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Samsung S3CC9RB microcontroller
ANSSI-CC-2004/07 		STMicroelectronics ST54L A02
NSCIB-CC-2300182-01-CR
name Samsung S3CC9RB microcontroller STMicroelectronics ST54L A02
scheme FR NL
status archived active
not_valid_after 01.09.2019 19.04.2029
not_valid_before 11.05.2004 19.04.2024
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-2300182-01-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_07.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300182-01-CR2.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_07.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300182-01-ST.pdf
manufacturer Samsung Electronics Co., Ltd. STMicroelectronics
manufacturer_web https://www.samsung.com https://www.st.com/
security_level EAL4+, AVA_VLA.4, ADV_IMP.2, ALC_DVS.2 EAL6+, ALC_FLR.2
dgst dfa41eb6da6f2af5 2bd2cc8a67ea9a19
heuristics/cert_id ANSSI-CC-2004/07 NSCIB-CC-2300182-01-CR
heuristics/cert_lab []
heuristics/extracted_sars AVA_MSU.2, ATE_FUN.1, ADV_RCR.1, ASE_INT.1, ADV_LLD.1, ADV_IMP.2, ASE_ENV.1, ATE_IND.2, ATE_DPT.1, AGD_USR.1, ASE_REQ.1, ASE_SRE.1, ALC_LCD.1, ALC_DVS.2, AVA_VLA.4, ADV_HLD.2, ATE_COV.2, ASE_PPC.1, ASE_DES.1, ALC_TAT.1, AGD_ADM.1, AVA_SOF.1, ASE_OBJ.1, ASE_TSS.1, ADV_SPM.1, ADV_FSP.1, ADV_DVS.2 ASE_CCL.1, ASE_OBJ.2, ALC_CMC.5, ATE_DPT.3, AVA_VAN.5, ASE_INT.1, ASE_REQ.2, ATE_FUN.2, ADV_IMP.2, AGD_PRE.1, ATE_IND.2, ASE_ECD.1, ALC_TAT.3, ALC_LCD.1, ALC_DVS.2, ADV_TDS.5, ALC_FLR.2, ASE_SPD.1, ATE_COV.3, ADV_INT.3, ALC_CMS.5, AGD_OPE.1, ADV_FSP.5, ALC_DEL.1, ASE_TSS.1, ADV_SPM.1, ADV_ARC.1
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/report_references/directly_referencing ANSSI-CC-2002/25 {}
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/report_references/indirectly_referencing ANSSI-CC-2002/25 {}
heuristics/scheme_data
heuristics/st_references/directly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/st_references/indirectly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/protection_profiles {} cf0f01bcd7be3e9c
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename NSCIB-2300182-01-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-23-0638980: 1
    • NSCIB-2300182-01: 1
    • NSCIB-CC-2300182-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL2: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: JM2
  • /CreationDate: D:20240424204220+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240424204220+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 91592
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2004_07.pdf NSCIB-CC-2300182-01-CR2.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
  • FR:
  • NL:
    • cert_id: NSCIB-CC-2300182-01-CR
    • cert_item: ST54L A02
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
pdf_data/report_keywords/cc_cert_id
  • FR:
    • Rapport de certification 2002/25: 1
    • Rapport de certification 2004/07: 13
  • NL:
    • CC-23-0638980: 1
    • NSCIB-2300182-01: 1
    • NSCIB-CC-2300182-01-CR: 1
    • NSCIB-CC-2300182-01-CR2: 10
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL3: 1
    • EAL4: 1
    • EAL4+: 1
    • EAL41: 1
    • EAL5: 1
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 et: 1
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 2
    • EAL6 augmented: 1
    • EAL6+: 2
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 2
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_DEL.2: 2
    • ADO_IGS: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 3
    • ADV_INT: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 1
    • AGD_USR: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 3
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_FLR.1: 1
    • ALC_FLR.2: 3
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 2
  • FCS:
    • FCS_CKM.1: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 2
    • FDP_IFF.1: 2
    • FDP_SDI.1: 2
  • FIA:
    • FIA_ATD.1: 2
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 2
  • FPT:
    • FPT_PHP.2: 2
    • FPT_PHP.3: 2
    • FPT_TST.1: 2
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 10
  • STMicroelectronics:
    • STMicroelectronics: 3
pdf_data/report_keywords/eval_facility
  • Serma:
    • SERMA: 3
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 4
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 2
  • constructions:
    • MAC:
      • CBC-MAC: 1
  • miscellaneous:
    • SM4:
      • SM4: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/report_keywords/crypto_engine
  • NesCrypt:
    • Nescrypt: 3
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 2
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
  • ISO:
    • ISO/IEC 15408:1999: 1
pdf_data/report_metadata
  • /Author: DCSSI
  • /CreationDate: D:20040517150856+02'00'
  • /Creator: Acrobat PDFMaker 5.0 pour Word
  • /ModDate: D:20040517150903+03'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: Micro-circuit SAMSUNG S3CC9RB
  • /Title: Rapport de certification 2004/07
  • pdf_file_size_bytes: 657386
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 26
pdf_data/st_filename cible2004_07.pdf NSCIB-CC-2300182-01-ST.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 10
    • BSI-CC-PP-0084-: 1
    • BSI-CC-PP-0084-2014: 64
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4: 12
    • EAL4 augmented: 1
  • EAL:
    • EAL4: 1
    • EAL6: 23
    • EAL6 augmented: 2
    • EAL6+: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 3
    • ACM_SCP: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_IGS: 3
  • ADV:
    • ADV_DVS.2: 1
    • ADV_FSP: 3
    • ADV_FSP.1: 1
    • ADV_HLD: 2
    • ADV_HLD.2: 1
    • ADV_IMP: 2
    • ADV_IMP.1: 2
    • ADV_IMP.2: 5
    • ADV_LLD: 2
    • ADV_LLD.1: 2
    • ADV_RCR: 3
    • ADV_RCR.1: 1
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 3
    • AGD_ADM.1: 1
    • AGD_USR: 3
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD: 2
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_MSU: 2
    • AVA_SOF: 2
    • AVA_VLA: 2
    • AVA_VLA.4: 6
  • ADV:
    • ADV_ARC: 2
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT.3: 1
    • ADV_SPM: 3
    • ADV_SPM.1: 3
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 3
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.5: 1
    • ALC_DEL: 3
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL: 4
    • ASE_CCL.1: 1
    • ASE_ECD: 4
    • ASE_ECD.1: 1
    • ASE_INT: 2
    • ASE_INT.1: 1
    • ASE_OBJ: 12
    • ASE_OBJ.2: 1
    • ASE_REQ: 31
    • ASE_REQ.2: 1
    • ASE_SPD: 9
    • ASE_SPD.1: 1
    • ASE_TSS: 7
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 3
    • ATE_COV.3: 1
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 2
    • FAU_SAA.1: 7
  • FCS:
    • FCS_CKM.1: 8
    • FCS_CKM.4: 7
    • FCS_COP.1: 8
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACC.2: 5
    • FDP_ACF.1: 6
    • FDP_IFC.1: 6
    • FDP_IFF.1: 6
    • FDP_ITC.1: 3
    • FDP_SDI.1: 5
  • FIA:
    • FIA_ATD.1: 7
    • FIA_UAU.2: 8
    • FIA_UID.1: 1
    • FIA_UID.2: 8
  • FMT:
    • FMT_MOF.1: 7
    • FMT_MSA.1: 6
    • FMT_MSA.2: 3
    • FMT_MSA.3: 7
    • FMT_SMR.1: 7
  • FPR:
    • FPR_UNO: 1
    • FPR_UNO.1: 4
  • FPT:
    • FPT_AMT.1: 2
    • FPT_PHP.2: 5
    • FPT_PHP.3: 5
    • FPT_TST.1: 8
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAR.1: 25
    • FAU_SAS: 2
    • FAU_SAS.1: 28
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 4
    • FCS_COP.1: 17
    • FCS_RNG: 2
    • FCS_RNG.1: 6
  • FDP:
    • FDP_ACC.1: 23
    • FDP_ACC.2: 14
    • FDP_ACF: 1
    • FDP_ACF.1: 30
    • FDP_IFC.1: 16
    • FDP_ITC.1: 2
    • FDP_ITC.2: 2
    • FDP_ITT.1: 10
    • FDP_SDC: 2
    • FDP_SDC.1: 8
    • FDP_SDI.2: 14
    • FDP_SMF.1: 2
    • FDP_SMR.1: 1
    • FDP_UCT.1: 16
    • FDP_UIT.1: 16
  • FIA:
    • FIA_API: 2
    • FIA_API.1: 6
    • FIA_UAU.1: 14
    • FIA_UID.1: 16
  • FMT:
    • FMT_LIM: 2
    • FMT_LIM.1: 29
    • FMT_LIM.2: 30
    • FMT_MSA.1: 28
    • FMT_MSA.3: 28
    • FMT_SMF.1: 23
    • FMT_SMR.1: 17
  • FPT:
    • FPT_FLS.1: 22
    • FPT_ITT.1: 9
    • FPT_PHP.3: 11
  • FRU:
    • FRU_FLT.2: 11
  • FTP:
    • FTP_ITC.1: 27
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • A:
    • A.DEV_ORG: 2
    • A.DLV: 1
    • A.DLV_AUDIT: 2
    • A.DLV_PROTECT: 2
    • A.DLV_RESP: 2
    • A.KEY_DEST: 3
    • A.SOFT_ARCHI: 2
    • A.USE_DIAG: 2
    • A.USE_PROD: 2
    • A.USE_SYS: 2
    • A.USE_TEST: 2
  • O:
    • O.CLON: 3
    • O.CRYPTO: 3
    • O.DESIGN: 1
    • O.DESIGN_ACS: 2
    • O.DEV_DIS: 4
    • O.DEV_TOOLS: 3
    • O.DIS_: 3
    • O.DIS_ME: 1
    • O.DIS_MECHANISM: 4
    • O.DIS_MEMORY: 3
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 2
    • O.DLV_RESP: 2
    • O.DSOFT: 1
    • O.DSOFT_ACS: 2
    • O.FLAW: 3
    • O.IC_DLV: 2
    • O.KEY_: 1
    • O.KEY_DEST: 3
    • O.MASK: 1
    • O.MASK_FAB: 2
    • O.MECH: 1
    • O.MECH_ACS: 2
    • O.MOD_: 2
    • O.MOD_MEMORY: 5
    • O.OPER: 1
    • O.OPERATE: 7
    • O.SOFT: 1
    • O.SOFT_ACS: 2
    • O.SOFT_DLV: 2
    • O.SOFT_MECH: 1
    • O.TA: 1
    • O.TAMPER: 3
    • O.TEST_OPERATE: 2
    • O.TI: 1
    • O.TI_ACS: 1
    • O.TOE_PRT: 3
    • O.USE_DIAG: 1
    • O.USE_SYS: 2
  • T:
    • T.CLON: 12
    • T.DIS_DEL: 5
    • T.DIS_DESIGN: 10
    • T.DIS_DSOFT: 8
    • T.DIS_INFO: 4
    • T.DIS_PHOTOMASK: 6
    • T.DIS_SOFT: 7
    • T.DIS_TEST: 5
    • T.DIS_TOOLS: 5
    • T.MOD_DEL: 5
    • T.MOD_DESIGN: 10
    • T.MOD_DSOFT: 9
    • T.MOD_PHOTOMASK: 5
    • T.MOD_SOFT: 10
    • T.T_DEL: 6
    • T.T_PHOTOMASK: 6
    • T.T_PRODUCT: 7
    • T.T_SAMPLE: 8
  • O:
    • O.C: 1
    • O.RND: 4
    • O.TOE-: 1
  • R:
    • R.O: 1
  • T:
    • T.RND: 3
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 6
  • Infineon:
    • Infineon Technologies: 1
  • NXP:
    • NXP: 1
  • Philips:
    • Philips: 1
  • STMicroelectronics:
    • STMicroelectronics: 26
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 13
  • AES_competition:
    • AES:
      • AES: 13
      • AES-128: 1
      • AES-192: 1
      • AES-256: 1
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 7
    • DES:
      • DES: 18
  • miscellaneous:
    • SM4:
      • SM4: 3
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 7
    • RNG: 6
  • TRNG:
    • TRNG: 3
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 8
  • ECB:
    • ECB: 7
pdf_data/st_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 1
    • Nescrypt: 4
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Physical Tampering: 1
    • physical tampering: 5
  • other:
    • reverse engineering: 1
  • FI:
    • Malfunction: 13
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 14
    • Physical Probing: 4
    • physical probing: 3
    • side channel: 2
  • other:
    • JIL: 53
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 2
pdf_data/st_keywords/standard_id
  • FIPS:
    • FIPS 186: 1
    • FIPS 46-2: 2
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 23
    • CCMB-2017-04-003: 2
  • FIPS:
    • FIPS PUB 197: 3
  • ISO:
    • ISO/IEC 14888: 2
    • ISO/IEC 7816-3: 1
    • ISO/IEC 9796: 1
    • ISO/IEC 9796-2: 1
  • NIST:
    • NIST SP 800-38A: 2
    • NIST SP 800-67: 3
    • SP 800-38A: 2
    • SP 800-67: 1
  • PKCS:
    • PKCS #1: 2
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. 10 To allow the: 1
    • out of scope: 1
  • OutOfScope:
    • The ST54L_SE is in the scope of this evaluation, while the ST54L_CLF is out of scope of this evaluation: 1
    • ES) is in User NVM. 46 Note: The ES is not part of the TOE and is out of scope of the evaluation: 1
    • Features Possible values NVM size 3.3 Mbytes, 2.5 Mbytes or 2 Mbytes MIFARE accelerator (out of scope) Active, Inactive SM3 accelerator (out of scope) Active, Inactive SM4 accelerator (out of scope: 1
    • Security IC Embedded Software (ES) is in User NVM. 46 Note: The ES is not part of the TOE and is out of scope of the evaluation. 1.6.3 TOE documentation 47 The user guidance documentation, part of the TOE: 1
    • out of scope: 5
    • out of scope) Active, Inactive SM3 accelerator (out of scope) Active, Inactive SM4 accelerator (out of scope: 1
    • to as the ST54L_SE). The ST54L_SE is in the scope of this evaluation, while the ST54L_CLF is out of scope of this evaluation. 19 Furthermore, the ST54L_SE features a MIFARE(a) Classic® cryptographic: 1
pdf_data/st_metadata
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  • /Author: Christiane DROULERS
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  • /Title: SMD_ST54L_VA02_1P.book
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  • pdf_hyperlinks: http://www.st.com
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