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ST Engineering Data Diode Model 328X
CSA_CC_20002 		Virtual Machine of Multos M3 G230M mask with AMD 113v4
ANSSI-CC-2013/40
name ST Engineering Data Diode Model 328X Virtual Machine of Multos M3 G230M mask with AMD 113v4
category Boundary Protection Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme SG FR
not_valid_after 09.06.2025 01.09.2019
not_valid_before 10.06.2020 04.07.2013
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC%20Certificate%20ST%20Data%20Diode%20328X.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ST%20Data%20Diode%20328X%20Certification%20Report%20v1.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC_2013-40fr.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/STEng%20Data%20Diode%20328X%20Security%20Target_v2.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-cible_2013-40en.pdf
manufacturer ST Engineering Electronics Multos international / Trusted Labs
manufacturer_web https://www.stengg.com https://www.multosiniternational.com
security_level EAL4+, AVA_VAN.5 EAL7
dgst 5ccf6e9e3b708da3 e2e9e34e9a3dfb6f
heuristics/cert_id CSA_CC_20002 ANSSI-CC-2013/40
heuristics/extracted_sars ADV_TDS.3, ASE_CCL.1, ATE_FUN.1, ASE_OBJ.2, AVA_VAN.5, ASE_INT.1, ALC_CMC.4, ASE_REQ.2, AGD_PRE.1, ATE_IND.2, ATE_DPT.1, ASE_ECD.1, ADV_IMP.1, ALC_LCD.1, ASE_SPD.1, ATE_COV.2, ALC_DVS.1, ALC_TAT.1, AGD_OPE.1, ALC_CMS.4, ALC_DEL.1, ASE_TSS.1, ADV_FSP.4, ADV_ARC.1 ADV_COMP.1
heuristics/report_references/directly_referencing {} ANSSI-CC-2013/39
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0813-2012, BSI-DSZ-CC-0640-2010, BSI-DSZ-CC-0728-2011, ANSSI-CC-2013/39
heuristics/st_references/directly_referencing {} BSI-DSZ-CC-0606-2010, BSI-DSZ-CC-0640-2010, BSI-DSZ-CC-0813-2012
heuristics/st_references/indirectly_referencing {} BSI-DSZ-CC-0606-2010, BSI-DSZ-CC-0640-2010, BSI-DSZ-CC-0728-2011, BSI-DSZ-CC-0813-2012
pdf_data/cert_filename CC Certificate ST Data Diode 328X.pdf
pdf_data/cert_keywords/cc_cert_id
  • SG:
    • CSA_CC_20002: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • An:
    • An Security: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /CreationDate: D:20200605154441Z
  • /Creator: PScript5.dll Version 5.2.2
  • /ModDate: D:20200629121408+08'00'
  • /Producer: iOS Version 13.4.1 (Build 17E262) Quartz PDFContext, AppendMode 1.1
  • /Title: Microsoft Word - [CER] CC Certificate ST Data Diode 328X
  • pdf_file_size_bytes: 625071
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename ST Data Diode 328X Certification Report v1.pdf ANSSI-CC_2013-40fr.pdf
pdf_data/report_frontpage
  • FR:
  • FR:
pdf_data/report_keywords/cc_cert_id
  • SG:
    • CSA_CC_20002: 2
  • FR:
    • ANSSI-CC-2013/39: 5
    • ANSSI-CC-2013/40: 17
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 1
  • EAL:
    • EAL 1: 1
    • EAL 3: 1
    • EAL 5: 1
    • EAL 7: 3
    • EAL4: 2
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 ElevĂ©: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ATE:
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.5: 1
  • ADV:
    • ADV_ARC: 1
    • ADV_FSP: 1
    • ADV_IMP: 1
    • ADV_INT: 1
    • ADV_SPM: 1
    • ADV_TDS: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_PRE: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMS: 1
    • ALC_DEL: 1
    • ALC_DVS: 1
    • ALC_FLR: 2
    • ALC_TAT: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_ECD: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_REQ: 1
    • ASE_SPD: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 1
    • ATE_DPT: 1
    • ATE_FUN: 1
    • ATE_IND: 1
  • AVA:
    • AVA_VAN: 2
pdf_data/report_keywords/cc_claims
  • OE:
    • OE.NETWORK: 1
    • OE.PHYSICAL: 1
    • OE.USER: 1
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon: 1
pdf_data/report_keywords/eval_facility
  • An:
    • An Security: 2
  • TrustedLabs:
    • Trusted Labs: 3
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 2
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-004: 1
    • CCMB-2018-04-003: 1
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
pdf_data/report_metadata
  • /CreationDate: D:20200615155403Z
  • /Creator: PScript5.dll Version 5.2.2
  • /ModDate: D:20200629121416+08'00'
  • /Producer: GPL Ghostscript 8.15
  • /Title: Microsoft Word - [CER] ST Data Diode 328X Certification Report
  • pdf_file_size_bytes: 1192136
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 20
  • /CreationDate:
  • /CreationDate--Text:
  • /Creator: PDFCreator Version 1.2.1
  • /Keywords:
  • /ModDate:
  • /ModDate--Text:
  • /Producer: GPL Ghostscript 9.02
  • /Subject:
  • /Title:
  • pdf_file_size_bytes: 176731
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 16
pdf_data/st_filename STEng Data Diode 328X Security Target_v2.pdf ANSSI-CC-cible_2013-40en.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0606-2010: 7
    • BSI-DSZ-CC-0640-2010: 7
    • BSI-DSZ-CC-0813-2012: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4+: 3
  • EAL:
    • EAL5+: 1
    • EAL7: 2
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ADV:
    • ADV_COMP.1: 1
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 2
    • FDP_IFC.2: 9
    • FDP_IFC.2.1: 1
    • FDP_IFC.2.2: 1
    • FDP_IFF: 1
    • FDP_IFF.1: 8
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
  • FMT:
    • FMT_MSA.3: 3
  • FAU:
    • FAU_ACC.2: 1
    • FAU_ARP: 3
    • FAU_ARP.1: 1
    • FAU_ARP.1.1: 1
    • FAU_GEN.1: 4
    • FAU_SAA: 3
    • FAU_SAA.1: 3
    • FAU_SAA.1.1: 1
    • FAU_SAA.1.2: 1
    • FAU_SAS.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_COP.1: 2
    • FCS_RND.1: 1
  • FDP:
    • FDP_ACC: 3
    • FDP_ACC.1: 4
    • FDP_ACC.2: 3
    • FDP_ACC.2.1: 2
    • FDP_ACC.2.2: 1
    • FDP_ACF: 3
    • FDP_ACF.1: 4
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 1
    • FDP_ITT.1: 1
    • FDP_ROL: 3
    • FDP_ROL.1: 1
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 1
  • FMT:
    • FMT_LIM.1: 1
    • FMT_LIM.2: 1
    • FMT_MSA.1: 1
    • FMT_MSA.3: 3
    • FMT_SMF.1: 1
  • FPT:
    • FPT_FLS: 3
    • FPT_FLS.1: 2
    • FPT_FLS.1.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
    • FPT_RCV: 3
    • FPT_RCV.4: 1
    • FPT_RCV.4.1: 1
    • FPT_TST.2: 1
  • FRU:
    • FRU_FLT.2: 1
    • FRU_RSA: 3
    • FRU_RSA.1: 1
    • FRU_RSA.1.1: 1
pdf_data/st_keywords/cc_claims
  • A:
    • A.NETWORK: 4
    • A.PHYSICAL: 4
    • A.USER: 3
  • O:
    • O.ONEWAY: 2
  • OE:
    • OE.NETWORK: 3
    • OE.PHYSICAL: 3
    • OE.USER: 3
  • T:
    • T.RCVDATALEAK: 1
  • A:
    • A.APPLI_CONT: 3
    • A.CIPHER: 3
    • A.CLON: 3
    • A.DECIPHER: 3
    • A.DIS_MEMORY: 3
    • A.LOAD: 4
    • A.MOD_MEMORY: 3
    • A.OPERATE: 3
    • A.REMOVE: 3
    • A.SECURITY: 4
    • A.SIDE: 3
    • A.TAMPER_ES: 4
  • O:
    • O.APPLI_DEV: 5
    • O.CIPHER: 2
    • O.CLON: 2
    • O.DECIPHER: 3
    • O.DEV_DIS_ES: 4
    • O.DIS_MEMORY: 2
    • O.DLV_: 2
    • O.DLV_DATA: 4
    • O.EFFECT_LOAD: 2
    • O.EFFECT_REMOVE: 2
    • O.INIT_ACS: 3
    • O.LOAD: 4
    • O.MOD_MEMORY: 1
    • O.OPERATE: 1
    • O.REMOVE: 3
    • O.RESOURCE: 1
    • O.RND: 1
    • O.ROLLBACK: 1
    • O.SAMPLE_ACS: 1
    • O.SECURITY: 2
    • O.SEGREGATE: 2
    • O.SIDE: 4
    • O.TAMPER_ES: 7
    • O.TEST_OPERA: 1
  • OSP:
    • OSP.CIPHER: 1
    • OSP.CONF-ALU: 1
  • T:
    • T.APP_CORR: 3
    • T.APP_DISC: 3
    • T.APP_MOD: 4
    • T.APP_READ: 3
    • T.APP_REMOVE: 4
    • T.DEL_REMOVE: 4
    • T.DIS_DATA: 6
    • T.DIS_TEST_ES: 2
    • T.ERR_REMOVE: 3
    • T.LOAD_APP: 4
    • T.LOAD_MAN: 2
    • T.LOAD_MOD: 2
    • T.LOAD_OTHER: 2
    • T.MOD: 2
    • T.MOD_DATA: 4
    • T.MOD_EXE: 4
    • T.MOD_LOAD: 2
    • T.MOD_SHARE: 2
    • T.MOD_TSF: 3
    • T.RESOURCES: 2
    • T.RND: 1
    • T.T_CMD: 4
    • T.T_ES: 2
    • T.T_TOOLS: 2
pdf_data/st_keywords/vendor
  • Infineon:
    • Infineon: 2
    • Infineon Technologies: 5
  • Thales:
    • Thales: 1
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 2
    • DES:
      • DES: 4
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 3
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 3
    • Physical Probing: 2
    • physical probing: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • for secure loading and execution of smartcard applications. Note that cryptographic primitives are out of scope. 1.6.4 Smartcard Product Life Cycle The Smartcard product life-cycle is decomposed into seven: 1
    • out of scope: 3
    • these elements are out of scope of the TOE: 1
    • this space in loading time and controls the access to its elements in runtime. (these elements are out of scope of the TOE) PUBLIC MULTOS M3 Common Criteria Virtual Machine Public Security Target Document: 1
    • to the context in which the security functions take place. Note that cryptographic primitives are out of scope. Table 12 shows how these security functions satisfy the TOE security functional requirements. 7.1: 1
pdf_data/st_metadata
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  • /ModDate: D:20200629121424+08'00'
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  • /Title: Microsoft Word - STEng Data Diode Security Target_v2.0_EAL4_Final
  • pdf_file_size_bytes: 316205
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
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state/cert/extract_ok True False
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