Comparing certificates Experimental feature

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STMicroelectronics NesLib 6.7.4 on ST33K1M5C and ST33K1M5T B01
NSCIB-CC-0322914-CR2 		STMicroelectronics NesLib 6.7.4 on ST33K1M5A and ST33K1M5M B02
NSCIB-CC-2300177-01-CR
name STMicroelectronics NesLib 6.7.4 on ST33K1M5C and ST33K1M5T B01 STMicroelectronics NesLib 6.7.4 on ST33K1M5A and ST33K1M5M B02
not_valid_after 24.11.2027 29.01.2029
not_valid_before 24.11.2022 29.01.2024
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-22-0322914_2-Cert.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300177-01-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0322914-CR2-1.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300177-01-CR-v2.0.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0322914-STlite%20_v02_0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300177-01-ST_lite_V03_2P.pdf
dgst 514463c90ec46f71 91e6ebfddb028fc6
heuristics/cert_id NSCIB-CC-0322914-CR2 NSCIB-CC-2300177-01-CR
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2024/05
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2024/05
heuristics/scheme_data
heuristics/st_references/directly_referenced_by {} ANSSI-CC-2024/05
heuristics/st_references/indirectly_referenced_by {} ANSSI-CC-2024/05
pdf_data/cert_filename NSCIB-CC-22-0322914_2-Cert.pdf NSCIB-CC-2300177-01-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2300177-01: 1
    • NSCIB-CC-2300177-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 2
  • AVA:
    • AVA_VAN.5: 1
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_claims
  • R:
    • R.L: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 1
    • ISO/IEC 15408-2: 1
    • ISO/IEC 15408-3: 1
    • ISO/IEC 18045: 2
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_metadata
  • /Author: kruitr
  • /CreationDate: D:20221130092647+01'00'
  • /Creator: Bullzip PDF Printer (11.0.0.2588)
  • /ModDate: D:20221130092913+01'00'
  • /Producer: PDF Printer / www.bullzip.com / FPG / TUV Rheinland Service GmbH
  • /Title: Microsoft Word - NSCIB-CC-22-0322914_2-Cert.doc
  • pdf_file_size_bytes: 237844
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: JM2
  • /CreationDate: D:20240130204701+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240130204701+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 93862
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-0322914-CR2-1.0.pdf NSCIB-CC-2300177-01-CR-v2.0.pdf
pdf_data/report_frontpage
  • NL:
    • cert_id: NSCIB-CC-0322914-CR2
    • cert_item: NesLib 6.7.4 on ST33K1M5C and ST33K1M5T B01
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
  • NL:
    • cert_id: NSCIB-CC-2300177-01-CR
    • cert_item: NesLib 6.7.4 on ST33K1M5A and ST33K1M5M B02
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
pdf_data/report_keywords/cc_cert_id
  • NL:
    • NSCIB-CC-0322914-CR2: 12
  • NL:
    • NSCIB-2300177-01: 1
    • NSCIB-CC-2300177-01-CR: 12
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 2
    • EAL6+: 1
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 3
    • EAL6+: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 2
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 2
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 1
pdf_data/report_metadata
pdf_data/st_filename NSCIB-CC-0322914-STlite _v02_0.pdf NSCIB-CC-2300177-01-ST_lite_V03_2P.pdf
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 6
  • T:
    • T.RND: 3
  • O:
    • O.ABUSE-FUNC: 3
    • O.ADD-FUNCTIONS: 3
    • O.ADD-FUNCTIONS-LIB: 2
    • O.IDENTIFICATION: 3
    • O.LEAK-: 2
    • O.LEAK-FORCED: 3
    • O.LEAK-INHERENT: 6
    • O.MALFUNCTION: 6
    • O.MEM-ACCESS: 3
    • O.PHYS-: 1
    • O.PHYS-MANIPULATION: 5
    • O.PHYS-PROBING: 5
    • O.RND: 6
  • OE:
    • OE.LIM-BLOCK-LOADER: 3
    • OE.LOADER-USAGE: 3
    • OE.PROCESS-SEC-IC: 3
    • OE.RESP-APPL: 3
  • T:
    • T.RND: 3
pdf_data/st_keywords/crypto_library
  • Neslib:
    • NESLIB 6.7.4: 1
    • NesLib 6.7: 2
    • NesLib 6.7.4: 40
  • Neslib:
    • NESLIB 6.7.4: 1
    • NesLib 6.7: 3
    • NesLib 6.7.4: 40
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 14
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 15
    • Physical Probing: 4
    • side channel: 13
  • other:
    • JIL: 28
  • FI:
    • Malfunction: 8
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 9
    • Physical Probing: 4
    • side channel: 13
  • other:
    • JIL: 28
pdf_data/st_metadata
  • /Author: Christiane DROULERS
  • /CreationDate: D:20220913135530Z
  • /Creator: FrameMaker 11.0
  • /ModDate: D:20220913141740+02'00'
  • /Producer: Acrobat Distiller 11.0 (Windows)
  • /Title: SMD_NL6_7_ST33K1M5_V02_0P.book
  • pdf_file_size_bytes: 797979
  • pdf_hyperlinks: http://www.st.com
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 68
  • /Author: feixbeno
  • /CreationDate: D:20230822101949Z
  • /Creator: FrameMaker 17.0.1
  • /CreatorTool: FrameMaker 17.0.1
  • /ModDate: D:20230822103317+02'00'
  • /Producer: Adobe PDF Library 17.0
  • /Title: SMD_NL6_7_ST33K1M5AM_V03_2P.pdf
  • /Trapped: /False
  • pdf_file_size_bytes: 1883067
  • pdf_hyperlinks: http://www.st.com
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 68
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