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Tripp Lite Secure KVM Switch Series (Model B002-DUA2 and Model B002-DUA4)
CCEVS-VR-VID-10481-2011 		NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
NSCIB-CC-2200030-02-CR
name Tripp Lite Secure KVM Switch Series (Model B002-DUA2 and Model B002-DUA4) NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
category Network and Network-Related Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme US NL
status archived active
not_valid_after 01.11.2014 19.11.2029
not_valid_before 31.10.2011 19.11.2024
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-02.1-Cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10481-vr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-02-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/st_vid10481-st.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-02-STLite_v09.pdf
manufacturer Tripp Lite NXP Semiconductors Germany GmbH
manufacturer_web https://www.tripplite.com https://www.nxp.com
security_level EAL2+, ALC_FLR.2 ALC_FLR.1, ALC_DVS.2, AVA_VAN.5, ASE_TSS.2, EAL5+
dgst e541985ff24b4b10 cd79a4200be9f14f
heuristics/cert_id CCEVS-VR-VID-10481-2011 NSCIB-CC-2200030-02-CR
heuristics/cert_lab US
heuristics/extracted_sars ADV_ARC.1, ASE_TSS.1, AGD_OPE.1, ALC_CMC.2, ADV_FSP.2, ALC_FLR.2, ASE_REQ.2, AVA_VAN.2, AGD_PRE.1, ASE_CCL.1, ATE_IND.2, ASE_ECD.1, ALC_DEL.1, ADV_TDS.1, ASE_OBJ.2, ALC_CMS.2, ATE_COV.1, ASE_INT.1, ASE_SPD.1, ATE_FUN.1 AVA_VAN.5, ADV_ARC.1, ATE_COV.2, ADV_FSP.5, AGD_OPE.1, ATE_DPT.3, ADV_IMP.1, ADV_CMS.5, ADV_TDS.4, ASE_TSS.2, ASE_REQ.2, ALC_DVS.2, AGD_PRE.1, ASE_CCL.1, ATE_IND.2, ASE_ECD.1, ALC_DEL.1, ASE_OBJ.2, ALC_FLR.1, ASE_INT.1, ADV_INT.2, ALC_TAT.2, ASE_SPD.1, ATE_FUN.1, ALC_CMS.5, ALC_CMC.4, ALC_LCD.1
heuristics/extracted_versions - 2.1.001
heuristics/report_references/directly_referenced_by {} NSCIB-CC-2200041-03-CR
heuristics/report_references/indirectly_referenced_by {} NSCIB-CC-2200041-03-CR
heuristics/scheme_data
heuristics/st_references/directly_referencing {} NSCIB-CC-2200030-01-CR
heuristics/st_references/indirectly_referencing {} NSCIB-CC-2200030-01-CR
heuristics/protection_profiles fd5d86dc01df0437 cf0f01bcd7be3e9c
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp_psshid_v2.1-vr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename NSCIB-CC-2200030-02.1-Cert.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2200030-02: 1
    • NSCIB-CC-2200030-02: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 7: 1
    • EAL2: 1
    • EAL5: 1
    • EAL5 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 1
  • ASE:
    • ASE_TSS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Wim Ton
  • /CreationDate: D:20250129091455+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20250129091455+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 87710
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename st_vid10481-vr.pdf NSCIB-CC-2200030-02-CR.pdf
pdf_data/report_frontpage
  • NL:
  • US:
    • cert_id: CCEVS-VR-VID10481-2011
    • cert_item: Tripp Lite Secure KVM Switch Series
    • cert_lab: US NIAP
  • NL:
    • cert_id: NSCIB-CC-2200030-02-CR
    • cert_item: NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
    • cert_lab: TÜV Informationstechnik GmbH
    • developer: NXP Semiconductors Germany GmbH
  • US:
pdf_data/report_keywords/cc_cert_id
  • US:
    • CCEVS-VR-VID10481-2011: 1
  • NL:
    • NSCIB-2200030-02: 1
    • NSCIB-CC-2200030-02: 2
    • NSCIB-CC-2200030-02-CR: 11
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2+: 4
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR.2: 3
  • ALC:
    • ALC_DVS.2: 2
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.2: 2
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 3
pdf_data/report_keywords/cc_claims
  • A:
    • A.ACCESS: 1
    • A.MANAGE: 1
    • A.NOEVIL: 1
    • A.PHYSICAL: 1
  • T:
    • T.INVALIDUSB: 1
    • T.RESIDUAL: 1
    • T.ROM_PROG: 1
    • T.SPOOF: 1
    • T.TRANSFER: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 13
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 3
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 1
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 2
pdf_data/report_keywords/standard_id
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_metadata
  • /Author: NAIP CCEVS
  • /CreationDate: D:20111212101134
  • /Creator: Microsoft® Office Word 2007
  • /ModDate: D:20111212101134
  • /Producer: Microsoft® Office Word 2007
  • /Title: VID 10481 VR
  • pdf_file_size_bytes: 245975
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 16
pdf_data/st_filename st_vid10481-st.pdf NSCIB-CC-2200030-02-STLite_v09.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2200030-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
    • BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 2 augmented: 1
    • EAL 2+: 1
    • EAL2: 3
    • EAL2 augmented: 3
  • EAL:
    • EAL4: 1
    • EAL5: 13
    • EAL5 augmented: 2
    • EAL5+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.2: 1
    • ADV_TDS.1: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.2: 1
    • ALC_CMS.2: 1
    • ALC_DEL.1: 1
    • ALC_FLR.2: 6
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.2: 1
  • ADV:
    • ADV_ARC.1: 5
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.2: 3
    • ADV_FSP.4: 4
    • ADV_FSP.5: 5
    • ADV_IMP.1: 6
    • ADV_INT.2: 1
    • ADV_TDS.1: 5
    • ADV_TDS.3: 2
    • ADV_TDS.4: 3
  • AGD:
    • AGD_OPE.1: 4
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 2
    • ALC_CMS: 1
    • ALC_CMS.4: 2
    • ALC_CMS.5: 4
    • ALC_DEL.1: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR.1: 6
    • ALC_LCD.1: 3
    • ALC_TAT.1: 4
    • ALC_TAT.2: 2
  • ASE:
    • ASE_CCL: 2
    • ASE_CCL.1: 2
    • ASE_ECD: 1
    • ASE_ECD.1: 3
    • ASE_INT: 2
    • ASE_INT.1: 4
    • ASE_OBJ.2: 3
    • ASE_REQ: 2
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD: 2
    • ASE_SPD.1: 2
    • ASE_TSS: 2
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV.1: 1
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_DPT.3: 2
    • ATE_FUN.1: 7
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ETC.1: 1
    • FDP_IFC.1: 5
    • FDP_IFF.1: 5
    • FDP_ITC.1: 1
    • FDP_MSA.1: 1
  • FMT:
    • FMT_MSA.1: 5
    • FMT_MSA.3: 5
    • FMT_SMF.1: 7
    • FMT_SMR.1: 4
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 6
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 7
    • FDP_ITT.1: 6
    • FDP_SDC: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 1
    • FDP_SDI: 4
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 8
  • FTP:
    • FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims
  • A:
    • A.ACCESS: 1
    • A.MANAGE: 1
    • A.NOEVIL: 1
    • A.PHYSICAL: 1
  • O:
    • O.CONF: 1
    • O.INDICATE: 1
    • O.ROM: 3
    • O.SELECT: 1
    • O.SWITCH: 1
    • O.USBDETECT: 1
  • OE:
    • OE.ACCESS: 1
    • OE.MANAGE: 1
    • OE.NOEVIL: 1
    • OE.PHYSICAL: 1
  • T:
    • T.INVALIDUSB: 1
    • T.RESIDUAL: 1
    • T.ROM_PROG: 1
    • T.SPOOF: 1
    • T.TRANSFER: 1
  • O:
    • O.RND: 1
    • O.RND_HW: 4
  • T:
    • T.RND: 1
    • T.RND_HW: 3
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 111
    • NXP Semiconductors: 29
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
    • RNG: 12
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • CFB:
    • CFB: 1
  • CTR:
    • CTR: 1
  • GCM:
    • GCM: 2
  • OFB:
    • OFB: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Physical Tampering: 8
  • FI:
    • Malfunction: 5
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 1
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS 140-3: 2
  • ISO:
    • ISO/IEC 7816: 4
pdf_data/st_metadata
  • /Author: TTC
  • /CreationDate: D:20111215152415
  • /Creator: Microsoft® Office Word 2007
  • /ModDate: D:20111215152415
  • /Producer: Microsoft® Office Word 2007
  • /Title: Security Target
  • pdf_file_size_bytes: 282094
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 28
  • /Author: NXP B.V.
  • /CreationDate: D:20230509104646+02'00'
  • /Creator: DITA Open Toolkit 3.3.1
  • /Keywords: NXP, ASE, SN300 B2 Single Chip Secured (NFC) Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL5 augmented
  • /Producer: Apache FOP Version 2.3
  • /Subject: NXP SN300 B2 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 846702
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 37
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
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