Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
HiRDB / Single Server Version 7 07-03
JISEC-CC-CRP-C0065 		S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
BSI-DSZ-CC-0452-2007
name HiRDB / Single Server Version 7 07-03 S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
category Databases ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 07.10.2013 01.09.2019
not_valid_before 22.11.2006 10.09.2007
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0065_ecvr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0452a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0452b.pdf
manufacturer Hitachi, Ltd. Samsung Electronics Co., Ltd.
manufacturer_web https://www.hitachi.com/ https://www.samsung.com
security_level EAL1 ADV_IMP.2, AVA_VLA.4, AVA_MSU.3, EAL4+, ALC_DVS.2
dgst 6b0ce7e3167a63fb 4cb552bf7281a5e3
heuristics/cert_id JISEC-CC-CRP-C0065 BSI-DSZ-CC-0452-2007
heuristics/cert_lab [] BSI
heuristics/extracted_sars {} ATE_COV.2, ADV_RCR.1, ALC_TAT.1, ADV_FSP.1, AVA_VLA.4, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_IMP.2, ATE_DPT.1, AVA_SOF.1, ADV_SPM.1, AVA_MSU.3
heuristics/extracted_versions 7, 07, 03 16, 2
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0501-2008
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0438-2007
heuristics/report_references/indirectly_referenced_by {} KECS-ISIS-0378-2012, KECS-ISIS-0222-2010, BSI-DSZ-CC-0501-2008, ANSSI-CC-2012/09, BSI-DSZ-CC-0624-2010
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0400-2007, BSI-DSZ-CC-0438-2007
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0098
  • certification_date:
  • claim: EAL1
  • enhanced:
    • assurance_level: EAL1
    • description: PRODUCT DESCRIPTION This TOE(HiRDB / Single Server Version 8) is a software product for Relational Database Management System(RDBMS). The TOE acts as a database server and provides access to the information stored in the database. Users generally access to the information stored in the database by requests for SQL execution at HiRDB server from HiRDB clients. The TOE provides functions that work for various and efficient data manipulation to meet the needs of users. And it also provides security functions that restrict access to user data to authorized users. Security functions of the TOE include the following. - Audit - Discretionary Access Control - Identification and Authentication - Security Management
    • evaluation_facility: Electronic Commerce Security Technology Laboratory Inc. Evaluation Center
    • product: HiRDB / Single Server Version 8
    • product_type: IT Product (Data Base Management System)
    • toe_version: 08-01
    • vendor: Hitachi, Ltd.
  • expiration_date: 01.10.2013
  • supplier: Hitachi, Ltd.
  • toe_japan_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0098_it7133.html
  • toe_japan_name: HiRDB / Single Server Version 8 08-01
  • toe_overseas_link: None
  • toe_overseas_name: -----
pdf_data/report_filename c0065_ecvr.pdf 0452a.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0452-2007
    • cert_item: S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
    • cert_lab: BSI
    • developer: Samsung Electronics Co., Ltd. Certification Report V1.0 ZS-01-01-F-326 V4.0 BSI -
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • Certification No. C0065: 1
  • DE:
    • BSI-DSZ-CC-0438-2007: 4
    • BSI-DSZ-CC-0452-2007: 21
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 7
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
  • EAL:
    • EAL 1: 1
    • EAL 4: 10
    • EAL 4 augmented: 2
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 6
    • EAL4 augmented: 1
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 3
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 5
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon Technologies AG: 1
  • Philips:
    • Philips: 1
  • Samsung:
    • Samsung: 16
pdf_data/report_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • Triple-DES: 2
    • DES:
      • DES: 5
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 2
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 3
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • physical probing: 1
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 20: 4
    • AIS 25: 2
    • AIS 26: 3
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 2
    • AIS 36: 2
    • AIS 38: 1
    • AIS20: 3
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 16-Bit RISC Microcontroller for Smart Card, Version 2, ETR Version 2, 28. August 2007, TÜViT (confidential document) [9] Protection Profile BSI-PP-0002-2001, Smart card IC Platform Protection Profile, Version 1.0: 1
    • 16-Bit RISC Microcontroller for Smart Card, Version 2, ETR-Lite Version 2, 28. August 2007, TÜViT (confidential document) [11] Configuration Management Documentation (Class ACM_AUT/CAP/SCP) – Project Cheyenne Version 1.1: 1
    • 2007-07-23 (confidential document) [12] User’s manual S3CC9GC/GW/LC 16-Bit CMOS Microcontroller for Smart Card, Version 5, 2007-06-05: 1
    • S3CC9LC 16-bit RISC Microcontroller for Smart Cards – Project Cheyenne, Version 1.0, 21 March 2007 (confidential document) [7] Security Target Lite of S3CC9LC 16-bit RISC Microcontroller for Smart Cards Version 1.0, 9th: 1
pdf_data/report_metadata
  • /CreationDate: D:20061122204438+09'00'
  • /ModDate: D:20061122204438+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /Title: untitled
  • pdf_file_size_bytes: 20053
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: BSI
  • /Company: BSI, Postfach 200363, 53133 Bonn
  • /CreationDate: D:20070924150656+02'00'
  • /Creator: Acrobat PDFMaker 8.1 für Word
  • /Keywords: Common Criteria, Certification, Zertifizierung, Samsung Electronics Co., Ltd, S3CC9LC 16-Bit RISC Microcontroller for Smart Card Version 2
  • /ModDate: D:20070924152012+02'00'
  • /Producer: Acrobat Distiller 8.1.0 (Windows)
  • /SourceModified: D:20070924114800
  • /Title: Certification Report BSI-DSZ-CC-0452-2007
  • pdf_file_size_bytes: 295256
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 38
pdf_data/st_filename 0452b.pdf
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002: 8
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL4: 10
    • EAL4 augmented: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 3
    • ADV_HLD: 1
    • ADV_HLD.1: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_IMP.2: 5
    • ADV_LLD: 1
    • ADV_LLD.1: 3
    • ADV_RCR: 1
    • ADV_RCR.1: 2
    • ADV_SPM: 1
    • ADV_SPM.1: 5
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 4
    • AGD_USR: 2
    • AGD_USR.1: 4
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 2
    • ALC_TAT.1: 2
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_MSU.3: 6
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 7
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 1
    • FAU_SAS: 3
    • FAU_SAS.1: 8
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 29
    • FCS_CKM.1.1: 3
    • FCS_CKM.2: 4
    • FCS_CKM.4: 19
    • FCS_CKM.4.1: 2
    • FCS_COP: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RND: 2
    • FCS_RND.1: 8
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 21
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 12
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_CKM.2: 1
    • FDP_IFC: 2
    • FDP_IFC.1: 22
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 15
    • FDP_ITC.1.1: 2
    • FDP_ITC.1.2: 2
    • FDP_ITC.1.3: 2
    • FDP_ITC.2: 17
    • FDP_ITC.2.1: 2
    • FDP_ITC.2.2: 2
    • FDP_ITC.2.3: 2
    • FDP_ITC.2.4: 2
    • FDP_ITC.2.5: 2
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 2
  • FMT:
    • FMT_LIM: 4
    • FMT_LIM.1: 14
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 1
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 21
    • FMT_MSA.2.1: 2
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS: 1
    • FPT_FLS.1: 22
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 2
    • FPT_PHP.3: 18
    • FPT_PHP.3.1: 1
    • FPT_SEP: 2
    • FPT_SEP.1: 10
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
    • FPT_TDC.1: 2
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 18
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 5
  • T:
    • T.RND: 4
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 13
      • T-DES: 1
      • Triple-DES: 1
    • DES:
      • DES: 12
  • miscellaneous:
    • SEED:
      • SEED: 1
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 10
    • RNG: 3
pdf_data/st_keywords/cipher_mode
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 8
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • Malfunction: 24
    • malfunction: 12
    • physical tampering: 2
  • SCA:
    • DPA: 5
    • Leak-Inherent: 20
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 3
    • physical probing: 6
    • side-channel: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 3
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 20: 2
    • AIS20: 3
  • FIPS:
    • FIPS PUB 46-3: 2
  • ISO:
    • ISO/IEC 15408-2005: 1
    • ISO/IEC 9796-1: 3
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: bryant
  • /CreationDate: D:20070809135307+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /ModDate: D:20070809135307+09'00'
  • /Producer: Acrobat Distiller 6.0.1 (Windows)
  • /Title: Microsoft Word - ST Lite C9LC v1.0.doc
  • pdf_file_size_bytes: 530227
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 61
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
state/st/txt_hash Different Different