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Comparing certificates Experimental feature
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| ST Engineering Data Diode Model 328X CSA_CC_20002 |
Oberthur Technologies Applet ID One Classic v1.01.1 en configuration CNS, Classic ou CIE chargée sur Cosmo v7.0-n Large, Standard et Basic (modes dual ou contact) sur composants NXP ANSSI-CC-2010/27 |
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| name | ST Engineering Data Diode Model 328X | Oberthur Technologies Applet ID One Classic v1.01.1 en configuration CNS, Classic ou CIE chargée sur Cosmo v7.0-n Large, Standard et Basic (modes dual ou contact) sur composants NXP |
| category | Boundary Protection Devices and Systems | ICs, Smart Cards and Smart Card-Related Devices and Systems |
| scheme | SG | FR |
| not_valid_after | 09.06.2025 | 01.09.2019 |
| not_valid_before | 10.06.2020 | 20.05.2010 |
| cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC%20Certificate%20ST%20Data%20Diode%20328X.pdf | |
| report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ST%20Data%20Diode%20328X%20Certification%20Report%20v1.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC_2010-27fr.pdf |
| st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/STEng%20Data%20Diode%20328X%20Security%20Target_v2.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-cible_2010-27en.pdf |
| manufacturer | ST Engineering Electronics | Oberthur Technologies / NXP Semiconductors GmbH |
| manufacturer_web | https://www.stengg.com | https://www.oberthur.com/ |
| security_level | EAL4+, AVA_VAN.5 | EAL4+, AVA_VAN.5, ALC_DVS.2 |
| dgst | 5ccf6e9e3b708da3 | 7bb1d4b3ded1f4fb |
| heuristics/cert_id | CSA_CC_20002 | ANSSI-CC-2010/27 |
| heuristics/cert_lab | [] | THALES |
| heuristics/extracted_sars | ADV_TDS.3, ASE_CCL.1, ATE_FUN.1, ASE_OBJ.2, AVA_VAN.5, ASE_INT.1, ALC_CMC.4, ASE_REQ.2, AGD_PRE.1, ATE_IND.2, ATE_DPT.1, ASE_ECD.1, ADV_IMP.1, ALC_LCD.1, ASE_SPD.1, ATE_COV.2, ALC_DVS.1, ALC_TAT.1, AGD_OPE.1, ALC_CMS.4, ALC_DEL.1, ASE_TSS.1, ADV_FSP.4, ADV_ARC.1 | ADV_TDS.3, ASE_CCL.1, ATE_FUN.1, ASE_OBJ.2, AVA_VAN.5, ASE_INT.1, ALC_CMC.4, ASE_REQ.2, ADV_IMP.2, AGD_PRE.1, ASE_ECD.1, ALC_LCD.1, ALC_DVS.2, ASE_SPD.1, ATE_COV.2, ALC_TAT.1, AGD_OPE.1, ALC_CMS.4, ALC_DEL.1, ASE_TSS.1, ADV_FSP.4, ADV_ARC.1 |
| heuristics/extracted_versions | - | 7.0, 1.01.1 |
| heuristics/report_references/directly_referencing | {} | ANSSI-CC-2009/36, ANSSI-CC-2010/36, ANSSI-CC-2009/48 |
| heuristics/report_references/indirectly_referencing | {} | ANSSI-CC-2009/48, BSI-DSZ-CC-0411-2007, ANSSI-CC-2010/36, ANSSI-CC-2009/36, ANSSI-CC-2009/11, BSI-DSZ-CC-0410-2007, BSI-DSZ-CC-0404-2007 |
| heuristics/st_references/directly_referencing | {} | ANSSI-CC-2009/48 |
| heuristics/st_references/indirectly_referencing | {} | ANSSI-CC-2009/48 |
| maintenance_updates |
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| pdf_data/cert_filename | CC Certificate ST Data Diode 328X.pdf | |
| pdf_data/cert_keywords/cc_cert_id |
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| pdf_data/cert_keywords/cc_protection_profile_id | ||
| pdf_data/cert_keywords/cc_security_level |
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| pdf_data/cert_keywords/cc_sar |
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| pdf_data/cert_keywords/cc_sfr | ||
| pdf_data/cert_keywords/cc_claims | ||
| pdf_data/cert_keywords/vendor | ||
| pdf_data/cert_keywords/eval_facility |
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| pdf_data/cert_keywords/symmetric_crypto | ||
| pdf_data/cert_keywords/asymmetric_crypto | ||
| pdf_data/cert_keywords/pq_crypto | ||
| pdf_data/cert_keywords/hash_function | ||
| pdf_data/cert_keywords/crypto_scheme | ||
| pdf_data/cert_keywords/crypto_protocol | ||
| pdf_data/cert_keywords/randomness | ||
| pdf_data/cert_keywords/cipher_mode | ||
| pdf_data/cert_keywords/ecc_curve | ||
| pdf_data/cert_keywords/crypto_engine | ||
| pdf_data/cert_keywords/tls_cipher_suite | ||
| pdf_data/cert_keywords/crypto_library | ||
| pdf_data/cert_keywords/vulnerability | ||
| pdf_data/cert_keywords/side_channel_analysis | ||
| pdf_data/cert_keywords/technical_report_id | ||
| pdf_data/cert_keywords/device_model | ||
| pdf_data/cert_keywords/tee_name | ||
| pdf_data/cert_keywords/os_name | ||
| pdf_data/cert_keywords/cplc_data | ||
| pdf_data/cert_keywords/ic_data_group | ||
| pdf_data/cert_keywords/standard_id | ||
| pdf_data/cert_keywords/javacard_version | ||
| pdf_data/cert_keywords/javacard_api_const | ||
| pdf_data/cert_keywords/javacard_packages | ||
| pdf_data/cert_keywords/certification_process | ||
| pdf_data/cert_metadata |
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| pdf_data/report_filename | ST Data Diode 328X Certification Report v1.pdf | ANSSI-CC_2010-27fr.pdf |
| pdf_data/report_frontpage |
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| pdf_data/report_keywords/cc_cert_id |
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| pdf_data/report_keywords/cc_protection_profile_id |
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| pdf_data/report_keywords/cc_security_level |
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| pdf_data/report_keywords/cc_sar |
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| pdf_data/report_keywords/cc_claims |
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| pdf_data/report_keywords/vendor |
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| pdf_data/report_keywords/eval_facility |
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| pdf_data/report_keywords/symmetric_crypto |
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| pdf_data/report_keywords/standard_id |
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| pdf_data/report_metadata |
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| pdf_data/st_filename | STEng Data Diode 328X Security Target_v2.pdf | ANSSI-CC-cible_2010-27en.pdf |
| pdf_data/st_keywords/cc_cert_id |
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| pdf_data/st_keywords/cc_protection_profile_id |
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| pdf_data/st_keywords/cc_security_level |
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| pdf_data/st_keywords/cc_sar |
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| pdf_data/st_keywords/cc_sfr |
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| pdf_data/st_keywords/cc_claims |
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| pdf_data/st_keywords/vendor |
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| pdf_data/st_keywords/symmetric_crypto |
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| pdf_data/st_keywords/crypto_scheme |
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| pdf_data/st_keywords/cipher_mode |
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| pdf_data/st_keywords/side_channel_analysis |
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| pdf_data/st_keywords/standard_id |
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| pdf_data/st_keywords/javacard_version |
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| pdf_data/st_keywords/certification_process |
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| pdf_data/st_metadata |
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| state/cert/convert_ok | True | False |
| state/cert/download_ok | True | False |
| state/cert/extract_ok | True | False |
| state/cert/pdf_hash | Different | Different |
| state/cert/txt_hash | Different | Different |
| state/report/pdf_hash | Different | Different |
| state/report/txt_hash | Different | Different |
| state/st/pdf_hash | Different | Different |
| state/st/txt_hash | Different | Different |