Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
Micro-circuit S3CJ9QD (reference S3CJ9QDX01 rev. 6)
ANSSI-CC-2005/37
Crypto Library V2.6 on P5CC008V1A and P5CC012V1A
NSCIB-CC-11-31802-CR
name Micro-circuit S3CJ9QD (reference S3CJ9QDX01 rev. 6) Crypto Library V2.6 on P5CC008V1A and P5CC012V1A
scheme FR NL
not_valid_after 01.09.2019 07.06.2017
not_valid_before 27.10.2005 06.07.2012
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2005_37.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Certification%20Report%20NSCIB-CC-11-31802-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2005_37.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST]%20P5_CL_C14_ST_Lite_CC012%20v1.1.pdf
manufacturer Samsung NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.samsung.com/ https://www.nxp.com
security_level EAL4+, ADV_IMP.2, AVA_VLA.3, ALC_DVS.2 AVA_VAN.5, EAL5+, ALC_DVS.2
dgst 475cbf49b32d0be9 f977d70e1882b3a2
heuristics/cert_id ANSSI-CC-2005/37 NSCIB-CC-11-31802-CR
heuristics/cert_lab []
heuristics/extracted_sars AGD_USR.1, ADV_HLD.2, AVA_MSU.2, ADV_FSP.2, ATE_DPT.1, ADV_IMP.2, AVA_VLA.3, ALC_LCD.1, ASE_INT.1, ADV_RCR.1, ASE_SRE.1, ATE_IND.2, ADV_SPM.1, ASE_REQ.1, ASE_TSS.1, ASE_PPC.1, ATE_COV.2, ATE_FUN.1, ALC_DVS.2, AVA_SOF.1, ASE_OBJ.1, ALC_TAT.1, ADV_LLD.1, ASE_ENV.1, AGD_ADM.1, ASE_DES.1 AGD_OPE.1, ALC_CMS.5, ALC_TAT.2, ASE_ECD.1, ADV_TDS.4, ALC_DEL.1, ALC_LCD.1, ADV_ARC.1, ADV_IMP.1, ASE_SPD.1, ADV_INT.2, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_DPT.3, ATE_IND.2, AVA_VAN.5, ASE_TSS.1, ATE_COV.2, ATE_FUN.1, ALC_DVS.2, ADV_FSP.5, ALC_CMC.4, AGD_PRE.1
heuristics/extracted_versions 6 2.6
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/protection_profiles {} f6d23054061d72ba
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename 2005_37.pdf Certification Report NSCIB-CC-11-31802-CR.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
  • FR:
  • NL:
    • cert_id: NSCIB-CC-11-31802-CR
    • cert_item:
    • cert_lab: Brightsight
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • FR:
    • Rapport de certification 2005/37: 12
  • DE:
    • BSI-DSZ-CC-0771: 1
    • BSI-DSZ-CC-0771-2011: 2
  • NL:
    • NSCIB-CC-11-31802: 1
    • NSCIB-CC-11-31802-CR: 14
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL3: 1
    • EAL4: 3
    • EAL41: 1
    • EAL5: 1
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 et: 1
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 2
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 3
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 2
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_DEL.2: 2
    • ADO_IGS: 1
    • ADO_IGS.1: 2
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 5
    • ADV_INT: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 1
    • AGD_USR: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.3: 5
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND: 2
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_CKM.4: 1
    • FCS_COP.1: 1
  • FDP:
    • FDP_ACC.2: 1
    • FDP_ACF.1: 1
    • FDP_IFC.1: 1
    • FDP_IFF.1: 1
    • FDP_SDI.1: 1
  • FIA:
    • FIA_ATD.1: 1
    • FIA_UAU.2: 1
    • FIA_UID.2: 1
  • FMT:
    • FMT_MOF.1: 1
    • FMT_MSA.1: 1
    • FMT_MSA.3: 1
    • FMT_SMR.1: 1
  • FPR:
    • FPR_UNO.1: 1
  • FPT:
    • FPT_PHP.2: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 1
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 10
  • NXP:
    • NXP: 9
    • NXP Semiconductors: 5
pdf_data/report_keywords/eval_facility
  • Serma:
    • SERMA: 1
    • Serma Technologies: 1
  • BrightSight:
    • Brightsight: 4
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 1
  • DES:
    • 3DES:
      • 3DES: 2
      • Triple-DES: 2
    • DES:
      • DES: 4
  • constructions:
    • MAC:
      • CBC-MAC: 2
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
    • SHA2:
      • SHA-224: 2
      • SHA-256: 4
pdf_data/report_keywords/randomness
  • PRNG:
    • PRNG: 2
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 2
  • ECB:
    • ECB: 2
pdf_data/report_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 2
  • SmartMX:
    • SmartMX: 17
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 2.6: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 2
  • SCA:
    • DPA: 1
    • SPA: 1
    • Side channel: 1
    • timing attacks: 1
  • other:
    • JIL: 3
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-2004-01-001: 1
    • CCIMB-2004-01-002: 1
    • CCIMB-2004-01-003: 1
    • CCIMB-2004-01-004: 1
  • BSI:
    • AIS36: 1
pdf_data/report_metadata
  • /Author: David Baudet
  • /Company: SGDN/DCSSI
  • /CreationDate: D:20051027151854+02'00'
  • /Creator: Acrobat PDFMaker 6.0 pour Word
  • /Keywords: CER/F/07.3
  • /ModDate: D:20051027151957+02'00'
  • /Producer: Acrobat Distiller 6.0 (Windows)
  • /SourceModified: D:20051027131847
  • /Subject: Micro-circuit S3CJ9QD (rfrence S3CJ9QDX01 rev.6)
  • /Title: Rapport de certification 2005/37
  • pdf_file_size_bytes: 286033
  • pdf_hyperlinks: mailto:[email protected], http://www.ssi.gouv.fr/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 21
pdf_data/st_filename cible2005_37.pdf [ST] P5_CL_C14_ST_Lite_CC012 v1.1.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0771: 1
  • NL:
    • NSCIB-CC-11-31802: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4: 1
    • EAL4 augmented: 1
  • EAL:
    • EAL 5: 3
    • EAL 5 augmented: 3
    • EAL4: 1
    • EAL4+: 2
    • EAL5: 29
    • EAL5 augmented: 1
    • EAL5+: 4
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_CAP: 1
    • ACM_SCP: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_IGS: 1
  • ADV:
    • ADV_FSP: 1
    • ADV_HLD: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 3
    • ADV_LLD: 1
    • ADV_RCR: 1
    • ADV_SPM: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_USR: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 3
    • ALC_FLR: 1
    • ALC_LCD: 1
    • ALC_TAT: 1
  • ATE:
    • ATE_COV: 1
    • ATE_DPT: 1
    • ATE_FUN: 1
  • AVA:
    • AVA_MSU: 1
    • AVA_SOF: 1
    • AVA_VLA: 1
    • AVA_VLA.3: 3
  • ACM:
    • ACM_CMS.5: 1
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 2
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 1
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 1
    • FDP_ACF.1: 2
    • FDP_IFC.1: 1
    • FDP_IFF.1: 2
    • FDP_SDI.1: 1
  • FIA:
    • FIA_ATD.1: 1
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 1
  • FPT:
    • FPT_PHP.2: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 2
  • FAU:
    • FAU_SAS.1: 2
  • FCS:
    • FCS_CKM.1: 11
    • FCS_CKM.1.1: 1
    • FCS_CKM.2: 1
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 23
    • FCS_COP.1.1: 5
    • FCS_RNG.1: 12
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 6
    • FDP_ACF.1: 5
    • FDP_IFC.1: 20
    • FDP_ITC.1: 6
    • FDP_ITC.2: 6
    • FDP_ITT: 1
    • FDP_ITT.1: 25
    • FDP_ITT.1.1: 1
    • FDP_RIP: 1
    • FDP_RIP.1: 6
    • FDP_RIP.1.1: 1
  • FMT:
    • FMT_LIM.1: 2
    • FMT_LIM.2: 2
    • FMT_MSA.1: 3
    • FMT_MSA.3: 2
    • FMT_SMF.1: 4
  • FPT:
    • FPT_FLS.1: 17
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 29
    • FPT_ITT.1.1: 1
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 14
pdf_data/st_keywords/cc_claims
  • A:
    • A: 1
    • A.DEV_ORG: 1
    • A.DLV: 1
    • A.DLV_AUDIT: 1
    • A.DLV_PROTECT: 1
    • A.DLV_RESP: 1
    • A.KEY_DEST: 2
    • A.SOFT_ARCHI: 1
    • A.USE_DIAG: 1
    • A.USE_PROD: 1
    • A.USE_SYS: 1
    • A.USE_TEST: 1
  • O:
    • O.CLON: 1
    • O.CRYPTO: 2
    • O.DESIGN_ACS: 1
    • O.DEV_DIS: 1
    • O.DEV_TOOLS: 1
    • O.DIS_MECHANISM: 1
    • O.DIS_MEMORY: 1
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 1
    • O.DLV_RESP: 1
    • O.DSOFT_ACS: 1
    • O.FLAW: 1
    • O.IC_DLV: 1
    • O.KEY_DEST: 2
    • O.MASK_FAB: 1
    • O.MECH_ACS: 1
    • O.MOD_MEMORY: 1
    • O.OPERATE: 1
    • O.SOFT_ACS: 1
    • O.SOFT_DLV: 1
    • O.SOFT_MECH: 1
    • O.TAMPER: 1
    • O.TEST_OPERATE: 1
    • O.TOE_PRT: 1
    • O.USE_DIAG: 1
    • O.USE_SYS: 1
  • T:
    • T.CLON: 2
    • T.DIS_DEL: 2
    • T.DIS_DESIGN: 2
    • T.DIS_DSOFT: 2
    • T.DIS_INFO: 1
    • T.DIS_PHOTOMAS: 1
    • T.DIS_PHOTOMASK: 1
    • T.DIS_SOFT: 1
    • T.DIS_TEST: 1
    • T.DIS_TOOLS: 1
    • T.MOD_DEL: 2
    • T.MOD_DESIGN: 1
    • T.MOD_DSOFT: 1
    • T.MOD_PHOTOMA: 1
    • T.MOD_SOFT: 2
    • T.T_DEL: 2
    • T.T_PHOTOMASK: 2
    • T.T_PRODUCT: 2
    • T.T_SAMPLE: 2
  • O:
    • O.COPY: 6
    • O.CUST_RECONFIG: 3
    • O.MEM_ACCESS: 5
    • O.MF_FW: 4
    • O.REUSE: 6
    • O.RND: 12
    • O.RSA: 5
    • O.SFR_ACCESS: 4
    • O.SHA: 5
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 5
  • NXP:
    • NXP: 66
    • NXP Semiconductors: 27
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 5
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • 3DES:
      • 3DES: 13
      • TDES: 3
      • Triple-DES: 18
    • DES:
      • DEA: 1
      • DES: 34
  • constructions:
    • MAC:
      • CBC-MAC: 12
pdf_data/st_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 2
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 11
    • SHA2:
      • SHA-224: 9
      • SHA-256: 10
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RNG: 1
  • RNG:
    • RND: 18
    • RNG: 41
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 17
  • ECB:
    • ECB: 11
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 3
  • SmartMX:
    • SmartMX: 104
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library 2.6: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Physical Tampering: 1
    • physical tampering: 4
  • FI:
    • DFA: 22
    • Malfunction: 13
    • fault induction: 1
    • fault injection: 1
    • malfunction: 3
  • SCA:
    • DPA: 12
    • Leak-Inherent: 12
    • Physical Probing: 2
    • SPA: 15
    • Timing attacks: 3
    • side channel: 19
    • side-channel: 11
    • timing attacks: 4
pdf_data/st_keywords/standard_id
  • FIPS:
    • FIPS 140-2: 1
    • FIPS 46-2: 1
    • FIPS140-2: 1
  • BSI:
    • AIS20: 2
    • AIS31: 2
  • CC:
    • CCMB-2009-07-004: 2
  • FIPS:
    • FIPS 180-2: 2
    • FIPS PUB 180-2: 1
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 2
    • FIPS PUB 81: 3
  • ISO:
    • ISO/IEC 9797-1: 1
  • PKCS:
    • PKCS #1: 6
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • Test ROM code and crypto. library). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • embedded software and an IC dedicated software (Test ROM code and crypto. library). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. S3CJ9QD SECURITY TARGET: 1
    • out of scope: 1
pdf_data/st_metadata
  • /Author: bryant
  • /CreationDate: D:20051026153046+09'00'
  • /Creator: PScript5.dll Version 5.2
  • /ModDate: D:20051026153046+09'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Title: Microsoft Word - ST-lite Blackfoot v1.0.doc
  • pdf_file_size_bytes: 466693
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 37
  • /Alternative descriptive title: Security Target Lite
  • /Author: Andreas Kühn, Markus Hinkelmann
  • /CertificationID: NSCIB-CC-11-31802
  • /Chip family: SmartMX
  • /Chip type: P5CC008V1A and P5CC012V1A
  • /Comments:
  • /Company: NXP Semiconductors / Brightsight
  • /Copyright date: 2012
  • /CreationDate: D:20120704150017+02'00'
  • /Creator: Acrobat PDFMaker 9.1 for Word
  • /Descriptive title: Security Target Lite
  • /Division: NXP Semiconductors
  • /Keywords: Crypto Library, SmartMX, P5CC008V1A, P5CC012V1A, NXP, EAL5+, AVA_VAN.5, Security Target, AES, DES, RSA, ECC over GF(p), SHA
  • /ModDate: D:20120704150104+02'00'
  • /Modification date: 4 Jul 2012
  • /Producer: Adobe PDF Library 9.0
  • /Revision: Rev. 1.1
  • /Security status: PUBLIC INFORMATION
  • /SourceModified: D:20120704125354
  • /Specification status: Evaluation documentation
  • /Status: accepted
  • /Subject: Common Criteria Evaluation of Crypto Library on SmartMX
  • /TOE long: Crypto Library V2.6 on P5CC008V1A and P5CC012V1A
  • /TOE short: Crypto Library on SmartMX
  • /Template date: 1 October 2006
  • /Template version: 2.8.1
  • /Title: Security Target - Crypto Library V2.7 on P5CC008V1A / P5CC012V1A
  • /docpath: I:\Workspace\CryptoLibP5\SmxCl\docs\02_sw_req_an
  • /philips_smx_cl_docpath: I:\SmartMX\P5_CryptoLib\SmxCl\docs\02_sw_req_an
  • /relBibilioPath: ..\Bibliography.doc
  • pdf_file_size_bytes: 374114
  • pdf_hyperlinks: http://www.nxp.com/, http://www.cacr.math.uwaterloo.ca/hac/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 49
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different