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Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
2019-48-INF-3811 		STMicroelectronics ST54L A02
NSCIB-CC-2300182-01-CR
name Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A STMicroelectronics ST54L A02
scheme ES NL
not_valid_after 07.06.2027 19.04.2029
not_valid_before 07.06.2022 19.04.2024
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48_Certificado.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-2300182-01-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20INF-3811.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300182-01-CR2.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2019-48%20ST_lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300182-01-ST.pdf
manufacturer Winbond Electonics Corporation STMicroelectronics
manufacturer_web https://www.winbond.com/ https://www.st.com/
security_level EAL5+, AVA_VAN.5, ALC_DVS.2 EAL6+, ALC_FLR.2
dgst 51a1149f945dea23 2bd2cc8a67ea9a19
heuristics/cert_id 2019-48-INF-3811 NSCIB-CC-2300182-01-CR
heuristics/cert_lab []
heuristics/extracted_sars ASE_CCL.1, ATE_FUN.1, ASE_OBJ.2, ATE_DPT.3, AVA_VAN.5, ASE_INT.1, ALC_CMC.4, ASE_REQ.2, ADV_INT.2, AGD_PRE.1, ASE_ECD.1, ADV_IMP.1, ADV_TDS.4, ALC_LCD.1, ALC_DVS.2, ASE_SPD.1, ATE_COV.2, ALC_CMS.5, AGD_OPE.1, ADV_FSP.5, ALC_DEL.1, ASE_TSS.1, ADV_ARC.1, ALC_TAT.2 ASE_CCL.1, ASE_OBJ.2, ALC_CMC.5, ATE_DPT.3, AVA_VAN.5, ASE_INT.1, ASE_REQ.2, ATE_FUN.2, ADV_IMP.2, AGD_PRE.1, ATE_IND.2, ASE_ECD.1, ALC_TAT.3, ALC_LCD.1, ALC_DVS.2, ADV_TDS.5, ALC_FLR.2, ASE_SPD.1, ATE_COV.3, ADV_INT.3, ALC_CMS.5, AGD_OPE.1, ADV_FSP.5, ALC_DEL.1, ASE_TSS.1, ADV_SPM.1, ADV_ARC.1
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/scheme_data
  • category: Smart Cards and similiar devices
  • certification_date: 07.06.2022
  • enhanced:
    • category: Smart Cards and similiar devices
    • cc_version: Common Criteria 3.1 release 5
    • cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1478
    • certification_date: 07.06.2022
    • description: The TOE is a memory flash IC designed to be embedded into highly critical hardware devices such as smart card, secure element, USB token, secure micro SD, etc. These devices will embed secure applications such as financial, telecommunication, identity (e-Government), etc. and will be working in a hostile environment. In particular, the TOE main function is the secure storage of the code and data of critical applications. The security needs for the TOE consist in: Maintaining the integrity of the content of the memories and the confidentiality of the content of protected memory areas as required by the critical HW products (e.g. Security IC) the Memory Flash is built for. Providing a secure communication with the Host device that will embed the TOE in a secure HW product such as Security IC.
    • evaluation_facility: Applus Laboratories
    • level: EAL5 + ALC_DVS.2 + AVA_VAN.5
    • manufacturer: Winbond Electronics Corporation
    • report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1479
    • status: Certified
    • target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1477
    • type: Product
  • manufacturer: Winbond Electronics Corporation
  • product: Winbond SpiFlash TrustME Secure Flash Memory W75F40WBYJEG version A
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/826-winbond-spiflash-trustme-secure-flash-memory-w75f40wbyjeg-version-a
heuristics/st_references/directly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/st_references/indirectly_referenced_by {} ANSSI-CC-2024/33, ANSSI-CC-2025/04, NSCIB-CC-2300130-02-CR
heuristics/protection_profiles {} cf0f01bcd7be3e9c
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename 2019-48_Certificado.pdf NSCIB-2300182-01-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-23-0638980: 1
    • NSCIB-2300182-01: 1
    • NSCIB-CC-2300182-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL5: 1
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL2: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
  • ALC:
    • ALC_FLR: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
pdf_data/cert_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 1
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 880365
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
  • /Author: JM2
  • /CreationDate: D:20240424204220+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240424204220+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 91592
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2019-48 INF-3811.pdf NSCIB-CC-2300182-01-CR2.pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-2300182-01-CR
    • cert_item: ST54L A02
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
pdf_data/report_keywords/cc_cert_id
  • ES:
    • 2019-48-INF-3811- v1: 1
  • NL:
    • CC-23-0638980: 1
    • NSCIB-2300182-01: 1
    • NSCIB-CC-2300182-01-CR: 1
    • NSCIB-CC-2300182-01-CR2: 10
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
    • EAL 2: 1
    • EAL 4: 2
    • EAL2: 1
    • EAL5: 8
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 2
    • EAL6 augmented: 1
    • EAL6+: 2
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 8
    • ALC_FLR: 3
    • ALC_LCD.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 9
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_FLR.1: 1
    • ALC_FLR.2: 3
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
pdf_data/report_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 1
    • FDP_RIP.1: 1
    • FDP_SDI.2: 1
    • FDP_UIT.1: 1
  • FMT:
    • FMT_LIM.1: 1
  • FPT:
    • FPT_FLS: 2
    • FPT_ITT.1: 1
    • FPT_TRP.1: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 3
pdf_data/report_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 5
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 2
  • constructions:
    • MAC:
      • CBC-MAC: 1
  • miscellaneous:
    • SM4:
      • SM4: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/report_keywords/crypto_engine
  • NesCrypt:
    • Nescrypt: 3
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • fault injection: 2
  • other:
    • JIL: 1
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 2
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/report_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 964023
  • pdf_hyperlinks: http://www.commoncriteriaportal.org/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 14
pdf_data/st_filename 2019-48 ST_lite.pdf NSCIB-CC-2300182-01-ST.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0084: 1
  • BSI:
    • BSI-CC-PP- 0084-2014: 10
    • BSI-CC-PP-0084-: 1
    • BSI-CC-PP-0084-2014: 64
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL5: 6
    • EAL5 augmented: 2
  • EAL:
    • EAL4: 1
    • EAL6: 23
    • EAL6 augmented: 2
    • EAL6+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 6
    • ADV_FSP.1: 3
    • ADV_FSP.2: 3
    • ADV_FSP.4: 1
    • ADV_FSP.5: 8
    • ADV_IMP.1: 9
    • ADV_INT.2: 1
    • ADV_TDS.1: 2
    • ADV_TDS.3: 4
    • ADV_TDS.4: 8
  • AGD:
    • AGD_OPE.1: 6
    • AGD_PRE.1: 6
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.1: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 2
    • ALC_DVS.2: 9
    • ALC_LCD.1: 3
    • ALC_TAT.1: 2
    • ALC_TAT.2: 3
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 5
    • ASE_INT.1: 5
    • ASE_OBJ.2: 3
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 2
    • ATE_COV.2: 3
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 6
  • AVA:
    • AVA_VAN.5: 10
  • ADV:
    • ADV_ARC: 2
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT.3: 1
    • ADV_SPM: 3
    • ADV_SPM.1: 3
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 3
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.5: 1
    • ALC_DEL: 3
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL: 4
    • ASE_CCL.1: 1
    • ASE_ECD: 4
    • ASE_ECD.1: 1
    • ASE_INT: 2
    • ASE_INT.1: 1
    • ASE_OBJ: 12
    • ASE_OBJ.2: 1
    • ASE_REQ: 31
    • ASE_REQ.2: 1
    • ASE_SPD: 9
    • ASE_SPD.1: 1
    • ASE_TSS: 7
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 3
    • ATE_COV.3: 1
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_ACC.1: 3
    • FDP_ACF: 1
    • FDP_IFC.1: 27
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 4
    • FDP_ITT.1: 13
    • FDP_ITT.1.1: 1
    • FDP_RIP.1: 8
    • FDP_RIP.1.1: 1
    • FDP_SDC: 4
    • FDP_SDC.1: 16
    • FDP_SDC.1.1: 2
    • FDP_SDI: 1
    • FDP_SDI.2: 11
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
    • FDP_UCT.1: 8
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 8
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 1
  • FMT:
    • FMT_LIM: 5
    • FMT_LIM.1: 22
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 2
  • FPT:
    • FPT_FLS: 24
    • FPT_FLS.1: 3
    • FPT_ITT.1: 12
    • FPT_ITT.1.1: 1
    • FPT_PHP.3: 14
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT.2: 12
    • FRU_FLT.2.1: 1
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 11
    • FTP_TRP.1.1: 1
    • FTP_TRP.1.2: 1
    • FTP_TRP.1.3: 1
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAR.1: 25
    • FAU_SAS: 2
    • FAU_SAS.1: 28
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 4
    • FCS_COP.1: 17
    • FCS_RNG: 2
    • FCS_RNG.1: 6
  • FDP:
    • FDP_ACC.1: 23
    • FDP_ACC.2: 14
    • FDP_ACF: 1
    • FDP_ACF.1: 30
    • FDP_IFC.1: 16
    • FDP_ITC.1: 2
    • FDP_ITC.2: 2
    • FDP_ITT.1: 10
    • FDP_SDC: 2
    • FDP_SDC.1: 8
    • FDP_SDI.2: 14
    • FDP_SMF.1: 2
    • FDP_SMR.1: 1
    • FDP_UCT.1: 16
    • FDP_UIT.1: 16
  • FIA:
    • FIA_API: 2
    • FIA_API.1: 6
    • FIA_UAU.1: 14
    • FIA_UID.1: 16
  • FMT:
    • FMT_LIM: 2
    • FMT_LIM.1: 29
    • FMT_LIM.2: 30
    • FMT_MSA.1: 28
    • FMT_MSA.3: 28
    • FMT_SMF.1: 23
    • FMT_SMR.1: 17
  • FPT:
    • FPT_FLS.1: 22
    • FPT_ITT.1: 9
    • FPT_PHP.3: 11
  • FRU:
    • FRU_FLT.2: 11
  • FTP:
    • FTP_ITC.1: 27
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • O:
    • O.C: 1
    • O.RND: 4
    • O.TOE-: 1
  • R:
    • R.O: 1
  • T:
    • T.RND: 3
pdf_data/st_keywords/vendor
  • Infineon:
    • Infineon Technologies: 1
  • NXP:
    • NXP: 1
  • Philips:
    • Philips: 1
  • STMicroelectronics:
    • STMicroelectronics: 26
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 13
      • AES-128: 1
      • AES-192: 1
      • AES-256: 1
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 7
    • DES:
      • DES: 18
  • miscellaneous:
    • SM4:
      • SM4: 3
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 7
    • RNG: 6
  • TRNG:
    • TRNG: 3
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 8
  • ECB:
    • ECB: 7
pdf_data/st_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 1
    • Nescrypt: 4
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Fault Injection: 1
    • Malfunction: 17
    • fault injection: 2
    • malfunction: 3
    • physical tampering: 3
  • SCA:
    • Leak-Inherent: 17
    • Physical Probing: 2
    • physical probing: 5
  • FI:
    • Malfunction: 13
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 14
    • Physical Probing: 4
    • physical probing: 3
    • side channel: 2
  • other:
    • JIL: 53
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 2
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-004: 1
  • ISO:
    • ISO/IEC 7816-3: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 23
    • CCMB-2017-04-003: 2
  • FIPS:
    • FIPS PUB 197: 3
  • ISO:
    • ISO/IEC 14888: 2
    • ISO/IEC 7816-3: 1
    • ISO/IEC 9796: 1
    • ISO/IEC 9796-2: 1
  • NIST:
    • NIST SP 800-38A: 2
    • NIST SP 800-67: 3
    • SP 800-38A: 2
    • SP 800-67: 1
  • PKCS:
    • PKCS #1: 2
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • The ST54L_SE is in the scope of this evaluation, while the ST54L_CLF is out of scope of this evaluation: 1
    • ES) is in User NVM. 46 Note: The ES is not part of the TOE and is out of scope of the evaluation: 1
    • Features Possible values NVM size 3.3 Mbytes, 2.5 Mbytes or 2 Mbytes MIFARE accelerator (out of scope) Active, Inactive SM3 accelerator (out of scope) Active, Inactive SM4 accelerator (out of scope: 1
    • Security IC Embedded Software (ES) is in User NVM. 46 Note: The ES is not part of the TOE and is out of scope of the evaluation. 1.6.3 TOE documentation 47 The user guidance documentation, part of the TOE: 1
    • out of scope: 5
    • out of scope) Active, Inactive SM3 accelerator (out of scope) Active, Inactive SM4 accelerator (out of scope: 1
    • to as the ST54L_SE). The ST54L_SE is in the scope of this evaluation, while the ST54L_CLF is out of scope of this evaluation. 19 Furthermore, the ST54L_SE features a MIFARE(a) Classic® cryptographic: 1
pdf_data/st_metadata
  • /Author: Christiane DROULERS
  • /CreationDate: D:20240222122049Z
  • /Creator: FrameMaker 11.0.2
  • /ModDate: D:20240223170819+01'00'
  • /Producer: Acrobat Distiller 11.0 (Windows)
  • /Title: SMD_ST54L_VA02_1P.book
  • pdf_file_size_bytes: 719927
  • pdf_hyperlinks: http://www.st.com
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 82
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