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FM1280 V05
SERTIT-109 		S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2
BSI-DSZ-CC-0501-2008
name FM1280 V05 S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2
scheme NO DE
not_valid_after 02.07.2023 01.09.2019
not_valid_before 02.07.2018 01.07.2008
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-109%20C%20v%202.0.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SERTIT-109%20Certification%20Report%20Fudan%20EAL5plus%20v2.0_rev.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501a.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/FM1280%20EAL5plus%20ST%20lite%20v2.0.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0501b.pdf
manufacturer Shanghai Fudan Microelectronics Group Co., Ltd. Samsung Electronics Co., Ltd.
manufacturer_web https://eng.fmsh.com https://www.samsung.com
security_level ALC_DVS.2, EAL5+, AVA_VAN.5 EAL5+, AVA_MSU.3, ALC_DVS.2, AVA_VLA.4
dgst 29eab60d2793d1a1 3f287c94d1039f0b
heuristics/cert_id SERTIT-109 BSI-DSZ-CC-0501-2008
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ALC_LCD.2, AGD_USR.1, ALC_DVS.2, AVA_SOF.1, ATE_COV.2, ATE_DPT.2, AGD_ADM.1, ADV_INT.1, ADV_RCR.2, ATE_FUN.1, ADV_IMP.2, ALC_TAT.2, ADV_HLD.3, AVA_VLA.4, ADV_SPM.3, ATE_IND.2, ADV_LLD.1, ADV_FSP.3, AVA_CCA.1, AVA_MSU.3
heuristics/extracted_versions - 16, 2
heuristics/report_references/directly_referenced_by {} BSI-DSZ-CC-0624-2010, KECS-ISIS-0222-2010
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0452-2007
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2012/09, KECS-ISIS-0378-2012, KECS-ISIS-0222-2010, BSI-DSZ-CC-0624-2010
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0438-2007, BSI-DSZ-CC-0400-2007, BSI-DSZ-CC-0452-2007
heuristics/scheme_data
  • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
  • certification_date: 02.07.2018
  • developer: Shanghai Fudan Microelectronics Group Co., Ltd.
  • enhanced:
    • category: ICs, Smart Cards and Smart Card-Related Devices and Systems
    • cert_id: SERTIT-109
    • certification_date: 02.07.2018
    • description: The TOE is a Dual Interface Smart Card Chip with IC Dedicated Software. It provides TDES, RSA, AES, ECC,True Random Number Generator and other security features. It can be widely and easily applied in various security fields such as banking and financial market, social security card, transport card, small-amount payment and security identification, etc. The TOE supports the following communication interfaces: - ISO/IEC 14443 TYPE A contactless interface - ISO/IEC 7816 contact interface - GPIO - SPI - I2C - UART
    • developer: Shanghai Fudan Microelectronics Group Co., Ltd.
    • documents: frozendict({'cert': [frozendict({'href': 'https://sertit.no/getfile.php/135331-1607953855/SERTIT/Sertifikater/2018/109/SERTIT-109%20C%20v%202.0.pdf'})], 'target': [frozendict({'href': 'https://sertit.no/getfile.php/135325-1607953847/SERTIT/Sertifikater/2018/109/FM1280%20EAL5%2B%20ST%20lite.pdf'})], 'report': [frozendict({'href': 'https://sertit.no/getfile.php/135328-1607953852/SERTIT/Sertifikater/2018/109/SERTIT-109%20Certification%20Report%20Fudan%20EAL5%2B%20v2.0_rev.pdf'})], 'maintenance': [frozendict({'href': 'https://sertit.no/getfile.php/135322-1607953843/SERTIT/Sertifikater/2018/109/SERTIT-109%20MR%20Maintenance%20Report%20v1.0-.pdf'})]})
    • evaluation_facility: Brightsight B.V.
    • expiration_date: 02.07.2023
    • level: EAL 5, ALC_DVS.2, ATE_DPT.2, AVA_VAN.5
    • mutual_recognition: CCRA, SOG-IS
    • product: V05
    • protection_profile: Security IC Platform Protection Profile with Augmentation Packages Version 1.0, BSI-CC-PP-0084-2014
    • sponsor: Shanghai Fudan Microelectronics Group Co., Ltd.
  • product: FM1280
  • url: https://sertit.no/certified-products/product-archive/fm1280
heuristics/st_references/directly_referenced_by {} KECS-ISIS-0222-2010
heuristics/st_references/indirectly_referenced_by {} KECS-ISIS-0222-2010
heuristics/protection_profiles cf0f01bcd7be3e9c {}
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf {}
pdf_data/cert_filename SERTIT-109 C v 2.0.pdf
pdf_data/cert_keywords/cc_cert_id
  • NO:
    • SERTIT-109: 2
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • pdf_file_size_bytes: 2830569
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename SERTIT-109 Certification Report Fudan EAL5plus v2.0_rev.pdf 0501a.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0501-2008
    • cert_item: S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2
    • cert_lab: BSI
    • developer: Samsung Electronics Co., Ltd
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • NO:
    • SERTIT-109: 20
  • DE:
    • BSI-DSZ-CC-0452-2007: 1
    • BSI-DSZ-CC-0501: 1
    • BSI-DSZ-CC-0501-2008: 19
  • NL:
    • CC-0452-2007: 1
    • CC-0501: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 23
  • BSI:
    • BSI-PP-0002-2001: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 5: 22
    • EAL 5 augmented: 1
    • EAL1: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5+: 1
    • EAL7: 1
  • EAL:
    • EAL 1: 1
    • EAL 4: 5
    • EAL 5: 4
    • EAL 5 augmented: 4
    • EAL 7: 1
    • EAL1: 5
    • EAL2: 3
    • EAL3: 4
    • EAL4: 6
    • EAL5: 6
    • EAL5+: 1
    • EAL6: 3
    • EAL7: 4
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR: 1
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 1
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 1
    • ADO_IGS: 2
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_INT: 2
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 6
    • ALC_FLR: 2
    • ALC_LCD: 1
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.2: 1
  • APE:
    • APE_DES: 1
    • APE_ENV: 1
    • APE_INT: 1
    • APE_OBJ: 1
    • APE_REQ: 1
    • APE_SRE: 1
  • ASE:
    • ASE_DES: 1
    • ASE_ENV: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_PPC: 1
    • ASE_REQ: 1
    • ASE_SRE: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_CCA: 2
    • AVA_MSU: 2
    • AVA_MSU.3: 5
    • AVA_SOF: 3
    • AVA_VLA: 3
    • AVA_VLA.2: 1
    • AVA_VLA.3: 1
    • AVA_VLA.4: 6
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 4
  • FCS:
    • FCS_COP.1: 8
    • FCS_RNG.1: 4
  • FDP:
    • FDP_ACC.1: 1
    • FDP_ACF.1: 1
    • FDP_IFC.1: 1
    • FDP_ITT.1: 1
    • FDP_SDC.1: 4
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM.1: 2
    • FMT_LIM.2: 2
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/vendor
  • Infineon:
    • Infineon Technologies AG: 1
  • Philips:
    • Philips: 1
  • Samsung:
    • Samsung: 17
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 2
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 5
  • DES:
    • 3DES:
      • TDES: 5
    • DES:
      • DES: 3
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • 3DES:
      • Triple-DES: 5
    • DES:
      • DES: 7
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 3
  • ECC:
    • ECDSA:
      • ECDSA: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 2
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • Fault Injection: 1
  • SCA:
    • DPA: 1
    • SPA: 1
  • other:
    • JIL: 2
  • FI:
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • physical probing: 1
    • side-channel: 1
  • other:
    • Bellcore attack: 1
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI 7149: 1
pdf_data/report_keywords/cplc_data
  • ICFab:
    • IC Fabricator: 1
  • ICVersion:
    • IC Version: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 14443: 2
    • ISO/IEC 15408: 8
    • ISO/IEC 7816: 2
  • BSI:
    • AIS 25: 3
    • AIS 26: 2
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 3
    • AIS 35: 2
    • AIS 36: 1
    • AIS 38: 1
    • AIS20: 1
  • ISO:
    • ISO/IEC 15408:2005: 3
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 2, TÜViT (confidential document) [8] Configuration Management Documentation (Class ACM_AUT/CAP/SCP) – Project Cheyenne II, Version: 1
    • 3, 2008-05-09 Samsung Electronics (confidential document) [9] Security Target Lite of S3CC9LC 16-bit RISC Microcontroller for Smart Cards, Version 1.0: 1
    • EVALUATION (ETR-COMP), 8103842493 / BSI-DSZ- CC-0501, S3CC91A, Version 2, 2008-06-03, TÜViT (confidential document) [12] Security Application Note, S3CC9LC, Version 1.1, 2008-05-06, Samsung Electronics 8: 1
    • for Smart Cards – Project Cheyenne II, Version 1.4, 2008-04-29, Samsung Electronics (confidential document) [7] EVALUATION TECHNICAL REPORT-SUMMARY (ETR SUMMARY), 8103842493 / BSI-DSZ-CC-0501, S3CC9LC: 1
pdf_data/report_metadata
  • /Author: Ulrich Isachsen
  • /CreationDate: D:20190319130354+01'00'
  • /Creator: Microsoft® Word 2013
  • /Keywords: ugradert
  • /ModDate: D:20190319130354+01'00'
  • /Producer: Microsoft® Word 2013
  • /Title: tittel
  • pdf_file_size_bytes: 423796
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 20
  • /Author: Federal Office for Information Security
  • /CreationDate: D:20080717125300+02'00'
  • /Creator: Writer
  • /Keywords: "S3CC9LC 16-bit RISC Microcontroller for Smart Card, Revision 2, BSI-DSZ-CC-0501-2008, Samsung Electronics Co., Ltd."
  • /ModDate: D:20080717145955+02'00'
  • /Producer: StarOffice 8
  • /Subject: Common Criteria Zertifizierung
  • /Title: Zertifizierungsreport BSI-DSZ-CC-0501-2008
  • pdf_file_size_bytes: 569988
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename FM1280 EAL5plus ST lite v2.0.pdf 0501b.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-PP-0002: 8
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL5: 2
    • EAL5 augmented: 2
    • EAL5+: 1
  • EAL:
    • EAL4: 1
    • EAL5: 8
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
  • ACM:
    • ACM_AUT: 2
    • ACM_AUT.1: 1
    • ACM_CAP: 2
    • ACM_CAP.4: 2
    • ACM_SCP: 2
    • ACM_SCP.3: 1
  • ADO:
    • ADO_DEL: 2
    • ADO_DEL.2: 2
    • ADO_IGS: 2
    • ADO_IGS.1: 3
  • ADV:
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.3: 1
    • ADV_HLD: 1
    • ADV_HLD.2: 1
    • ADV_HLD.3: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_LLD: 1
    • ADV_LLD.1: 2
    • ADV_RCR: 1
    • ADV_RCR.2: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 4
    • ADV_SPM.3: 1
  • AGD:
    • AGD_ADM: 2
    • AGD_ADM.1: 4
    • AGD_USR: 2
    • AGD_USR.1: 4
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 2
    • ALC_TAT.2: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 2
    • ATE_DPT: 1
    • ATE_DPT.2: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_CCA: 1
    • AVA_CCA.1: 1
    • AVA_MSU: 1
    • AVA_MSU.2: 1
    • AVA_MSU.3: 6
    • AVA_SOF: 1
    • AVA_SOF.1: 1
    • AVA_VLA: 1
    • AVA_VLA.4: 7
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 9
    • FCS_CKM.4: 9
    • FCS_COP.1: 28
    • FCS_COP.1.1: 4
    • FCS_RNG.1: 6
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_ACC.1: 8
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 7
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 4
    • FDP_ITC.1: 13
    • FDP_ITC.2: 5
    • FDP_ITT.1: 6
    • FDP_SDC.1: 7
    • FDP_SDC.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 2
    • FMT_MSA.3: 3
  • FPT:
    • FPT_FLS.1: 6
    • FPT_ITT.1: 6
    • FPT_PHP.3: 5
  • FRU:
    • FRU_FLT.2: 6
  • FAU:
    • FAU_GEN: 1
    • FAU_GEN.1: 1
    • FAU_SAS: 3
    • FAU_SAS.1: 8
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 29
    • FCS_CKM.1.1: 3
    • FCS_CKM.2: 4
    • FCS_CKM.4: 19
    • FCS_CKM.4.1: 2
    • FCS_COP: 1
    • FCS_COP.1: 21
    • FCS_COP.1.1: 2
    • FCS_RND: 2
    • FCS_RND.1: 8
    • FCS_RND.1.1: 1
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 21
    • FDP_ACC.1.1: 1
    • FDP_ACF: 1
    • FDP_ACF.1: 12
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_CKM.2: 1
    • FDP_IFC: 2
    • FDP_IFC.1: 22
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 15
    • FDP_ITC.1.1: 2
    • FDP_ITC.1.2: 2
    • FDP_ITC.1.3: 2
    • FDP_ITC.2: 17
    • FDP_ITC.2.1: 2
    • FDP_ITC.2.2: 2
    • FDP_ITC.2.3: 2
    • FDP_ITC.2.4: 2
    • FDP_ITC.2.5: 2
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 2
  • FMT:
    • FMT_LIM: 4
    • FMT_LIM.1: 14
    • FMT_LIM.1.1: 1
    • FMT_LIM.2: 19
    • FMT_LIM.2.1: 1
    • FMT_MSA: 2
    • FMT_MSA.1: 12
    • FMT_MSA.1.1: 1
    • FMT_MSA.2: 21
    • FMT_MSA.2.1: 2
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 7
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_AMT.1: 1
    • FPT_FLS: 1
    • FPT_FLS.1: 22
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 2
    • FPT_PHP.3: 18
    • FPT_PHP.3.1: 1
    • FPT_SEP: 2
    • FPT_SEP.1: 10
    • FPT_SEP.1.1: 1
    • FPT_SEP.1.2: 1
    • FPT_TDC.1: 2
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 18
  • FTP:
    • FTP_ITC.1: 2
    • FTP_TRP.1: 2
pdf_data/st_keywords/cc_claims
  • O:
    • O.AES: 5
    • O.ECC: 5
    • O.MEM_ACCCESS: 1
    • O.MEM_ACCESS: 4
    • O.RND: 3
    • O.RSA: 5
    • O.TDES: 6
  • T:
    • T.RND: 2
  • O:
    • O.RND: 5
  • T:
    • T.RND: 4
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 29
  • DES:
    • 3DES:
      • 3DES: 1
      • TDEA: 1
      • TDES: 16
      • Triple-DES: 7
    • DES:
      • DES: 13
  • DES:
    • 3DES:
      • 3DES: 13
      • T-DES: 1
      • Triple-DES: 1
    • DES:
      • DES: 12
  • miscellaneous:
    • SEED:
      • SEED: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 30
    • ECDH:
      • ECDH: 3
    • ECDSA:
      • ECDSA: 4
pdf_data/st_keywords/crypto_scheme
  • KA:
    • Key Agreement: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 8
  • TRNG:
    • TRNG: 1
  • RNG:
    • RND: 10
    • RNG: 3
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 5
  • ECB:
    • ECB: 5
pdf_data/st_keywords/crypto_engine
  • TORNADO:
    • TORNADO: 8
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 5
    • fault injection: 1
    • malfunction: 4
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
  • FI:
    • DFA: 1
    • Malfunction: 24
    • malfunction: 12
    • physical tampering: 2
  • SCA:
    • DPA: 5
    • Leak-Inherent: 20
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 3
    • physical probing: 6
    • side-channel: 2
    • timing attacks: 1
  • other:
    • reverse engineering: 3
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS31: 2
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • FIPS:
    • FIPS 197: 3
  • ISO:
    • ISO/IEC 14443: 4
    • ISO/IEC 7816: 4
  • NIST:
    • NIST SP 800-38A: 1
    • NIST SP 800-67: 1
  • PKCS:
    • PKCS#1: 3
  • BSI:
    • AIS 20: 2
    • AIS20: 3
  • FIPS:
    • FIPS PUB 46-3: 2
  • ISO:
    • ISO/IEC 15408-2005: 1
    • ISO/IEC 7816: 4
    • ISO/IEC 9796-1: 3
pdf_data/st_metadata
  • /Author: FMSH
  • /CreationDate: D:20180606084137+08'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20180606084137+08'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 677458
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 31
  • /Author: Kyungsuk Yi (Bryant)
  • /CreationDate: D:20080604112348+09'00'
  • /Creator: PScript5.dll Version 5.2.2
  • /Keywords: Smartcard, IC, S3CC9LC, 16-bit RISC Microcontroller For Smart Cards, 16-bit CMOS Microcontroller For Smart Cards, Samsung Electronics
  • /ModDate: D:20080609165456+09'00'
  • /Producer: Acrobat Distiller 6.0.1 (Windows)
  • /Subject: Security Target Lite
  • /Title: Security Target Lite of S3CC9LC 16-bit RISC Microcontroller For Smart Cards
  • pdf_file_size_bytes: 536251
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 60
state/cert/convert_garbage True False
state/cert/convert_ok True False
state/cert/download_ok True False
state/cert/extract_ok True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different