Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
Data Security Kit(D) Software V1.00E
JISEC-CC-CRP-C0057 		NXP JCOP 3 SECID P40 ChipDoc-Lite in SSCD Configuration (version 1.0.10)
ANSSI-CC-2018/07
name Data Security Kit(D) Software V1.00E NXP JCOP 3 SECID P40 ChipDoc-Lite in SSCD Configuration (version 1.0.10)
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP FR
not_valid_after 31.01.2013 12.03.2023
not_valid_before 31.10.2006 12.03.2018
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0057_ecvr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/anssi-cc-2018-07fr.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/anssi-cible-2018_07en.pdf
manufacturer KYOCERA MITA Corporation NXP Semiconductors
manufacturer_web https://www.kyoceramita.com/ https://www.nxp.com/
security_level EAL3 EAL5+, ALC_DVS.2, AVA_VAN.5
dgst e97590283c1ec64c 7c742cbf21424f57
heuristics/cert_id JISEC-CC-CRP-C0057 ANSSI-CC-2018/07
heuristics/cert_lab [] SERMA
heuristics/extracted_sars {} ADV_ARC.1, AGD_OPE.1, ATE_COV.2, ALC_DEL.1, AGD_PRE.1, ADV_TDS.3, ASE_SPD.1, ALC_LCD.1, ASE_OBJ.2, ASE_REQ.2, AVA_VAN.5, ATE_FUN.1, ASE_TSS.1, ALC_CMS.4, ATE_IND.2, ALC_CMC.4, ASE_CCL.1, ALC_DVS.2, ATE_DPT.2, ASE_ECD.1, ADV_IMP.1, ASE_INT.1, ALC_TAT.1, ADV_FSP.4
heuristics/extracted_versions 1.00 1.0.10
heuristics/report_references/directly_referencing {} NSCIB-CC-65655-CR2, NSCIB-CC-65156-CR2
heuristics/report_references/indirectly_referencing {} NSCIB-CC-65655-CR2, NSCIB-CC-65156-CR2
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0150
  • certification_date: 01.03.2008
  • claim: EAL3
  • enhanced:
    • assurance_level: EAL3
    • cc_version: 2.1
    • cert_link: https://www.ipa.go.jp/en/security/c0150_eimg.pdf
    • description: PRODUCT DESCRIPTION Description of TOE The TOE is installed as an option to the MFPs "KM-3050, KM-4050, KM-5050, KM-3050i, KM-4050i, KM-5050i, CS-3050, CS-4050, CS-5050" of KYOCERA MITA Corporation. It is used to protect the image data that exists on HDD during or after each processing the copy function, the print function, the network scanning function, and the fax (sending and receiving) function from an illegal exposure. TOE security functions To defend assets to be protected in relation to the use of the above-mentioned basic functions, this TOE has the following security functions. - Hard disk accumulation data overwrite deletion function - Hard disk accumulation data encryption function
    • evaluation_facility: Information Technology Security Center Evaluation Department
    • product: Data Security Kit(C) Software
    • product_type: IT Product (data protection function in digital MFP)
    • toe_version: V1.40
    • vendor: KYOCERA MITA Corporation
  • expiration_date: 01.03.2013
  • supplier: KYOCERA MITA Corporation
  • toe_japan_name: Data Security Kit (C) Software V1.40
  • toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0150_it5063.html
  • toe_overseas_name: Data Security Kit (C) Software V1.40
heuristics/protection_profiles {} 27abdb9c6ab375a7, d918b28fd7bb5d79
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0059b_pdf.pdf, https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0075b_pdf.pdf
pdf_data/report_filename c0057_ecvr.pdf anssi-cc-2018-07fr.pdf
pdf_data/report_frontpage
  • FR:
  • FR:
    • cc_security_level: EAL5 augmenté ALC_DVS.2, AVA_VAN.5
    • cc_version: Critères Communs version 3.1 révision 4
    • cert_id: ANSSI-CC-2018/07
    • cert_item: NXP JCOP 3 SECID P40 ChipDoc-Lite in SSCD Configuration
    • cert_item_version: Version 1.0.10
    • cert_lab: Serma Safety & Security 14 rue Galilée, CS 10055, 33615 Pessac Cedex, France
    • developer: NXP Semiconductors GmbH Troplowitzstr. 20, 22529 Hamburg, Allemagne Commanditaire NXP Semiconductors GmbH Troplowitzstr. 20, 22529 Hamburg, Allemagne
    • match_rules: ['Référence du rapport de certification(.+)Nom du produit(.+)Référence/version du produit(.+)Conformité à un profil de protection(.+)Critères d’évaluation et version(.+)Niveau d’évaluation(.+)Développeur (.+)Centre d’évaluation(.+)Accords de reconnaissance applicables']
    • ref_protection_profiles: PP-SSCD-Part2] Protection profiles for secure signature creation device - Device with key generation, v2.0.1 ; [PP-SSCD-Part3] Protection profiles for secure signature creation device - Device with key import, v1.0.2
pdf_data/report_keywords/cc_cert_id
  • JP:
    • Certification No. C0057: 1
  • FR:
    • ANSSI-CC-2018/07: 17
  • NL:
    • NSCIB-CC-65156-CR2: 1
    • NSCIB-CC-65655-CR2: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0075-2012: 1
    • BSI-PP-0084-2014: 1
  • other:
    • PP-SSCD-: 3
    • PP-SSCD-Part2: 2
    • PP-SSCD-Part3: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL3: 1
  • EAL:
    • EAL 1: 1
    • EAL 3: 1
    • EAL 5: 1
    • EAL 7: 1
    • EAL2: 2
    • EAL5: 4
    • EAL7: 1
  • ITSEC:
    • ITSEC E6 Elevé: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_FSP: 1
    • ADV_IMP: 1
    • ADV_INT: 1
    • ADV_SPM: 1
    • ADV_TDS: 1
  • AGD:
    • AGD_OPE: 2
    • AGD_PRE: 3
  • ALC:
    • ALC_CMC: 1
    • ALC_CMS: 1
    • ALC_DEL: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_TAT: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_ECD: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_REQ: 1
    • ASE_SPD: 1
    • ASE_TSS: 1
    • ASE_TSS.2: 2
  • ATE:
    • ATE_COV: 1
    • ATE_DPT: 1
    • ATE_FUN: 1
    • ATE_IND: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.5: 6
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 23
    • NXP Semiconductors: 4
pdf_data/report_keywords/eval_facility
  • ITSC:
    • Information Technology Security Center: 1
  • Serma:
    • SERMA: 1
    • Serma Safety & Security: 1
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 1
pdf_data/report_keywords/os_name
  • JCOP:
    • JCOP 3: 19
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
pdf_data/report_metadata
  • /CreationDate: D:20061102202158+09'00'
  • /ModDate: D:20061102202158+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /Title: untitled
  • pdf_file_size_bytes: 12898
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Category: Référence, Version
  • /Comments: NXP Semiconductors GmbH
  • /Company: SGDSN/ANSSI
  • /CreationDate: D:20180314154523+01'00'
  • /Creator: Acrobat PDFMaker 11 pour Word
  • /Keywords: ANSSI-CC-CER-F-07.026
  • /ModDate: D:20180314174237+01'00'
  • /Producer: Adobe PDF Library 11.0
  • /SourceModified: D:20180314144518
  • /Subject:
  • /Title:
  • pdf_file_size_bytes: 265654
  • pdf_hyperlinks: mailto:[email protected], http://www.ssi.gouv.fr/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 16
pdf_data/st_filename anssi-cible-2018_07en.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-15-65655-CR: 1
    • NSCIB-CC-15-65156: 2
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0059-2009-MA-01: 3
    • BSI-CC-PP-0075: 3
    • BSI-CC-PP0059-2009-MA-01–: 1
    • BSI-CC-PP0075-2012–: 2
    • BSI-PP-0035: 1
    • BSI-PP-0035-2007: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 4+: 2
    • EAL 5+: 4
    • EAL4: 6
    • EAL4 augmented: 2
    • EAL4+: 2
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 2
    • ADV_FSP.4: 2
    • ADV_IMP.1: 2
    • ADV_TDS.3: 2
  • AGD:
    • AGD_OPE.1: 2
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 5
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
  • FCS:
    • FCS_CKM.1: 7
    • FCS_CKM.1.1: 1
    • FCS_CKM.4: 6
    • FCS_CKM.4.1: 1
    • FCS_COP: 6
    • FCS_COP.1: 9
    • FCS_COP.1.1: 1
  • FDP:
    • FDP_ACC: 11
    • FDP_ACC.1: 6
    • FDP_ACF: 10
    • FDP_ACF.1: 18
    • FDP_ITC: 2
    • FDP_ITC.1: 5
    • FDP_RIP.1: 6
    • FDP_RIP.1.1: 1
    • FDP_SDI: 7
    • FDP_SDI.2: 6
    • FDP_UCT: 5
    • FDP_UCT.1: 3
  • FIA:
    • FIA_AFL.1: 4
    • FIA_AFL.1.1: 1
    • FIA_AFL.1.2: 1
    • FIA_UAU.1: 6
    • FIA_UAU.1.1: 2
    • FIA_UAU.1.2: 1
    • FIA_UID.1: 7
    • FIA_UID.1.1: 1
    • FIA_UID.1.2: 1
  • FMT:
    • FMT_MOF: 1
    • FMT_MOF.1: 5
    • FMT_MSA: 7
    • FMT_MSA.1: 4
    • FMT_MSA.2: 7
    • FMT_MSA.2.1: 1
    • FMT_MSA.3: 6
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MSA.4: 7
    • FMT_MSA.4.1: 1
    • FMT_MTD: 9
    • FMT_MTD.1: 2
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPT:
    • FPT_EMS: 4
    • FPT_EMS.1: 15
    • FPT_EMS.1.1: 4
    • FPT_EMS.1.2: 3
    • FPT_FLS.1: 5
    • FPT_FLS.1.1: 1
    • FPT_ITC.1: 1
    • FPT_PHP.1: 4
    • FPT_PHP.1.1: 1
    • FPT_PHP.1.2: 1
    • FPT_PHP.3: 5
    • FPT_PHP.3.1: 1
    • FPT_TST: 1
    • FPT_TST.1: 8
    • FPT_TST.1.1: 1
    • FPT_TST.1.2: 1
    • FPT_TST.1.3: 1
  • FTP:
    • FTP_ITC: 5
    • FTP_ITC.1: 7
pdf_data/st_keywords/cc_claims
  • A:
    • A.CGA: 5
    • A.CSP: 4
    • A.SCA: 5
    • A.SCP: 1
  • OE:
    • OE.HID_VAD: 6
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 40
    • NXP Semiconductors: 22
    • NXP Semiconductors N.V: 60
pdf_data/st_keywords/eval_facility
  • BrightSight:
    • BrightSight: 1
    • Brightsight: 1
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 1
      • TDES: 2
    • DES:
      • DES: 5
pdf_data/st_keywords/asymmetric_crypto
  • FF:
    • DH:
      • Diffie-Hellman: 1
  • RSA:
    • RSA 1024: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
    • SHA2:
      • SHA-224: 1
      • SHA-256: 2
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 6
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • PRNG:
    • DRBG: 1
  • RNG:
    • RNG: 2
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • fault injection: 1
    • malfunction: 1
    • physical tampering: 4
  • SCA:
    • DPA: 2
    • SPA: 2
    • timing attacks: 2
pdf_data/st_keywords/technical_report_id
  • BSI:
    • BSI 2006: 1
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
  • JCOP:
    • JCOP 3: 2
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • FIPS:
    • FIPS PUB 180-2: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 7816: 2
  • PKCS:
    • PKCS#1: 3
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /CreationDate: D:20180202125246Z
  • /Creator: Microsoft® Word 2016
  • /ModDate: D:20180314174256+01'00'
  • /Producer: Microsoft® Word 2016
  • /Title:
  • pdf_file_size_bytes: 1495602
  • pdf_hyperlinks: http://www.nxp.com/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 60
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
state/st/txt_hash Different Different