Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
Thinklogical TLX1280
SERTIT-119
S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
BSI-DSZ-CC-0452-2007
name Thinklogical TLX1280 S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme NO DE
not_valid_after 12.12.2024 01.09.2019
not_valid_before 12.12.2019 10.09.2007
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-119%20C%20v%201.0.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-119%20TLX1280%20Matrix%20Switch%20CR%20v%201.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0452a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ThinklogicalSecurityTarget_1_4_TLX1280.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0452b.pdf
manufacturer Thinklogical Samsung Electronics Co., Ltd.
manufacturer_web https://www.thinklogical.com/ https://www.samsung.com
security_level EAL4 ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2
dgst b1cd1ea7547c6661 4cb552bf7281a5e3
heuristics/cert_id SERTIT-119 BSI-DSZ-CC-0452-2007
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AVA_VAN.3, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 ATE_COV.2, ADV_RCR.1, ALC_TAT.1, ADV_FSP.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, AVA_SOF.1, ADV_SPM.1, AVA_MSU.3
heuristics/extracted_versions - 16, 2
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0501-2008
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0438-2007
heuristics/report_references/indirectly_referenced_by {} KECS-ISIS-0378-2012, KECS-ISIS-0222-2010, BSI-DSZ-CC-0501-2008, ANSSI-CC-2012/09, BSI-DSZ-CC-0624-2010
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0400-2007, BSI-DSZ-CC-0438-2007
pdf_data/cert_filename SERTIT-119 C v 1.0.pdf
pdf_data/cert_keywords/cc_cert_id
  • NO:
    • SERTIT-119: 2
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 2
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • Norconsult:
    • Norconsult AS: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • pdf_file_size_bytes: 905575
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename SERTIT-119 TLX1280 Matrix Switch CR v 1.0.pdf 0452a.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0452-2007
    • cert_item: S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
    • cert_lab: BSI
    • developer: Samsung Electronics Co., Ltd. Certification Report V1.0 ZS-01-01-F-326 V4.0 BSI -
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • NO:
    • SERTIT-119: 18
  • DE:
    • BSI-DSZ-CC-0438-2007: 4
    • BSI-DSZ-CC-0452-2007: 21
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 7
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 22
    • EAL1: 1
    • EAL4: 1
    • EAL7: 1
  • EAL:
    • EAL 1: 1
    • EAL 4: 10
    • EAL 4 augmented: 2
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 6
    • EAL4 augmented: 1
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_FLR: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.3: 1
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 3
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/cc_sfr
  • FDP:
    • FDP_ETC.1: 1
    • FDP_IFC.1: 1
    • FDP_IFF.1: 1
    • FDP_ITC.1: 1
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon Technologies AG: 1
  • Philips:
    • Philips: 1
  • Samsung:
    • Samsung: 16
pdf_data/report_keywords/eval_facility
  • Norconsult:
    • Norconsult AS: 1
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • Triple-DES: 2
    • DES:
      • DES: 5
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 2
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 3
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • physical probing: 1
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2017-04-004: 1
  • ISO:
    • ISO/IEC 15408: 8
  • BSI:
    • AIS 20: 4
    • AIS 25: 2
    • AIS 26: 3
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 2
    • AIS 36: 2
    • AIS 38: 1
    • AIS20: 3
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 16-Bit RISC Microcontroller for Smart Card, Version 2, ETR Version 2, 28. August 2007, TÜViT (confidential document) [9] Protection Profile BSI-PP-0002-2001, Smart card IC Platform Protection Profile, Version 1.0: 1
    • 16-Bit RISC Microcontroller for Smart Card, Version 2, ETR-Lite Version 2, 28. August 2007, TÜViT (confidential document) [11] Configuration Management Documentation (Class ACM_AUT/CAP/SCP) – Project Cheyenne Version 1.1: 1
    • 2007-07-23 (confidential document) [12] User’s manual S3CC9GC/GW/LC 16-Bit CMOS Microcontroller for Smart Card, Version 5, 2007-06-05: 1
    • S3CC9LC 16-bit RISC Microcontroller for Smart Cards – Project Cheyenne, Version 1.0, 21 March 2007 (confidential document) [7] Security Target Lite of S3CC9LC 16-bit RISC Microcontroller for Smart Cards Version 1.0, 9th: 1
pdf_data/report_metadata
  • /CreationDate: D:20200108131915+01'00'
  • /ModDate: D:20200108131915+01'00'
  • pdf_file_size_bytes: 594921
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 18
  • /Author: BSI
  • /Company: BSI, Postfach 200363, 53133 Bonn
  • /CreationDate: D:20070924150656+02'00'
  • /Creator: Acrobat PDFMaker 8.1 für Word
  • /Keywords: Common Criteria, Certification, Zertifizierung, Samsung Electronics Co., Ltd, S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
  • /ModDate: D:20070924152012+02'00'
  • /Producer: Acrobat Distiller 8.1.0 (Windows)
  • /SourceModified: D:20070924114800
  • /Title: Certification Report BSI-DSZ-CC-0452-2007
  • pdf_file_size_bytes: 295256
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 38
pdf_data/st_filename ThinklogicalSecurityTarget_1_4_TLX1280.pdf 0452b.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002: 8
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL4: 6
  • EAL:
    • EAL 4: 1
    • EAL4: 10
    • EAL4 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 2
    • ADV_FSP.4: 2
    • ADV_IMP.1: 2
    • ADV_TDS.3: 2
  • AGD:
    • AGD_OPE.1: 2
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 2
    • ALC_CMS.4: 2
    • ALC_DEL.1: 2
    • ALC_DVS.1: 2
    • ALC_LCD.1: 2
    • ALC_TAT.1: 2
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.1: 2
    • ATE_FUN.1: 2
    • ATE_IND.2: 2
  • AVA:
    • AVA_VAN.3: 2
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 3
    • ADV_HLD: 1
    • ADV_HLD.1: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_IMP.2: 5
    • ADV_LLD: 1
    • ADV_LLD.1: 3
    • ADV_RCR: 1
    • ADV_RCR.1: 2
    • ADV_SPM: 1
    • ADV_SPM.1: 5
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 4
    • AGD_USR: 2
    • AGD_USR.1: 4
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 2
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_MSU.3: 6
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 7
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_ETC.1: 7
    • FDP_ETC.1.1: 1
    • FDP_ETC.1.2: 1
    • FDP_IFC.1: 7
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 7
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.2: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
    • FDP_ITC.1: 7
    • FDP_ITC.1.1: 1
    • FDP_ITC.1.2: 1
    • FDP_ITC.1.3: 1
  • FMT:
    • FMT_MSA.3: 3
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 1
    • FAU_SAS: 3
    • FAU_SAS.1: 8
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 29
    • FCS_CKM.1.1: 3
    • FCS_CKM.2: 4
    • FCS_CKM.4: 19
    • FCS_CKM.4.1: 2
    • FCS_COP: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RND: 2
    • FCS_RND.1: 8
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 21
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 12
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_CKM.2: 1
    • FDP_IFC: 2
    • FDP_IFC.1: 22
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 15
    • FDP_ITC.1.1: 2
    • FDP_ITC.1.2: 2
    • FDP_ITC.1.3: 2
    • FDP_ITC.2: 17
    • FDP_ITC.2.1: 2
    • FDP_ITC.2.2: 2
    • FDP_ITC.2.3: 2
    • FDP_ITC.2.4: 2
    • FDP_ITC.2.5: 2
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 2
  • FMT:
    • FMT_LIM: 4
    • FMT_LIM.1: 14
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 1
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 21
    • FMT_MSA.2.1: 2
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS: 1
    • FPT_FLS.1: 22
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 2
    • FPT_PHP.3: 18
    • FPT_PHP.3.1: 1
    • FPT_SEP: 2
    • FPT_SEP.1: 10
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
    • FPT_TDC.1: 2
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 18
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • A:
    • A.ACCESS: 1
    • A.EMISSION: 2
    • A.MANAGE: 2
    • A.NOEVIL: 2
    • A.PHYSICAL: 2
    • A.SCENARIO: 2
  • O:
    • O.CONF: 7
    • O.CONNECT: 3
    • O.CRYPTOGRAPHY: 1
  • OE:
    • OE.EMISSION: 2
    • OE.INSTAL: 1
    • OE.MANAGE: 4
    • OE.NOEVIL: 2
    • OE.PHYSICAL: 2
    • OE.SCENARIO: 2
  • T:
    • T.ATTACK: 3
    • T.COMINT: 1
    • T.INSTALL: 3
    • T.RESIDUAL: 3
    • T.STATE: 3
  • O:
    • O.RND: 5
  • T:
    • T.RND: 4
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 13
      • T-DES: 1
      • Triple-DES: 1
    • DES:
      • DES: 12
  • miscellaneous:
    • SEED:
      • SEED: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 10
    • RNG: 3
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 8
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • Malfunction: 24
    • malfunction: 12
    • physical tampering: 2
  • SCA:
    • DPA: 5
    • Leak-Inherent: 20
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 3
    • physical probing: 6
    • side-channel: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 3
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 20: 2
    • AIS20: 3
  • FIPS:
    • FIPS PUB 46-3: 2
  • ISO:
    • ISO/IEC 15408-2005: 1
    • ISO/IEC 9796-1: 3
pdf_data/st_metadata
  • /Author: cjb
  • /CreationDate: D:20191024183130-04'00'
  • /ModDate: D:20191024183130-04'00'
  • /Producer: Bullzip PDF Printer / www.bullzip.com / Freeware Edition
  • /Title: Microsoft Word - ThinklogicalSecurityTarget_1_4_TLX1280.doc
  • pdf_file_size_bytes: 1275391
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 22
  • /Author: bryant
  • /CreationDate: D:20070809135307+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /ModDate: D:20070809135307+09'00'
  • /Producer: Acrobat Distiller 6.0.1 (Windows)
  • /Title: Microsoft Word - ST Lite C9LC v1.0.doc
  • pdf_file_size_bytes: 530227
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 61
state/cert/convert_garbage True False
state/cert/convert_ok True False
state/cert/download_ok True False
state/cert/extract_ok True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different