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ST Engineering Data Diode Model 328X
CSA_CC_20002 		Samsung S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 9 with optional secure RSA 3.7S and ECC 2.4S Libraries including specific IC Dedicated Software
BSI-DSZ-CC-0624-2010
name ST Engineering Data Diode Model 328X Samsung S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 9 with optional secure RSA 3.7S and ECC 2.4S Libraries including specific IC Dedicated Software
category Boundary Protection Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme SG DE
status active archived
not_valid_after 09.06.2025 01.09.2019
not_valid_before 10.06.2020 29.01.2010
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC%20Certificate%20ST%20Data%20Diode%20328X.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ST%20Data%20Diode%20328X%20Certification%20Report%20v1.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0624a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/STEng%20Data%20Diode%20328X%20Security%20Target_v2.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0624b_pdf.pdf
manufacturer ST Engineering Electronics Samsung Electronics Co., Ltd.
manufacturer_web https://www.stengg.com https://www.samsung.com
security_level AVA_VAN.5, EAL4+ EAL5+
dgst 5ccf6e9e3b708da3 164184f3ca5502fb
heuristics/cert_id CSA_CC_20002 BSI-DSZ-CC-0624-2010
heuristics/cert_lab [] BSI
heuristics/extracted_sars ADV_IMP.1, AVA_VAN.5, ADV_ARC.1, ADV_FSP.4, ATE_IND.2, AGD_PRE.1, ALC_CMC.4, AGD_OPE.1, ASE_REQ.2, ASE_ECD.1, ATE_COV.2, ASE_OBJ.2, ASE_SPD.1, ADV_TDS.3, ASE_INT.1, ASE_TSS.1, ALC_DEL.1, ATE_DPT.1, ALC_DVS.1, ALC_TAT.1, ASE_CCL.1, ALC_LCD.1, ATE_FUN.1, ALC_CMS.4 ATE_IND.2, ADV_FSP.3, ALC_LCD.2, AVA_SOF.1, ALC_TAT.2, ADV_SPM.3, ADV_RCR.2, ADV_IMP.2, AVA_CCA.1, AVA_MSU.3, ADV_LLD.1, ADV_INT.1, ALC_DVS.2, ATE_COV.2, AGD_USR.1, ADV_HLD.3, AGD_ADM.1, ATE_DPT.2, AVA_VLA.4, ATE_FUN.1
heuristics/extracted_versions - 2.4, 3.7
heuristics/report_references/directly_referenced_by {} KECS-ISIS-0378-2012, ANSSI-CC-2012/09
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0501-2008
heuristics/report_references/indirectly_referenced_by {} KECS-ISIS-0378-2012, ANSSI-CC-2012/09
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0501-2008, BSI-DSZ-CC-0452-2007, BSI-DSZ-CC-0438-2007, BSI-DSZ-CC-0400-2007
heuristics/st_references/directly_referenced_by {} KECS-ISIS-0378-2012
heuristics/st_references/indirectly_referenced_by {} KECS-ISIS-0378-2012
maintenance_updates
pdf_data/cert_filename CC Certificate ST Data Diode 328X.pdf
pdf_data/cert_keywords/cc_cert_id
  • SG:
    • CSA_CC_20002: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • An:
    • An Security: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
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  • /Producer: iOS Version 13.4.1 (Build 17E262) Quartz PDFContext, AppendMode 1.1
  • /Title: Microsoft Word - [CER] CC Certificate ST Data Diode 328X
  • pdf_file_size_bytes: 625071
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename ST Data Diode 328X Certification Report v1.pdf 0624a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0624-2010
    • cert_item: Samsung S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 9 with optional secure RSA 3.7S and ECC 2.4S Libraries including specific IC Dedicated Software
    • cert_lab: BSI
    • developer: Samsung Electronics Co., Ltd
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • SG:
    • CSA_CC_20002: 2
  • DE:
    • BSI-DSZ-CC-0501-2008: 2
    • BSI-DSZ-CC-0624-2009: 1
    • BSI-DSZ-CC-0624-2010: 19
  • NL:
    • CC-0624: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002-2001: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 1
  • EAL:
    • EAL 1: 1
    • EAL 4: 5
    • EAL 5: 4
    • EAL 5 augmented: 3
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 6
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ATE:
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.5: 1
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.2: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/cc_claims
  • OE:
    • OE.NETWORK: 1
    • OE.PHYSICAL: 1
    • OE.USER: 1
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon Technologies AG: 1
  • Philips:
    • Philips: 1
  • Samsung:
    • Samsung: 30
pdf_data/report_keywords/eval_facility
  • An:
    • An Security: 2
  • TUV:
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • 3DES:
      • Triple-DES: 5
    • DES:
      • DES: 7
  • constructions:
    • MAC:
      • HMAC: 3
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 39
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA1: 2
    • SHA2:
      • SHA224: 4
      • SHA256: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 3
    • physical probing: 1
    • side-channel: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-004: 1
    • CCMB-2018-04-003: 1
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
  • BSI:
    • AIS 20: 3
    • AIS 25: 3
    • AIS 26: 3
    • AIS 31: 1
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 2
    • AIS 36: 1
    • AIS 38: 1
    • AIS20: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 1.6, 2009-08-05, Samsung (confidential document) [9] Security Target Lite of S3CC9LC 16-bit RISC Microcontroller for Smart Cards – Project Cheyenne: 1
    • 2, 2010-01-28, TÜViT (confidential document) [8] Configuration Management Documentation (Class ACM_AUT/CAP/SCP) – Project Cheyenne II Site: 1
    • Evaluation (ETR-COMP), 8104953923 / BSI-DSZ-CC- 0624, S3CC9LC, Version 2, 2010-01-28, TÜViT (confidential document) 8 specifically • AIS 20, Version 1, 2 December 1999, Funktionalitätsklassen und: 1
    • including specific IC Dedicated Software, Version 2.1, 20th November 2009 Samsung Electronics (confidential document) [7] Evaluation Technical Report Summary (ETR SUMMARY), 8105621102 / BSI-DSZ- CC-0624, S3CC9LC: 1
pdf_data/report_metadata
  • /CreationDate: D:20200615155403Z
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  • /Title: Microsoft Word - [CER] ST Data Diode 328X Certification Report
  • pdf_file_size_bytes: 1192136
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 20
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20100208102410+01'00'
  • /Creator: Writer
  • /Keywords: "Samsung S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 9 with optional secure RSA 3.7S and ECC 2.4S Libraries including specific IC Dedicated Software, Samsung Electronics Co, Ltd."
  • /ModDate: D:20100210110815+01'00'
  • /Producer: StarOffice 9
  • /Subject: Common Criteria Certification
  • /Title: Certificationreport BSI-DSZ-CC-0624-2010
  • pdf_file_size_bytes: 815194
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 38
pdf_data/st_filename STEng Data Diode 328X Security Target_v2.pdf 0624b_pdf.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0002: 10
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4+: 3
  • EAL:
    • EAL4: 1
    • EAL5: 8
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.3: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_HLD.3: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 2
    • ADV_RCR: 1
    • ADV_RCR.2: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 5
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 4
    • AGD_USR: 2
    • AGD_USR.1: 4
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_DPT.2: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_CCA.1: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_MSU.3: 6
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 7
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 2
    • FDP_IFC.2: 9
    • FDP_IFC.2.1: 1
    • FDP_IFC.2.2: 1
    • FDP_IFF: 1
    • FDP_IFF.1: 8
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
  • FMT:
    • FMT_MSA.3: 3
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 1
    • FAU_SAS: 3
    • FAU_SAS.1: 8
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM: 5
    • FCS_CKM.1: 41
    • FCS_CKM.1.1: 3
    • FCS_CKM.2: 4
    • FCS_CKM.4: 29
    • FCS_CKM.4.1: 3
    • FCS_COP: 17
    • FCS_COP.1: 35
    • FCS_RND: 2
    • FCS_RND.1: 8
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 24
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 12
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_CKM.2: 2
    • FDP_IFC: 2
    • FDP_IFC.1: 25
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 23
    • FDP_ITC.1.1: 3
    • FDP_ITC.1.2: 3
    • FDP_ITC.1.3: 3
    • FDP_ITC.2: 26
    • FDP_ITC.2.1: 3
    • FDP_ITC.2.2: 3
    • FDP_ITC.2.3: 3
    • FDP_ITC.2.4: 3
    • FDP_ITC.2.5: 3
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 2
  • FMT:
    • FMT_LIM: 4
    • FMT_LIM.1: 14
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 1
    • FMT_MSA: 2
    • FMT_MSA.1: 13
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 29
    • FMT_MSA.2.1: 3
    • FMT_MSA.3: 14
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 9
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS: 1
    • FPT_FLS.1: 22
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 2
    • FPT_PHP.3: 18
    • FPT_PHP.3.1: 1
    • FPT_SEP: 2
    • FPT_SEP.1: 10
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
    • FPT_TDC.1: 3
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 18
  • FTP:
    • FTP_ITC.1: 3
    • FTP_TRP.1: 3
pdf_data/st_keywords/cc_claims
  • A:
    • A.NETWORK: 4
    • A.PHYSICAL: 4
    • A.USER: 3
  • O:
    • O.ONEWAY: 2
  • OE:
    • OE.NETWORK: 3
    • OE.PHYSICAL: 3
    • OE.USER: 3
  • T:
    • T.RCVDATALEAK: 1
  • O:
    • O.RND: 5
  • T:
    • T.RND: 4
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 3
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 13
      • T-DES: 1
      • TDEA: 2
      • Triple-DES: 1
    • DES:
      • DES: 10
  • constructions:
    • MAC:
      • HMAC: 3
  • miscellaneous:
    • SEED:
      • SEED: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 83
    • ECDH:
      • ECDH: 10
    • ECDSA:
      • ECDSA: 25
  • FF:
    • DH:
      • Diffie-Hellman: 2
    • DSA:
      • DSA: 2
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 1
      • SHA1: 5
    • SHA2:
      • SHA-224: 2
      • SHA-256: 1
      • SHA224: 8
      • SHA256: 8
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 10
    • RNG: 3
pdf_data/st_keywords/cipher_mode
  • ECB:
    • ECB: 2
pdf_data/st_keywords/ecc_curve
  • Brainpool:
    • brainpoolP192r1: 4
    • brainpoolP224r1: 5
    • brainpoolP256r1: 5
    • brainpoolP320r1: 1
    • brainpoolP384r1: 5
    • brainpoolP512r1: 1
  • NIST:
    • P-192: 10
    • P-224: 10
    • P-256: 10
    • P-384: 10
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 17
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 4
    • Malfunction: 24
    • malfunction: 12
    • physical tampering: 2
  • SCA:
    • DPA: 10
    • Leak-Inherent: 20
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 6
    • physical probing: 6
    • side channel: 2
    • side-channel: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 3
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS 20: 2
    • AIS20: 3
  • FIPS:
    • FIPS PUB 180-3: 6
  • ISO:
    • ISO/IEC 15408-2005: 1
    • ISO/IEC 7816: 6
pdf_data/st_metadata
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  • /Title: Microsoft Word - STEng Data Diode Security Target_v2.0_EAL4_Final
  • pdf_file_size_bytes: 316205
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
  • /Author: KyungSuk YI (Bryant)
  • /Baustein: SLE66C82P/SLE66C42P
  • /BausteinVersion: a15
  • /Classification: Public
  • /Comments:
  • /Company:
  • /CreationDate: D:20091216150432+09'00'
  • /Creator: Word용 Acrobat PDFMaker 9.1
  • /Datum: 23-10-2003
  • /Dokument: Security Target
  • /EEPROM: 8 kBytes
  • /Jahr: 2003
  • /Keywords: Security Target of Samsung S3CC9LC 16-bit Secure RISC Microcontroller for Smart Card with optional Secure RSA and ECC Library including specific IC Dedicated Software
  • /ModDate: D:20100128181239+09'00'
  • /PP_Augmentations: Smartcard Integrated Circuit Platform Augmentations V0.98
  • /PP_Date: July 2001
  • /PP_Short: BSI-PP-0002; Version 1.0, July 2001
  • /PP_Version: 1.0
  • /Producer: Acrobat Distiller 9.2.0 (Windows)
  • /Protection Profile: Smartcard IC Platform Protection Profile
  • /ROM: 64 kBytes
  • /SourceModified: D:20091216060245
  • /Subject: Security Target Lite
  • /Technologie: 0,22 µm
  • /Title: Security Target Lite of Samsung S3CC9LC 16-bit Secure RISC Microcontroller for Smart Card with optional Secure RSA and ECC Library including specific IC Dedicated Software
  • /Version: 1.2
  • /XRAM: 2 kBytes
  • /m-Nummer: m1474/m1495
  • pdf_file_size_bytes: 518043
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 70
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