This page was not yet optimized for use on mobile devices.

Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.

	Samsung S3CC9PB microcontroller (reference S3CC9PBX01) ANSSI-CC-2002/25	Samsung SP of S3B512C revision 3 2021-23-INF-4038
name	Samsung S3CC9PB microcontroller (reference S3CC9PBX01)	Samsung SP of S3B512C revision 3
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	FR	ES
status	archived	active
not_valid_after	01.09.2019	08.04.2028
not_valid_before	01.01.2002	08.04.2023
cert_link		https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23_Certificado.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2002_25.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20INF-4038.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2002_25.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20ST_Lite.pdf
manufacturer	Samsung Electronics Co., Ltd.	Samsung Electronics Co., Ltd.
manufacturer_web	https://www.samsung.com	https://www.samsung.com
security_level	EAL4+, AVA_VLA.4, ADV_IMP.2, ALC_DVS.2	EAL2
dgst	9aa2895387590839	95f760528ffedd31
heuristics/cert_id	ANSSI-CC-2002/25	2021-23-INF-4038
heuristics/cert_lab	[]	[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ADV_LLD.1, AVA_MSU.2, ALC_LCD.1, ALC_TAT.1, ADV_FSP.2, ALC_DVS.2, ADV_IMP.2, AGD_ADM.1, ATE_IND.2, AVA_VLA.4, ADV_RCR.1, ATE_DPT.1, AVA_SOF.1, ADV_HLD.2, AGD_USR.1, ATE_COV.2, ATE_FUN.1, ADV_SPM.1	ASE_CCL.1, ATE_FUN.1, ASE_OBJ.2, ALC_CMS.2, ASE_INT.1, ASE_REQ.2, AGD_PRE.1, ATE_IND.2, ASE_ECD.1, AVA_VAN.2, ADV_TDS.1, ASE_SPD.1, ALC_CMC.2, ADV_FSP.2, ATE_COV.1, AGD_OPE.1, ALC_DEL.1, ASE_TSS.1, ADV_ARC.1
heuristics/extracted_versions	-	3
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	ANSSI-CC-2004/06, ANSSI-CC-2004/08, ANSSI-CC-2004/07	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	ANSSI-CC-2004/06, ANSSI-CC-2004/08, ANSSI-CC-2004/07	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data		category: Biometric Devices certification_date: 08.04.2023 enhanced: category: Biometric Devices cc_version: Common Criteria 3.1 release 5 cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1701 certification_date: 08.04.2023 description: The SP of S3B512C single-chip CMOS micro-controller is designed and packaged specifically for "Biometric Smart Card" applications. The Cortex-M33 CPU architecture of the SP of S3B512C microcontrollerfollows the Harvard style, that is, it has separate program memory and data memory. Both instruction and data can be fetched simultaneously without causing a stall, using separate paths for memory access. The main security features of the SP of S3B512C integrated circuit are: Secure fingerprint image capture and feature extraction provided by TOE SP firmware, integrity protected. Access control of Users to Flash memory positions where SP firmware is executed. TOE Unique Identification Countermeasures to avoid attackers reproduction of fingerprint data. An AES hardware block supporting AES encryption and decryption with 128-bit, 192-bit and 256-bit keys in ECB mode. The AES block supports encryption of fingerprint features to be sent to SE of S3B512C. Note SE (Secure Element) is not TOE. evaluation_facility: Applus Laboratories level: EAL2 manufacturer: Samsung Electronics Co., Ltd report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1702 status: Certified target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1700 type: Product manufacturer: Samsung Electronics Co., Ltd product: Samsung SP of S3B512C revision 3 product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/974-samsung-sp-of-s3b512c-revision-3
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	{}
maintenance_updates
protection_profiles
protection_profile_links	{}	{}
pdf_data/cert_filename		2021-23_Certificado.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level		EAL: EAL 2: 1 EAL 4: 1 EAL2: 1
pdf_data/cert_keywords/cc_sar		ALC: ALC_FLR: 2
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims		O: O.E: 1 T: T.I: 1
pdf_data/cert_keywords/vendor		Samsung: Samsung: 3
pdf_data/cert_keywords/eval_facility		Applus: Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata		/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 913137 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 2
pdf_data/report_filename	2002_25.pdf	2021-23 INF-4038.pdf
pdf_data/report_frontpage	FR:	FR:
pdf_data/report_keywords/cc_cert_id	FR: Rapport de certification 2002/25: 4	ES: 2021-23-INF-4038- v1: 1
pdf_data/report_keywords/cc_protection_profile_id
pdf_data/report_keywords/cc_security_level	EAL: EAL 1: 1 EAL 4: 5 EAL 7: 1 EAL1: 1 EAL4: 3 EAL7: 1	EAL: EAL 1: 1 EAL 2: 1 EAL 4: 2 EAL2: 8 ITSEC: ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar	ACM: ACM_AUT.1: 1 ACM_CAP.4: 1 ACM_SCP.2: 1 ADO: ADO_DEL.2: 1 ADO_IGS.1: 1 ADV: ADV_FSP.2: 1 ADV_HLD.2: 1 ADV_IMP.2: 6 ADV_LLD.1: 1 ADV_RCR.1: 1 ADV_SPM.1: 1 AGD: AGD_ADM.1: 1 AGD_USR.1: 1 ALC: ALC_DVS.2: 6 ALC_LCD.1: 1 ALC_TAT.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_MSU.2: 1 AVA_SOF.1: 1 AVA_VLA.4: 8	ADV: ADV_ARC.1: 1 ADV_TDS.1: 1 AGD: AGD_OPE.1: 1 ALC: ALC_CMC.2: 1 ALC_DEL.1: 1 ALC_FLR: 2 ASE: ASE_CCL.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_SPD.1: 1 ATE: ATE_COV.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.2: 1
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor	Samsung: Samsung: 17	Samsung: Samsung: 14
pdf_data/report_keywords/eval_facility	Serma: Serma Technologies: 3	Applus: Applus Laboratories: 4
pdf_data/report_keywords/symmetric_crypto	DES: DES: DES: 4	AES_competition: AES: AES: 7
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol		PGP: PGP: 1
pdf_data/report_keywords/randomness
pdf_data/report_keywords/cipher_mode		ECB: ECB: 2
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: physical tampering: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name		IBM: SE: 5
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	CC: CCIMB-99-031: 1 CCIMB-99-032: 1 CCIMB-99-033: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: SGDN/DCSSI /CreationDate: D:20030107150647Z00'00' /Creator: FrameMaker 6.0 /ModDate: D:20030107155953Z00'00' /Producer: Acrobat Distiller 5.0 (Windows) /Subject: Samsung S3CC9PB microcontroller /Title: Rapport de certification 2002-25 pdf_file_size_bytes: 240469 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 15	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 394885 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 13
pdf_data/st_filename	cible2002_25.pdf	2021-23 ST_Lite.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
pdf_data/st_keywords/cc_security_level	EAL: EAL 4: 1 EAL 4 augmented: 1 EAL4: 2 EAL4 augmented: 1	EAL: EAL2: 5
pdf_data/st_keywords/cc_sar	ACM: ACM_AUT: 2 ACM_CAP: 2 ACM_SCP: 2 ADO: ADO_DEL: 2 ADO_IGS: 2 ADV: ADV_FSP: 2 ADV_HLD: 2 ADV_IMP: 2 ADV_IMP.2: 1 ADV_LLD: 2 ADV_RCR: 2 ADV_SPM: 2 AGD: AGD_ADM: 2 AGD_USR: 2 ALC: ALC_DVS: 2 ALC_DVS.2: 1 ALC_FLR: 2 ALC_LCD: 2 ALC_TAT: 2 ATE: ATE_COV: 2 ATE_DPT: 2 ATE_FUN: 2 ATE_IND: 1 AVA: AVA_MSU: 2 AVA_SOF: 2 AVA_VLA: 2 AVA_VLA.4: 1	ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_FSP.2: 1 ADV_TDS.1: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.2: 1 ALC_CMS.2: 1 ALC_DEL.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.2: 1
pdf_data/st_keywords/cc_sfr	FAU: FAU_SAA.1: 1 FCS: FCS_CKM.1: 2 FCS_CKM.4: 2 FCS_COP.1: 2 FDP: FDP_ACC.2: 1 FDP_ACF.1: 2 FDP_IFC.1: 1 FDP_IFF.1: 2 FDP_SDI.1: 1 FIA: FIA_ATD.1: 1 FIA_UAU.2: 2 FIA_UID.2: 2 FMT: FMT_MOF.1: 2 FMT_MSA.1: 2 FMT_MSA.3: 2 FMT_SMR.1: 2 FPR: FPR_UNO.1: 1 FPT: FPT_PHP.2: 1 FPT_PHP.3: 1 FPT_TST.1: 2	FAU: FAU_GEN: 2 FAU_GEN.1: 1 FAU_SAS: 9 FAU_SAS.1: 12 FAU_SAS.1.1: 2 FCS: FCS_CKM: 1 FCS_CKM.1: 4 FCS_CKM.4: 7 FCS_CKM.4.1: 1 FCS_COP: 1 FCS_COP.1: 6 FCS_COP.1.1: 1 FDP: FDP_ACC: 1 FDP_ACC.1: 15 FDP_ACC.1.1: 1 FDP_ACF: 2 FDP_ACF.1: 7 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC.1: 10 FDP_ITC: 2 FDP_ITC.1: 10 FDP_ITC.1.1: 1 FDP_ITC.1.2: 1 FDP_ITC.1.3: 1 FDP_ITC.2: 4 FDP_ITT: 1 FDP_ITT.1: 6 FDP_ITT.1.1: 1 FDP_RIP: 1 FDP_RIP.1: 1 FDP_RIP.2: 6 FDP_RIP.2.1: 1 FDP_SDI: 1 FDP_SDI.1: 1 FDP_SDI.2: 6 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FDP_UCT: 1 FDP_UCT.1: 6 FDP_UCT.1.1: 1 FDP_UIT: 1 FDP_UIT.1: 6 FDP_UIT.1.1: 1 FDP_UIT.1.2: 1 FMT: FMT_MSA: 2 FMT_MSA.1: 9 FMT_MSA.1.1: 1 FMT_MSA.3: 11 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_SMF.1: 3 FMT_SMR.1: 6 FPT: FPT_ITT: 1 FPT_ITT.1: 6 FPT_ITT.1.1: 1 FTP: FTP_ITC.1: 4 FTP_TRP: 1 FTP_TRP.1: 10 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 1
pdf_data/st_keywords/cc_claims	A: A.DEV_ORG: 1 A.DLV: 1 A.DLV_AUDIT: 1 A.DLV_PROTECT: 1 A.DLV_RESP: 1 A.KEY_DEST: 2 A.SOFT_ARCHI: 1 A.USE_DIAG: 1 A.USE_PROD: 1 A.USE_SYS: 1 A.USE_TEST: 1 O: O.CLON: 1 O.CRYPTO: 2 O.DESIGN_ACS: 1 O.DEV_DIS: 1 O.DEV_TOOLS: 1 O.DIS_MECHANISM: 1 O.DIS_MEMORY: 1 O.DLV_AUDIT: 1 O.DLV_PROTECT: 1 O.DLV_RESP: 1 O.DSOFT_ACS: 1 O.FLAW: 1 O.IC_DLV: 1 O.KEY_DEST: 2 O.MASK_FAB: 1 O.MECH_ACS: 1 O.MOD_MEMORY: 1 O.OPERATE: 1 O.SOFT_ACS: 1 O.SOFT_DLV: 1 O.SOFT_MECH: 1 O.TAMPER: 1 O.TEST_OPERATE: 1 O.TOE_PRT: 1 O.USE_DIAG: 1 O.USE_SYS: 1 T: T.CLON: 2 T.DIS_DEL: 2 T.DIS_DESIGN: 2 T.DIS_DSOFT: 2 T.DIS_INFO: 1 T.DIS_PHOTOMAS: 1 T.DIS_PHOTOMASK: 1 T.DIS_SOFT: 1 T.DIS_TEST: 1 T.DIS_TOOLS: 1 T.MOD_DEL: 2 T.MOD_DESIGN: 1 T.MOD_DSOFT: 1 T.MOD_PHOTOMA: 1 T.MOD_SOFT: 2 T.T_DEL: 2 T.T_PHOTOMASK: 2 T.T_PRODUCT: 2 T.T_SAMPLE: 2	O: O.AES: 10
pdf_data/st_keywords/vendor	Samsung: Samsung: 1	Samsung: Samsung: 20
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	DES: DES: DES: 6	AES_competition: AES: AES: 36
pdf_data/st_keywords/asymmetric_crypto		ECC: ECC: ECC: 4
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme		MAC: MAC: 2
pdf_data/st_keywords/crypto_protocol		PGP: PGP: 1
pdf_data/st_keywords/randomness		RNG: RNG: 1
pdf_data/st_keywords/cipher_mode		ECB: ECB: 3
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: physical tampering: 6 other: reverse engineering: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name		IBM: SE: 70
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id		CC: CCMB-2017-04-001: 1 CCMB-2017-04-002: 1 CCMB-2017-04-003: 1 CCMB-2017-04-004: 1 FIPS: FIPS 197: 1 FIPS197: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process	OutOfScope: Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1 a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. The TOE submitted to the: 1 out of scope: 1
pdf_data/st_metadata	/CreationDate: D:20021129145359 /ModDate: D:20021129145400+09'00' /Producer: Acrobat Distiller 4.0 for Windows pdf_file_size_bytes: 267011 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 31	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 1418253 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 51
state/cert/convert_garbage	None	None
state/cert/convert_ok	False	True
state/cert/download_ok	False	True
state/cert/extract_ok	False	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	None	None
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	None	None
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different