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S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software BSI-DSZ-CC-0910-2016 |
Infineon Technologies Smart Card IC (Security Controller) M5072 with optional RSA v1.03.006/v2.06.003, EC v1.03.006/ v2.06.003, Toolbox v1.03.006/ v2.06.003, SCL v2.02.010 libraries with specific IC dedicated software BSI-DSZ-CC-0946-V3-2017 |
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name | S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software | Infineon Technologies Smart Card IC (Security Controller) M5072 with optional RSA v1.03.006/v2.06.003, EC v1.03.006/ v2.06.003, Toolbox v1.03.006/ v2.06.003, SCL v2.02.010 libraries with specific IC dedicated software |
not_valid_before | 2016-11-30 | 2017-08-18 |
not_valid_after | 2021-11-30 | 2022-08-17 |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910b_pdf.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0946V3b_pdf.pdf |
manufacturer | Samsung Electronics Co., Ltd. | Infineon Technologies AG |
manufacturer_web | https://www.samsung.com | https://www.infineon.com/ |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910a_pdf.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0946V3a_pdf.pdf |
maintenance_updates | frozendict({'_type': 'sec_certs.sample.cc.CCCertificate.MaintenanceReport', 'maintenance_date': datetime.date(2018, 12, 20), 'maintenance_title': 'Reassessment - S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software', 'maintenance_report_link': 'https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910ra1a_pdf.pdf', 'maintenance_st_link': None}), frozendict({'_type': 'sec_certs.sample.cc.CCCertificate.MaintenanceReport', 'maintenance_date': datetime.date(2018, 12, 20), 'maintenance_title': 'S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software', 'maintenance_report_link': 'https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0910ma1a_pdf.pdf', 'maintenance_st_link': None}) | |
state/report/pdf_hash | 200870bf0bb791cfadb4e399114a9a529ccc9d212213078ba644a9a802f5e7a1 | 307fea2724f1de569bbef8f79cbf2bc58c601a7625408ca964f90259e2c3d2d5 |
state/report/txt_hash | 56175c58ab9e2e12c07ce95a251f9bd5820337df113d6ba92e31c72364f94d09 | c3694d765f381adad3e01e2e1a75d5987c7ba04dfe5507bf334eeeef388f8320 |
state/st/pdf_hash | 8274080fb1ed65d3877d570cdab7a09c79ad1b1e0afcd6b64245f1493f580581 | 64c8952853d8047a6d7c6578ea29faf5793bcf7ea3bddbbcbc9ab49af6d374a6 |
state/st/txt_hash | a744cb55847d1dbde41fa9f58a681a3a75bf45c1d1808af4d3f93e8f5049af0b | 2fa61c12d81735ec270664252c652510d549007a4f7ab814e9e1727269e79e8a |
heuristics/cert_id | BSI-DSZ-CC-0910-2016 | BSI-DSZ-CC-0946-V3-2017 |
heuristics/extracted_versions | 1.01 | 2.02.010, 1.03.006, 2.06.003 |
heuristics/report_references/directly_referencing | None | BSI-DSZ-CC-0946-V2-2015 |
heuristics/report_references/indirectly_referencing | None | BSI-DSZ-CC-0827-V2-2014, BSI-DSZ-CC-0827-2013, BSI-DSZ-CC-0791-2012, BSI-DSZ-CC-0946-2014, BSI-DSZ-CC-0946-V2-2015 |
pdf_data/report_filename | 0910a_pdf.pdf | 0946V3a_pdf.pdf |
pdf_data/report_frontpage/DE/cert_id | BSI-DSZ-CC-0910-2016 | BSI-DSZ-CC-0946-V3-2017 |
pdf_data/report_frontpage/DE/cert_item | S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with optional Secure ECC Library (Version 1.01) including specific IC Dedicated Software | Infineon Technologies Smart Card IC (Security Controller) M5072 with optional RSA v1.03.006/v2.06.003, EC v1.03.006/ v2.06.003, Toolbox v1.03.006/ v2.06.003, SCL v2.02.010 libraries with specific IC dedicated software |
pdf_data/report_frontpage/DE/developer | Samsung Electronics | Infineon Technologies AG |
pdf_data/report_keywords/asymmetric_crypto |
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pdf_data/report_keywords/asymmetric_crypto/ECC/ECC/ECC | 19 | 5 |
pdf_data/report_keywords/asymmetric_crypto/ECC/ECDH/ECDH | 2 | 1 |
pdf_data/report_keywords/asymmetric_crypto/ECC/ECDSA/ECDSA | 3 | 1 |
pdf_data/report_keywords/cc_cert_id/DE |
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pdf_data/report_keywords/cc_claims | |
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pdf_data/report_keywords/cc_protection_profile_id/BSI |
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pdf_data/report_keywords/cc_protection_profile_id/BSI/BSI-CC-PP-0035-2007 | 4 | 2 |
pdf_data/report_keywords/cc_sar/ASE |
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pdf_data/report_keywords/cc_sar/ATE/ATE_FUN | 2 | 1 |
pdf_data/report_keywords/cc_sar/ATE/ATE_IND | 2 | 1 |
pdf_data/report_keywords/cc_sar/AVA/AVA_VAN | 3 | 2 |
pdf_data/report_keywords/cc_security_level/EAL |
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pdf_data/report_keywords/cc_security_level/EAL/EAL 5 | 13 | 14 |
pdf_data/report_keywords/cc_security_level/EAL/EAL 6 | 4 | 3 |
pdf_data/report_keywords/cc_sfr | |
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pdf_data/report_keywords/certification_process/ConfidentialDocument |
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pdf_data/report_keywords/cipher_mode |
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pdf_data/report_keywords/crypto_library | |
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pdf_data/report_keywords/crypto_scheme |
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pdf_data/report_keywords/ecc_curve |
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pdf_data/report_keywords/hash_function |
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pdf_data/report_keywords/randomness |
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pdf_data/report_keywords/randomness/RNG/RNG | 1 | 2 |
pdf_data/report_keywords/randomness/TRNG |
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pdf_data/report_keywords/side_channel_analysis |
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pdf_data/report_keywords/side_channel_analysis/SCA |
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pdf_data/report_keywords/side_channel_analysis/SCA/DPA | 2 | 4 |
pdf_data/report_keywords/side_channel_analysis/SCA/SPA | 1 | 3 |
pdf_data/report_keywords/standard_id |
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pdf_data/report_keywords/standard_id/BSI |
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pdf_data/report_keywords/standard_id/BSI/AIS 25 | 2 | 1 |
pdf_data/report_keywords/standard_id/BSI/AIS 26 | 2 | 1 |
pdf_data/report_keywords/standard_id/BSI/AIS 31 | 4 | 2 |
pdf_data/report_keywords/standard_id/BSI/AIS 34 | 2 | 1 |
pdf_data/report_keywords/standard_id/BSI/AIS 35 | 2 | 1 |
pdf_data/report_keywords/standard_id/BSI/AIS31 | 3 | 1 |
pdf_data/report_keywords/symmetric_crypto |
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pdf_data/report_keywords/symmetric_crypto/AES_competition/AES/AES | 4 | 9 |
pdf_data/report_keywords/symmetric_crypto/DES/3DES |
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pdf_data/report_keywords/symmetric_crypto/DES/DES/DES | 1 | 7 |
pdf_data/report_keywords/tee_name | |
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pdf_data/report_keywords/vendor |
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pdf_data/report_metadata//CreationDate | D:20170103094609+01'00' | D:20170829141626+02'00' |
pdf_data/report_metadata//Keywords | "Common Criteria, Certification, Zertifizierung, EAL5, S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH" | "Common Criteria, Certification, Zertifizierung, SmartCard, Infineon, IFX, 0946-V3, PP-0084, Security IC" |
pdf_data/report_metadata//ModDate | D:20170103132209+01'00' | D:20170830070656+02'00' |
pdf_data/report_metadata//Producer | LibreOffice 4.2 | LibreOffice 5.2 |
pdf_data/report_metadata//Title | Certification Report BSI-DSZ-CC-0910-2016 | Certification Report BSI-DSZ-CC-0946-V3-2017 |
pdf_data/report_metadata/pdf_file_size_bytes | 741597 | 1150834 |
pdf_data/report_metadata/pdf_number_of_pages | 38 | 42 |
pdf_data/st_filename | 0910b_pdf.pdf | 0946V3b_pdf.pdf |
pdf_data/st_keywords/asymmetric_crypto |
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pdf_data/st_keywords/asymmetric_crypto/ECC/ECC/ECC | 58 | 67 |
pdf_data/st_keywords/asymmetric_crypto/ECC/ECDSA/ECDSA | 14 | 16 |
pdf_data/st_keywords/asymmetric_crypto/FF/DH/Diffie-Hellman | 2 | 6 |
pdf_data/st_keywords/cc_claims/O |
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pdf_data/st_keywords/cc_claims/O/O.RND | 6 | 1 |
pdf_data/st_keywords/cc_claims/T/T.RND | 5 | 1 |
pdf_data/st_keywords/cc_protection_profile_id/BSI |
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pdf_data/st_keywords/cc_protection_profile_id/BSI/BSI-PP-0035 | 5 | 3 |
pdf_data/st_keywords/cc_sar/ADV |
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pdf_data/st_keywords/cc_sar/ADV/ADV_ARC.1 | 7 | 2 |
pdf_data/st_keywords/cc_sar/ADV/ADV_FSP | 2 | 1 |
pdf_data/st_keywords/cc_sar/ADV/ADV_FSP.4 | 2 | 1 |
pdf_data/st_keywords/cc_sar/AGD |
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pdf_data/st_keywords/cc_sar/ALC |
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pdf_data/st_keywords/cc_sar/ALC/ALC_CMS | 2 | 1 |
pdf_data/st_keywords/cc_sar/ALC/ALC_DVS.2 | 8 | 9 |
pdf_data/st_keywords/cc_sar/ALC/ALC_TAT.2 | 1 | 3 |
pdf_data/st_keywords/cc_sar/ASE |
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pdf_data/st_keywords/cc_sar/ATE |
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pdf_data/st_keywords/cc_sar/ATE/ATE_DPT.3 | 1 | 4 |
pdf_data/st_keywords/cc_sar/AVA |
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pdf_data/st_keywords/cc_sar/AVA/AVA_VAN.5 | 13 | 11 |
pdf_data/st_keywords/cc_security_level/EAL |
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pdf_data/st_keywords/cc_security_level/EAL/EAL 5 | 2 | 4 |
pdf_data/st_keywords/cc_security_level/EAL/EAL 5 augmented | 2 | 3 |
pdf_data/st_keywords/cc_security_level/EAL/EAL5 | 6 | 7 |
pdf_data/st_keywords/cc_security_level/EAL/EAL5 augmented | 1 | 3 |
pdf_data/st_keywords/cc_sfr |
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pdf_data/st_keywords/cc_sfr/FAU |
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pdf_data/st_keywords/cc_sfr/FAU/FAU_GEN | 2 | 1 |
pdf_data/st_keywords/cc_sfr/FAU/FAU_SAS | 8 | 5 |
pdf_data/st_keywords/cc_sfr/FAU/FAU_SAS.1 | 12 | 10 |
pdf_data/st_keywords/cc_sfr/FAU/FAU_SAS.1.1 | 2 | 1 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_CKM | 5 | 22 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_CKM.1 | 23 | 30 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_CKM.2 | 2 | 5 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_CKM.4 | 11 | 28 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_COP | 27 | 46 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_COP.1 | 22 | 29 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_RNG | 6 | 20 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_RNG.1 | 12 | 23 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_RNG.1.1 | 2 | 1 |
pdf_data/st_keywords/cc_sfr/FCS/FCS_RNG.1.2 | 2 | 1 |
pdf_data/st_keywords/cc_sfr/FDP |
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pdf_data/st_keywords/cc_sfr/FDP/FDP_ACC.1 | 8 | 23 |
pdf_data/st_keywords/cc_sfr/FDP/FDP_ACF.1 | 10 | 20 |
pdf_data/st_keywords/cc_sfr/FDP/FDP_IFC.1 | 18 | 14 |
pdf_data/st_keywords/cc_sfr/FDP/FDP_ITC.1 | 9 | 21 |
pdf_data/st_keywords/cc_sfr/FDP/FDP_ITC.2 | 9 | 21 |
pdf_data/st_keywords/cc_sfr/FDP/FDP_ITT.1 | 17 | 11 |
pdf_data/st_keywords/cc_sfr/FDP/FDP_SDI.1 | 1 | 17 |
pdf_data/st_keywords/cc_sfr/FMT |
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pdf_data/st_keywords/cc_sfr/FMT/FMT_LIM | 20 | 3 |
pdf_data/st_keywords/cc_sfr/FMT/FMT_LIM.1 | 28 | 7 |
pdf_data/st_keywords/cc_sfr/FMT/FMT_LIM.2 | 32 | 8 |
pdf_data/st_keywords/cc_sfr/FMT/FMT_MSA.1 | 12 | 18 |
pdf_data/st_keywords/cc_sfr/FMT/FMT_MSA.3 | 13 | 19 |
pdf_data/st_keywords/cc_sfr/FMT/FMT_SMF.1 | 9 | 16 |
pdf_data/st_keywords/cc_sfr/FPT |
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pdf_data/st_keywords/cc_sfr/FPT/FPT_FLS.1 | 21 | 18 |
pdf_data/st_keywords/cc_sfr/FPT/FPT_ITT.1 | 15 | 13 |
pdf_data/st_keywords/cc_sfr/FPT/FPT_PHP.3 | 20 | 14 |
pdf_data/st_keywords/cc_sfr/FRU |
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pdf_data/st_keywords/cc_sfr/FRU/FRU_FLT.2 | 17 | 8 |
pdf_data/st_keywords/cipher_mode |
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pdf_data/st_keywords/cipher_mode/CTR/CTR | 5 | 7 |
pdf_data/st_keywords/cipher_mode/ECB/ECB | 11 | 9 |
pdf_data/st_keywords/crypto_library | |
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pdf_data/st_keywords/crypto_scheme/KA/Key Agreement | 2 | 4 |
pdf_data/st_keywords/ecc_curve |
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pdf_data/st_keywords/ecc_curve/NIST |
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pdf_data/st_keywords/ecc_curve/NIST/P-192 | 8 | 4 |
pdf_data/st_keywords/hash_function |
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pdf_data/st_keywords/randomness/RNG/RND | 11 | 2 |
pdf_data/st_keywords/randomness/RNG/RNG | 8 | 11 |
pdf_data/st_keywords/randomness/TRNG |
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pdf_data/st_keywords/randomness/TRNG/TRNG | 4 | 14 |
pdf_data/st_keywords/side_channel_analysis |
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pdf_data/st_keywords/side_channel_analysis/FI |
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pdf_data/st_keywords/side_channel_analysis/FI/DFA | 2 | 7 |
pdf_data/st_keywords/side_channel_analysis/FI/Malfunction | 27 | 12 |
pdf_data/st_keywords/side_channel_analysis/FI/malfunction | 11 | 1 |
pdf_data/st_keywords/side_channel_analysis/SCA |
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pdf_data/st_keywords/side_channel_analysis/SCA/Leak-Inherent | 23 | 10 |
pdf_data/st_keywords/side_channel_analysis/SCA/Physical Probing | 4 | 2 |
pdf_data/st_keywords/side_channel_analysis/SCA/SPA | 5 | 6 |
pdf_data/st_keywords/side_channel_analysis/SCA/physical probing | 9 | 1 |
pdf_data/st_keywords/side_channel_analysis/SCA/side channel | 2 | 7 |
pdf_data/st_keywords/standard_id |
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pdf_data/st_keywords/standard_id/BSI |
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pdf_data/st_keywords/standard_id/BSI/AIS31 | 1 | 5 |
pdf_data/st_keywords/standard_id/CC |
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pdf_data/st_keywords/standard_id/CC/CCMB-2012-09-001 | 3 | 1 |
pdf_data/st_keywords/standard_id/CC/CCMB-2012-09-002 | 3 | 1 |
pdf_data/st_keywords/standard_id/CC/CCMB-2012-09-003 | 3 | 1 |
pdf_data/st_keywords/standard_id/FIPS |
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pdf_data/st_keywords/symmetric_crypto |
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pdf_data/st_keywords/symmetric_crypto/AES_competition/AES/AES | 16 | 43 |
pdf_data/st_keywords/symmetric_crypto/DES/3DES |
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pdf_data/st_keywords/symmetric_crypto/DES/3DES/3DES | 6 | 21 |
pdf_data/st_keywords/symmetric_crypto/DES/3DES/TDEA | 1 | 2 |
pdf_data/st_keywords/symmetric_crypto/DES/3DES/Triple-DES | 1 | 3 |
pdf_data/st_keywords/symmetric_crypto/DES/DES/DES | 9 | 13 |
pdf_data/st_keywords/technical_report_id | |
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pdf_data/st_keywords/tee_name | |
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pdf_data/st_keywords/vendor |
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pdf_data/st_metadata |
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pdf_data/st_metadata//Author | Sunggeun Park | Jürgen Noller, Rainer Urian |
pdf_data/st_metadata//CreationDate | D:20161122184902+09'00' | D:20170829171858+02'00' |
pdf_data/st_metadata//Creator | Word용 Acrobat PDFMaker 10.1 | Microsoft® Word 2010 |
pdf_data/st_metadata//Keywords | ST Lite; S3FV5RP; S3FV5RK; S3FV5RJ; S3FV5RH | CC-Zertification, Security IC, Infineon Technologies AG, SmartCard |
pdf_data/st_metadata//ModDate | D:20170201195503+09'00' | D:20170829171858+02'00' |
pdf_data/st_metadata//Producer | Adobe PDF Library 10.0 | Microsoft® Word 2010 |
pdf_data/st_metadata//Subject | ST Lite of S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software | BSI-DSZ-CC-0946-V3-2017 |
pdf_data/st_metadata//Title | Security Target of Samsung S3FV5RP, S3FV5RK, S3FV5RJ, S3FV5RH 32-bit RISC Microcontroller for Smart Card with optional Secure ECC Library including specific IC Dedicated Software | ST-Lite |
pdf_data/st_metadata/pdf_file_size_bytes | 1425901 | 1217401 |
pdf_data/st_metadata/pdf_hyperlinks | http://www.ietf.org/rfc/rfc5639.txt, mailto:[email protected];[email protected]?subject=Document%20question%20, http://www.bsi.bund.de/, http://www.infineon.com/ | |
pdf_data/st_metadata/pdf_is_encrypted | True | False |
pdf_data/st_metadata/pdf_number_of_pages | 71 | 77 |
dgst | 444c4b57afd7eb38 | 6fbfdf147c9b6ad8 |