Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
Samsung S3CC9P9 microcontroller
ANSSI-CC-2004/06 		STMicroelectronics ST33K1M5C and ST33K1M5T C02
NSCIB-CC-2300056-02-CR
name Samsung S3CC9P9 microcontroller STMicroelectronics ST33K1M5C and ST33K1M5T C02
scheme FR NL
status archived active
not_valid_after 01.09.2019 09.09.2029
not_valid_before 11.05.2004 09.09.2024
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300056-02-CERT.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_06.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300056-02-CR2.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_06.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300056-02-ST_lite.pdf
manufacturer Samsung Electronics Co., Ltd. STMicroelectronics
manufacturer_web https://www.samsung.com https://www.st.com/
security_level ALC_DVS.2, ADV_IMP.2, EAL4+, AVA_VLA.4 EAL6+, ALC_FLR.2
dgst 473ea605d6a40ef5 34d1675a7a079459
heuristics/cert_id ANSSI-CC-2004/06 NSCIB-CC-2300056-02-CR
heuristics/cert_lab []
heuristics/extracted_sars ALC_DVS.2, ALC_TAT.1, ADV_IMP.2, ATE_DPT.1, ADV_DVS.2, ASE_REQ.1, ATE_COV.2, ADV_LLD.1, ASE_DES.1, AVA_SOF.1, AVA_MSU.2, ADV_RCR.1, ADV_HLD.2, ATE_IND.2, ASE_TSS.1, ASE_INT.1, AGD_USR.1, ALC_LCD.1, ADV_SPM.1, ADV_FSP.1, ASE_ENV.1, ASE_OBJ.1, ASE_SRE.1, ASE_PPC.1, AGD_ADM.1, ATE_FUN.1, AVA_VLA.4 AGD_OPE.1, ADV_ARC.1, ALC_DVS.2, ATE_DPT.3, ATE_FUN.2, ALC_CMS.5, ADV_IMP.2, ALC_FLR.2, ASE_OBJ.2, ADV_INT.3, ASE_REQ.2, ALC_DEL.1, ADV_FSP.5, ALC_TAT.3, ASE_SPD.1, AVA_VAN.5, ATE_IND.2, ASE_TSS.1, ASE_INT.1, AGD_PRE.1, ALC_LCD.1, ALC_CMC.5, ADV_SPM.1, ASE_CCL.1, ATE_COV.3, ASE_ECD.1, ADV_TDS.5
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2025/10
heuristics/report_references/directly_referencing ANSSI-CC-2002/25 {}
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2025/10
heuristics/report_references/indirectly_referencing ANSSI-CC-2002/25 {}
heuristics/scheme_data
heuristics/st_references/directly_referenced_by {} ANSSI-CC-2025/10
heuristics/st_references/indirectly_referenced_by {} ANSSI-CC-2025/10
heuristics/protection_profiles {} cf0f01bcd7be3e9c
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename NSCIB-CC-2300056-02-CERT.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2300056-02: 1
    • NSCIB-CC-2300056-02: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Gebruiker
  • /CreationDate: D:20240923195124+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20240923195124+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 87760
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2004_06.pdf NSCIB-CC-2300056-02-CR2.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
  • FR:
  • NL:
    • cert_id: NSCIB-CC-2300056-02-CR
    • cert_item: ST33K1M5C and ST33K1M5T C02
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
pdf_data/report_keywords/cc_cert_id
  • FR:
    • Rapport de certification 2002/25: 1
    • Rapport de certification 2004/06: 13
  • NL:
    • NSCIB-2300056-01: 1
    • NSCIB-2300056-02: 1
    • NSCIB-CC-2300056-02-CR: 1
    • NSCIB-CC-2300056-02-CR2: 11
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL3: 1
    • EAL4: 1
    • EAL4+: 1
    • EAL41: 1
    • EAL5: 1
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 et: 1
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL6+: 2
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 2
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_DEL.2: 2
    • ADO_IGS: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 3
    • ADV_INT: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 1
    • AGD_USR: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 3
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_FLR.1: 1
    • ALC_FLR.2: 3
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 2
  • FCS:
    • FCS_CKM.1: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 2
    • FDP_IFF.1: 2
    • FDP_SDI.1: 2
  • FIA:
    • FIA_ATD.1: 2
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 2
  • FPT:
    • FPT_PHP.2: 2
    • FPT_PHP.3: 2
    • FPT_TST.1: 2
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 10
  • STMicroelectronics:
    • STMicroelectronics: 3
pdf_data/report_keywords/eval_facility
  • Serma:
    • SERMA: 3
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 4
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 2
  • constructions:
    • MAC:
      • CBC-MAC: 1
  • miscellaneous:
    • SM4:
      • SM4: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/report_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 4
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
  • ISO:
    • ISO/IEC 15408:1999: 1
pdf_data/report_keywords/certification_process
  • OutOfScope:
    • following proprietary or non-standard algorithms, protocols and implementations: none, which are out of scope as there are no security claims relating to these. Page: 11/12 of report number: 1
    • out of scope: 1
pdf_data/report_metadata
  • /Author: DCSSI
  • /CreationDate: D:20040517150819+02'00'
  • /Creator: Acrobat PDFMaker 5.0 pour Word
  • /ModDate: D:20040517150839+03'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: Micro-circuit SAMSUNG S3CC9P9
  • /Title: Rapport de certification 2004/06
  • pdf_file_size_bytes: 656869
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 26
pdf_data/st_filename cible2004_06.pdf NSCIB-CC-2300056-02-ST_lite.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 10
    • BSI-CC-PP-0084-: 1
    • BSI-CC-PP-0084-2014: 63
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4: 12
    • EAL4 augmented: 1
  • EAL:
    • EAL4: 1
    • EAL6: 23
    • EAL6 augmented: 2
    • EAL6+: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 3
    • ACM_SCP: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_IGS: 3
  • ADV:
    • ADV_DVS.2: 1
    • ADV_FSP: 3
    • ADV_FSP.1: 1
    • ADV_HLD: 2
    • ADV_HLD.2: 1
    • ADV_IMP: 2
    • ADV_IMP.1: 2
    • ADV_IMP.2: 5
    • ADV_LLD: 2
    • ADV_LLD.1: 2
    • ADV_RCR: 3
    • ADV_RCR.1: 1
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 3
    • AGD_ADM.1: 1
    • AGD_USR: 3
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD: 2
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_MSU: 2
    • AVA_SOF: 2
    • AVA_VLA: 2
    • AVA_VLA.4: 6
  • ADV:
    • ADV_ARC: 2
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT.3: 1
    • ADV_SPM: 4
    • ADV_SPM.1: 3
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 3
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.5: 1
    • ALC_DEL: 3
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL: 4
    • ASE_CCL.1: 1
    • ASE_ECD: 4
    • ASE_ECD.1: 1
    • ASE_INT: 2
    • ASE_INT.1: 1
    • ASE_OBJ: 12
    • ASE_OBJ.2: 1
    • ASE_REQ: 31
    • ASE_REQ.2: 1
    • ASE_SPD: 9
    • ASE_SPD.1: 1
    • ASE_TSS: 7
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 3
    • ATE_COV.3: 1
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 2
    • FAU_SAA.1: 7
  • FCS:
    • FCS_CKM.1: 8
    • FCS_CKM.4: 7
    • FCS_COP.1: 8
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACC.2: 5
    • FDP_ACF.1: 6
    • FDP_IFC.1: 6
    • FDP_IFF.1: 6
    • FDP_ITC.1: 3
    • FDP_SDI.1: 5
  • FIA:
    • FIA_ATD.1: 7
    • FIA_UAU.2: 8
    • FIA_UID.1: 1
    • FIA_UID.2: 8
  • FMT:
    • FMT_MOF.1: 7
    • FMT_MSA.1: 6
    • FMT_MSA.2: 3
    • FMT_MSA.3: 7
    • FMT_SMR.1: 7
  • FPR:
    • FPR_UNO: 1
    • FPR_UNO.1: 4
  • FPT:
    • FPT_AMT.1: 2
    • FPT_PHP.2: 5
    • FPT_PHP.3: 5
    • FPT_TST.1: 8
  • FAU:
    • FAU_GEN.1: 8
    • FAU_SAR.1: 26
    • FAU_SAS: 2
    • FAU_SAS.1: 26
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 4
    • FCS_COP.1: 17
    • FCS_RNG: 2
    • FCS_RNG.1: 6
  • FDP:
    • FDP_ACC.1: 23
    • FDP_ACC.2: 14
    • FDP_ACF.1: 31
    • FDP_IFC.1: 17
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 10
    • FDP_SDC: 2
    • FDP_SDC.1: 6
    • FDP_SDI.2: 13
    • FDP_SMF.1: 2
    • FDP_SMR.1: 1
    • FDP_UCT.1: 16
    • FDP_UIT.1: 16
  • FIA:
    • FIA_API: 2
    • FIA_API.1: 6
    • FIA_UAU.1: 14
    • FIA_UID.1: 16
  • FMT:
    • FMT_LIM: 2
    • FMT_LIM.1: 29
    • FMT_LIM.2: 30
    • FMT_MSA.1: 28
    • FMT_MSA.3: 28
    • FMT_SMF.1: 25
    • FMT_SMR.1: 17
  • FPT:
    • FPT_FLS.1: 24
    • FPT_ITT.1: 9
    • FPT_PHP.3: 11
  • FRU:
    • FRU_FLT.2: 11
  • FTP:
    • FTP_ITC.1: 28
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • A:
    • A.DEV_ORG: 2
    • A.DLV: 1
    • A.DLV_AUDIT: 2
    • A.DLV_PROTECT: 2
    • A.DLV_RESP: 2
    • A.KEY_DEST: 3
    • A.SOFT_ARCHI: 2
    • A.USE_DIAG: 2
    • A.USE_PROD: 2
    • A.USE_SYS: 2
    • A.USE_TEST: 2
  • O:
    • O.CLON: 3
    • O.CRYPTO: 3
    • O.DESIGN: 1
    • O.DESIGN_ACS: 2
    • O.DEV_DIS: 4
    • O.DEV_TOOLS: 3
    • O.DIS_: 3
    • O.DIS_ME: 1
    • O.DIS_MECHANISM: 4
    • O.DIS_MEMORY: 3
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 2
    • O.DLV_RESP: 2
    • O.DSOFT: 1
    • O.DSOFT_ACS: 2
    • O.FLAW: 3
    • O.IC_DLV: 2
    • O.KEY_: 1
    • O.KEY_DEST: 3
    • O.MASK: 1
    • O.MASK_FAB: 2
    • O.MECH: 1
    • O.MECH_ACS: 2
    • O.MOD_: 2
    • O.MOD_MEMORY: 5
    • O.OPER: 1
    • O.OPERATE: 7
    • O.SOFT: 1
    • O.SOFT_ACS: 2
    • O.SOFT_DLV: 2
    • O.SOFT_MECH: 1
    • O.TA: 1
    • O.TAMPER: 3
    • O.TEST_OPERATE: 2
    • O.TI: 1
    • O.TI_ACS: 1
    • O.TOE_PRT: 3
    • O.USE_DIAG: 1
    • O.USE_SYS: 2
  • T:
    • T.CLON: 12
    • T.DIS_DEL: 5
    • T.DIS_DESIGN: 10
    • T.DIS_DSOFT: 8
    • T.DIS_INFO: 4
    • T.DIS_PHOTOMASK: 6
    • T.DIS_SOFT: 7
    • T.DIS_TEST: 5
    • T.DIS_TOOLS: 5
    • T.MOD_DEL: 5
    • T.MOD_DESIGN: 10
    • T.MOD_DSOFT: 9
    • T.MOD_PHOTOMASK: 5
    • T.MOD_SOFT: 10
    • T.T_DEL: 6
    • T.T_PHOTOMASK: 6
    • T.T_PRODUCT: 7
    • T.T_SAMPLE: 8
  • O:
    • O.C: 4
    • O.RND: 4
    • O.TOE-: 1
  • R:
    • R.O: 4
  • T:
    • T.RND: 3
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 6
  • Infineon:
    • Infineon Technologies: 1
  • Philips:
    • Philips: 1
  • STMicroelectronics:
    • STMicroelectronics: 24
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 13
  • AES_competition:
    • AES:
      • AES: 14
      • AES-128: 1
      • AES-192: 1
      • AES-256: 1
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 5
    • DES:
      • DES: 19
  • miscellaneous:
    • SM4:
      • SM4: 1
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 7
    • RNG: 6
  • TRNG:
    • TRNG: 3
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 8
  • ECB:
    • ECB: 7
pdf_data/st_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 6
    • Nescrypt: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Physical Tampering: 1
    • physical tampering: 5
  • other:
    • reverse engineering: 1
  • FI:
    • Malfunction: 13
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 14
    • Physical Probing: 4
    • physical probing: 3
    • side channel: 2
  • other:
    • JIL: 69
pdf_data/st_keywords/standard_id
  • FIPS:
    • FIPS 186: 1
    • FIPS 46-2: 2
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 22
    • CCMB-2017-04-003: 2
  • FIPS:
    • FIPS PUB 197: 3
  • ISO:
    • ISO/IEC 14888: 2
    • ISO/IEC 7816-3: 1
    • ISO/IEC 9796: 1
    • ISO/IEC 9796-2: 1
  • NIST:
    • NIST SP 800-38A: 2
    • NIST SP 800-67: 3
    • SP 800-38A: 2
    • SP 800-67: 1
  • PKCS:
    • PKCS #1: 2
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. 10 To allow the: 1
    • out of scope: 1
  • OutOfScope:
    • ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation: 1
    • ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation: 1
    • Security IC Embedded Software (ES) is in User NVM. 45 Note: The ES is not part of the TOE and is out of scope of the evaluation. 1.6.3 TOE documentation 46 The user guidance documentation, part of the TOE: 1
    • The TOE also provides a 16- and 32-bit CRC calculation block (ISO13239, IEEE 802.3, etc..) which is out of scope of this evaluation. 41 Figure 1 provides an overview of the ST33K1M5C and ST33K1M5T C02: 1
    • out of scope: 2
pdf_data/st_metadata
  • /CreationDate: D:20040221110009
  • /Creator: AdobePS5.dll Version 5.0.1
  • /ModDate: D:20040221110011+09'00'
  • /Producer: Acrobat Distiller 4.0 for Windows
  • /Title: Microsoft Word - ST C9P9 v1.2_FEB 21_.doc
  • pdf_file_size_bytes: 651062
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 58
  • /Author: feixbeno
  • /CreationDate: D:20240822161430Z
  • /Creator: FrameMaker 17.0.1
  • /CreatorTool: FrameMaker 17.0.1
  • /ModDate: D:20240822162619+02'00'
  • /Producer: Adobe PDF Library 17.0
  • /Title: SMD_ST33K1M5_ST_21_001_VC02_1P.pdf
  • /Trapped: /False
  • pdf_file_size_bytes: 1585015
  • pdf_hyperlinks: http://www.st.com
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 85
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different