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	STMicroelectronics ST33K1M5A and ST33K1M5M B03 NSCIB-CC-2300112-02-CR	Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A 2019-48-INF-3811
name	STMicroelectronics ST33K1M5A and ST33K1M5M B03	Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	NL	ES
status	active	active
not_valid_after	09.09.2029	07.06.2027
not_valid_before	09.09.2024	07.06.2022
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300112-02-CERT.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48_Certificado.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300112-02-CR2.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20INF-3811.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300112-02-ST_lite.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20ST_lite.pdf
manufacturer	STMicroelectronics	Winbond Electonics Corporation
manufacturer_web	https://www.st.com/	https://www.winbond.com/
security_level	EAL6+, ALC_FLR.2	EAL5+, AVA_VAN.5, ALC_DVS.2
dgst	83fc6586c8ac42f5	51a1149f945dea23
heuristics/cert_id	NSCIB-CC-2300112-02-CR	2019-48-INF-3811
heuristics/cert_lab		[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ATE_IND.2, ADV_INT.3, ALC_LCD.1, ADV_SPM.1, ATE_FUN.2, ASE_CCL.1, AGD_OPE.1, ASE_SPD.1, ADV_IMP.2, ALC_TAT.3, ASE_OBJ.2, ATE_DPT.3, ALC_CMS.5, ADV_ARC.1, ALC_DVS.2, ASE_INT.1, AVA_VAN.5, ASE_TSS.1, ASE_REQ.2, ALC_FLR.2, ALC_DEL.1, ADV_FSP.5, AGD_PRE.1, ADV_TDS.5, ATE_COV.3, ALC_CMC.5, ASE_ECD.1	ALC_LCD.1, ASE_CCL.1, AGD_OPE.1, ASE_SPD.1, ASE_OBJ.2, ATE_DPT.3, ATE_COV.2, ALC_CMS.5, ADV_ARC.1, ATE_FUN.1, ADV_IMP.1, ALC_DVS.2, ALC_TAT.2, ASE_INT.1, AVA_VAN.5, ASE_TSS.1, ADV_TDS.4, ALC_CMC.4, ADV_INT.2, ASE_REQ.2, ALC_DEL.1, ADV_FSP.5, AGD_PRE.1, ASE_ECD.1
heuristics/extracted_versions	-	-
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data	cert_id: NSCIB-CC-2300112-02-CR cert_link: https://trustcb.com/download/?wpdmdl=4481 certification_date: 09.09.2024 developer: STMicroelectronics evaluation_facility: SGS Brightsight level: EAL6+ ALC_FLR.2 product: ST33K1M5A and ST33K1M5M B03 report_link: https://trustcb.com/download/?wpdmdl=4493 status: Issued target_link: https://trustcb.com/download/?wpdmdl=4483	category: Smart Cards and similiar devices certification_date: 07.06.2022 enhanced: category: Smart Cards and similiar devices cc_version: Common Criteria 3.1 release 5 cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1478 certification_date: 07.06.2022 description: The TOE is a memory flash IC designed to be embedded into highly critical hardware devices such as smart card, secure element, USB token, secure micro SD, etc. These devices will embed secure applications such as financial, telecommunication, identity (e-Government), etc. and will be working in a hostile environment. In particular, the TOE main function is the secure storage of the code and data of critical applications. The security needs for the TOE consist in: Maintaining the integrity of the content of the memories and the confidentiality of the content of protected memory areas as required by the critical HW products (e.g. Security IC) the Memory Flash is built for. Providing a secure communication with the Host device that will embed the TOE in a secure HW product such as Security IC. evaluation_facility: Applus Laboratories level: EAL5 + ALC_DVS.2 + AVA_VAN.5 manufacturer: Winbond Electronics Corporation report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1479 status: Certified target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1477 type: Product manufacturer: Winbond Electronics Corporation product: Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/826-winbond-spiflash-trustme-secure-flash-memory-w75f40wbyjeg-version-a
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	cf0f01bcd7be3e9c	{}
maintenance_updates
protection_profiles
protection_profile_links	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf	{}
pdf_data/cert_filename	NSCIB-CC-2300112-02-CERT.pdf	2019-48_Certificado.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id	NL: NSCIB-2300112-02: 1 NSCIB-CC-2300112-02: 1
pdf_data/cert_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level	EAL: EAL2: 1 EAL6: 1 EAL6 augmented: 1 EAL7: 1	EAL: EAL 2: 1 EAL5: 1
pdf_data/cert_keywords/cc_sar	ALC: ALC_FLR: 1 ALC_FLR.2: 1 ALC_FLR.3: 1	ALC: ALC_DVS.2: 1 ALC_FLR: 1 AVA: AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims		O: O.E: 1
pdf_data/cert_keywords/vendor	STMicroelectronics: STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility	BrightSight: Brightsight: 1 SGS: SGS: 1 SGS Brightsight: 1	Applus: Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id	ISO: ISO/IEC 15408-1: 2 ISO/IEC 18045: 4 ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/Author: Gebruiker /CreationDate: D:20240923195638+01'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240923195638+01'00' /Producer: Microsoft® Word 2021 /Title: NSCIB Certificate pdf_file_size_bytes: 87790 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 880365 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 2
pdf_data/report_filename	NSCIB-CC-2300112-02-CR2.pdf	2019-48 INF-3811.pdf
pdf_data/report_frontpage	NL: cert_id: NSCIB-CC-2300112-02-CR cert_item: ST33K1M5A and ST33K1M5M B03 cert_lab: SGS Brightsight B.V. developer: STMicroelectronics	NL:
pdf_data/report_keywords/cc_cert_id	NL: NSCIB-2300112-01: 1 NSCIB-2300112-02: 1 NSCIB-CC-2300112-02-CR: 1 NSCIB-CC-2300112-02-CR2: 11	ES: 2019-48-INF-3811- v1: 1
pdf_data/report_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level	EAL: EAL 6: 1 EAL 6 augmented: 1 EAL4: 1 EAL6: 1 EAL6 augmented: 1 EAL6+: 2	EAL: EAL 1: 1 EAL 2: 1 EAL 4: 2 EAL2: 1 EAL5: 8 ITSEC: ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar	ADV: ADV_IMP: 1 ALC: ALC_FLR.1: 1 ALC_FLR.2: 3 AVA: AVA_VAN: 1 AVA_VAN.5: 1	ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_IMP.1: 1 ADV_TDS.4: 1 AGD: AGD_OPE.1: 1 ALC: ALC_CMC.4: 1 ALC_DEL.1: 1 ALC_DVS.2: 8 ALC_FLR: 3 ALC_LCD.1: 1 ASE: ASE_CCL.1: 1 ASE_INT.1: 1 ASE_REQ.2: 1 ATE: ATE_COV.2: 1 ATE_FUN.1: 1 AVA: AVA_VAN.5: 9
pdf_data/report_keywords/cc_sfr		FDP: FDP_IFC.1: 1 FDP_RIP.1: 1 FDP_SDI.2: 1 FDP_UIT.1: 1 FMT: FMT_LIM.1: 1 FPT: FPT_FLS: 2 FPT_ITT.1: 1 FPT_TRP.1: 1 FRU: FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor	STMicroelectronics: STMicroelectronics: 3
pdf_data/report_keywords/eval_facility	BrightSight: Brightsight: 3 SGS: SGS: 3 SGS Brightsight: 3	Applus: Applus Laboratories: 5
pdf_data/report_keywords/symmetric_crypto	AES_competition: AES: AES: 2 DES: DES: DES: 2 constructions: MAC: CBC-MAC: 1 miscellaneous: SM4: SM4: 1
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness	RNG: RNG: 1 TRNG: TRNG: 1
pdf_data/report_keywords/cipher_mode	CBC: CBC: 1
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine	NesCrypt: NESCRYPT: 4
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: DFA: 1 SCA: side-channel: 1 other: JIL: 2 JIL-AAPS: 2 JIL-AM: 1	FI: fault injection: 2 other: JIL: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process	OutOfScope: following proprietary or non-standard algorithms, protocols and implementations: none, which are out of scope as there are no security claims relating to these. Page: 11/12 of report number: 1 out of scope: 1
pdf_data/report_metadata	/Author: Gebruiker /CreationDate: D:20240927181632+01'00' /Creator: Microsoft® Word 2021 /ModDate: D:20240927181632+01'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 261601 pdf_hyperlinks: mailto:[email protected], http://www.commoncriteriaportal.org/, https://nscib.nl/, https://www.sogis.eu/, https://trustcb.com/common-criteria/nscib/ pdf_is_encrypted: False pdf_number_of_pages: 12	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 964023 pdf_hyperlinks: http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 14
pdf_data/st_filename	NSCIB-CC-2300112-02-ST_lite.pdf	2019-48 ST_lite.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-CC-PP- 0084-2014: 10 BSI-CC-PP-0084-: 1 BSI-CC-PP-0084-2014: 63	BSI: BSI-PP-0084: 1
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 1 EAL6: 23 EAL6 augmented: 2 EAL6+: 1	EAL: EAL5: 6 EAL5 augmented: 2
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC: 2 ADV_ARC.1: 1 ADV_FSP: 4 ADV_FSP.5: 3 ADV_IMP: 1 ADV_IMP.2: 1 ADV_INT.3: 1 ADV_SPM: 4 ADV_SPM.1: 3 ADV_TDS.5: 1 AGD: AGD_OPE: 1 AGD_OPE.1: 1 AGD_PRE: 3 AGD_PRE.1: 1 ALC: ALC_CMC: 1 ALC_CMC.5: 1 ALC_CMS: 1 ALC_CMS.5: 1 ALC_DEL: 3 ALC_DEL.1: 1 ALC_DVS: 1 ALC_DVS.2: 1 ALC_FLR.2: 6 ALC_LCD.1: 1 ALC_TAT.3: 1 ASE: ASE_CCL: 4 ASE_CCL.1: 1 ASE_ECD: 4 ASE_ECD.1: 1 ASE_INT: 2 ASE_INT.1: 1 ASE_OBJ: 12 ASE_OBJ.2: 1 ASE_REQ: 31 ASE_REQ.2: 1 ASE_SPD: 9 ASE_SPD.1: 1 ASE_TSS: 7 ASE_TSS.1: 1 ATE: ATE_COV: 3 ATE_COV.3: 1 ATE_DPT.3: 1 ATE_FUN.2: 1 ATE_IND.2: 1 AVA: AVA_VAN: 1 AVA_VAN.5: 1	ADV: ADV_ARC: 1 ADV_ARC.1: 6 ADV_FSP.1: 3 ADV_FSP.2: 3 ADV_FSP.4: 1 ADV_FSP.5: 8 ADV_IMP.1: 9 ADV_INT.2: 1 ADV_TDS.1: 2 ADV_TDS.3: 4 ADV_TDS.4: 8 AGD: AGD_OPE.1: 6 AGD_PRE.1: 6 ALC: ALC_CMC.4: 1 ALC_CMS.1: 1 ALC_CMS.5: 1 ALC_DEL.1: 1 ALC_DVS.1: 2 ALC_DVS.2: 9 ALC_LCD.1: 3 ALC_TAT.1: 2 ALC_TAT.2: 3 ASE: ASE_CCL.1: 1 ASE_ECD.1: 5 ASE_INT.1: 5 ASE_OBJ.2: 3 ASE_REQ.1: 2 ASE_REQ.2: 2 ASE_SPD.1: 2 ASE_TSS.1: 1 ATE: ATE_COV.1: 2 ATE_COV.2: 3 ATE_DPT.1: 1 ATE_DPT.3: 1 ATE_FUN.1: 6 AVA: AVA_VAN.5: 10
pdf_data/st_keywords/cc_sfr	FAU: FAU_GEN.1: 8 FAU_SAR.1: 26 FAU_SAS: 2 FAU_SAS.1: 26 FCS: FCS_CKM.1: 2 FCS_CKM.4: 4 FCS_COP.1: 17 FCS_RNG: 2 FCS_RNG.1: 6 FDP: FDP_ACC.1: 23 FDP_ACC.2: 14 FDP_ACF.1: 31 FDP_IFC.1: 17 FDP_ITC.1: 3 FDP_ITC.2: 3 FDP_ITT.1: 10 FDP_SDC: 2 FDP_SDC.1: 6 FDP_SDI.2: 13 FDP_SMF.1: 2 FDP_SMR.1: 1 FDP_UCT.1: 16 FDP_UIT.1: 16 FIA: FIA_API: 2 FIA_API.1: 6 FIA_UAU.1: 14 FIA_UID.1: 16 FMT: FMT_LIM: 2 FMT_LIM.1: 29 FMT_LIM.2: 30 FMT_MSA.1: 28 FMT_MSA.3: 28 FMT_SMF.1: 25 FMT_SMR.1: 17 FPT: FPT_FLS.1: 24 FPT_ITT.1: 9 FPT_PHP.3: 11 FRU: FRU_FLT.2: 11 FTP: FTP_ITC.1: 28 FTP_TRP.1: 2	FDP: FDP_ACC.1: 3 FDP_ACF: 1 FDP_IFC.1: 27 FDP_IFC.1.1: 1 FDP_IFF.1: 4 FDP_ITT.1: 13 FDP_ITT.1.1: 1 FDP_RIP.1: 8 FDP_RIP.1.1: 1 FDP_SDC: 4 FDP_SDC.1: 16 FDP_SDC.1.1: 2 FDP_SDI: 1 FDP_SDI.2: 11 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FDP_UCT.1: 8 FDP_UCT.1.1: 1 FDP_UIT.1: 8 FDP_UIT.1.1: 1 FDP_UIT.1.2: 1 FMT: FMT_LIM: 5 FMT_LIM.1: 22 FMT_LIM.1.1: 2 FMT_LIM.2: 19 FMT_LIM.2.1: 2 FPT: FPT_FLS: 24 FPT_FLS.1: 3 FPT_ITT.1: 12 FPT_ITT.1.1: 1 FPT_PHP.3: 14 FPT_PHP.3.1: 1 FRU: FRU_FLT.2: 12 FRU_FLT.2.1: 1 FTP: FTP_ITC.1: 2 FTP_TRP.1: 11 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 1
pdf_data/st_keywords/cc_claims	O: O.C: 4 O.RND: 4 O.TOE-: 1 R: R.O: 4 T: T.RND: 3
pdf_data/st_keywords/vendor	Infineon: Infineon Technologies: 1 Philips: Philips: 1 STMicroelectronics: STMicroelectronics: 22
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	AES_competition: AES: AES: 14 AES-128: 1 AES-192: 1 AES-256: 1 DES: 3DES: TDEA: 1 TDES: 5 DES: DES: 19 miscellaneous: SM4: SM4: 1
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme		MAC: MAC: 2
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RND: 7 RNG: 6 TRNG: TRNG: 3
pdf_data/st_keywords/cipher_mode	CBC: CBC: 8 ECB: ECB: 7
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine	NesCrypt: NESCRYPT: 6 Nescrypt: 1
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 13 malfunction: 2 physical tampering: 1 SCA: Leak-Inherent: 14 Physical Probing: 4 physical probing: 3 side channel: 2 other: JIL: 69	FI: Fault Injection: 1 Malfunction: 17 fault injection: 2 malfunction: 3 physical tampering: 3 SCA: Leak-Inherent: 17 Physical Probing: 2 physical probing: 5
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 22 CCMB-2017-04-003: 2 FIPS: FIPS PUB 197: 3 ISO: ISO/IEC 14888: 2 ISO/IEC 7816-3: 1 ISO/IEC 9796: 1 ISO/IEC 9796-2: 1 NIST: NIST SP 800-38A: 2 NIST SP 800-67: 3 SP 800-38A: 2 SP 800-67: 1 PKCS: PKCS #1: 2	CC: CCMB-2017-04-004: 1 ISO: ISO/IEC 7816-3: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process	OutOfScope: ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation: 1 ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation: 1 Security IC Embedded Software (ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation. 1.6.3 TOE documentation 46 The user guidance documentation, part of the TOE: 1 The TOE also provides a 16- and 32-bit CRC calculation block (ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation. 41 Figure 1 provides an overview of the ST33K1M5A and ST33K1M5M B03: 1 out of scope: 2
pdf_data/st_metadata	/Author: feixbeno /CreationDate: D:20240822172325Z /Creator: FrameMaker 17.0.1 /CreatorTool: FrameMaker 17.0.1 /ModDate: D:20240822172354+02'00' /Producer: Adobe PDF Library 17.0 /Title: SMD_ST33K1M5AM_ST_21_002_VB03_1P.pdf /Trapped: /False pdf_file_size_bytes: 1579749 pdf_hyperlinks: http://www.st.com pdf_is_encrypted: False pdf_number_of_pages: 84	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 639311 pdf_hyperlinks: http://en.wikipedia.org/wiki/De_facto_standard, http://en.wikipedia.org/wiki/Full_duplex, http://en.wikipedia.org/wiki/Serial_communications, http://en.wikipedia.org/wiki/Synchronous_circuit pdf_is_encrypted: False pdf_number_of_pages: 47
state/cert/convert_garbage	False	False
state/cert/convert_ok	True	True
state/cert/download_ok	True	True
state/cert/extract_ok	True	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different