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Samsung S3CC9P9 microcontroller
ANSSI-CC-2004/06 		NesLib 6.7.4 on ST33K1M5A and ST33K1M5M B03
NSCIB-CC-2300177-02-CR
name Samsung S3CC9P9 microcontroller NesLib 6.7.4 on ST33K1M5A and ST33K1M5M B03
scheme FR NL
status archived active
not_valid_after 01.09.2019 14.11.2029
not_valid_before 11.05.2004 14.11.2024
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300177-02-Cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_06.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300177-02-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_06.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300177-02-ST_lite.pdf
manufacturer Samsung Electronics Co., Ltd. STMicroelectronics
manufacturer_web https://www.samsung.com https://www.st.com/
security_level EAL4+, ALC_DVS.2, ADV_IMP.2, AVA_VLA.4 ALC_DVS.2, EAL5+, ALC_FLR.2, AVA_VAN.5
dgst 473ea605d6a40ef5 30324ba0191020f1
heuristics/cert_id ANSSI-CC-2004/06 NSCIB-CC-2300177-02-CR
heuristics/cert_lab []
heuristics/extracted_sars ADV_DVS.2, ATE_DPT.1, AVA_MSU.2, ADV_SPM.1, ASE_SRE.1, ATE_COV.2, AVA_SOF.1, ADV_LLD.1, ASE_INT.1, AVA_VLA.4, ALC_LCD.1, ALC_DVS.2, AGD_ADM.1, ASE_ENV.1, ADV_HLD.2, ATE_IND.2, ATE_FUN.1, ASE_DES.1, ASE_REQ.1, ADV_IMP.2, ASE_OBJ.1, ADV_RCR.1, ALC_TAT.1, ADV_FSP.1, ASE_TSS.1, ASE_PPC.1, AGD_USR.1 ADV_TDS.4, ATE_COV.2, AGD_OPE.1, ALC_DEL.1, ASE_INT.1, ADV_ARC.1, ADV_FSP.5, AVA_VAN.5, ASE_ECD.1, ALC_FLR.2, ATE_DPT.3, ALC_LCD.1, ASE_REQ.2, ADV_IMP.1, ALC_DVS.2, ASE_OBJ.2, ATE_IND.2, ALC_TAT.2, ATE_FUN.1, ALC_CMC.4, ALC_CMS.5, ADV_INT.2, ASE_SPD.1, ASE_TSS.1, AGD_PRE.1, ASE_CCL.1
heuristics/extracted_versions - 6.7.4
heuristics/report_references/directly_referencing ANSSI-CC-2002/25 {}
heuristics/report_references/indirectly_referencing ANSSI-CC-2002/25 {}
heuristics/scheme_data
heuristics/protection_profiles {} cf0f01bcd7be3e9c
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename NSCIB-CC-2300177-02-Cert.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2300177-02: 1
    • NSCIB-CC-2300177-02: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • STMicroelectronics:
    • STMicroelectronics: 1
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
  • SGS:
    • SGS: 1
    • SGS Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
  • Neslib:
    • NesLib 6.7.4: 1
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: JM2
  • /CreationDate: D:20241115121832+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20241115121832+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 87804
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2004_06.pdf NSCIB-CC-2300177-02-CR.pdf
pdf_data/report_frontpage
  • FR:
  • NL:
  • FR:
  • NL:
    • cert_id: NSCIB-CC-2300177-02-CR
    • cert_item: NesLib 6.7.4 on ST33K1M5A and ST33K1M5M B03
    • cert_lab: SGS Brightsight B.V.
    • developer: STMicroelectronics
pdf_data/report_keywords/cc_cert_id
  • FR:
    • Rapport de certification 2002/25: 1
    • Rapport de certification 2004/06: 13
  • NL:
    • NSCIB-2300177-02: 1
    • NSCIB-CC-2300177-02-CR: 12
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL3: 1
    • EAL4: 1
    • EAL4+: 1
    • EAL41: 1
    • EAL5: 1
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 et: 1
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 2
    • EAL6+: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT: 1
    • ACM_AUT.1: 2
    • ACM_CAP: 1
    • ACM_CAP.4: 2
    • ACM_SCP: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL: 1
    • ADO_DEL.2: 2
    • ADO_IGS: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.2: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 3
    • ADV_INT: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 1
    • ADV_RCR: 1
    • ADV_RCR.1: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM: 1
    • AGD_ADM.1: 1
    • AGD_USR: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_DES.1: 1
    • ASE_ENV.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_PPC.1: 1
    • ASE_REQ.1: 1
    • ASE_SRE.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 3
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_DVS.2: 2
    • ALC_FLR.1: 1
    • ALC_FLR.2: 3
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 5
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 2
  • FCS:
    • FCS_CKM.1: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 2
    • FDP_ACF.1: 2
    • FDP_IFC.1: 2
    • FDP_IFF.1: 2
    • FDP_SDI.1: 2
  • FIA:
    • FIA_ATD.1: 2
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 2
  • FPT:
    • FPT_PHP.2: 2
    • FPT_PHP.3: 2
    • FPT_TST.1: 2
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 10
  • STMicroelectronics:
    • STMicroelectronics: 3
pdf_data/report_keywords/eval_facility
  • Serma:
    • SERMA: 3
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 4
  • AES_competition:
    • AES:
      • AES: 3
  • DES:
    • DES:
      • DES: 4
  • constructions:
    • MAC:
      • CBC-MAC: 1
  • miscellaneous:
    • SM4:
      • SM4: 1
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECDH:
      • ECDH: 2
    • ECDSA:
      • ECDSA: 2
  • FF:
    • DH:
      • Diffie-Hellman: 2
pdf_data/report_keywords/hash_function
  • Keccak:
    • Keccak: 1
  • SHA:
    • SHA1:
      • SHA-1: 1
    • SHA2:
      • SHA-2: 1
    • SHA3:
      • SHA-3: 2
pdf_data/report_keywords/randomness
  • PRNG:
    • DRBG: 2
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/report_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 3
pdf_data/report_keywords/crypto_library
  • Neslib:
    • NesLib 6.7: 2
    • NesLib 6.7.4: 13
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
  • ISO:
    • ISO/IEC 15408:1999: 1
pdf_data/report_keywords/javacard_api_const
  • curves:
    • X25519: 1
pdf_data/report_metadata
  • /Author: DCSSI
  • /CreationDate: D:20040517150819+02'00'
  • /Creator: Acrobat PDFMaker 5.0 pour Word
  • /ModDate: D:20040517150839+03'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: Micro-circuit SAMSUNG S3CC9P9
  • /Title: Rapport de certification 2004/06
  • pdf_file_size_bytes: 656869
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 26
pdf_data/st_filename cible2004_06.pdf NSCIB-CC-2300177-02-ST_lite.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 10
    • BSI-CC-PP-0084-: 2
    • BSI-CC-PP-0084-2014: 59
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4: 12
    • EAL4 augmented: 1
  • EAL:
    • EAL4: 1
    • EAL5: 19
    • EAL5 augmented: 3
    • EAL6: 2
    • EAL6 augmented: 2
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 3
    • ACM_SCP: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_IGS: 3
  • ADV:
    • ADV_DVS.2: 1
    • ADV_FSP: 3
    • ADV_FSP.1: 1
    • ADV_HLD: 2
    • ADV_HLD.2: 1
    • ADV_IMP: 2
    • ADV_IMP.1: 2
    • ADV_IMP.2: 5
    • ADV_LLD: 2
    • ADV_LLD.1: 2
    • ADV_RCR: 3
    • ADV_RCR.1: 1
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 3
    • AGD_ADM.1: 1
    • AGD_USR: 3
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 4
    • ALC_FLR: 2
    • ALC_LCD: 2
    • ALC_TAT: 2
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_MSU: 2
    • AVA_SOF: 2
    • AVA_VLA: 2
    • AVA_VLA.4: 6
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.5: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 6
    • ALC_FLR.2: 10
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL: 3
    • ASE_CCL.1: 1
    • ASE_ECD: 6
    • ASE_ECD.1: 1
    • ASE_INT: 2
    • ASE_INT.1: 1
    • ASE_OBJ: 5
    • ASE_OBJ.2: 1
    • ASE_REQ: 12
    • ASE_REQ.2: 1
    • ASE_SPD: 4
    • ASE_SPD.1: 1
    • ASE_TSS: 7
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 6
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 2
    • FAU_SAA.1: 7
  • FCS:
    • FCS_CKM.1: 8
    • FCS_CKM.4: 7
    • FCS_COP.1: 8
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACC.2: 5
    • FDP_ACF.1: 6
    • FDP_IFC.1: 6
    • FDP_IFF.1: 6
    • FDP_ITC.1: 3
    • FDP_SDI.1: 5
  • FIA:
    • FIA_ATD.1: 7
    • FIA_UAU.2: 8
    • FIA_UID.1: 1
    • FIA_UID.2: 8
  • FMT:
    • FMT_MOF.1: 7
    • FMT_MSA.1: 6
    • FMT_MSA.2: 3
    • FMT_MSA.3: 7
    • FMT_SMR.1: 7
  • FPR:
    • FPR_UNO: 1
    • FPR_UNO.1: 4
  • FPT:
    • FPT_AMT.1: 2
    • FPT_PHP.2: 5
    • FPT_PHP.3: 5
    • FPT_TST.1: 8
  • FAU:
    • FAU_GEN.1: 2
    • FAU_SAR.1: 11
    • FAU_SAS: 1
    • FAU_SAS.1: 13
  • FCS:
    • FCS_CKM.1: 33
    • FCS_CKM.4: 5
    • FCS_COP.1: 133
    • FCS_RNG: 1
    • FCS_RNG.1: 5
  • FDP:
    • FDP_ACC.1: 26
    • FDP_ACC.2: 6
    • FDP_ACF.1: 18
    • FDP_CKM.2: 2
    • FDP_IFC.1: 20
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 10
    • FDP_SBO: 5
    • FDP_SBO.1: 54
    • FDP_SBO.1.1: 1
    • FDP_SDC: 1
    • FDP_SDC.1: 7
    • FDP_SDI.2: 10
    • FDP_SMF.1: 2
    • FDP_SMR.1: 1
    • FDP_UCT.1: 9
    • FDP_UIT.1: 8
  • FIA:
    • FIA_API: 1
    • FIA_API.1: 5
    • FIA_UAU.1: 8
    • FIA_UID.1: 10
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 18
    • FMT_LIM.2: 18
    • FMT_MSA.1: 18
    • FMT_MSA.3: 18
    • FMT_SMF.1: 16
    • FMT_SMR.1: 13
  • FPT:
    • FPT_FLS.1: 16
    • FPT_ITT.1: 10
    • FPT_PHP.3: 9
  • FRU:
    • FRU_FLT.2: 10
  • FTP:
    • FTP_ITC.1: 20
    • FTP_TRP.1: 3
pdf_data/st_keywords/cc_claims
  • A:
    • A.DEV_ORG: 2
    • A.DLV: 1
    • A.DLV_AUDIT: 2
    • A.DLV_PROTECT: 2
    • A.DLV_RESP: 2
    • A.KEY_DEST: 3
    • A.SOFT_ARCHI: 2
    • A.USE_DIAG: 2
    • A.USE_PROD: 2
    • A.USE_SYS: 2
    • A.USE_TEST: 2
  • O:
    • O.CLON: 3
    • O.CRYPTO: 3
    • O.DESIGN: 1
    • O.DESIGN_ACS: 2
    • O.DEV_DIS: 4
    • O.DEV_TOOLS: 3
    • O.DIS_: 3
    • O.DIS_ME: 1
    • O.DIS_MECHANISM: 4
    • O.DIS_MEMORY: 3
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 2
    • O.DLV_RESP: 2
    • O.DSOFT: 1
    • O.DSOFT_ACS: 2
    • O.FLAW: 3
    • O.IC_DLV: 2
    • O.KEY_: 1
    • O.KEY_DEST: 3
    • O.MASK: 1
    • O.MASK_FAB: 2
    • O.MECH: 1
    • O.MECH_ACS: 2
    • O.MOD_: 2
    • O.MOD_MEMORY: 5
    • O.OPER: 1
    • O.OPERATE: 7
    • O.SOFT: 1
    • O.SOFT_ACS: 2
    • O.SOFT_DLV: 2
    • O.SOFT_MECH: 1
    • O.TA: 1
    • O.TAMPER: 3
    • O.TEST_OPERATE: 2
    • O.TI: 1
    • O.TI_ACS: 1
    • O.TOE_PRT: 3
    • O.USE_DIAG: 1
    • O.USE_SYS: 2
  • T:
    • T.CLON: 12
    • T.DIS_DEL: 5
    • T.DIS_DESIGN: 10
    • T.DIS_DSOFT: 8
    • T.DIS_INFO: 4
    • T.DIS_PHOTOMASK: 6
    • T.DIS_SOFT: 7
    • T.DIS_TEST: 5
    • T.DIS_TOOLS: 5
    • T.MOD_DEL: 5
    • T.MOD_DESIGN: 10
    • T.MOD_DSOFT: 9
    • T.MOD_PHOTOMASK: 5
    • T.MOD_SOFT: 10
    • T.T_DEL: 6
    • T.T_PHOTOMASK: 6
    • T.T_PRODUCT: 7
    • T.T_SAMPLE: 8
  • O:
    • O.ABUSE-FUNC: 3
    • O.ADD-FUNCTIONS: 3
    • O.ADD-FUNCTIONS-LIB: 2
    • O.IDENTIFICATION: 3
    • O.LEAK-: 2
    • O.LEAK-FORCED: 3
    • O.LEAK-INHERENT: 6
    • O.MALFUNCTION: 6
    • O.MEM-ACCESS: 3
    • O.PHYS-: 1
    • O.PHYS-MANIPULATION: 5
    • O.PHYS-PROBING: 5
    • O.RND: 6
  • OE:
    • OE.LIM-BLOCK-LOADER: 3
    • OE.LOADER-USAGE: 3
    • OE.PROCESS-SEC-IC: 3
    • OE.RESP-APPL: 3
  • T:
    • T.RND: 3
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 6
  • STMicroelectronics:
    • STMicroelectronics: 11
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 13
  • AES_competition:
    • AES:
      • AES: 26
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 7
    • DES:
      • DES: 47
  • constructions:
    • MAC:
      • CBC-MAC: 2
      • CMAC: 4
      • HMAC: 4
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
    • ECDH:
      • ECDH: 5
    • ECDSA:
      • ECDSA: 6
    • EdDSA:
      • EdDSA: 4
  • FF:
    • DH:
      • Diffie-Hellman: 19
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
  • Keccak:
    • Keccak: 23
  • SHA:
    • SHA1:
      • SHA-1: 15
    • SHA2:
      • SHA-2: 3
      • SHA-224: 5
      • SHA-256: 8
      • SHA-384: 7
      • SHA-512: 7
    • SHA3:
      • SHA-3: 6
      • SHA3-224: 4
      • SHA3-256: 4
      • SHA3-384: 4
      • SHA3-512: 4
  • SHAKE:
    • SHAKE128: 4
    • SHAKE256: 4
pdf_data/st_keywords/crypto_scheme
  • KEM:
    • KEM: 1
pdf_data/st_keywords/randomness
  • PRNG:
    • DRBG: 21
  • RNG:
    • RND: 9
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 7
  • CCM:
    • CCM: 4
  • CFB:
    • CFB: 5
  • CTR:
    • CTR: 5
  • ECB:
    • ECB: 5
  • GCM:
    • GCM: 4
  • OFB:
    • OFB: 5
pdf_data/st_keywords/ecc_curve
  • Edwards:
    • Ed25519: 2
pdf_data/st_keywords/crypto_engine
  • NesCrypt:
    • NESCRYPT: 1
    • Nescrypt: 6
pdf_data/st_keywords/crypto_library
  • Neslib:
    • NESLIB 6.7.4: 1
    • NesLib 6.7: 3
    • NesLib 6.7.4: 41
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Physical Tampering: 1
    • physical tampering: 5
  • other:
    • reverse engineering: 1
  • FI:
    • Malfunction: 8
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 9
    • Physical Probing: 4
    • side channel: 13
  • other:
    • JIL: 28
pdf_data/st_keywords/standard_id
  • FIPS:
    • FIPS 186: 1
    • FIPS 46-2: 2
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 11
    • CCMB-2017-04-003: 2
  • FIPS:
    • FIPS 180-4: 5
    • FIPS 186-4: 5
    • FIPS 197: 5
    • FIPS 198-1: 4
    • FIPS 202: 6
  • ISO:
    • ISO/IEC 14888: 4
    • ISO/IEC 9796: 2
    • ISO/IEC 9796-2: 4
  • NIST:
    • NIST SP 800-38A: 4
    • NIST SP 800-38B: 4
    • NIST SP 800-38C: 3
    • NIST SP 800-38D: 3
    • NIST SP 800-56A: 4
    • NIST SP 800-67: 3
    • NIST SP 800-90A: 9
    • NIST SP 800-90B: 1
    • SP 800-38A: 2
    • SP 800-38C: 1
    • SP 800-38D: 1
    • SP 800-56A: 2
    • SP 800-67: 1
  • PKCS:
    • PKCS #1: 8
    • PKCS1: 1
  • RFC:
    • RFC 7748: 4
    • RFC 8032: 1
pdf_data/st_keywords/javacard_api_const
  • curves:
    • X25519: 5
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. 10 To allow the: 1
    • out of scope: 1
pdf_data/st_metadata
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  • /Trapped: /False
  • pdf_file_size_bytes: 1889519
  • pdf_hyperlinks: http://www.st.com
  • pdf_is_encrypted: False
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