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	DataDiodeX Modules v1.0.0 None	NXP MF3D(H)x3 NSCIB-CC-23-0011955-CR
name	DataDiodeX Modules v1.0.0	NXP MF3D(H)x3
category	Boundary Protection Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	TR	NL
status	active	active
not_valid_after	13.06.2028	10.03.2028
not_valid_before	13.06.2023	10.03.2023
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Dataflowx%20CC%20Certificate.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-23-0011955-Cert.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Dataflowx%20CERTIFICATION%20REPORT.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-23-0011955-CR.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/DataDiodeX_ST%20Lite.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-23-0011955-STLite_v24.pdf
manufacturer	Dataflowx Teknoloji A.S.	NXP Semiconductors
manufacturer_web	https://www.dataflowx.com	https://www.nxp.com/
security_level	EAL4+, AVA_VAN.5	ALC_DVS.2, EAL5+, AVA_VAN.5
dgst	f95a955d7fb33087	5bc20fdb39f6806f
heuristics/cert_id		NSCIB-CC-23-0011955-CR
heuristics/cert_lab	[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions	1.0.0	-
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data		cert_id: NSCIB-CC-23-0011955-CR cert_link: https://www.tuv-nederland.nl/assets/files/cerfiticaten/2023/03/nscib-cc-23-0011955-cert.pdf level: EAL 5 augmented with ALC_DVS.2 and AVA_VAN.5 manufacturer: NXP Semiconductors Germany GmbH manufacturer_link: www.nxp.com product: MF3D(H)x3 report_link: https://www.tuv-nederland.nl/assets/files/cerfiticaten/2023/03/nscib-cc-23-0011955-cr.pdf scheme: NSCIB target_link: https://www.tuv-nederland.nl/assets/files/cerfiticaten/2023/03/nscib-cc-23-0011955-stlite_v24.pdf
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	cf0f01bcd7be3e9c
maintenance_updates		maintenance_date: 10.06.2020 maintenance_report_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0011955-MA.pdf maintenance_st_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0011955-STv2.1.pdf maintenance_title: Assurance Continuity Maintenance Report MF3D(H)x3
protection_profiles
protection_profile_links	{}	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename	Dataflowx CC Certificate.pdf	NSCIB-CC-23-0011955-Cert.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id		NL: CC-23-0011955: 1
pdf_data/cert_keywords/cc_protection_profile_id		BSI: BSI-CC-PP- 0084-2014: 1
pdf_data/cert_keywords/cc_security_level	EAL: EAL4: 1	EAL: EAL 5: 1 EAL 5 augmented: 1 EAL 7: 1 EAL2: 1
pdf_data/cert_keywords/cc_sar	AVA: AVA_VAN.5: 1	ALC: ALC_DVS.2: 1 ALC_FLR.3: 2 AVA: AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims	A: A.S: 1	R: R.L: 1
pdf_data/cert_keywords/vendor		NXP: NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility		BrightSight: Brightsight: 1 SGS: SGS: 1 SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id	ISO: ISO/IEC 15408: 2	ISO: ISO/IEC 15408-1: 1 ISO/IEC 15408-2: 1 ISO/IEC 15408-3: 1 ISO/IEC 18045: 2
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/CreationDate: D:20230620113433+03'00' /ModDate: D:20230620113433+03'00' pdf_file_size_bytes: 238422 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1	/Author: kruitr /CreationDate: D:20230327140529+02'00' /Creator: Bullzip PDF Printer (11.10.0.2761) /ModDate: D:20230327140754+02'00' /Producer: PDF Printer / www.bullzip.com / FPG / TUV Rheinland Service GmbH /Title: Microsoft Word - NSCIB-CC-23-0011955-Cert.doc pdf_file_size_bytes: 270416 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1
pdf_data/report_filename	Dataflowx CERTIFICATION REPORT.pdf	NSCIB-CC-23-0011955-CR.pdf
pdf_data/report_frontpage	NL:	NL: cert_id: NSCIB-CC-0011955-CR2 cert_item: MF3D(H)x3 cert_lab: SGS Brightsight B.V. developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id		NL: NSCIB-CC-0011955-CR2: 11
pdf_data/report_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level	EAL: EAL 4: 1 EAL 4+: 3 EAL2: 1 EAL4+: 1	EAL: EAL 5: 1 EAL 5 augmented: 1 EAL4: 1 EAL5: 1 EAL5 augmented: 1 EAL5+: 1
pdf_data/report_keywords/cc_sar	ADV: ADV_ARC.1: 1 ADV_FSP.4: 1 ADV_IMP.1: 1 ADV_TDS.3: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS.4: 1 ALC_DEL.1: 1 ALC_DVS.1: 1 ALC_LCD.1: 1 ALC_TAT.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.1: 1 ATE_FUN.1: 1 AVA: AVA_VAN.5: 6	ADV: ADV_IMP: 2 ALC: ALC_DVS.2: 2 AVA: AVA_VAN.5: 3
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor		NXP: NXP: 1 NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility	BEAM: BEAM Teknoloji: 3	BrightSight: Brightsight: 3 SGS: SGS: 3 SGS Brightsight: 3
pdf_data/report_keywords/symmetric_crypto		AES_competition: AES: AES: 4 DES: 3DES: 3DES: 1 Triple-DES: 1 DES: DES: 2 constructions: MAC: CMAC: 1
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function	MD: MD5: MD5: 1 SHA: SHA2: SHA256: 1
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness		RNG: RNG: 1
pdf_data/report_keywords/cipher_mode		CBC: CBC: 2
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis		SCA: side channel: 1 other: JIL: 2 JIL-AAPS: 1 JIL-AM: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	CC: CCMB-2012-09-001: 1 CCMB-2012-09-002: 1 CCMB-2012-09-003: 1 CCMB-2012-09-004: 1 ISO: ISO/IEC 17025: 2	BSI: AIS 31: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages	org: org.tr: 1
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: TSE KSDB /CreationDate: D:20230605110402+03'00' /Creator: Microsoft® Word 2016 /ModDate: D:20230622143850+02'00' /Producer: 3.0.1 (5.0.1) pdf_file_size_bytes: 1574698 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 17	/Author: Microsoft Office User /CreationDate: D:20230323080816+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20230323080816+00'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 200963 pdf_hyperlinks: https://www.sogis.eu/, mailto:[email protected], http://www.tuv.com/nl, http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 11
pdf_data/st_filename	DataDiodeX_ST Lite.pdf	NSCIB-CC-23-0011955-STLite_v24.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id		NL: NSCIB-CC-0011955: 1
pdf_data/st_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 7 EAL4 augmented: 1	EAL: EAL4: 2 EAL5: 7 EAL5 augmented: 2
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC.1: 1 ADV_FSP.4: 1 ADV_TDS.3: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS.4: 1 ALC_DEL.1: 1 ALC_DVS.1: 1 ALC_LCD.1: 1 ALC_TAT.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.5: 5	ADV: ADV_ARC.1: 1 ADV_FSP: 3 ADV_FSP.4: 3 ADV_FSP.5: 11 ADV_IMP.1: 1 ADV_INT.2: 1 ADV_TDS.4: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS: 3 ALC_CMS.4: 3 ALC_CMS.5: 5 ALC_DEL.1: 1 ALC_DVS.2: 3 ALC_LCD.1: 1 ALC_TAT.2: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.3: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr	FDP: FDP_IFC.1: 2 FDP_IFC.2: 5 FDP_IFC.2.2: 1 FDP_IFF.1: 6 FDP_IFF.1.1: 1 FDP_IFF.1.2: 1 FDP_IFF.1.3: 1 FDP_IFF.1.4: 1 FDP_IFF.1.5: 1 FMT: FMT_MSA.3: 1	FAU: FAU_SAS.1: 7 FAU_SAS.1.1: 1 FCS: FCS_CKM: 31 FCS_CKM.1: 7 FCS_CKM.2: 2 FCS_CKM.4: 7 FCS_COP: 24 FCS_COP.1: 5 FCS_RNG: 14 FCS_RNG.1: 5 FDP: FDP_ACC: 12 FDP_ACC.1: 10 FDP_ACF: 9 FDP_ACF.1: 6 FDP_ETC: 17 FDP_ETC.1: 1 FDP_ETC.2: 1 FDP_ETC.3: 10 FDP_ETC.3.1: 1 FDP_ETC.3.2: 1 FDP_ETC.3.3: 1 FDP_IFC.1: 6 FDP_ITC: 11 FDP_ITC.1: 6 FDP_ITC.2: 11 FDP_ITT.1: 3 FDP_ROL: 8 FDP_ROL.1: 2 FDP_SDC.1: 7 FDP_SDC.1.1: 1 FDP_SDI.1: 1 FDP_SDI.2: 6 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FIA: FIA_UAU: 25 FIA_UAU.1: 1 FIA_UAU.2: 1 FIA_UAU.3: 2 FIA_UAU.5: 2 FIA_UID: 10 FIA_UID.1: 5 FIA_UID.2: 1 FMT: FMT_LIM.1: 4 FMT_LIM.2: 4 FMT_MSA: 17 FMT_MSA.1: 3 FMT_MSA.3: 3 FMT_MTD: 8 FMT_MTD.1: 1 FMT_SMF: 13 FMT_SMF.1: 5 FMT_SMR: 12 FMT_SMR.1: 7 FPR: FPR_UNL: 8 FPR_UNL.1: 1 FPT: FPT_FLS.1: 4 FPT_ITT.1: 3 FPT_PHP.3: 3 FPT_RPL: 11 FPT_RPL.1: 2 FPT_TDC: 9 FPT_TDC.1: 4 FRU: FRU_FLT.2: 2 FTP: FTP_ITC.1: 1 FTP_TRP: 17 FTP_TRP.1: 8
pdf_data/st_keywords/cc_claims		A: A: 1 O: O.MAC: 7 O.RND: 1 T: T.RND: 1
pdf_data/st_keywords/vendor		NXP: NXP: 96 NXP Semiconductors: 30
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto		AES_competition: AES: AES: 27 DES: 3DES: TDEA: 1 TDES: 2 Triple-DES: 6 DES: DES: 8 constructions: MAC: CMAC: 6
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme		MAC: MAC: 24
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness		RNG: RND: 2 RNG: 15
pdf_data/st_keywords/cipher_mode		CBC: CBC: 4
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis		FI: Malfunction: 3 fault injection: 3 malfunction: 1 SCA: Leak-Inherent: 2 Physical Probing: 2
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	CC: CCMB-2017-04-001: 1 CCMB-2017-04-002: 1 CCMB-2017-04-003: 1 CCMB-2017-04-004: 1	BSI: AIS31: 1 CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 2 CCMB-2017-04-003: 2 CCMB-2017-04-004: 2 FIPS: FIPS PUB 197: 2 FIPS PUB 46-3: 1 NIST: NIST SP 800-38A: 2 NIST SP 800-38B: 1 NIST SP 800-67: 2
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata	/Author: Dell /CreationDate: D:20230622112358+03'00' /Creator: Microsoft® Word Microsoft 365 için /ModDate: D:20230622112358+03'00' /Producer: Microsoft® Word Microsoft 365 için /Subject: Security Target v0.1 /Title: Security Target v0.1 pdf_file_size_bytes: 539591 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 30	/Author: NXP B.V. /CreationDate: D:20230105131916+01'00' /Creator: DITA Open Toolkit 3.3.1 /Keywords: Common Criteria, Security Target, MF3D(H)x3, MIFARE DESFire EV3 /Producer: Apache FOP Version 2.3 /Subject: MF3D(H)x3 /Title: Security Target Lite pdf_file_size_bytes: 502351 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 64
state/cert/convert_garbage	True	False
state/cert/convert_ok	True	True
state/cert/download_ok	True	True
state/cert/extract_ok	True	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different