TORNADOBlock cipher modes
ECB, CBCCPLC
IC Fabricator, IC VersionVendor
Infineon Technologies AG, Samsung, PhilipsSecurity level
EAL 5, EAL 4, EAL4, EAL 1, EAL 7, EAL5+, EAL1, EAL2, EAL3, EAL5, EAL6, EAL7, EAL 5 augmentedSecurity Assurance Requirements (SAR)
ACM_AUT, ACM_CAP, ACM_SCP, ACM_AUT.1, ACM_CAP.4, ACM_SCP.3, ADO_DEL, ADO_IGS, ADO_DEL.2, ADO_IGS.1, ADV_IMP.2, ADV_FSP, ADV_HLD, ADV_IMP, ADV_INT, ADV_LLD, ADV_RCR, ADV_SPM, AGD_ADM, AGD_USR, ALC_DVS.2, ALC_DVS, ALC_FLR, ALC_LCD, ALC_TAT, ALC_LCD.2, ALC_TAT.2, ATE_COV, ATE_DPT, ATE_FUN, ATE_IND, AVA_MSU.3, AVA_VLA.4, AVA_CCA, AVA_MSU, AVA_SOF, AVA_VLA, AVA_VLA.2, AVA_VLA.3, APE_DES, APE_ENV, APE_INT, APE_OBJ, APE_REQ, APE_SRE, ASE_DES, ASE_ENV, ASE_INT, ASE_OBJ, ASE_PPC, ASE_REQ, ASE_SRE, ASE_TSSProtection profiles
BSI-PP-0002-2001Certificates
BSI-DSZ-CC-0501-2008, BSI-DSZ-CC-0452-2007, BSI-DSZ-CC-0501Evaluation facilities
TΓV Informationstechnik, TΓViTSide-channel analysis
physical probing, side-channel, DPA, physical tampering, Bellcore attack, JILCertification process
for Smart Cards - Project Cheyenne II, Version 1.4, 2008-04-29, Samsung Electronics (confidential document, TECHNICAL REPORT-SUMMARY (ETR SUMMARY), 8103842493 / BSI-DSZ-CC-0501, S3CC9LC, Version 2, TΓViT (confidential document, Class ACM_AUT/CAP/SCP) - Project Cheyenne II, Version 1.3, 2008-05-09 Samsung Electronics (confidential document, EVALUATION (ETR-COMP), 8103842493 / BSI-DSZCC-0501, S3CC91A, Version 2, 2008-06-03, TΓViT (confidential documentFrontpage
| Certificate ID | BSI-DSZ-CC-0501-2008 ###### |
|---|---|
| Certified item | ##### S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2 ##### |
| Certification lab | BSI |
| Developer | Samsung Electronics Co., Ltd. BSI - |
Cross-references
Outgoing- BSI-DSZ-CC-0452-2007 - archived - S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
- KECS-ISIS-0222-2010 - archived - KCOS e-Passport V1.1 S3CC9 LC/GC/GW
- BSI-DSZ-CC-0624-2010 - archived - Samsung S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 9 with optional secure RSA 3.7S and ECC 2.4S Libraries including specific IC Dedicated Software
Security target
Extracted keywords
Symmetric Algorithms
DES, 3DES, Triple-DES, SEEDRandomness
RNG, RNDEngines
TORNADOVendor
SamsungSecurity level
EAL5, EAL5+, EAL4, EAL5 augmentedClaims
O.RND, T.RNDSecurity Assurance Requirements (SAR)
ACM_CAP.4, ACM_AUT.1, ACM_SCP.3, ACM_AUT, ACM_CAP, ACM_SCP, ADO_DEL.2, ADO_IGS.1, ADO_DEL, ADO_IGS, ADV_SPM.1, ADV_FSP.3, ADV_SPM.3, ADV_HLD.3, ADV_LLD.1, ADV_IMP.2, ADV_INT.1, ADV_RCR.2, ADV_FSP, ADV_HLD, ADV_INT, ADV_LLD, ADV_IMP, ADV_RCR, ADV_SPM, ADV_FSP.1, ADV_HLD.2, ADV_IMP.1, AGD_ADM.1, AGD_USR.1, AGD_ADM, AGD_USR, ALC_DVS.2, ALC_LCD.2, ALC_TAT.2, ALC_DVS, ALC_LCD, ALC_TAT, ALC_DVS.1, ATE_COV.2, ATE_DPT.2, ATE_FUN.1, ATE_IND.2, ATE_COV, ATE_DPT, ATE_FUN, AVA_MSU.3, AVA_VLA.4, AVA_CCA.1, AVA_SOF.1, AVA_CCA, AVA_MSU, AVA_SOF, AVA_VLA, AVA_MSU.2Security Functional Requirements (SFR)
FAU_SAS.1, FAU_SAS.1.1, FAU_SAS, FAU_GEN.1, FAU_GEN, FCS_RND.1, FCS_RND.1.1, FCS_COP, FCS_COP.1, FCS_COP.1.1, FCS_CKM.1, FCS_CKM.4, FCS_CKM.1.1, FCS_CKM.2, FCS_CKM.4.1, FCS_RND, FDP_ITT.1, FDP_ITT.1.1, FDP_ACC.1, FDP_IFC.1, FDP_IFC.1.1, FDP_IFF.1, FDP_ACF.1, FDP_ACC.1.1, FDP_ACF.1.1, FDP_ACF.1.2, FDP_ACF.1.3, FDP_ACF.1.4, FDP_ITC.1, FDP_ITC.2, FDP_ITC.1.1, FDP_ITC.1.2, FDP_ITC.1.3, FDP_ITC.2.1, FDP_ITC.2.2, FDP_ITC.2.3, FDP_ITC.2.4, FDP_ITC.2.5, FDP_CKM.2, FDP_ACC, FDP_ACF, FDP_IFC, FDP_ITT, FDP_SDI.1, FMT_LIM.1, FMT_LIM.2, FMT_LIM.1.1, FMT_LIM.2.1, FMT_MSA.3, FMT_MSA.1, FMT_SMF.1, FMT_MSA.3.1, FMT_MSA.3.2, FMT_SMR.1, FMT_MSA.1.1, FMT_SMF.1.1, FMT_MSA.2, FMT_MSA.2.1, FMT_MSA, FMT_SMF, FMT_LIM, FPT_FLS.1, FPT_FLS.1.1, FPT_SEP.1, FPT_SEP.1.1, FPT_SEP.1.2, FPT_PHP.3, FPT_PHP.3.1, FPT_ITT.1, FPT_ITT.1.1, FPT_TDC.1, FPT_FLS, FPT_SEP, FPT_PHP, FPT_ITT, FPT_AMT.1, FRU_FLT.2, FRU_FLT.1, FRU_FLT.2.1, FRU_FLT, FTP_ITC.1, FTP_TRP.1Protection profiles
BSI-PP-0002Side-channel analysis
Leak-Inherent, Physical Probing, physical probing, Physical probing, side-channel, SPA, DPA, timing attacks, physical tampering, Malfunction, malfunction, DFA, reverse engineeringCross-references
Incoming- KECS-ISIS-0222-2010 - archived - KCOS e-Passport V1.1 S3CC9 LC/GC/GW
Automated analysis
Automated inference - use with caution
All attributes shown in this section (e.g., links between certificates, products, vendors, and known CVEs) are generated by automated heuristics and have not been reviewed by humans. These methods can produce false positives or false negatives and should not be treated as definitive without independent verification. This applies equally to the Cross-references section below. If you want to know more about how this data is computed and how reliable it is, see our documentation on automated analysis. If you believe any information here is inaccurate or harmful, please submit feedback.Certificate ID
BSI-DSZ-CC-0501-2008Extracted SARs
ADV_FSP.3, ADV_HLD.3, ADV_IMP.2, ADV_INT.1, ADV_LLD.1, ADV_RCR.2, ADV_SPM.3, AGD_ADM.1, AGD_USR.1, ALC_DVS.2, ALC_LCD.2, ALC_TAT.2, ATE_COV.2, ATE_DPT.2, ATE_FUN.1, ATE_IND.2, AVA_CCA.1, AVA_MSU.3, AVA_SOF.1, AVA_VLA.4Similar certificates
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Cross-references
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The certificate was first processed.
{
"_type": "sec_certs.sample.cc.CCCertificate",
"category": "ICs, Smart Cards and Smart Card-Related Devices and Systems",
"cert_link": null,
"dgst": "3f287c94d1039f0b",
"heuristics": {
"_type": "sec_certs.sample.cc_eucc_common.Heuristics",
"annotated_references": null,
"cert_id": "BSI-DSZ-CC-0501-2008",
"cert_lab": [
"BSI"
],
"cpe_matches": null,
"direct_transitive_cves": null,
"eal": "EAL5+",
"extracted_sars": {
"_type": "Set",
"elements": [
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_IMP",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_LCD",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AVA_MSU",
"level": 3
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_SPM",
"level": 3
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_RCR",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AGD_ADM",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_LLD",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_HLD",
"level": 3
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AGD_USR",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_FSP",
"level": 3
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AVA_SOF",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_FUN",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_DVS",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ADV_INT",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_DPT",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AVA_CCA",
"level": 1
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ALC_TAT",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "AVA_VLA",
"level": 4
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_COV",
"level": 2
},
{
"_type": "sec_certs.sample.sar.SAR",
"family": "ATE_IND",
"level": 2
}
]
},
"extracted_versions": {
"_type": "Set",
"elements": [
"2",
"16"
]
},
"indirect_transitive_cves": null,
"next_certificates": null,
"prev_certificates": null,
"protection_profiles": null,
"related_cves": null,
"report_references": {
"_type": "sec_certs.sample.certificate.References",
"directly_referenced_by": {
"_type": "Set",
"elements": [
"KECS-ISIS-0222-2010",
"BSI-DSZ-CC-0624-2010"
]
},
"directly_referencing": {
"_type": "Set",
"elements": [
"BSI-DSZ-CC-0452-2007"
]
},
"indirectly_referenced_by": {
"_type": "Set",
"elements": [
"ANSSI-CC-2012/09",
"KECS-ISIS-0378-2012",
"KECS-ISIS-0222-2010",
"BSI-DSZ-CC-0624-2010"
]
},
"indirectly_referencing": {
"_type": "Set",
"elements": [
"BSI-DSZ-CC-0400-2007",
"BSI-DSZ-CC-0438-2007",
"BSI-DSZ-CC-0452-2007"
]
}
},
"scheme_data": null,
"st_references": {
"_type": "sec_certs.sample.certificate.References",
"directly_referenced_by": {
"_type": "Set",
"elements": [
"KECS-ISIS-0222-2010"
]
},
"directly_referencing": null,
"indirectly_referenced_by": {
"_type": "Set",
"elements": [
"KECS-ISIS-0222-2010"
]
},
"indirectly_referencing": null
},
"verified_cpe_matches": null
},
"maintenance_updates": {
"_type": "Set",
"elements": [
{
"_type": "sec_certs.sample.cc.CCCertificate.MaintenanceReport",
"maintenance_date": "2008-08-18",
"maintenance_report_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma2a.pdf",
"maintenance_st_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma2b.pdf",
"maintenance_title": "S3CC9L5 16-bit RISC Microcontroller for Smart Card, Revision 1"
},
{
"_type": "sec_certs.sample.cc.CCCertificate.MaintenanceReport",
"maintenance_date": "2008-07-10",
"maintenance_report_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma1a.pdf",
"maintenance_st_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma1b.pdf",
"maintenance_title": "S3CC9LA 16-bit RISC Microcontroller for Smart Card, Revision 0"
},
{
"_type": "sec_certs.sample.cc.CCCertificate.MaintenanceReport",
"maintenance_date": "2009-01-08",
"maintenance_report_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma3a.pdf",
"maintenance_st_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma3b.pdf",
"maintenance_title": "S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 5"
},
{
"_type": "sec_certs.sample.cc.CCCertificate.MaintenanceReport",
"maintenance_date": "2009-02-27",
"maintenance_report_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma4a.pdf",
"maintenance_st_link": "https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501_ma4b.pdf",
"maintenance_title": "S3CC9LC 16-bit RISC Microcontroller for Smart Card Version: Revision 8"
}
]
},
"manufacturer": "Samsung Electronics Co., Ltd.",
"manufacturer_web": "https://www.samsung.com",
"name": "S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2",
"not_valid_after": "2019-09-01",
"not_valid_before": "2008-07-01",
"pdf_data": {
"_type": "sec_certs.sample.cc_eucc_common.PdfData",
"cert_filename": null,
"cert_frontpage": null,
"cert_keywords": null,
"cert_metadata": null,
"report_filename": "0501a.pdf",
"report_frontpage": {
"DE": {
"cert_id": "BSI-DSZ-CC-0501-2008 ######",
"cert_item": "##### S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2 #####",
"cert_lab": "BSI",
"developer": "Samsung Electronics Co., Ltd. BSI -",
"match_rules": [
"(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)"
]
}
},
"report_keywords": {
"asymmetric_crypto": {
"ECC": {
"ECDSA": {
"ECDSA": 1
}
}
},
"cc_cert_id": {
"DE": {
"BSI-DSZ-CC-0452-2007": 1,
"BSI-DSZ-CC-0501": 1,
"BSI-DSZ-CC-0501-2008": 36
}
},
"cc_claims": {},
"cc_protection_profile_id": {
"BSI": {
"BSI-PP-0002-2001": 4
}
},
"cc_sar": {
"ACM": {
"ACM_AUT": 2,
"ACM_AUT.1": 1,
"ACM_CAP": 2,
"ACM_CAP.4": 1,
"ACM_SCP": 2,
"ACM_SCP.3": 1
},
"ADO": {
"ADO_DEL": 2,
"ADO_DEL.2": 1,
"ADO_IGS": 2,
"ADO_IGS.1": 1
},
"ADV": {
"ADV_FSP": 2,
"ADV_HLD": 2,
"ADV_IMP": 2,
"ADV_IMP.2": 1,
"ADV_INT": 2,
"ADV_LLD": 2,
"ADV_RCR": 2,
"ADV_SPM": 2
},
"AGD": {
"AGD_ADM": 2,
"AGD_USR": 2
},
"ALC": {
"ALC_DVS": 2,
"ALC_DVS.2": 6,
"ALC_FLR": 2,
"ALC_LCD": 2,
"ALC_LCD.2": 1,
"ALC_TAT": 2,
"ALC_TAT.2": 1
},
"APE": {
"APE_DES": 1,
"APE_ENV": 1,
"APE_INT": 1,
"APE_OBJ": 1,
"APE_REQ": 1,
"APE_SRE": 1
},
"ASE": {
"ASE_DES": 1,
"ASE_ENV": 1,
"ASE_INT": 1,
"ASE_OBJ": 1,
"ASE_PPC": 1,
"ASE_REQ": 1,
"ASE_SRE": 1,
"ASE_TSS": 1
},
"ATE": {
"ATE_COV": 2,
"ATE_DPT": 2,
"ATE_FUN": 2,
"ATE_IND": 2
},
"AVA": {
"AVA_CCA": 2,
"AVA_MSU": 2,
"AVA_MSU.3": 5,
"AVA_SOF": 3,
"AVA_VLA": 3,
"AVA_VLA.2": 1,
"AVA_VLA.3": 1,
"AVA_VLA.4": 6
}
},
"cc_security_level": {
"EAL": {
"EAL 1": 1,
"EAL 4": 5,
"EAL 5": 4,
"EAL 5 augmented": 4,
"EAL 7": 1,
"EAL1": 5,
"EAL2": 4,
"EAL3": 4,
"EAL4": 7,
"EAL5": 6,
"EAL5+": 1,
"EAL6": 4,
"EAL7": 4
}
},
"cc_sfr": {},
"certification_process": {
"ConfidentialDocument": {
"Class ACM_AUT/CAP/SCP) - Project Cheyenne II, Version 1.3, 2008-05-09 Samsung Electronics (confidential document": 1,
"EVALUATION (ETR-COMP), 8103842493 / BSI-DSZCC-0501, S3CC91A, Version 2, 2008-06-03, T\u00dcViT (confidential document": 1,
"TECHNICAL REPORT-SUMMARY (ETR SUMMARY), 8103842493 / BSI-DSZ-CC-0501, S3CC9LC, Version 2, T\u00dcViT (confidential document": 1,
"for Smart Cards - Project Cheyenne II, Version 1.4, 2008-04-29, Samsung Electronics (confidential document": 1
}
},
"cipher_mode": {
"CBC": {
"CBC": 1
},
"ECB": {
"ECB": 1
}
},
"cplc_data": {
"ICFab": {
"IC Fabricator": 1
},
"ICVersion": {
"IC Version": 1
}
},
"crypto_engine": {
"TORNADO": {
"TORNADO": 2
}
},
"crypto_library": {},
"crypto_protocol": {},
"crypto_scheme": {},
"device_model": {},
"ecc_curve": {},
"eval_facility": {
"TUV": {
"T\u00dcV Informationstechnik": 2,
"T\u00dcViT": 2
}
},
"hash_function": {},
"ic_data_group": {},
"javacard_api_const": {},
"javacard_packages": {},
"javacard_version": {},
"os_name": {},
"pq_crypto": {},
"randomness": {
"RNG": {
"RNG": 1
}
},
"side_channel_analysis": {
"FI": {
"physical tampering": 1
},
"SCA": {
"DPA": 1,
"physical probing": 1,
"side-channel": 1
},
"other": {
"Bellcore attack": 1,
"JIL": 4
}
},
"standard_id": {
"BSI": {
"AIS 25": 3,
"AIS 26": 2,
"AIS 31": 3,
"AIS 32": 1,
"AIS 34": 3,
"AIS 35": 2,
"AIS 36": 1,
"AIS 38": 1,
"AIS20": 1
},
"ISO": {
"ISO/IEC 15408:2005": 3
}
},
"symmetric_crypto": {
"AES_competition": {
"AES": {
"AES": 1
}
},
"DES": {
"3DES": {
"Triple-DES": 5
},
"DES": {
"DES": 6
}
}
},
"technical_report_id": {
"BSI": {
"BSI 7125": 2,
"BSI 7148": 1,
"BSI 7149": 1
}
},
"tee_name": {},
"tls_cipher_suite": {},
"vendor": {
"Infineon": {
"Infineon Technologies AG": 1
},
"Philips": {
"Philips": 1
},
"Samsung": {
"Samsung": 19
}
},
"vulnerability": {}
},
"report_metadata": {
"/Author": "Federal Office for Information Security",
"/CreationDate": "D:20080717125300+02\u002700\u0027",
"/Creator": "Writer",
"/Keywords": "\"S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2, BSI-DSZ-CC-0501-2008, Samsung Electronics Co., Ltd.\"",
"/ModDate": "D:20080717145955+02\u002700\u0027",
"/Producer": "StarOffice 8",
"/Subject": "Common Criteria Zertifizierung",
"/Title": "Zertifizierungsreport BSI-DSZ-CC-0501-2008",
"pdf_file_size_bytes": 569988,
"pdf_hyperlinks": {
"_type": "Set",
"elements": [
"http://www.bsi.bund.de/"
]
},
"pdf_is_encrypted": false,
"pdf_number_of_pages": 36
},
"st_filename": "0501b.pdf",
"st_frontpage": null,
"st_keywords": {
"asymmetric_crypto": {},
"cc_cert_id": {},
"cc_claims": {
"O": {
"O.RND": 5
},
"T": {
"T.RND": 4
}
},
"cc_protection_profile_id": {
"BSI": {
"BSI-PP-0002": 8
}
},
"cc_sar": {
"ACM": {
"ACM_AUT": 2,
"ACM_AUT.1": 1,
"ACM_CAP": 2,
"ACM_CAP.4": 2,
"ACM_SCP": 2,
"ACM_SCP.3": 1
},
"ADO": {
"ADO_DEL": 2,
"ADO_DEL.2": 2,
"ADO_IGS": 2,
"ADO_IGS.1": 3
},
"ADV": {
"ADV_FSP": 1,
"ADV_FSP.1": 2,
"ADV_FSP.3": 1,
"ADV_HLD": 1,
"ADV_HLD.2": 1,
"ADV_HLD.3": 1,
"ADV_IMP": 1,
"ADV_IMP.1": 1,
"ADV_IMP.2": 1,
"ADV_INT": 1,
"ADV_INT.1": 1,
"ADV_LLD": 1,
"ADV_LLD.1": 2,
"ADV_RCR": 1,
"ADV_RCR.2": 1,
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