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HiRDB / Single Server Version 7 07-03
JISEC-CC-CRP-C0065 		NXP Smart Card Controller P60D080PVC and its major configurations P60D052PVC, P60D040PVC, P60C080PVC, P60C052PVC and P60C040PVC
BSI-DSZ-CC-0837-2013
name HiRDB / Single Server Version 7 07-03 NXP Smart Card Controller P60D080PVC and its major configurations P60D052PVC, P60D040PVC, P60C080PVC, P60C052PVC and P60C040PVC
category Databases ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 07.10.2013 01.09.2019
not_valid_before 22.11.2006 24.06.2013
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0065_ecvr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0837a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0837b_pdf.pdf
manufacturer Hitachi, Ltd. NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.hitachi.com/ https://www.nxp.com
security_level EAL1 EAL6+, ALC_FLR.1
dgst 6b0ce7e3167a63fb 6e6d45dbf30497f8
heuristics/cert_id JISEC-CC-CRP-C0065 BSI-DSZ-CC-0837-2013
heuristics/cert_lab [] BSI
heuristics/extracted_sars {} ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, APE_ECD.1, ALC_FLR.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ADV_IMP.2, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions 7, 07, 03 -
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0893-2014, BSI-DSZ-CC-0892-2014, ANSSI-CC-2014/86, NSCIB-CC-12-36243-CR, BSI-DSZ-CC-0861-2014
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2015/37, ANSSI-CC-2016/04, NSCIB-CC-12-36243-CR2, ANSSI-CC-2016/03, BSI-DSZ-CC-0892-2014, ANSSI-CC-2015/03, ANSSI-CC-2015/41, ANSSI-CC-2015/44, ANSSI-CC-2015/39, ANSSI-CC-2015/02, ANSSI-CC-2015/30, ANSSI-CC-2014/86, BSI-DSZ-CC-0892-V2-2015, ANSSI-CC-2015/74, NSCIB-CC-12-36243-CR, ANSSI-CC-2015/01, ANSSI-CC-2015/04, ANSSI-CC-2015/75, ANSSI-CC-2015/38, ANSSI-CC-2016/63, BSI-DSZ-CC-0861-2014, BSI-DSZ-CC-0893-2014, ANSSI-CC-2015/40, ANSSI-CC-2015/08, ANSSI-CC-2015/15
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0098
  • certification_date:
  • claim: EAL1
  • enhanced:
    • assurance_level: EAL1
    • description: PRODUCT DESCRIPTION This TOE(HiRDB / Single Server Version 8) is a software product for Relational Database Management System(RDBMS). The TOE acts as a database server and provides access to the information stored in the database. Users generally access to the information stored in the database by requests for SQL execution at HiRDB server from HiRDB clients. The TOE provides functions that work for various and efficient data manipulation to meet the needs of users. And it also provides security functions that restrict access to user data to authorized users. Security functions of the TOE include the following. - Audit - Discretionary Access Control - Identification and Authentication - Security Management
    • evaluation_facility: Electronic Commerce Security Technology Laboratory Inc. Evaluation Center
    • product: HiRDB / Single Server Version 8
    • product_type: IT Product (Data Base Management System)
    • toe_version: 08-01
    • vendor: Hitachi, Ltd.
  • expiration_date: 01.10.2013
  • supplier: Hitachi, Ltd.
  • toe_japan_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0098_it7133.html
  • toe_japan_name: HiRDB / Single Server Version 8 08-01
  • toe_overseas_link: None
  • toe_overseas_name: -----
heuristics/st_references/directly_referenced_by {} ANSSI-CC-2015/08
heuristics/st_references/indirectly_referenced_by {} ANSSI-CC-2015/08
heuristics/protection_profiles {} f6d23054061d72ba
maintenance_updates
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename c0065_ecvr.pdf 0837a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0837-2013
    • cert_item: NXP Smart Card Controller P60D080PVC and its major configurations P60D052PVC, P60D040PVC, P60C080PVC, P60C052PVC and P60C040PVC
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • Certification No. C0065: 1
  • DE:
    • BSI-DSZ-CC-0837: 1
    • BSI-DSZ-CC-0837-2013: 22
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0035-2007: 3
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
  • EAL:
    • EAL 4: 3
    • EAL 5: 3
    • EAL 6: 4
    • EAL 6 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 2
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 1
    • ADV_INT.3: 2
    • ADV_SPM: 1
    • ADV_SPM.1: 2
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_TDS.5: 2
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 1
    • ALC_CMC.5: 3
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 3
    • ALC_FLR: 1
    • ALC_FLR.1: 6
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 1
    • ALC_TAT.3: 3
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 3
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 2
    • ATE_COV.3: 2
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 3
    • ATE_DPT.4: 1
    • ATE_FUN: 2
    • ATE_FUN.1: 1
    • ATE_FUN.2: 2
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 2
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 5
  • R:
    • R.O: 5
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 21
    • NXP Semiconductors: 31
pdf_data/report_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 4
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 4
  • DES:
    • 3DES:
      • Triple-DES: 3
    • DES:
      • DES: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 2
pdf_data/report_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 12
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • physical probing: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 20: 1
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 3
    • AIS 37: 1
    • AIS 38: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 3.0, 2012-10-18 (confidential document) [16] Product Data Sheet Addendum, SmartMX2 family, Post Delivery Configuration, NXP Semiconductors: 1
    • Evaluation Technical Report, BSI-DSZ-CC-0837, Version 4, 2013-03-27, TÜV Informationstechnik GmbH (confidential document) [10] ETR for composite evaluation according to AIS 36 for the Product NXP Secure Smart Card: 1
    • P60x080/052/040PVC, Version 5, 2013-04-23, [9] TÜV Informationstechnik GmbH (confidential document) [11] NXP Secure Smart Card Controller P60x080/052/040PVC, Configuration List, NXP Semiconductors: 1
    • Rev. 1.0, 2012-11-22 (confidential document) [15] Wafer and delivery specification, SmartMX2 family P60x040/052/080 VC, NXP Semiconductors, Rev: 1
    • Rev. 3.1, 2012-12-12 (confidential document) [17] Product Data Sheet Addendum, SmartMX2 family, Chip Health Mode, NXP Semiconductors, Rev. 3.0: 1
    • Rev. 3.3, 2012-12-11 (confidential document) [19] Order Entry Form, P60D080, NXP Semiconductors, Version 0.2, 2012-05-07 [20] Order Entry Form: 1
    • Unit Identification, Rev 01.00, 2012-12-11 (confidential document) 9 specifically • AIS 20, Version 2, Funktionalitätsklassen und Evaluationsmethodologie für: 1
    • Unit Identification, Rev. 3.1, 2012-02-02 (confidential document) [14] Guidance and Operation Manual, NXP Secure Smart Card Controller P60x040/052/080VC, NXP: 1
    • Version 1.0, 2012-12-13, NXP Secure Smart Card Controller P60x080/052/040PVC, NXP Semiconductors (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
    • confidential document) [18] Product Data Sheet Addendum, SmartMX2 family, Firmware Interface Specification, Firmware, NXP: 1
    • family P60x040/052/080 VC, NXP Semiconductors, Business Unit Identification, Rev. 3.0, 2012-10-31 (confidential document) [13] Instruction set for the SmartMX2 family, Secure smart card controller, NXP Semiconductors: 1
pdf_data/report_metadata
  • /CreationDate: D:20061122204438+09'00'
  • /ModDate: D:20061122204438+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /Title: untitled
  • pdf_file_size_bytes: 20053
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20130702103841+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, smart card, security controller, chip platform, NXP P60"
  • /ModDate: D:20130702105453+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: IT security
  • /Title: Certification Report BSI-DSZ-CC-0837-2013
  • pdf_file_size_bytes: 1090954
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 38
pdf_data/st_filename 0837b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0837: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 6: 2
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL6: 36
    • EAL6 augmented: 3
    • EAL6+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.4: 3
    • ADV_FSP.5: 11
    • ADV_IMP: 1
    • ADV_IMP.2: 4
    • ADV_INT.3: 1
    • ADV_SPM: 2
    • ADV_SPM.1: 1
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 4
    • ALC_CMC.4: 3
    • ALC_CMC.5: 4
    • ALC_CMS: 4
    • ALC_CMS.4: 3
    • ALC_CMS.5: 5
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.1: 5
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.3: 4
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 2
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 7
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 3
    • FCS_COP.1: 23
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 9
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 36
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 32
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_FLS.1: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 5
    • FDP_ITC.2: 5
    • FDP_ITT.1: 14
    • FDP_SDI.1: 1
    • FDP_SDI.2: 7
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 4
    • FMT_MSA.1: 25
    • FMT_MSA.1.1: 2
    • FMT_MSA.3: 20
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 19
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 7
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 13
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITT.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.CUST_RECONFIG: 5
    • O.EEPROM_INTEGRITY: 5
    • O.FM_FW: 9
    • O.HW_AES: 7
    • O.INTEGRITY_CHK: 7
    • O.MEM_ACCESS: 9
    • O.RND: 3
    • O.SFR_ACCESS: 9
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 108
    • NXP Semiconductors: 33
  • Philips:
    • Philips: 1
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 33
  • DES:
    • 3DES:
      • TDEA: 3
      • TDES: 1
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 2
      • DES: 16
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 14
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
  • SmartMX:
    • SmartMX: 1
    • SmartMX2: 18
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 13
    • fault injection: 3
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 13
    • Physical Probing: 2
    • physical probing: 1
    • side channel: 1
    • timing attacks: 2
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 2
    • CCMB-2009-07-003: 2
    • CCMB-2009-07-004: 2
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 14443: 20
    • ISO/IEC 18092: 2
    • ISO/IEC 7816: 22
    • ISO/IEC 7816-3: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: NXP Semiconductors
  • /CreationDate: D:20121219105730
  • /Creator: Microsoft® Office Word 2007
  • /Keywords: CC Security Evaluation, Security Target, Functional Requirements, Security Functionality, Assurance Level EAL6+, P60D144PVA, P60D080PVA
  • /ModDate: D:20121219120949+01'00'
  • /Producer: Microsoft® Office Word 2007
  • /Subject: P60x080/052/040PVC
  • /Title: Security Target
  • pdf_file_size_bytes: 1374099
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 82
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state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
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