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STMicroelectronics ST33K1M5A and ST33K1M5M B03
NSCIB-CC-2300112-02-CR 		Samsung S3CC9FB microcontroller
ANSSI-CC-2004/08
name STMicroelectronics ST33K1M5A and ST33K1M5M B03 Samsung S3CC9FB microcontroller
scheme NL FR
status active archived
not_valid_after 09.09.2029 01.09.2019
not_valid_before 09.09.2024 11.05.2004
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300112-02-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300112-02-CR2.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_08.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300112-02-ST_lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_08.pdf
manufacturer STMicroelectronics Samsung Electronics Co., Ltd.
manufacturer_web https://www.st.com/ https://www.samsung.com
security_level EAL6+, ALC_FLR.2 EAL4+, ADV_IMP.2, ALC_DVS.2, AVA_VLA.4
dgst 83fc6586c8ac42f5 cb87424f533f753c
heuristics/cert_id NSCIB-CC-2300112-02-CR ANSSI-CC-2004/08
heuristics/cert_lab []
heuristics/extracted_sars ALC_CMS.5, AGD_OPE.1, ASE_ECD.1, ALC_TAT.3, ALC_DEL.1, ALC_CMC.5, ADV_IMP.2, ALC_LCD.1, ADV_ARC.1, ASE_SPD.1, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_DPT.3, ATE_IND.2, ADV_SPM.1, AVA_VAN.5, ASE_TSS.1, ALC_DVS.2, ADV_TDS.5, ADV_FSP.5, ADV_INT.3, ATE_FUN.2, AGD_PRE.1, ATE_COV.3, ALC_FLR.2 AGD_USR.1, ADV_HLD.2, AVA_MSU.2, ADV_FSP.2, ATE_DPT.1, ADV_IMP.2, ALC_LCD.1, ASE_INT.1, ADV_RCR.1, ASE_SRE.1, ATE_IND.2, ADV_SPM.1, ASE_REQ.1, ASE_TSS.1, ASE_PPC.1, ATE_COV.2, ATE_FUN.1, ALC_DVS.2, AVA_SOF.1, ASE_OBJ.1, ALC_TAT.1, AVA_VLA.4, ADV_LLD.1, ASE_ENV.1, AGD_ADM.1, ASE_DES.1
heuristics/report_references/directly_referencing {} ANSSI-CC-2002/25
heuristics/report_references/indirectly_referencing {} ANSSI-CC-2002/25
heuristics/scheme_data
heuristics/protection_profiles cf0f01bcd7be3e9c {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf {}
pdf_data/cert_filename NSCIB-CC-2300112-02-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2300112-02: 1
    • NSCIB-CC-2300112-02: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Gebruiker
  • /CreationDate: D:20240923195638+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240923195638+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 87790
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-2300112-02-CR2.pdf 2004_08.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
    • cert_id: NSCIB-CC-2300112-02-CR
    • cert_item: ST33K1M5A and ST33K1M5M B03
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
  • FR:
  • NL:
pdf_data/report_keywords/cc_cert_id
  • NL:
    • NSCIB-2300112-01: 1
    • NSCIB-2300112-02: 1
    • NSCIB-CC-2300112-02-CR: 1
    • NSCIB-CC-2300112-02-CR2: 11
  • FR:
    • Rapport de certification 2002/25: 1
    • Rapport de certification 2004/08: 13
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL6+: 2
  • EAL:
    • EAL1: 1
    • EAL3: 1
    • EAL4: 1
    • EAL4+: 1
    • EAL41: 1
    • EAL5: 1
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 et: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_FLR.1: 1
    • ALC_FLR.2: 3
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 2
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_DEL.2: 2
    • ADO_IGS: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 3
    • ADV_INT: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 1
    • AGD_USR: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 3
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 2
  • FCS:
    • FCS_CKM.1: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 2
    • FDP_IFF.1: 2
    • FDP_SDI.1: 2
  • FIA:
    • FIA_ATD.1: 2
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 2
  • FPT:
    • FPT_PHP.2: 2
    • FPT_PHP.3: 2
    • FPT_TST.1: 2
pdf_data/report_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 3
  • Samsung:
    • Samsung: 10
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
  • Serma:
    • SERMA: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 2
  • constructions:
    • MAC:
      • CBC-MAC: 1
  • miscellaneous:
    • SM4:
      • SM4: 1
  • DES:
    • DES:
      • DES: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/report_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 4
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
  • ISO:
    • ISO/IEC 15408:1999: 1
pdf_data/report_keywords/certification_process
  • OutOfScope:
    • following proprietary or non-standard algorithms, protocols and implementations: none, which are out of scope as there are no security claims relating to these. Page: 11/12 of report number: 1
    • out of scope: 1
pdf_data/report_metadata
  • /Author: DCSSI
  • /CreationDate: D:20040517150918+02'00'
  • /Creator: Acrobat PDFMaker 5.0 pour Word
  • /ModDate: D:20040517150925+03'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: Micro-circuit SAMSUNG S3CC9FB
  • /Title: Rapport de certification 2004/08
  • pdf_file_size_bytes: 657323
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 26
pdf_data/st_filename NSCIB-CC-2300112-02-ST_lite.pdf cible2004_08.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 10
    • BSI-CC-PP-0084-: 1
    • BSI-CC-PP-0084-2014: 63
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 1
    • EAL6: 23
    • EAL6 augmented: 2
    • EAL6+: 1
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 2
    • EAL4 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC: 2
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT.3: 1
    • ADV_SPM: 4
    • ADV_SPM.1: 3
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 3
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.5: 1
    • ALC_DEL: 3
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL: 4
    • ASE_CCL.1: 1
    • ASE_ECD: 4
    • ASE_ECD.1: 1
    • ASE_INT: 2
    • ASE_INT.1: 1
    • ASE_OBJ: 12
    • ASE_OBJ.2: 1
    • ASE_REQ: 31
    • ASE_REQ.2: 1
    • ASE_SPD: 9
    • ASE_SPD.1: 1
    • ASE_TSS: 7
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 3
    • ATE_COV.3: 1
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 2
    • ACM_SCP: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_IGS: 2
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 1
    • ALC_FLR: 2
    • ALC_LCD: 2
    • ALC_TAT: 2
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_SOF: 2
    • AVA_VLA: 2
    • AVA_VLA.4: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAR.1: 26
    • FAU_SAS: 2
    • FAU_SAS.1: 26
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 4
    • FCS_COP.1: 17
    • FCS_RNG: 2
    • FCS_RNG.1: 6
  • FDP:
    • FDP_ACC.1: 23
    • FDP_ACC.2: 14
    • FDP_ACF.1: 31
    • FDP_IFC.1: 17
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 10
    • FDP_SDC: 2
    • FDP_SDC.1: 6
    • FDP_SDI.2: 13
    • FDP_SMF.1: 2
    • FDP_SMR.1: 1
    • FDP_UCT.1: 16
    • FDP_UIT.1: 16
  • FIA:
    • FIA_API: 2
    • FIA_API.1: 6
    • FIA_UAU.1: 14
    • FIA_UID.1: 16
  • FMT:
    • FMT_LIM: 2
    • FMT_LIM.1: 29
    • FMT_LIM.2: 30
    • FMT_MSA.1: 28
    • FMT_MSA.3: 28
    • FMT_SMF.1: 25
    • FMT_SMR.1: 17
  • FPT:
    • FPT_FLS.1: 24
    • FPT_ITT.1: 9
    • FPT_PHP.3: 11
  • FRU:
    • FRU_FLT.2: 11
  • FTP:
    • FTP_ITC.1: 28
    • FTP_TRP.1: 2
  • FAU:
    • FAU_SAA.1: 1
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 1
    • FDP_ACF.1: 2
    • FDP_IFC.1: 1
    • FDP_IFF.1: 2
    • FDP_SDI.1: 1
  • FIA:
    • FIA_ATD.1: 1
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 1
  • FPT:
    • FPT_PHP.2: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 2
pdf_data/st_keywords/cc_claims
  • O:
    • O.C: 4
    • O.RND: 4
    • O.TOE-: 1
  • R:
    • R.O: 4
  • T:
    • T.RND: 3
  • A:
    • A.DEV_ORG: 1
    • A.DLV: 1
    • A.DLV_AUDIT: 1
    • A.DLV_PROTECT: 1
    • A.DLV_RESP: 1
    • A.KEY_DEST: 2
    • A.SOFT_ARCHI: 1
    • A.USE_DIAG: 1
    • A.USE_PROD: 1
    • A.USE_SYS: 1
    • A.USE_TEST: 1
  • O:
    • O.CLON: 1
    • O.CRYPTO: 2
    • O.DESIGN_ACS: 1
    • O.DEV_DIS: 1
    • O.DEV_TOOLS: 1
    • O.DIS_MECHANISM: 1
    • O.DIS_MEMORY: 1
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 1
    • O.DLV_RESP: 1
    • O.DSOFT_ACS: 1
    • O.FLAW: 1
    • O.IC_DLV: 1
    • O.KEY_DEST: 2
    • O.MASK_FAB: 1
    • O.MECH_ACS: 1
    • O.MOD_MEMORY: 1
    • O.OPERATE: 1
    • O.SOFT_ACS: 1
    • O.SOFT_DLV: 1
    • O.SOFT_MECH: 1
    • O.TAMPER: 1
    • O.TEST_OPERATE: 1
    • O.TOE_PRT: 1
    • O.USE_DIAG: 1
    • O.USE_SYS: 1
  • T:
    • T.CLON: 2
    • T.DIS_DEL: 2
    • T.DIS_DESIGN: 2
    • T.DIS_DSOFT: 2
    • T.DIS_INFO: 1
    • T.DIS_PHOTOMAS: 1
    • T.DIS_PHOTOMASK: 1
    • T.DIS_SOFT: 1
    • T.DIS_TEST: 1
    • T.DIS_TOOLS: 1
    • T.MOD_DEL: 2
    • T.MOD_DESIGN: 1
    • T.MOD_DSOFT: 1
    • T.MOD_PHOTOMA: 1
    • T.MOD_SOFT: 2
    • T.T_DEL: 2
    • T.T_PHOTOMASK: 2
    • T.T_PRODUCT: 2
    • T.T_SAMPLE: 2
pdf_data/st_keywords/vendor
  • Infineon:
    • Infineon Technologies: 1
  • Philips:
    • Philips: 1
  • STMicroelectronics:
    • STMicroelectronics: 22
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 14
      • AES-128: 1
      • AES-192: 1
      • AES-256: 1
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 5
    • DES:
      • DES: 19
  • miscellaneous:
    • SM4:
      • SM4: 1
  • DES:
    • DES:
      • DES: 6
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 7
    • RNG: 6
  • TRNG:
    • TRNG: 3
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 8
  • ECB:
    • ECB: 7
pdf_data/st_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 6
    • Nescrypt: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 13
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 14
    • Physical Probing: 4
    • physical probing: 3
    • side channel: 2
  • other:
    • JIL: 69
  • FI:
    • physical tampering: 6
  • other:
    • reverse engineering: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 22
    • CCMB-2017-04-003: 2
  • FIPS:
    • FIPS PUB 197: 3
  • ISO:
    • ISO/IEC 14888: 2
    • ISO/IEC 7816-3: 1
    • ISO/IEC 9796: 1
    • ISO/IEC 9796-2: 1
  • NIST:
    • NIST SP 800-38A: 2
    • NIST SP 800-67: 3
    • SP 800-38A: 2
    • SP 800-67: 1
  • PKCS:
    • PKCS #1: 2
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation: 1
    • ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation: 1
    • Security IC Embedded Software (ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation. 1.6.3 TOE documentation 46 The user guidance documentation, part of the TOE: 1
    • The TOE also provides a 16- and 32-bit CRC calculation block (ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation. 41 Figure 1 provides an overview of the ST33K1M5A and ST33K1M5M B03: 1
    • out of scope: 2
  • OutOfScope:
    • Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. The TOE submitted to the: 1
    • out of scope: 1
pdf_data/st_metadata
  • /Author: feixbeno
  • /CreationDate: D:20240822172325Z
  • /Creator: FrameMaker 17.0.1
  • /CreatorTool: FrameMaker 17.0.1
  • /ModDate: D:20240822172354+02'00'
  • /Producer: Adobe PDF Library 17.0
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