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	Samsung S3CC9FB microcontroller ANSSI-CC-2004/08	ID-One eIDL v1.0 en configuration EAC avec BAP et AA masqué sur les composants P60x144PVA/PVE ANSSI-CC-2016/51
name	Samsung S3CC9FB microcontroller	ID-One eIDL v1.0 en configuration EAC avec BAP et AA masqué sur les composants P60x144PVA/PVE
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	FR	FR
status	archived	archived
not_valid_after	01.09.2019	13.07.2021
not_valid_before	11.05.2004	13.07.2016
cert_link	None	None
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_08.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-En_2016_51en.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_08.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/anssi_cible_2016_51_LITE.pdf
manufacturer	Samsung Electronics Co., Ltd.	Oberthur Technologies
manufacturer_web	https://www.samsung.com	https://www.oberthur.com/
security_level	ADV_IMP.2, EAL4+, ALC_DVS.2, AVA_VLA.4	EAL5+, ALC_DVS.2, AVA_VAN.5
dgst	cb87424f533f753c	3bff9751dc502428
heuristics/cert_id	ANSSI-CC-2004/08	ANSSI-CC-2016/51
heuristics/cert_lab	[]	CEA
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_PPC.1, ASE_DES.1, ASE_OBJ.1, ADV_LLD.1, ASE_SRE.1, ATE_COV.2, ADV_SPM.1, AVA_SOF.1, ASE_REQ.1, AVA_MSU.2, ALC_LCD.1, ATE_FUN.1, ASE_TSS.1, ASE_ENV.1, ATE_IND.2, ADV_HLD.2, ADV_RCR.1, ALC_DVS.2, ATE_DPT.1, ASE_INT.1, ALC_TAT.1, AGD_USR.1, AGD_ADM.1, ADV_IMP.2, AVA_VLA.4, ADV_FSP.2	ADV_TDS.4, ADV_INT.2, ASE_TSS.2, ATE_DPT.3, ALC_CMS.5, ALC_TAT.2, ALC_FLR.1, ALC_DVS.2, AVA_VAN.5, ADV_FSP.5
heuristics/extracted_versions	-	1.0
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	ANSSI-CC-2002/25	BSI-DSZ-CC-0978-2016
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	ANSSI-CC-2002/25	BSI-DSZ-CC-0978-2016
heuristics/scheme_data
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	BSI-DSZ-CC-0978-2016
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	BSI-DSZ-CC-0978-2016
heuristics/protection_profiles	{}	{}
maintenance_updates		maintenance_date: 03.04.2017 maintenance_report_link: https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-2016-51-M01.pdf maintenance_st_link: None maintenance_title: ANSSI-CC-2016/51-M01
protection_profiles
protection_profile_links	{}	{}
pdf_data/cert_filename	None	None
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
pdf_data/cert_keywords/cc_sar
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
pdf_data/report_filename	2004_08.pdf	ANSSI-CC-En_2016_51en.pdf
pdf_data/report_frontpage	FR:	FR: cc_security_level: EAL 5 augmented ALC_DVS.2, AVA_VAN.5 cc_version: Common Criteria version 3.1 revision 4 cert_id: ANSSI-CC-2016/51 cert_item: ID-One eIDL v1.0 in EAC configuration with BAP and AA on P60x144PVA/PVE components cert_item_version: SAAAAR 080031 : ePass V3 Full EACv2 on NXP SAAAAR 082456 : Code r6.0 Generic SAAAAR 082844 : Optional Code r4.0 Digital Blurred Image cert_lab: CEA - LETI 17 rue des martyrs, 38054 Grenoble Cedex 9, France developer: Oberthur Technologies 420 rue d'Estienne d'Orves CS 40008 92705 Colombes, France NXP Semiconductors Box 54 02 40, D-22502 Hamburg, Allemagne Sponsor Oberthur Technologies 420 rue d'Estienne d'Orves CS 40008 92705 Colombes, France match_rules: ['Certification report reference(.+)Product name(.+)Product reference(.+)Protection profile conformity(.+)Evaluation criteria and version(.+)Evaluation level(.+)Developers(.+)Evaluation facility(.+)Recognition arrangements'] ref_protection_profiles: None
pdf_data/report_keywords/cc_cert_id	FR: Rapport de certification 2002/25: 1 Rapport de certification 2004/08: 13	DE: BSI-DSZ-CC-0978-2016: 3 FR: ANSSI-CC-2016/51: 17
pdf_data/report_keywords/cc_protection_profile_id		BSI: BSI-PP- 0035-2007: 1 BSI-PP-0035-2007: 2
pdf_data/report_keywords/cc_security_level	EAL: EAL1: 1 EAL3: 1 EAL4: 1 EAL4+: 1 EAL41: 1 EAL5: 1 EAL7: 2 ITSEC: ITSEC E6 et: 1	EAL: EAL 1: 1 EAL 3: 1 EAL 5: 2 EAL 5 augmented: 1 EAL 7: 1 EAL2: 2 EAL5: 1 EAL5 augmented: 1 EAL6: 1 EAL7: 1 ITSEC: ITSEC E6 High: 1
pdf_data/report_keywords/cc_sar	ACM: ACM_AUT: 1 ACM_AUT.1: 2 ACM_CAP: 1 ACM_CAP.4: 2 ACM_SCP: 1 ACM_SCP.2: 1 ADO: ADO_DEL: 1 ADO_DEL.2: 2 ADO_IGS: 1 ADO_IGS.1: 1 ADV: ADV_FSP: 1 ADV_FSP.2: 1 ADV_HLD: 1 ADV_HLD.2: 1 ADV_IMP: 1 ADV_IMP.2: 3 ADV_INT: 1 ADV_LLD: 1 ADV_LLD.1: 1 ADV_RCR: 1 ADV_RCR.1: 1 ADV_SPM: 1 ADV_SPM.1: 1 AGD: AGD_ADM: 1 AGD_ADM.1: 1 AGD_USR: 1 AGD_USR.1: 1 ALC: ALC_DVS: 1 ALC_DVS.2: 4 ALC_FLR: 2 ALC_LCD.1: 1 ALC_TAT: 1 ALC_TAT.1: 1 ASE: ASE_DES.1: 1 ASE_ENV.1: 1 ASE_INT.1: 1 ASE_OBJ.1: 1 ASE_PPC.1: 1 ASE_REQ.1: 1 ASE_SRE.1: 1 ASE_TSS.1: 1 ATE: ATE_COV: 1 ATE_COV.2: 1 ATE_DPT: 1 ATE_DPT.1: 1 ATE_FUN: 1 ATE_FUN.1: 1 ATE_IND: 1 ATE_IND.2: 1 AVA: AVA_CCA: 1 AVA_MSU: 1 AVA_MSU.2: 1 AVA_SOF: 1 AVA_SOF.1: 1 AVA_VLA: 1 AVA_VLA.4: 3	ADV: ADV_ARC: 1 ADV_FSP: 1 ADV_IMP: 1 ADV_INT: 1 ADV_SPM: 1 ADV_TDS: 1 AGD: AGD_OPE: 2 AGD_PRE: 4 ALC: ALC_CMC: 1 ALC_CMS: 1 ALC_DEL: 1 ALC_DVS: 1 ALC_DVS.2: 2 ALC_FLR: 2 ALC_FLR.1: 1 ALC_TAT: 1 ASE: ASE_CCL: 1 ASE_ECD: 1 ASE_INT: 1 ASE_OBJ: 1 ASE_REQ: 1 ASE_SPD: 1 ASE_TSS: 1 ASE_TSS.2: 1 ATE: ATE_COV: 1 ATE_DPT: 1 ATE_FUN: 1 ATE_IND: 1 AVA: AVA_VAN: 2 AVA_VAN.5: 4
pdf_data/report_keywords/cc_sfr	FAU: FAU_SAA.1: 2 FCS: FCS_CKM.1: 2 FCS_COP.1: 2 FDP: FDP_ACC.2: 2 FDP_ACF.1: 2 FDP_IFC.1: 2 FDP_IFF.1: 2 FDP_SDI.1: 2 FIA: FIA_ATD.1: 2 FIA_UAU.2: 2 FIA_UID.2: 2 FMT: FMT_MOF.1: 2 FMT_MSA.1: 2 FMT_MSA.3: 2 FMT_SMR.1: 2 FPR: FPR_UNO.1: 2 FPT: FPT_PHP.2: 2 FPT_PHP.3: 2 FPT_TST.1: 2
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor	Samsung: Samsung: 10	NXP: NXP: 7 NXP Semiconductors: 2 Oberthur: OBERTHUR: 4 Oberthur Technologies: 8
pdf_data/report_keywords/eval_facility	Serma: SERMA: 3	CEA-LETI: CEA - LETI: 1 CESTI: CESTI: 1
pdf_data/report_keywords/symmetric_crypto	DES: DES: DES: 4
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol		PACE: PACE: 2
pdf_data/report_keywords/randomness
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	CC: CCIMB-99-031: 1 CCIMB-99-032: 1 CCIMB-99-033: 1 ISO: ISO/IEC 15408:1999: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: DCSSI /CreationDate: D:20040517150918+02'00' /Creator: Acrobat PDFMaker 5.0 pour Word /ModDate: D:20040517150925+03'00' /Producer: Acrobat Distiller 5.0 (Windows) /Subject: Micro-circuit SAMSUNG S3CC9FB /Title: Rapport de certification 2004/08 pdf_file_size_bytes: 657323 pdf_hyperlinks: {} pdf_is_encrypted: True pdf_number_of_pages: 26	/Author: /CreationDate: /Creator: PDFCreator Version 1.2.1 /Keywords: /ModDate: /Producer: GPL Ghostscript 9.02 /Subject: /Title: ANSSI-CC-En_2016_51en pdf_file_size_bytes: 200004 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 16
pdf_data/st_filename	cible2004_08.pdf	anssi_cible_2016_51_LITE.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id		DE: BSI-DSZ-CC-0978-2016: 1 FR: ANSSi-CC-PP-2009/02: 1
pdf_data/st_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-056: 1 BSI-PP-0035: 1 BSI-PP-0056: 2
pdf_data/st_keywords/cc_security_level	EAL: EAL 4: 1 EAL 4 augmented: 1 EAL4: 2 EAL4 augmented: 1	EAL: EAL 5: 1 EAL 6: 1 EAL4: 2 EAL5: 9 EAL5 augmented: 3
pdf_data/st_keywords/cc_sar	ACM: ACM_AUT: 2 ACM_CAP: 2 ACM_SCP: 2 ADO: ADO_DEL: 2 ADO_IGS: 2 ADV: ADV_FSP: 2 ADV_HLD: 2 ADV_IMP: 2 ADV_IMP.2: 1 ADV_LLD: 2 ADV_RCR: 2 ADV_SPM: 2 AGD: AGD_ADM: 2 AGD_USR: 2 ALC: ALC_DVS: 2 ALC_DVS.2: 1 ALC_FLR: 2 ALC_LCD: 2 ALC_TAT: 2 ATE: ATE_COV: 2 ATE_DPT: 2 ATE_FUN: 2 ATE_IND: 1 AVA: AVA_MSU: 2 AVA_SOF: 2 AVA_VLA: 2 AVA_VLA.4: 1	ADV: ADV_FSP.5: 2 ADV_INT.2: 2 ADV_TDS.4: 2 AGD: AGD_OPE: 1 AGD_PRE: 3 ALC: ALC_CMS.5: 2 ALC_DVS.2: 11 ALC_FLR.1: 1 ALC_TAT.2: 2 ATE: ATE_DPT.3: 2 AVA: AVA_VAN.5: 8
pdf_data/st_keywords/cc_sfr	FAU: FAU_SAA.1: 1 FCS: FCS_CKM.1: 2 FCS_CKM.4: 2 FCS_COP.1: 2 FDP: FDP_ACC.2: 1 FDP_ACF.1: 2 FDP_IFC.1: 1 FDP_IFF.1: 2 FDP_SDI.1: 1 FIA: FIA_ATD.1: 1 FIA_UAU.2: 2 FIA_UID.2: 2 FMT: FMT_MOF.1: 2 FMT_MSA.1: 2 FMT_MSA.3: 2 FMT_SMR.1: 2 FPR: FPR_UNO.1: 1 FPT: FPT_PHP.2: 1 FPT_PHP.3: 1 FPT_TST.1: 2	FAU: FAU_SAS: 4 FAU_SAS.1: 6 FAU_SAS.1.1: 1 FAU_STG: 3 FAU_STG.2: 3 FCS: FCS_CKM: 19 FCS_CKM.1: 8 FCS_CKM.1.1: 1 FCS_CKM.4: 2 FCS_COP: 55 FCS_COP.1: 27 FCS_RND: 4 FCS_RND.1: 6 FCS_RND.1.1: 1 FDP: FDP_ACC: 5 FDP_ACC.1: 2 FDP_ACC.2: 2 FDP_ACF: 5 FDP_ACF.1: 9 FDP_DAU: 3 FDP_DAU.1: 2 FDP_ITC: 7 FDP_ITC.1: 6 FDP_UCT: 6 FDP_UCT.1: 4 FDP_UIT: 10 FDP_UIT.1: 9 FIA: FIA_AFL: 4 FIA_AFL.1: 2 FIA_API: 4 FIA_API.1: 6 FIA_API.1.1: 1 FIA_UAU: 26 FIA_UAU.1: 5 FIA_UAU.4: 4 FIA_UAU.5: 11 FIA_UAU.6: 2 FIA_UID: 6 FIA_UID.1: 5 FMT: FMT_LIM: 12 FMT_LIM.1: 13 FMT_LIM.1.1: 1 FMT_LIM.2: 13 FMT_LIM.2.1: 1 FMT_MOF: 3 FMT_MOF.1: 1 FMT_MTD: 47 FMT_MTD.1: 16 FMT_MTD.3: 2 FMT_SMF: 2 FMT_SMF.1: 2 FMT_SMR: 7 FMT_SMR.1: 7 FPT: FPT_EMS: 12 FPT_EMS.1: 15 FPT_EMS.1.1: 1 FPT_EMS.1.2: 1 FPT_FLS: 2 FPT_FLS.1: 2 FPT_PHP: 2 FPT_PHP.3: 2 FPT_TST: 6 FPT_TST.1: 14 FTP: FTP_ITC: 7 FTP_ITC.1: 6
pdf_data/st_keywords/cc_claims	A: A.DEV_ORG: 1 A.DLV: 1 A.DLV_AUDIT: 1 A.DLV_PROTECT: 1 A.DLV_RESP: 1 A.KEY_DEST: 2 A.SOFT_ARCHI: 1 A.USE_DIAG: 1 A.USE_PROD: 1 A.USE_SYS: 1 A.USE_TEST: 1 O: O.CLON: 1 O.CRYPTO: 2 O.DESIGN_ACS: 1 O.DEV_DIS: 1 O.DEV_TOOLS: 1 O.DIS_MECHANISM: 1 O.DIS_MEMORY: 1 O.DLV_AUDIT: 1 O.DLV_PROTECT: 1 O.DLV_RESP: 1 O.DSOFT_ACS: 1 O.FLAW: 1 O.IC_DLV: 1 O.KEY_DEST: 2 O.MASK_FAB: 1 O.MECH_ACS: 1 O.MOD_MEMORY: 1 O.OPERATE: 1 O.SOFT_ACS: 1 O.SOFT_DLV: 1 O.SOFT_MECH: 1 O.TAMPER: 1 O.TEST_OPERATE: 1 O.TOE_PRT: 1 O.USE_DIAG: 1 O.USE_SYS: 1 T: T.CLON: 2 T.DIS_DEL: 2 T.DIS_DESIGN: 2 T.DIS_DSOFT: 2 T.DIS_INFO: 1 T.DIS_PHOTOMAS: 1 T.DIS_PHOTOMASK: 1 T.DIS_SOFT: 1 T.DIS_TEST: 1 T.DIS_TOOLS: 1 T.MOD_DEL: 2 T.MOD_DESIGN: 1 T.MOD_DSOFT: 1 T.MOD_PHOTOMA: 1 T.MOD_SOFT: 2 T.T_DEL: 2 T.T_PHOTOMASK: 2 T.T_PRODUCT: 2 T.T_SAMPLE: 2	OE: OE.BAC-PP: 2 OE.MRD_: 2
pdf_data/st_keywords/vendor	Samsung: Samsung: 1	NXP: NXP: 108 NXP Semiconductors: 6 Oberthur: Oberthur: 1 Oberthur Technologies: 106
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	DES: DES: DES: 6	AES_competition: AES: AES: 22 DES: 3DES: 3DES: 14 DES: DES: 6 constructions: MAC: CMAC: 2
pdf_data/st_keywords/asymmetric_crypto		ECC: ECC: ECC: 5 ECDH: ECDH: 3 ECDSA: ECDSA: 2 FF: DH: DH: 2 Diffie-Hellman: 5
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function		SHA: SHA1: SHA1: 8 SHA2: SHA-224: 2 SHA-256: 1 SHA-384: 1 SHA-512: 1 SHA224: 1 SHA256: 4 SHA384: 1 SHA512: 1
pdf_data/st_keywords/crypto_scheme		MAC: MAC: 8
pdf_data/st_keywords/crypto_protocol		PACE: PACE: 16
pdf_data/st_keywords/randomness
pdf_data/st_keywords/cipher_mode		CBC: CBC: 5 ECB: ECB: 1
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: physical tampering: 6 other: reverse engineering: 1	FI: DFA: 1 Malfunction: 3 Physical tampering: 1 fault injection: 1 malfunction: 3 physical tampering: 1 SCA: DPA: 1 physical probing: 3 other: reverse engineering: 1
pdf_data/st_keywords/technical_report_id		BSI: BSI 2006: 1
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group		EF: EF.COM: 12 EF.DG1: 15 EF.DG13: 5 EF.DG14: 3 EF.DG16: 1 EF.DG24: 14 EF.DG5: 2 EF.DG6: 5 EF.DG7: 12 EF.DG8: 12 EF.DG9: 2 EF.SOD: 10
pdf_data/st_keywords/standard_id		BSI: AIS 31: 1 AIS31: 1 CC: CCMB-2012-09-001: 1 CCMB-2012-09-002: 1 CCMB-2012-09-003: 1 FIPS: FIPS 197: 1 FIPS 46-3: 1 ICAO: ICAO: 12 ISO: ISO/IEC 11770-2: 2 ISO/IEC 15946: 2 ISO/IEC 15946-1: 1 ISO/IEC 15946-2: 1 ISO/IEC 7816-4: 1 ISO/IEC 7816-9: 1 NIST: NIST SP 800-90: 1 PKCS: PKCS#1: 1 PKCS#3: 2 RFC: RFC 3447: 1 SCP: SCP02: 2 SCP03: 2
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process	OutOfScope: Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1 a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. The TOE submitted to the: 1 out of scope: 1
pdf_data/st_metadata	/CreationDate: D:20040716152549Z /ModDate: D:20041001095815+03'00' /Producer: Acrobat Distiller 4.0 for Windows pdf_file_size_bytes: 219561 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 31	/Author: michetho /CreationDate: D:20160706150901+02'00' /Creator: Microsoft® Office Word 2007 /ModDate: D:20160706150901+02'00' /Producer: Microsoft® Office Word 2007 /Subject: <Document name> /Title: ID-One eIDL v1.0 in EAC configuration with BAP AA on NXP P60x144 PVA/PVE - Public Security Target pdf_file_size_bytes: 2042833 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 97
state/cert/convert_garbage	False	False
state/cert/convert_ok	False	False
state/cert/download_ok	False	False
state/cert/extract_ok	False	False
state/cert/pdf_hash	Equal	Equal
state/cert/txt_hash	Equal	Equal
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different