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Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
2019-48-INF-3811 		NXP Secure Smart Card Controller P5CD080V0B, P5CN080V0B and P5CC080V0B each with specific IC Dedicated Software
BSI-DSZ-CC-0410-2007
name Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A NXP Secure Smart Card Controller P5CD080V0B, P5CN080V0B and P5CC080V0B each with specific IC Dedicated Software
scheme ES DE
status active archived
not_valid_after 07.06.2027 01.09.2019
not_valid_before 07.06.2022 05.07.2007
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48_Certificado.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20INF-3811.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0410a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20ST_lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0410b.pdf
manufacturer Winbond Electonics Corporation NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.winbond.com/ https://www.nxp.com
security_level EAL5+, AVA_VAN.5, ALC_DVS.2 EAL5+, ALC_DVS.2, AVA_MSU.3, AVA_VLA.4
dgst 51a1149f945dea23 bcd0e4e3bb198e0b
heuristics/cert_id 2019-48-INF-3811 BSI-DSZ-CC-0410-2007
heuristics/cert_lab [] BSI
heuristics/indirect_transitive_cves {} CVE-2021-3011
heuristics/extracted_sars ALC_LCD.1, ASE_CCL.1, AGD_OPE.1, ASE_SPD.1, ASE_OBJ.2, ATE_DPT.3, ATE_COV.2, ALC_CMS.5, ADV_ARC.1, ATE_FUN.1, ADV_IMP.1, ALC_DVS.2, ALC_TAT.2, ASE_INT.1, AVA_VAN.5, ASE_TSS.1, ADV_TDS.4, ALC_CMC.4, ADV_INT.2, ASE_REQ.2, ALC_DEL.1, ADV_FSP.5, AGD_PRE.1, ASE_ECD.1 ATE_IND.2, ADV_RCR.2, ADV_SPM.3, AGD_ADM.1, ADV_IMP.2, ADV_FSP.3, ADV_INT.1, ASE_REQ.1, AVA_CCA.1, ATE_COV.2, ASE_PPC.1, AGD_USR.1, ATE_FUN.1, ASE_DES.1, ADV_LLD.1, ALC_DVS.2, ALC_TAT.2, ALC_LCD.2, ASE_INT.1, ASE_SRE.1, ASE_OBJ.1, AVA_SOF.1, ATE_DPT.2, ASE_TSS.1, AVA_MSU.3, AVA_VLA.4, ADV_HLD.3, ASE_ENV.1
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2009/48, ANSSI-CC-2009/19, BSI-DSZ-CC-0674-2011, BSI-DSZ-CC-0608-2010, BSI-DSZ-CC-0704-2010, BSI-DSZ-CC-0446-2007, BSI-DSZ-CC-0521-2008, ANSSI-CC-2008/13, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0417-2008, BSI-DSZ-CC-0518-2008, BSI-DSZ-CC-0567-2009, BSI-DSZ-CC-0798-2012, ANSSI-CC-2009/03, BSI-DSZ-CC-0537-2009, BSI-DSZ-CC-0799-2012, BSI-DSZ-CC-0673-2010, BSI-DSZ-CC-0680-2010, ANSSI-CC-2012/45, ANSSI-CC-2008/14, ANSSI-CC-2008/45, ANSSI-CC-2008/28, BSI-DSZ-CC-0463-2008, BSI-DSZ-CC-0625-2010, BSI-DSZ-CC-0797-2012, BSI-DSZ-CC-0532-2008, BSI-DSZ-CC-0575-2009, BSI-DSZ-CC-0603-2010, BSI-DSZ-CC-0527-2008, BSI-DSZ-CC-0635-2010, BSI-DSZ-CC-0506-2008, BSI-DSZ-CC-0582-2009, ANSSI-CC-2009/20, BSI-DSZ-CC-0533-2009, BSI-DSZ-CC-0571-2008, ANSSI-CC-2008/12, BSI-DSZ-CC-0643-2010, BSI-DSZ-CC-0604-2010, BSI-DSZ-CC-0479-2008, BSI-DSZ-CC-0658-2010, BSI-DSZ-CC-0634-2009, BSI-DSZ-CC-0602-2009, BSI-DSZ-CC-0522-2008
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0404-2007
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2009/19, BSI-DSZ-CC-0748-2011, BSI-DSZ-CC-0446-2007, ANSSI-CC-2008/13, BSI-DSZ-CC-0518-2008, BSI-DSZ-CC-0642-2011, BSI-DSZ-CC-0798-2012, ANSSI-CC-2012/46, ANSSI-CC-2013/70, BSI-DSZ-CC-0742-2011, BSI-DSZ-CC-0673-2010, BSI-DSZ-CC-0680-2010, BSI-DSZ-CC-0447-2008, ANSSI-CC-2012/09, ANSSI-CC-2010/39, BSI-DSZ-CC-0700-2011, BSI-DSZ-CC-0730-2011, BSI-DSZ-CC-0479-2008, BSI-DSZ-CC-0747-2011, BSI-DSZ-CC-0741-2011, BSI-DSZ-CC-0674-2011, BSI-DSZ-CC-0609-2010, BSI-DSZ-CC-0417-2008, BSI-DSZ-CC-0861-2014, ANSSI-CC-2009/07, BSI-DSZ-CC-0799-2012, BSI-DSZ-CC-0746-2012, BSI-DSZ-CC-0797-2012, BSI-DSZ-CC-0625-2010, ANSSI-CC-2010/27, ANSSI-CC-2011/21, BSI-DSZ-CC-0603-2010, BSI-DSZ-CC-0575-2009, ANSSI-CC-2012/10, BSI-DSZ-CC-0533-2009, BSI-DSZ-CC-0439-2008, ANSSI-CC-2008/12, ANSSI-CC-2008/16, BSI-DSZ-CC-0604-2010, ANSSI-CC-2010/59, BSI-DSZ-CC-0700-V2-2013, ANSSI-CC-2009/48, BSI-DSZ-CC-0521-2008, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0567-2009, ANSSI-CC-2009/03, BSI-DSZ-CC-0744-2011, ANSSI-CC-2012/45, BSI-DSZ-CC-0661-2011, ANSSI-CC-2008/45, ANSSI-CC-2008/28, BSI-DSZ-CC-0710-2010, BSI-DSZ-CC-0463-2008, ANSSI-CC-2009/08, ANSSI-CC-2010/06, BSI-DSZ-CC-0532-2008, ANSSI-CC-2010/58, BSI-DSZ-CC-0635-2010, BSI-DSZ-CC-0515-2009, BSI-DSZ-CC-0506-2008, BSI-DSZ-CC-0582-2009, BSI-DSZ-CC-0745-2012, BSI-DSZ-CC-0568-2008, BSI-DSZ-CC-0643-2010, BSI-DSZ-CC-0731-2011, BSI-DSZ-CC-0709-2010, BSI-DSZ-CC-0743-2011, BSI-DSZ-CC-0602-2009, BSI-DSZ-CC-0522-2008, BSI-DSZ-CC-0528-2008, BSI-DSZ-CC-0440-2008, BSI-DSZ-CC-0608-2010, BSI-DSZ-CC-0704-2010, BSI-DSZ-CC-0694-2012, BSI-DSZ-CC-0576-2009, BSI-DSZ-CC-0537-2009, BSI-DSZ-CC-0812-2012, ANSSI-CC-2008/14, BSI-DSZ-CC-0675-2011, ANSSI-CC-2009/17, BSI-DSZ-CC-0527-2008, ANSSI-CC-2009/20, BSI-DSZ-CC-0571-2008, BSI-DSZ-CC-0658-2010, BSI-DSZ-CC-0634-2009
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0404-2007
heuristics/scheme_data
  • category: Smart Cards and similiar devices
  • certification_date: 07.06.2022
  • enhanced:
    • category: Smart Cards and similiar devices
    • cc_version: Common Criteria 3.1 release 5
    • cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1478
    • certification_date: 07.06.2022
    • description: The TOE is a memory flash IC designed to be embedded into highly critical hardware devices such as smart card, secure element, USB token, secure micro SD, etc. These devices will embed secure applications such as financial, telecommunication, identity (e-Government), etc. and will be working in a hostile environment. In particular, the TOE main function is the secure storage of the code and data of critical applications. The security needs for the TOE consist in: Maintaining the integrity of the content of the memories and the confidentiality of the content of protected memory areas as required by the critical HW products (e.g. Security IC) the Memory Flash is built for. Providing a secure communication with the Host device that will embed the TOE in a secure HW product such as Security IC.
    • evaluation_facility: Applus Laboratories
    • level: EAL5 + ALC_DVS.2 + AVA_VAN.5
    • manufacturer: Winbond Electronics Corporation
    • report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1479
    • status: Certified
    • target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1477
    • type: Product
  • manufacturer: Winbond Electronics Corporation
  • product: Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/826-winbond-spiflash-trustme-secure-flash-memory-w75f40wbyjeg-version-a
heuristics/st_references/directly_referenced_by {} BSI-DSZ-CC-0674-2011, BSI-DSZ-CC-0704-2010, BSI-DSZ-CC-0446-2007, BSI-DSZ-CC-0521-2008, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0417-2008, BSI-DSZ-CC-0518-2008, BSI-DSZ-CC-0567-2009, BSI-DSZ-CC-0798-2012, BSI-DSZ-CC-0537-2009, BSI-DSZ-CC-0799-2012, BSI-DSZ-CC-0673-2010, BSI-DSZ-CC-0680-2010, BSI-DSZ-CC-0463-2008, BSI-DSZ-CC-0532-2008, BSI-DSZ-CC-0603-2010, ANSSI-CC-2011/21, BSI-DSZ-CC-0527-2008, BSI-DSZ-CC-0635-2010, BSI-DSZ-CC-0506-2008, BSI-DSZ-CC-0515-2009, BSI-DSZ-CC-0582-2009, BSI-DSZ-CC-0533-2009, BSI-DSZ-CC-0571-2008, BSI-DSZ-CC-0643-2010, BSI-DSZ-CC-0604-2010, BSI-DSZ-CC-0634-2009, BSI-DSZ-CC-0602-2009, BSI-DSZ-CC-0522-2008
heuristics/st_references/indirectly_referenced_by {} BSI-DSZ-CC-0674-2011, BSI-DSZ-CC-0704-2010, BSI-DSZ-CC-0446-2007, BSI-DSZ-CC-0521-2008, BSI-DSZ-CC-0804-2012, BSI-DSZ-CC-0417-2008, BSI-DSZ-CC-0518-2008, BSI-DSZ-CC-0567-2009, BSI-DSZ-CC-0798-2012, BSI-DSZ-CC-0537-2009, BSI-DSZ-CC-0799-2012, BSI-DSZ-CC-0673-2010, BSI-DSZ-CC-0680-2010, BSI-DSZ-CC-0463-2008, BSI-DSZ-CC-0797-2012, BSI-DSZ-CC-0532-2008, BSI-DSZ-CC-0603-2010, ANSSI-CC-2011/21, BSI-DSZ-CC-0527-2008, BSI-DSZ-CC-0635-2010, BSI-DSZ-CC-0506-2008, BSI-DSZ-CC-0515-2009, BSI-DSZ-CC-0582-2009, BSI-DSZ-CC-0533-2009, BSI-DSZ-CC-0571-2008, BSI-DSZ-CC-0643-2010, BSI-DSZ-CC-0604-2010, BSI-DSZ-CC-0634-2009, BSI-DSZ-CC-0602-2009, BSI-DSZ-CC-0522-2008
maintenance_updates
pdf_data/cert_filename 2019-48_Certificado.pdf
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL5: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 880365
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
pdf_data/report_filename 2019-48 INF-3811.pdf 0410a.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0410-2007
    • cert_item: NXP Secure Smart Card Controller P5CD080V0B, P5CN080V0B and P5CC080V0B each with specific IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH Business Line Identification
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • ES:
    • 2019-48-INF-3811- v1: 1
  • DE:
    • BSI-DSZ-CC-0404-2007: 1
    • BSI-DSZ-CC-0410: 2
    • BSI-DSZ-CC-0410-2007: 24
  • NL:
    • CC-0404-2007: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0002-2001: 2
    • BSI-PP-0002-: 1
    • BSI-PP-0002-2001: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2: 1
    • EAL5: 8
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 1: 1
    • EAL 4: 2
    • EAL 5: 3
    • EAL 5 augmented: 3
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 9
    • EAL5: 8
    • EAL5 augmented: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 8
    • ALC_FLR: 3
    • ALC_LCD.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 9
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 2
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.3: 3
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 2
    • ADV_FSP.3: 2
    • ADV_HLD: 2
    • ADV_HLD.3: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 2
    • ADV_INT: 2
    • ADV_INT.1: 2
    • ADV_LLD: 2
    • ADV_LLD.1: 1
    • ADV_RCR: 2
    • ADV_RCR.2: 2
    • ADV_SPM: 2
    • ADV_SPM.3: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 1
    • AGD_USR: 2
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 3
    • ALC_TAT: 2
    • ALC_TAT.2: 3
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 2
    • ATE_COV.2: 1
    • ATE_DPT: 2
    • ATE_DPT.2: 2
    • ATE_FUN: 2
    • ATE_FUN.1: 1
    • ATE_IND: 2
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 2
    • AVA_CCA.1: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_SOF.1: 1
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 1
    • FDP_RIP.1: 1
    • FDP_SDI.2: 1
    • FDP_UIT.1: 1
  • FMT:
    • FMT_LIM.1: 1
  • FPT:
    • FPT_FLS: 2
    • FPT_ITT.1: 1
    • FPT_TRP.1: 1
  • FRU:
    • FRU_FLT.2: 1
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_CKM.4: 1
    • FCS_COP.1: 2
    • FCS_RND.1: 1
  • FDP:
    • FDP_ACC.1: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 1
    • FDP_ITC.1: 1
    • FDP_ITT.1: 1
  • FMT:
    • FMT_LIM.1: 1
    • FMT_LIM.2: 1
    • FMT_MSA.1: 2
    • FMT_MSA.2: 1
    • FMT_MSA.3: 2
    • FMT_SMF.1: 1
    • FMT_SMR.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
    • FPT_SEP.1: 2
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 27
    • NXP Semiconductors: 19
  • Philips:
    • Philips: 1
pdf_data/report_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 5
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 11
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 1
      • DES: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 4
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • fault injection: 2
  • other:
    • JIL: 1
  • FI:
    • Malfunction: 1
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • Physical Probing: 1
    • SPA: 1
    • physical probing: 1
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 25: 1
    • AIS 26: 2
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 1
    • AIS 36: 4
  • FIPS:
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
    • ISO/IEC15408: 2005: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • Card Controllers, NXP Semiconductors, Business Line Identification, Version 1.2, March 7th, 2007 (confidential document) [7] Security Target Lite, Evaluation of the P5CD080V0B, P5CC080V0B, P5CN080V0B Secure Smart Card: 1
    • NXP P5CD080V0B Secure Smart Card Controller, version 1.0, Date from June 08th, 2007, (confidential document) [9] Smart Card IC Platform Protection Profile, Version 1.0, July 2001, registered at the German: 1
pdf_data/report_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 964023
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 14
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /Company: BSI, Postfach 200363, 53133 Bonn
  • /CreationDate: D:20070712132652+02'00'
  • /Creator: Acrobat PDFMaker 7.0.7 für Word
  • /Keywords: Common Criteria, Certification, Zertifizierung, NXP Secure Smart Card Controller , NXP Semiconductors Germany GmbH
  • /ModDate: D:20070712143705+02'00'
  • /Producer: Acrobat Distiller 7.0.5 (Windows)
  • /SourceModified: D:20070712090200
  • /Title: Certification Report BSI-DSZ-CC-0410-2007
  • pdf_file_size_bytes: 305168
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 46
pdf_data/st_filename 2019-48 ST_lite.pdf 0410b.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0410: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0084: 1
  • BSI:
    • BSI-PP-0002-2001: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL5: 6
    • EAL5 augmented: 2
  • EAL:
    • EAL 5: 4
    • EAL 5 augmented: 2
    • EAL4: 4
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL5: 34
    • EAL5 augmented: 1
    • EAL5+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 6
    • ADV_FSP.1: 3
    • ADV_FSP.2: 3
    • ADV_FSP.4: 1
    • ADV_FSP.5: 8
    • ADV_IMP.1: 9
    • ADV_INT.2: 1
    • ADV_TDS.1: 2
    • ADV_TDS.3: 4
    • ADV_TDS.4: 8
  • AGD:
    • AGD_OPE.1: 6
    • AGD_PRE.1: 6
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.1: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 2
    • ALC_DVS.2: 9
    • ALC_LCD.1: 3
    • ALC_TAT.1: 2
    • ALC_TAT.2: 3
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 5
    • ASE_INT.1: 5
    • ASE_OBJ.2: 3
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 2
    • ATE_COV.2: 3
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 6
  • AVA:
    • AVA_VAN.5: 10
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 1
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 4
    • ACM_SCP.2: 4
    • ACM_SCP.3: 5
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 4
    • ADV_FSP.2: 4
    • ADV_FSP.3: 6
    • ADV_HLD: 1
    • ADV_HLD.3: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 4
    • ADV_RCR.2: 1
    • ADV_SPM: 1
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 2
    • AGD_USR: 2
    • AGD_USR.1: 2
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.2: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA.1: 1
    • AVA_MSU: 2
    • AVA_MSU.3: 1
    • AVA_SOF.1: 2
    • AVA_VLA.4: 3
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_ACC.1: 3
    • FDP_ACF: 1
    • FDP_IFC.1: 27
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 4
    • FDP_ITT.1: 13
    • FDP_ITT.1.1: 1
    • FDP_RIP.1: 8
    • FDP_RIP.1.1: 1
    • FDP_SDC: 4
    • FDP_SDC.1: 16
    • FDP_SDC.1.1: 2
    • FDP_SDI: 1
    • FDP_SDI.2: 11
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
    • FDP_UCT.1: 8
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 8
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FMT:
    • FMT_LIM: 5
    • FMT_LIM.1: 22
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 2
  • FPT:
    • FPT_FLS: 24
    • FPT_FLS.1: 3
    • FPT_ITT.1: 12
    • FPT_ITT.1.1: 1
    • FPT_PHP.3: 14
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT.2: 12
    • FRU_FLT.2.1: 1
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 1
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_CKM: 1
    • FCS_CKM.1: 6
    • FCS_CKM.4: 4
    • FCS_COP.1: 26
    • FCS_COP.1.1: 2
    • FCS_RND.1: 5
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC.1: 33
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 30
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 10
    • FDP_ITC: 1
    • FDP_ITC.1: 6
    • FDP_ITC.2: 6
    • FDP_ITT.1: 6
    • FDP_SDI.1: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 29
    • FMT_MSA.1.1: 2
    • FMT_MSA.2: 6
    • FMT_MSA.3: 22
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 14
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
    • FPT_SEP.1: 15
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
  • FRU:
    • FRU_FLT.2: 7
pdf_data/st_keywords/cc_claims
  • O:
    • O.CONFIG: 7
    • O.HW_AES: 7
    • O.MEM_ACCESS: 9
    • O.MF_FW: 7
    • O.RND: 3
    • O.SFR_ACCESS: 7
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 85
    • NXP Semiconductors: 16
  • Philips:
    • Philips: 3
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 38
  • DES:
    • 3DES:
      • TDEA: 3
      • Triple-DEA: 1
      • Triple-DES: 10
    • DES:
      • DEA: 2
      • DES: 29
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 11
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Fault Injection: 1
    • Malfunction: 17
    • fault injection: 2
    • malfunction: 3
    • physical tampering: 3
  • SCA:
    • Leak-Inherent: 17
    • Physical Probing: 2
    • physical probing: 5
  • FI:
    • Malfunction: 10
    • fault injection: 4
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • Leak-Inherent: 14
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 2
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-004: 1
  • ISO:
    • ISO/IEC 7816-3: 1
  • BSI:
    • AIS31: 3
  • CC:
    • CCMB-2005-08-001: 2
    • CCMB-2005-08-002: 2
    • CCMB-2005-08-003: 2
    • CCMB-2005-08-004: 1
  • FIPS:
    • FIPS PUB 197: 3
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
pdf_data/st_metadata
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