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Change v06.00
None 		Microcontrôleurs SAMSUNG S3FT9MD et S3FT9MC Revision 0
ANSSI-CC-2014/37
name Change v06.00 Microcontrôleurs SAMSUNG S3FT9MD et S3FT9MC Revision 0
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme TR FR
not_valid_after 12.09.2020 01.09.2019
not_valid_before 12.09.2017 11.07.2014
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Change_v06.00_CR.docx https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-2014_37_Rapport.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CHANGE-ST_Lite_06.00.docx https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-2014_37_cible.pdf
manufacturer Edata Elektronik San. ve Tic. A.Ş. Samsung Electronics Co., Ltd.
manufacturer_web https://www.edata.com.tr/ https://www.samsung.com
security_level EAL2 AVA_VAN.5, EAL5+, ALC_DVS.2
dgst 7ebbee8bc1ee79a1 9c3048ee4eb0b27d
heuristics/cert_id ANSSI-CC-2014/37
heuristics/cert_lab [] CEA
heuristics/extracted_sars {} ALC_CMS.5, AGD_OPE.1, ALC_TAT.2, ASE_ECD.1, ADV_TDS.4, ALC_DEL.1, ALC_LCD.1, ADV_ARC.1, ADV_IMP.1, ASE_SPD.1, ADV_INT.2, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_DPT.3, ATE_IND.2, AVA_VAN.5, ASE_TSS.1, ATE_COV.2, ATE_FUN.1, ALC_DVS.2, ADV_FSP.5, ALC_CMC.4, AGD_PRE.1
heuristics/extracted_versions 06.00 0
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2015/12, ANSSI-CC-2014/59, ANSSI-CC-2014/58, ANSSI-CC-2014/57
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2014/59, KECS-ISIS-0799-2017, ANSSI-CC-2014/57, ANSSI-CC-2018/26, ANSSI-CC-2019/18, ANSSI-CC-2015/12, ANSSI-CC-2014/58, KECS-ISIS-0797-2017, ANSSI-CC-2018/25, ANSSI-CC-2019/19, KECS-ISIS-0798-2017
heuristics/protection_profiles f66582c39ca00e84 f6d23054061d72ba
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/NGCRFAS-2_PP_v1 3.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename Change_v06.00_CR.docx ANSSI-CC-2014_37_Rapport.pdf
pdf_data/report_frontpage
  • FR:
  • FR:
    • cc_security_level: EAL 5 augmenté ALC_DVS.2, AVA_VAN.5
    • cc_version: Critères Communs version 3.1 révision 4
    • cert_id: ANSSI-CC-2014/37
    • cert_item: Microcontrôleurs SAMSUNG S3FT9MD et S3FT9MC
    • cert_item_version: Revision 0
    • cert_lab: CEA - LETI 17 rue des martyrs, 38054 Grenoble Cedex 9, France
    • developer: Samsung Electronics Co. Ltd. 17th floor, B-Tower 1-1, Samsungjeonja-ro, Hwaseong-si Gyeonggi-do 445-330 South Korea COREE DU SUD Commanditaire Samsung Electronics Co. Ltd. 17th floor, B-Tower 1-1, Samsungjeonja-ro, Hwaseong-si Gyeonggi-do 445-330 South Korea COREE DU SUD
    • match_rules: ['Référence du rapport de certification(.+)Nom du produit(.+)Référence/version du produit(.+)Conformité à un profil de protection(.+)Critères d’évaluation et version(.+)Niveau d’évaluation(.+)Développeur (.+)Centre d’évaluation(.+)Accords de reconnaissance applicables']
    • ref_protection_profiles: PP0035] : Security IC Platform Protection Profile Version 1.0
pdf_data/report_keywords/cc_cert_id
  • FR:
    • ANSSI-CC-2014/37: 18
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035-2007: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
    • EAL 3: 1
    • EAL 5: 3
    • EAL 7: 1
    • EAL4: 2
    • EAL7: 1
  • ITSEC:
    • ITSEC E6 Elevé: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_FSP: 1
    • ADV_IMP: 1
    • ADV_INT: 1
    • ADV_SPM: 1
    • ADV_TDS: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_PRE: 1
  • ALC:
    • ALC_CMC: 2
    • ALC_CMS: 1
    • ALC_DEL: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_FLR: 1
    • ALC_LCD: 1
    • ALC_TAT: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_ECD: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_REQ: 1
    • ASE_SPD: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 1
    • ATE_DPT: 1
    • ATE_FUN: 1
    • ATE_IND: 1
  • AVA:
    • AVA_VAN: 3
    • AVA_VAN.5: 2
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 15
pdf_data/report_keywords/eval_facility
  • CEA-LETI:
    • CEA - LETI: 1
  • CESTI:
    • CESTI: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • 3DES:
      • 3DES: 1
    • DES:
      • DES: 1
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness
  • TRNG:
    • DTRNG: 12
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 31: 2
    • AIS31: 1
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata
  • /Author: gimenez-j
  • /CreationDate: D:20140724102535+02'00'
  • /Creator: Microsoft® Word 2010
  • /Keywords: ANSSI-CC-CER-F-07.009
  • /ModDate: D:20140724102535+02'00'
  • /Producer: Microsoft® Word 2010
  • /Subject: Microcontrôleurs SAMSUNG S3FT9MD et S3FT9MC Revision 0
  • /Title: ANSSI-CC-2014/37
  • pdf_file_size_bytes: 636336
  • pdf_hyperlinks: http://www.ssi.gouv.fr/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 17
pdf_data/st_filename CHANGE-ST_Lite_06.00.docx ANSSI-CC-2014_37_cible.pdf
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 5
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 5: 2
    • EAL 5 augmented: 2
    • EAL5: 6
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 7
    • ADV_ARV: 1
    • ADV_FSP: 2
    • ADV_FSP.4: 2
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_INT.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_VAN: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 1
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 8
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 8
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM.1: 9
    • FCS_CKM.4: 5
    • FCS_COP: 11
    • FCS_COP.1: 9
    • FCS_RNG: 6
    • FCS_RNG.1: 14
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 14
    • FDP_ACC.1.1: 1
    • FDP_ACF: 2
    • FDP_ACF.1: 10
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 18
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 4
    • FDP_ITC.2: 4
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
  • FMT:
    • FMT_LIM: 8
    • FMT_LIM.1: 24
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 28
    • FMT_LIM.2.1: 2
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 9
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 6
  • FPT:
    • FPT_FLS: 1
    • FPT_FLS.1: 21
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 3
    • FPT_PHP.3: 20
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims
  • O:
    • O.MEM_ACCESS: 1
    • O.RND: 5
    • O.RNG: 1
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 3
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 14
  • DES:
    • 3DES:
      • 3DES: 6
      • TDEA: 1
      • Triple-DES: 1
    • DES:
      • DES: 8
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 3
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 10
    • RNG: 1
  • TRNG:
    • DTRNG: 19
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • ECB:
    • ECB: 3
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 27
    • malfunction: 11
    • physical tampering: 2
  • SCA:
    • DPA: 2
    • Leak-Inherent: 23
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 1
    • physical probing: 9
    • side-channel: 3
    • timing attacks: 1
  • other:
    • reverse engineering: 5
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 31: 2
    • AIS31: 3
    • BSI-AIS31: 3
  • CC:
    • CCMB-2012-09-001: 3
    • CCMB-2012-09-002: 3
    • CCMB-2012-09-003: 3
    • CCMB-2012-09-004: 3
  • FIPS:
    • FIPS 197: 1
    • FIPS197: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: KyungSuk YI
  • /Baustein: SLE66C82P/SLE66C42P
  • /BausteinVersion: a15
  • /Classification: Public
  • /Company:
  • /CreationDate: D:20131122160616+09'00'
  • /Creator: Word용 Acrobat PDFMaker 10.1
  • /Datum: 23-10-2003
  • /Dokument: Security Target
  • /EEPROM: 8 kBytes
  • /Jahr: 2003
  • /Keywords:
  • /ModDate: D:20131122160634+09'00'
  • /PP_Augmentations: Smartcard Integrated Circuit Platform Augmentations V0.98
  • /PP_Date: July 2001
  • /PP_Short: BSI-PP-0002; Version 1.0, July 2001
  • /PP_Version: 1.0
  • /Producer: Adobe PDF Library 10.0
  • /Protection Profile: Smartcard IC Platform Protection Profile
  • /ROM: 64 kBytes
  • /SourceModified: D:20131122070522
  • /Subject:
  • /Technologie: 0,22 µm
  • /Title: Security Target
  • /Version: 1.2
  • /XRAM: 2 kBytes
  • /m-Nummer: m1474/m1495
  • pdf_file_size_bytes: 1255935
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 63
state/report/convert_garbage True False
state/report/convert_ok False True
state/report/extract_ok False True
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/convert_garbage True False
state/st/convert_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
state/st/txt_hash Different Different