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	Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A 2019-48-INF-3811	NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB NSCIB-CC-2200030-02-CR
name	Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A	NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	ES	NL
status	active	active
not_valid_after	07.06.2027	19.11.2029
not_valid_before	07.06.2022	19.11.2024
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48_Certificado.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-02.1-Cert.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20INF-3811.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-02-CR.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20ST_lite.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-02-STLite_v09.pdf
manufacturer	Winbond Electonics Corporation	NXP Semiconductors Germany GmbH
manufacturer_web	https://www.winbond.com/	https://www.nxp.com
security_level	EAL5+, AVA_VAN.5, ALC_DVS.2	EAL5+, ASE_TSS.2, AVA_VAN.5, ALC_DVS.2, ALC_FLR.1
dgst	51a1149f945dea23	cd79a4200be9f14f
heuristics/cert_id	2019-48-INF-3811	NSCIB-CC-2200030-02-CR
heuristics/cert_lab	[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ALC_LCD.1, ASE_CCL.1, AGD_OPE.1, ASE_SPD.1, ASE_OBJ.2, ATE_DPT.3, ATE_COV.2, ALC_CMS.5, ADV_ARC.1, ATE_FUN.1, ADV_IMP.1, ALC_DVS.2, ALC_TAT.2, ASE_INT.1, AVA_VAN.5, ASE_TSS.1, ADV_TDS.4, ALC_CMC.4, ADV_INT.2, ASE_REQ.2, ALC_DEL.1, ADV_FSP.5, AGD_PRE.1, ASE_ECD.1	ATE_IND.2, ALC_LCD.1, ASE_CCL.1, ADV_CMS.5, AGD_OPE.1, ASE_SPD.1, ALC_FLR.1, ASE_OBJ.2, ATE_DPT.3, ASE_TSS.2, ATE_COV.2, ALC_CMS.5, ADV_ARC.1, ATE_FUN.1, ADV_IMP.1, ALC_DVS.2, ALC_TAT.2, ASE_INT.1, AVA_VAN.5, ADV_TDS.4, ALC_CMC.4, ASE_REQ.2, ADV_INT.2, ALC_DEL.1, ADV_FSP.5, AGD_PRE.1, ASE_ECD.1
heuristics/extracted_versions	-	2.1.001
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	NSCIB-CC-2200041-03-CR
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	NSCIB-CC-2200041-03-CR
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data	category: Smart Cards and similiar devices certification_date: 07.06.2022 enhanced: category: Smart Cards and similiar devices cc_version: Common Criteria 3.1 release 5 cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1478 certification_date: 07.06.2022 description: The TOE is a memory flash IC designed to be embedded into highly critical hardware devices such as smart card, secure element, USB token, secure micro SD, etc. These devices will embed secure applications such as financial, telecommunication, identity (e-Government), etc. and will be working in a hostile environment. In particular, the TOE main function is the secure storage of the code and data of critical applications. The security needs for the TOE consist in: Maintaining the integrity of the content of the memories and the confidentiality of the content of protected memory areas as required by the critical HW products (e.g. Security IC) the Memory Flash is built for. Providing a secure communication with the Host device that will embed the TOE in a secure HW product such as Security IC. evaluation_facility: Applus Laboratories level: EAL5 + ALC_DVS.2 + AVA_VAN.5 manufacturer: Winbond Electronics Corporation report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1479 status: Certified target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1477 type: Product manufacturer: Winbond Electronics Corporation product: Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/826-winbond-spiflash-trustme-secure-flash-memory-w75f40wbyjeg-version-a	cert_id: NSCIB-CC-2200030-02-CR cert_link: https://trustcb.com/download/?wpdmdl=4627 certification_date: 19.11.2024 developer: NXP Semiconductors GmbH evaluation_facility: TÜV Informationstechnik level: EAL5 + ALC_DVS.2, ALC_FLR.1, ASE_TSS.2, and AVA_VAN.5 product: NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB report_link: https://trustcb.com/download/?wpdmdl=4628 status: Issued target_link: https://trustcb.com/download/?wpdmdl=4629
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	NSCIB-CC-2200030-01-CR
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	NSCIB-CC-2200030-01-CR
heuristics/protection_profiles	{}	cf0f01bcd7be3e9c
maintenance_updates
protection_profiles
protection_profile_links	{}	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename	2019-48_Certificado.pdf	NSCIB-CC-2200030-02.1-Cert.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id		NL: NSCIB-2200030-02: 1 NSCIB-CC-2200030-02: 1
pdf_data/cert_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level	EAL: EAL 2: 1 EAL5: 1	EAL: EAL 7: 1 EAL2: 1 EAL5: 1 EAL5 augmented: 1
pdf_data/cert_keywords/cc_sar	ALC: ALC_DVS.2: 1 ALC_FLR: 1 AVA: AVA_VAN.5: 1	ALC: ALC_DVS.2: 1 ALC_FLR: 1 ALC_FLR.1: 1 ALC_FLR.3: 1 ASE: ASE_TSS.2: 1 AVA: AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims	O: O.E: 1
pdf_data/cert_keywords/vendor		NXP: NXP: 1 NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility	Applus: Applus Laboratories: 1	TUV: TÜV Informationstechnik: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id		ISO: ISO/IEC 15408-1: 2 ISO/IEC 18045: 4 ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 880365 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 2	/Author: Wim Ton /CreationDate: D:20250129091455+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20250129091455+00'00' /Producer: Microsoft® Word 2021 /Title: NSCIB Certificate pdf_file_size_bytes: 87710 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1
pdf_data/report_filename	2019-48 INF-3811.pdf	NSCIB-CC-2200030-02-CR.pdf
pdf_data/report_frontpage	NL:	NL: cert_id: NSCIB-CC-2200030-02-CR cert_item: NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB cert_lab: TÜV Informationstechnik GmbH developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id	ES: 2019-48-INF-3811- v1: 1	NL: NSCIB-2200030-02: 1 NSCIB-CC-2200030-02: 2 NSCIB-CC-2200030-02-CR: 11
pdf_data/report_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level	EAL: EAL 1: 1 EAL 2: 1 EAL 4: 2 EAL2: 1 EAL5: 8 ITSEC: ITSEC Evaluation: 1	EAL: EAL 5: 1 EAL 5 augmented: 1 EAL4: 1 EAL5: 1 EAL5 augmented: 1 EAL5+: 1
pdf_data/report_keywords/cc_sar	ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_IMP.1: 1 ADV_TDS.4: 1 AGD: AGD_OPE.1: 1 ALC: ALC_CMC.4: 1 ALC_DEL.1: 1 ALC_DVS.2: 8 ALC_FLR: 3 ALC_LCD.1: 1 ASE: ASE_CCL.1: 1 ASE_INT.1: 1 ASE_REQ.2: 1 ATE: ATE_COV.2: 1 ATE_FUN.1: 1 AVA: AVA_VAN.5: 9	ALC: ALC_DVS.2: 2 ALC_FLR.1: 2 ASE: ASE_TSS.2: 2 AVA: AVA_VAN: 1 AVA_VAN.5: 3
pdf_data/report_keywords/cc_sfr	FDP: FDP_IFC.1: 1 FDP_RIP.1: 1 FDP_SDI.2: 1 FDP_UIT.1: 1 FMT: FMT_LIM.1: 1 FPT: FPT_FLS: 2 FPT_ITT.1: 1 FPT_TRP.1: 1 FRU: FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor		NXP: NXP: 13 NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility	Applus: Applus Laboratories: 5	TUV: TÜV Informationstechnik: 3
pdf_data/report_keywords/symmetric_crypto
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness		RNG: RNG: 1
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: fault injection: 2 other: JIL: 1	SCA: side-channel: 1 other: JIL: 2 JIL-AAPS: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name		IBM: SE: 2
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id		ISO: ISO/IEC 7816: 2
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 964023 pdf_hyperlinks: http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 14	/Author: Wim Ton /CreationDate: D:20241125113844+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20241125113844+00'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 229956 pdf_hyperlinks: mailto:[email protected], http://www.commoncriteriaportal.org/, https://nscib.nl/, https://www.sogis.eu/, https://trustcb.com/common-criteria/nscib/ pdf_is_encrypted: False pdf_number_of_pages: 11
pdf_data/st_filename	2019-48 ST_lite.pdf	NSCIB-CC-2200030-02-STLite_v09.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id		NL: NSCIB-2200030-01: 1
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-PP-0084: 1	BSI: BSI-CC-PP-0084-2014: 1 BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level	EAL: EAL5: 6 EAL5 augmented: 2	EAL: EAL4: 1 EAL5: 13 EAL5 augmented: 2 EAL5+: 3
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC: 1 ADV_ARC.1: 6 ADV_FSP.1: 3 ADV_FSP.2: 3 ADV_FSP.4: 1 ADV_FSP.5: 8 ADV_IMP.1: 9 ADV_INT.2: 1 ADV_TDS.1: 2 ADV_TDS.3: 4 ADV_TDS.4: 8 AGD: AGD_OPE.1: 6 AGD_PRE.1: 6 ALC: ALC_CMC.4: 1 ALC_CMS.1: 1 ALC_CMS.5: 1 ALC_DEL.1: 1 ALC_DVS.1: 2 ALC_DVS.2: 9 ALC_LCD.1: 3 ALC_TAT.1: 2 ALC_TAT.2: 3 ASE: ASE_CCL.1: 1 ASE_ECD.1: 5 ASE_INT.1: 5 ASE_OBJ.2: 3 ASE_REQ.1: 2 ASE_REQ.2: 2 ASE_SPD.1: 2 ASE_TSS.1: 1 ATE: ATE_COV.1: 2 ATE_COV.2: 3 ATE_DPT.1: 1 ATE_DPT.3: 1 ATE_FUN.1: 6 AVA: AVA_VAN.5: 10	ADV: ADV_ARC.1: 5 ADV_CMS.4: 1 ADV_CMS.5: 1 ADV_FSP: 1 ADV_FSP.1: 2 ADV_FSP.2: 3 ADV_FSP.4: 4 ADV_FSP.5: 5 ADV_IMP.1: 6 ADV_INT.2: 1 ADV_TDS.1: 5 ADV_TDS.3: 2 ADV_TDS.4: 3 AGD: AGD_OPE.1: 4 AGD_PRE.1: 2 ALC: ALC_CMC.4: 2 ALC_CMS: 1 ALC_CMS.4: 2 ALC_CMS.5: 4 ALC_DEL.1: 2 ALC_DVS.1: 1 ALC_DVS.2: 5 ALC_FLR.1: 6 ALC_LCD.1: 3 ALC_TAT.1: 4 ALC_TAT.2: 2 ASE: ASE_CCL: 2 ASE_CCL.1: 2 ASE_ECD: 1 ASE_ECD.1: 3 ASE_INT: 2 ASE_INT.1: 4 ASE_OBJ.2: 3 ASE_REQ: 2 ASE_REQ.1: 2 ASE_REQ.2: 2 ASE_SPD: 2 ASE_SPD.1: 2 ASE_TSS: 2 ASE_TSS.2: 6 ATE: ATE_COV.1: 1 ATE_COV.2: 2 ATE_DPT.1: 1 ATE_DPT.3: 2 ATE_FUN.1: 7 ATE_IND.2: 1 AVA: AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr	FDP: FDP_ACC.1: 3 FDP_ACF: 1 FDP_IFC.1: 27 FDP_IFC.1.1: 1 FDP_IFF.1: 4 FDP_ITT.1: 13 FDP_ITT.1.1: 1 FDP_RIP.1: 8 FDP_RIP.1.1: 1 FDP_SDC: 4 FDP_SDC.1: 16 FDP_SDC.1.1: 2 FDP_SDI: 1 FDP_SDI.2: 11 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FDP_UCT.1: 8 FDP_UCT.1.1: 1 FDP_UIT.1: 8 FDP_UIT.1.1: 1 FDP_UIT.1.2: 1 FMT: FMT_LIM: 5 FMT_LIM.1: 22 FMT_LIM.1.1: 2 FMT_LIM.2: 19 FMT_LIM.2.1: 2 FPT: FPT_FLS: 24 FPT_FLS.1: 3 FPT_ITT.1: 12 FPT_ITT.1.1: 1 FPT_PHP.3: 14 FPT_PHP.3.1: 1 FRU: FRU_FLT.2: 12 FRU_FLT.2.1: 1 FTP: FTP_ITC.1: 2 FTP_TRP.1: 11 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 1	FAU: FAU_SAS: 1 FAU_SAS.1: 5 FAU_SAS.1.1: 1 FCS: FCS_RNG: 6 FCS_RNG.1: 3 FDP: FDP_IFC.1: 7 FDP_ITT.1: 6 FDP_SDC: 1 FDP_SDC.1: 5 FDP_SDC.1.1: 1 FDP_SDI: 4 FDP_SDI.1: 1 FDP_SDI.2: 3 FMT: FMT_LIM: 1 FMT_LIM.1: 4 FMT_LIM.2: 3 FPT: FPT_FLS.1: 8 FPT_ITT.1: 6 FPT_PHP.3: 7 FRU: FRU_FLT.2: 8 FTP: FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims		O: O.RND: 1 O.RND_HW: 4 T: T.RND: 1 T.RND_HW: 3
pdf_data/st_keywords/vendor		NXP: NXP: 111 NXP Semiconductors: 29
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto		AES_competition: AES: AES: 2 DES: DES: DES: 1
pdf_data/st_keywords/asymmetric_crypto		ECC: ECC: ECC: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme	MAC: MAC: 2
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness		RNG: RND: 2 RNG: 12
pdf_data/st_keywords/cipher_mode		CBC: CBC: 1 CFB: CFB: 1 CTR: CTR: 1 GCM: GCM: 2 OFB: OFB: 1
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Fault Injection: 1 Malfunction: 17 fault injection: 2 malfunction: 3 physical tampering: 3 SCA: Leak-Inherent: 17 Physical Probing: 2 physical probing: 5	FI: Malfunction: 5 malfunction: 1 SCA: Leak-Inherent: 5 Physical Probing: 2 physical probing: 2 side channel: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	CC: CCMB-2017-04-004: 1 ISO: ISO/IEC 7816-3: 1	BSI: AIS31: 1 CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 2 CCMB-2017-04-003: 2 CCMB-2017-04-004: 2 FIPS: FIPS 140-3: 2 ISO: ISO/IEC 7816: 4
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 639311 pdf_hyperlinks: http://en.wikipedia.org/wiki/De_facto_standard, http://en.wikipedia.org/wiki/Full_duplex, http://en.wikipedia.org/wiki/Serial_communications, http://en.wikipedia.org/wiki/Synchronous_circuit pdf_is_encrypted: False pdf_number_of_pages: 47	/Author: NXP B.V. /CreationDate: D:20230509104646+02'00' /Creator: DITA Open Toolkit 3.3.1 /Keywords: NXP, ASE, SN300 B2 Single Chip Secured (NFC) Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL5 augmented /Producer: Apache FOP Version 2.3 /Subject: NXP SN300 B2 Series - Secure Element /Title: Security Target Lite pdf_file_size_bytes: 846702 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 37
state/cert/convert_garbage	False	False
state/cert/convert_ok	True	True
state/cert/download_ok	True	True
state/cert/extract_ok	True	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different