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Samsung S3CC9FB microcontroller
ANSSI-CC-2004/08
MTCOS Pro 2.2 EAC with PACE / P60D080PVC (BAC)
BSI-DSZ-CC-0893-2014
name Samsung S3CC9FB microcontroller MTCOS Pro 2.2 EAC with PACE / P60D080PVC (BAC)
scheme FR DE
not_valid_before 11.05.2004 14.04.2014
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_08.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0893a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_08.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0893b_pdf.pdf
manufacturer Samsung Electronics Co., Ltd. MaskTech International GmbH
manufacturer_web https://www.samsung.com https://www.masktech.de/
security_level ADV_IMP.2, EAL4+, ALC_DVS.2, AVA_VLA.4 ALC_DVS.2, EAL4+
dgst cb87424f533f753c 8175b9f5fa84e5b2
heuristics/cert_id ANSSI-CC-2004/08 BSI-DSZ-CC-0893-2014
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_PPC.1, ASE_DES.1, ASE_OBJ.1, ADV_LLD.1, ASE_SRE.1, ATE_COV.2, ADV_SPM.1, AVA_SOF.1, ASE_REQ.1, AVA_MSU.2, ALC_LCD.1, ATE_FUN.1, ASE_TSS.1, ASE_ENV.1, ATE_IND.2, ADV_HLD.2, ADV_RCR.1, ALC_DVS.2, ATE_DPT.1, ASE_INT.1, ALC_TAT.1, AGD_USR.1, AGD_ADM.1, ADV_IMP.2, AVA_VLA.4, ADV_FSP.2 ALC_FLR.3, ADV_ARC.1, ATE_FUN.2, ADV_TDS.6, ATE_IND.3, AGD_OPE.1, APE_REQ.2, ADV_FSP.6, ADV_SPM.1, AGD_PRE.1, ALC_DEL.1, APE_SPD.1, ASE_SPD.1, ALC_CMS.5, ASE_OBJ.2, ASE_REQ.2, APE_OBJ.2, AVA_VAN.5, ALC_LCD.2, APE_ECD.1, ALC_CMC.5, ATE_COV.3, ASE_CCL.1, ATE_DPT.4, ALC_DVS.2, APE_CCL.1, ADV_INT.3, ASE_ECD.1, ASE_INT.1, APE_INT.1, ASE_TSS.2, ADV_IMP.2, ALC_TAT.3
heuristics/extracted_versions - 2.2
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0892-V2-2015, BSI-DSZ-CC-0892-2014
heuristics/report_references/directly_referencing ANSSI-CC-2002/25 BSI-DSZ-CC-0892-2014, NSCIB-CC-12-36243-CR, BSI-DSZ-CC-0837-2013
heuristics/report_references/indirectly_referenced_by {} BSI-DSZ-CC-0893-2014, BSI-DSZ-CC-0892-2014, BSI-DSZ-CC-0892-V2-2015
heuristics/report_references/indirectly_referencing ANSSI-CC-2002/25 BSI-DSZ-CC-0893-2014, BSI-DSZ-CC-0892-2014, NSCIB-CC-12-36243-CR, BSI-DSZ-CC-0837-2013
heuristics/st_references/directly_referencing {} NSCIB-CC-12-36243-CR
heuristics/st_references/indirectly_referencing {} NSCIB-CC-12-36243-CR
heuristics/protection_profiles {} 60455fc9564e2545
maintenance_updates
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0055b.pdf
pdf_data/report_filename 2004_08.pdf 0893a_pdf.pdf
pdf_data/report_frontpage
  • FR:
  • DE:
  • FR:
  • DE:
    • cert_id: BSI-DSZ-CC-0893-2014
    • cert_item: MTCOS Pro 2.2 EAC with PACE / P60D080PVC (BAC
    • cert_lab: BSI
    • developer: MaskTech International GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • FR:
    • Rapport de certification 2002/25: 1
    • Rapport de certification 2004/08: 13
  • DE:
    • BSI-DSZ-CC-0837: 1
    • BSI-DSZ-CC-0837-2013: 3
    • BSI-DSZ-CC-0892-2014: 5
    • BSI-DSZ-CC-0893-2014: 23
    • BSI-DSZ-CC-S-0011-2012: 2
    • BSI-DSZ-CC-S-0015-2012: 2
    • BSI-DSZ-CC-S-0023-2013: 2
  • NL:
    • NSCIB-CC-12-36243: 3
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0055-2009: 6
    • BSI-CC-PP-0056-V2-2012: 1
    • BSI-CC-PP-0056-V2-2012-MA-02: 1
    • BSI-CC-PP-0068-V2-2011: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL3: 1
    • EAL4: 1
    • EAL4+: 1
    • EAL41: 1
    • EAL5: 1
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 et: 1
  • EAL:
    • EAL 4: 6
    • EAL 4 augmented: 3
    • EAL 5: 1
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 2
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_DEL.2: 2
    • ADO_IGS: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 3
    • ADV_INT: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 1
    • AGD_USR: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 3
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 1
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 1
    • ADV_INT.3: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_TDS.5: 1
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 2
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 2
    • ALC_CMS.5: 1
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 2
    • ALC_TAT.2: 1
    • ALC_TAT.3: 1
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 1
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 1
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 1
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 2
  • FCS:
    • FCS_CKM.1: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 2
    • FDP_IFF.1: 2
    • FDP_SDI.1: 2
  • FIA:
    • FIA_ATD.1: 2
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 2
  • FPT:
    • FPT_PHP.2: 2
    • FPT_PHP.3: 2
    • FPT_TST.1: 2
  • FCS:
    • FCS_CKM.1.1: 1
    • FCS_COP: 2
    • FCS_COP.1: 5
pdf_data/report_keywords/cc_claims
  • OE:
    • OE.MRTD: 2
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 10
  • NXP:
    • NXP: 13
    • NXP Semiconductors: 1
pdf_data/report_keywords/eval_facility
  • Serma:
    • SERMA: 3
  • BrightSight:
    • Brightsight: 2
  • SRC:
    • SRC Security Research & Consulting: 3
  • TUV:
    • TÜV Informationstechnik: 1
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 4
  • AES_competition:
    • AES:
      • AES: 2
      • AES-128: 2
      • AES-192: 1
      • AES-256: 1
  • DES:
    • 3DES:
      • 3DES: 3
      • Triple-DES: 3
    • DES:
      • DES: 5
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 1
    • SHA2:
      • SHA-2: 2
pdf_data/report_keywords/crypto_scheme
  • MAC:
    • MAC: 6
pdf_data/report_keywords/crypto_protocol
  • PACE:
    • PACE: 22
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 2
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 4
pdf_data/report_keywords/ecc_curve
  • Brainpool:
    • brainpoolP256r1: 2
    • brainpoolP512r1: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • fault injection: 1
  • SCA:
    • side channel: 1
  • other:
    • JIL: 3
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 25: 1
    • BSI 7125: 2
    • BSI 7148: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
  • ISO:
    • ISO/IEC 15408:1999: 1
  • BSI:
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 1
    • AIS 36: 3
  • FIPS:
    • FIPS 180-2: 1
    • FIPS 46-3: 1
    • FIPS PUB 180-2: 1
  • ICAO:
    • ICAO: 15
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • ETR) - MTCOS Pro 2.2 EAC with PACE / P60D080PVC (BAC), SRC Security Research & Consulting GmbH (confidential document) [11] MTCOS Pro 2.2 EAC with PACE / P60D080PVC (BAC), User Guidance, MaskTech International GmbH: 1
    • Pro 2.2 EAC with PACE / P60D080PVC (BAC), Version 0.4, 21.02.2014, MaskTech International GmbH (confidential document) [33] Machine Readable Travel Documents Technical Report, Supplemental Access Control for Machine: 1
    • of the Security Target MTCOS Pro 2.2 EAC with PACE / P60D080PVC (BAC), MaskTech International GmbH (confidential document) [7] Machine Readable Travel Document with "ICAO Application" Basic Access Control, Version 1.10: 1
pdf_data/report_metadata
  • /Author: DCSSI
  • /CreationDate: D:20040517150918+02'00'
  • /Creator: Acrobat PDFMaker 5.0 pour Word
  • /ModDate: D:20040517150925+03'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: Micro-circuit SAMSUNG S3CC9FB
  • /Title: Rapport de certification 2004/08
  • pdf_file_size_bytes: 657323
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 26
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20140416105452+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, MRTD, EAC, BAC, PACE, Reisepass, ePassport, Extended Access Control, MTCOS, MaskTech"
  • /ModDate: D:20140416105919+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0893-2014
  • pdf_file_size_bytes: 1099878
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, https://www.bsi.bund.de/, http://www.commoncriteriaportal.org/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 40
pdf_data/st_filename cible2004_08.pdf 0893b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0837: 2
    • BSI-DSZ-CC-0892: 1
    • BSI-DSZ-CC-0893: 2
    • BSI-DSZ-CC-S-0004-2010: 1
    • BSI-DSZ-CC-S-0011-2012: 1
    • BSI-DSZ-CC-S-0015-2012: 2
  • NL:
    • NSCIB-CC-12-36243: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0055: 1
    • BSI-CC-PP-0055: 3
    • BSI-CC-PP-0056: 2
    • BSI-PP-0035: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 2
    • EAL4 augmented: 1
  • EAL:
    • EAL4: 10
    • EAL4 augmented: 4
    • EAL6: 2
    • EAL6 augmented: 2
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 2
    • ACM_SCP: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_IGS: 2
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 1
    • ALC_FLR: 2
    • ALC_LCD: 2
    • ALC_TAT: 2
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_SOF: 2
    • AVA_VLA: 2
    • AVA_VLA.4: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 1
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 1
    • FDP_ACF.1: 2
    • FDP_IFC.1: 1
    • FDP_IFF.1: 2
    • FDP_SDI.1: 1
  • FIA:
    • FIA_ATD.1: 1
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 1
  • FPT:
    • FPT_PHP.2: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 2
pdf_data/st_keywords/cc_claims
  • A:
    • A.DEV_ORG: 1
    • A.DLV: 1
    • A.DLV_AUDIT: 1
    • A.DLV_PROTECT: 1
    • A.DLV_RESP: 1
    • A.KEY_DEST: 2
    • A.SOFT_ARCHI: 1
    • A.USE_DIAG: 1
    • A.USE_PROD: 1
    • A.USE_SYS: 1
    • A.USE_TEST: 1
  • O:
    • O.CLON: 1
    • O.CRYPTO: 2
    • O.DESIGN_ACS: 1
    • O.DEV_DIS: 1
    • O.DEV_TOOLS: 1
    • O.DIS_MECHANISM: 1
    • O.DIS_MEMORY: 1
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 1
    • O.DLV_RESP: 1
    • O.DSOFT_ACS: 1
    • O.FLAW: 1
    • O.IC_DLV: 1
    • O.KEY_DEST: 2
    • O.MASK_FAB: 1
    • O.MECH_ACS: 1
    • O.MOD_MEMORY: 1
    • O.OPERATE: 1
    • O.SOFT_ACS: 1
    • O.SOFT_DLV: 1
    • O.SOFT_MECH: 1
    • O.TAMPER: 1
    • O.TEST_OPERATE: 1
    • O.TOE_PRT: 1
    • O.USE_DIAG: 1
    • O.USE_SYS: 1
  • T:
    • T.CLON: 2
    • T.DIS_DEL: 2
    • T.DIS_DESIGN: 2
    • T.DIS_DSOFT: 2
    • T.DIS_INFO: 1
    • T.DIS_PHOTOMAS: 1
    • T.DIS_PHOTOMASK: 1
    • T.DIS_SOFT: 1
    • T.DIS_TEST: 1
    • T.DIS_TOOLS: 1
    • T.MOD_DEL: 2
    • T.MOD_DESIGN: 1
    • T.MOD_DSOFT: 1
    • T.MOD_PHOTOMA: 1
    • T.MOD_SOFT: 2
    • T.T_DEL: 2
    • T.T_PHOTOMASK: 2
    • T.T_PRODUCT: 2
    • T.T_SAMPLE: 2
  • A:
    • A.MRTD: 8
  • O:
    • O.AES: 1
    • O.COMPARE: 1
    • O.COPY: 1
    • O.CUST: 1
    • O.DES: 3
    • O.ECC: 3
    • O.ECDSA: 1
    • O.EEPROM: 3
    • O.FM: 1
    • O.HW: 4
    • O.INTEGRITY: 3
    • O.MEM: 3
    • O.REUSE: 1
    • O.RND: 1
    • O.RSA: 3
    • O.SFR: 3
    • O.SHA: 1
  • OE:
    • OE.MRTD: 5
  • OT:
    • OT.AC: 9
  • T:
    • T.RND: 1
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
  • NXP:
    • NXP: 4
    • NXP Semiconductors: 2
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 6
  • AES_competition:
    • AES:
      • AES: 12
  • DES:
    • 3DES:
      • 3DES: 1
      • Triple-DES: 16
    • DES:
      • DES: 28
  • constructions:
    • MAC:
      • KMAC: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 19
    • ECDH:
      • ECDH: 1
    • ECDSA:
      • ECDSA: 6
  • FF:
    • DH:
      • Diffie-Hellman: 3
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 7
    • SHA2:
      • SHA-2: 1
      • SHA-224: 3
      • SHA-256: 3
      • SHA-384: 2
      • SHA-512: 2
pdf_data/st_keywords/crypto_scheme
  • KEX:
    • Key Exchange: 3
  • MAC:
    • MAC: 18
pdf_data/st_keywords/crypto_protocol
  • PACE:
    • PACE: 5
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 20
    • RNG: 17
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 3
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • physical tampering: 6
  • other:
    • reverse engineering: 1
  • FI:
    • Malfunction: 24
    • Physical Tampering: 7
    • Physical tampering: 1
    • fault injection: 1
    • malfunction: 6
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 5
  • other:
    • reverse engineering: 1
pdf_data/st_keywords/tee_name
  • IBM:
    • SSC: 1
pdf_data/st_keywords/ic_data_group
  • EF:
    • EF.COM: 8
    • EF.DG1: 30
    • EF.DG13: 4
    • EF.DG14: 2
    • EF.DG15: 2
    • EF.DG16: 28
    • EF.DG2: 10
    • EF.DG3: 8
    • EF.DG4: 7
    • EF.DG5: 8
    • EF.SOD: 8
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2005-08-001: 1
    • CCMB-2012-09-001: 2
    • CCMB-2012-09-002: 2
    • CCMB-2012-09-003: 2
    • CCMB-2012-09-004: 2
  • FIPS:
    • FIPS 140-2: 1
    • FIPS 180-2: 2
    • FIPS 46-3: 2
    • FIPS PUB 140-2: 1
    • FIPS PUB 180-2: 1
    • FIPS PUB 46-3: 1
  • ICAO:
    • ICAO: 22
  • ISO:
    • ISO/IEC 14443: 6
    • ISO/IEC 15946-3: 1
    • ISO/IEC 7816: 4
    • ISO/IEC 7816-2: 1
    • ISO/IEC 7816-4: 1
    • ISO/IEC 7816:2008: 1
    • ISO/IEC 9797:1999: 1
  • RFC:
    • RFC3369: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. The TOE submitted to the: 1
    • out of scope: 1
pdf_data/st_metadata
  • /CreationDate: D:20040716152549Z
  • /ModDate: D:20041001095815+03'00'
  • /Producer: Acrobat Distiller 4.0 for Windows
  • pdf_file_size_bytes: 219561
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 31
  • /Author: MaskTech International GmbH
  • /CreationDate: D:20140221150005Z
  • /Creator: TeX output 2014.02.21:1459
  • /Keywords: Common Criteria, CC, Machine Readable Travel Document, MRTD, Basic Access Control, BAC, ePass, MTCOS, EAL 4+
  • /ModDate: D:20140221150706+01'00'
  • /Producer: dvipdfm 0.13.2c, Copyright © 1998, by Mark A. Wicks
  • /Subject: Common Criteria Certification
  • /Title: MTCOS Pro 2.2 ICAO - EAC with PACE / P60D080PVC (BAC) - Security Target lite
  • pdf_file_size_bytes: 476131
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 79
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