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HiRDB / Single Server Version 7 07-03
JISEC-CC-CRP-C0065 		S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2
BSI-DSZ-CC-0501-2008
name HiRDB / Single Server Version 7 07-03 S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2
category Databases ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 07.10.2013 01.09.2019
not_valid_before 22.11.2006 01.07.2008
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0065_ecvr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501b.pdf
manufacturer Hitachi, Ltd. Samsung Electronics Co., Ltd.
manufacturer_web https://www.hitachi.com/ https://www.samsung.com
security_level EAL1 EAL5+, AVA_MSU.3, ALC_DVS.2, AVA_VLA.4
dgst 6b0ce7e3167a63fb 3f287c94d1039f0b
heuristics/cert_id JISEC-CC-CRP-C0065 BSI-DSZ-CC-0501-2008
heuristics/cert_lab [] BSI
heuristics/extracted_sars {} ALC_LCD.2, AGD_USR.1, ALC_DVS.2, AVA_SOF.1, ATE_COV.2, ATE_DPT.2, AGD_ADM.1, ADV_INT.1, ADV_RCR.2, ATE_FUN.1, ADV_IMP.2, ALC_TAT.2, ADV_HLD.3, AVA_VLA.4, ADV_SPM.3, ATE_IND.2, ADV_LLD.1, ADV_FSP.3, AVA_CCA.1, AVA_MSU.3
heuristics/extracted_versions 7, 07, 03 16, 2
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0624-2010, KECS-ISIS-0222-2010
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0452-2007
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2012/09, KECS-ISIS-0378-2012, KECS-ISIS-0222-2010, BSI-DSZ-CC-0624-2010
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0438-2007, BSI-DSZ-CC-0400-2007, BSI-DSZ-CC-0452-2007
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0098
  • certification_date:
  • claim: EAL1
  • enhanced:
    • assurance_level: EAL1
    • description: PRODUCT DESCRIPTION This TOE(HiRDB / Single Server Version 8) is a software product for Relational Database Management System(RDBMS). The TOE acts as a database server and provides access to the information stored in the database. Users generally access to the information stored in the database by requests for SQL execution at HiRDB server from HiRDB clients. The TOE provides functions that work for various and efficient data manipulation to meet the needs of users. And it also provides security functions that restrict access to user data to authorized users. Security functions of the TOE include the following. - Audit - Discretionary Access Control - Identification and Authentication - Security Management
    • evaluation_facility: Electronic Commerce Security Technology Laboratory Inc. Evaluation Center
    • product: HiRDB / Single Server Version 8
    • product_type: IT Product (Data Base Management System)
    • toe_version: 08-01
    • vendor: Hitachi, Ltd.
  • expiration_date: 01.10.2013
  • supplier: Hitachi, Ltd.
  • toe_japan_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0098_it7133.html
  • toe_japan_name: HiRDB / Single Server Version 8 08-01
  • toe_overseas_link: None
  • toe_overseas_name: -----
heuristics/st_references/directly_referenced_by {} KECS-ISIS-0222-2010
heuristics/st_references/indirectly_referenced_by {} KECS-ISIS-0222-2010
maintenance_updates
pdf_data/report_filename c0065_ecvr.pdf 0501a.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0501-2008
    • cert_item: S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2
    • cert_lab: BSI
    • developer: Samsung Electronics Co., Ltd
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • Certification No. C0065: 1
  • DE:
    • BSI-DSZ-CC-0452-2007: 1
    • BSI-DSZ-CC-0501: 1
    • BSI-DSZ-CC-0501-2008: 19
  • NL:
    • CC-0452-2007: 1
    • CC-0501: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
  • EAL:
    • EAL 1: 1
    • EAL 4: 5
    • EAL 5: 4
    • EAL 5 augmented: 4
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 6
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.2: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon Technologies AG: 1
  • Philips:
    • Philips: 1
  • Samsung:
    • Samsung: 17
pdf_data/report_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • 3DES:
      • Triple-DES: 5
    • DES:
      • DES: 7
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECDSA:
      • ECDSA: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 2
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • physical probing: 1
    • side-channel: 1
  • other:
    • Bellcore attack: 1
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 3
    • AIS 26: 2
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 2
    • AIS 36: 1
    • AIS 38: 1
    • AIS20: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 2, TÜViT (confidential document) [8] Configuration Management Documentation (Class ACM_AUT/CAP/SCP) – Project Cheyenne II, Version: 1
    • 3, 2008-05-09 Samsung Electronics (confidential document) [9] Security Target Lite of S3CC9LC 16-bit RISC Microcontroller for Smart Cards, Version 1.0: 1
    • EVALUATION (ETR-COMP), 8103842493 / BSI-DSZ- CC-0501, S3CC91A, Version 2, 2008-06-03, TÜViT (confidential document) [12] Security Application Note, S3CC9LC, Version 1.1, 2008-05-06, Samsung Electronics 8: 1
    • for Smart Cards – Project Cheyenne II, Version 1.4, 2008-04-29, Samsung Electronics (confidential document) [7] EVALUATION TECHNICAL REPORT-SUMMARY (ETR SUMMARY), 8103842493 / BSI-DSZ-CC-0501, S3CC9LC: 1
pdf_data/report_metadata
  • /CreationDate: D:20061122204438+09'00'
  • /ModDate: D:20061122204438+09'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /Title: untitled
  • pdf_file_size_bytes: 20053
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: Federal Office for Information Security
  • /CreationDate: D:20080717125300+02'00'
  • /Creator: Writer
  • /Keywords: "S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2, BSI-DSZ-CC-0501-2008, Samsung Electronics Co., Ltd."
  • /ModDate: D:20080717145955+02'00'
  • /Producer: StarOffice 8
  • /Subject: Common Criteria Zertifizierung
  • /Title: Zertifizierungsreport BSI-DSZ-CC-0501-2008
  • pdf_file_size_bytes: 569988
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename 0501b.pdf
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002: 8
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 1
    • EAL5: 8
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.3: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_HLD.3: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 2
    • ADV_RCR: 1
    • ADV_RCR.2: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 4
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 4
    • AGD_USR: 2
    • AGD_USR.1: 4
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_DPT.2: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_CCA.1: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_MSU.3: 6
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 7
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 1
    • FAU_SAS: 3
    • FAU_SAS.1: 8
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 29
    • FCS_CKM.1.1: 3
    • FCS_CKM.2: 4
    • FCS_CKM.4: 19
    • FCS_CKM.4.1: 2
    • FCS_COP: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RND: 2
    • FCS_RND.1: 8
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 21
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 12
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_CKM.2: 1
    • FDP_IFC: 2
    • FDP_IFC.1: 22
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 15
    • FDP_ITC.1.1: 2
    • FDP_ITC.1.2: 2
    • FDP_ITC.1.3: 2
    • FDP_ITC.2: 17
    • FDP_ITC.2.1: 2
    • FDP_ITC.2.2: 2
    • FDP_ITC.2.3: 2
    • FDP_ITC.2.4: 2
    • FDP_ITC.2.5: 2
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 2
  • FMT:
    • FMT_LIM: 4
    • FMT_LIM.1: 14
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 1
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 21
    • FMT_MSA.2.1: 2
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS: 1
    • FPT_FLS.1: 22
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 2
    • FPT_PHP.3: 18
    • FPT_PHP.3.1: 1
    • FPT_SEP: 2
    • FPT_SEP.1: 10
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
    • FPT_TDC.1: 2
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 18
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 5
  • T:
    • T.RND: 4
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 13
      • T-DES: 1
      • Triple-DES: 1
    • DES:
      • DES: 12
  • miscellaneous:
    • SEED:
      • SEED: 1
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 10
    • RNG: 3
pdf_data/st_keywords/cipher_mode
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 8
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • Malfunction: 24
    • malfunction: 12
    • physical tampering: 2
  • SCA:
    • DPA: 5
    • Leak-Inherent: 20
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 3
    • physical probing: 6
    • side-channel: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 3
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 20: 2
    • AIS20: 3
  • FIPS:
    • FIPS PUB 46-3: 2
  • ISO:
    • ISO/IEC 15408-2005: 1
    • ISO/IEC 7816: 4
    • ISO/IEC 9796-1: 3
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata
  • /Author: Kyungsuk Yi (Bryant)
  • /CreationDate: D:20080604112348+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Smartcard, IC, S3CC9LC, 16-bit RISC Microcontroller For Smart Cards, 16-bit CMOS Microcontroller For Smart Cards, Samsung Electronics
  • /ModDate: D:20080609165456+09'00'
  • /Producer: Acrobat Distiller 6.0.1 (Windows)
  • /Subject: Security Target Lite
  • /Title: Security Target Lite of S3CC9LC 16-bit RISC Microcontroller For Smart Cards
  • pdf_file_size_bytes: 536251
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 60
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state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
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