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ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055
CSA_CC_21006 		Crypto Library V2.6 on P5CC008V1A and P5CC012V1A
NSCIB-CC-11-31802-CR
name ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 Crypto Library V2.6 on P5CC008V1A and P5CC012V1A
category Boundary Protection Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme SG NL
status active archived
not_valid_after 08.07.2027 07.06.2017
not_valid_before 08.07.2022 06.07.2012
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Certification%20Report%20NSCIB-CC-11-31802-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[ST]%20P5_CL_C14_ST_Lite_CC012%20v1.1.pdf
manufacturer ST Engineering Electronics NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.stengg.com https://www.nxp.com
security_level EAL4+, AVA_VAN.5 EAL5+, ALC_DVS.2, AVA_VAN.5
dgst 1dab1c190f3b92d2 f977d70e1882b3a2
heuristics/cert_id CSA_CC_21006 NSCIB-CC-11-31802-CR
heuristics/cert_lab []
heuristics/extracted_sars AGD_OPE.1, ATE_COV.2, AVA_VAN.5, ATE_IND.2, ASE_ECD.1, ALC_LCD.1, ASE_TSS.1, ATE_DPT.1, ADV_FSP.4, ADV_IMP.1, ASE_REQ.2, ASE_SPD.1, ATE_FUN.1, ADV_TDS.3, ADV_ARC.1, ALC_DEL.1, ASE_OBJ.2, ALC_DVS.1, ALC_CMC.4, ASE_INT.1, ALC_CMS.4, AGD_PRE.1, ALC_TAT.1, ASE_CCL.1 AGD_OPE.1, ATE_COV.2, AVA_VAN.5, ATE_DPT.3, ALC_CMS.5, ATE_IND.2, ASE_ECD.1, ALC_LCD.1, ALC_TAT.2, ASE_TSS.1, ADV_IMP.1, ASE_REQ.2, ALC_DVS.2, ASE_SPD.1, ATE_FUN.1, ADV_ARC.1, ALC_DEL.1, ASE_OBJ.2, ALC_CMC.4, ASE_INT.1, ADV_INT.2, AGD_PRE.1, ADV_FSP.5, ASE_CCL.1, ADV_TDS.4
heuristics/extracted_versions 2.2.1055 2.6
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/protection_profiles {} f6d23054061d72ba
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/cert_filename [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf
pdf_data/cert_keywords/cc_cert_id
  • SG:
    • CSA_CC_21006: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
    • EAL 4 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • An:
    • An Security: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /CreationDate: D:20220708024530+08'00'
  • /ModDate: D:20220711181729+08'00'
  • pdf_file_size_bytes: 495889
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf Certification Report NSCIB-CC-11-31802-CR.pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-11-31802-CR
    • cert_item:
    • cert_lab: Brightsight
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • SG:
    • CSA_CC_21006: 2
  • DE:
    • BSI-DSZ-CC-0771: 1
    • BSI-DSZ-CC-0771-2011: 2
  • NL:
    • NSCIB-CC-11-31802: 1
    • NSCIB-CC-11-31802-CR: 14
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4+: 1
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 2
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 3
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ATE:
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_VAN: 3
    • AVA_VAN.5: 4
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 3
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND: 2
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
pdf_data/report_keywords/cc_claims
  • OE:
    • OE.NETWORK: 1
    • OE.PHYSICAL: 1
    • OE.USER: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 9
    • NXP Semiconductors: 5
pdf_data/report_keywords/eval_facility
  • An:
    • An Security: 3
  • BrightSight:
    • Brightsight: 4
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 2
      • Triple-DES: 2
    • DES:
      • DES: 4
  • constructions:
    • MAC:
      • CBC-MAC: 2
pdf_data/report_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 2
    • SHA2:
      • SHA-224: 2
      • SHA-256: 4
pdf_data/report_keywords/randomness
  • PRNG:
    • PRNG: 2
  • RNG:
    • RNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 2
  • ECB:
    • ECB: 2
pdf_data/report_keywords/crypto_engine
  • SmartMX:
    • SmartMX: 17
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 2.6: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 2
  • SCA:
    • DPA: 1
    • SPA: 1
    • Side channel: 1
    • timing attacks: 1
  • other:
    • JIL: 3
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-004: 1
    • CCMB-2018-04-003: 1
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 18045: 4
  • BSI:
    • AIS36: 1
pdf_data/report_metadata
pdf_data/st_filename [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf [ST] P5_CL_C14_ST_Lite_CC012 v1.1.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0771: 1
  • NL:
    • NSCIB-CC-11-31802: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4+: 3
  • EAL:
    • EAL 5: 3
    • EAL 5 augmented: 3
    • EAL4: 1
    • EAL4+: 2
    • EAL5: 29
    • EAL5 augmented: 1
    • EAL5+: 4
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ACM:
    • ACM_CMS.5: 1
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 2
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 2
    • FDP_IFC.2: 9
    • FDP_IFC.2.1: 1
    • FDP_IFC.2.2: 1
    • FDP_IFF: 1
    • FDP_IFF.1: 8
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
  • FMT:
    • FMT_MSA.3: 3
  • FAU:
    • FAU_SAS.1: 2
  • FCS:
    • FCS_CKM.1: 11
    • FCS_CKM.1.1: 1
    • FCS_CKM.2: 1
    • FCS_CKM.4: 11
    • FCS_CKM.4.1: 1
    • FCS_COP.1: 23
    • FCS_COP.1.1: 5
    • FCS_RNG.1: 12
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 6
    • FDP_ACF.1: 5
    • FDP_IFC.1: 20
    • FDP_ITC.1: 6
    • FDP_ITC.2: 6
    • FDP_ITT: 1
    • FDP_ITT.1: 25
    • FDP_ITT.1.1: 1
    • FDP_RIP: 1
    • FDP_RIP.1: 6
    • FDP_RIP.1.1: 1
  • FMT:
    • FMT_LIM.1: 2
    • FMT_LIM.2: 2
    • FMT_MSA.1: 3
    • FMT_MSA.3: 2
    • FMT_SMF.1: 4
  • FPT:
    • FPT_FLS.1: 17
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 29
    • FPT_ITT.1.1: 1
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 14
pdf_data/st_keywords/cc_claims
  • A:
    • A.NETWORK: 4
    • A.PHYSICAL: 4
    • A.USER: 3
  • O:
    • O.ONEWAY: 2
  • OE:
    • OE.NETWORK: 3
    • OE.PHYSICAL: 3
    • OE.USER: 3
  • T:
    • T.RCVDATALEAK: 1
  • O:
    • O.COPY: 6
    • O.CUST_RECONFIG: 3
    • O.MEM_ACCESS: 5
    • O.MF_FW: 4
    • O.REUSE: 6
    • O.RND: 12
    • O.RSA: 5
    • O.SFR_ACCESS: 4
    • O.SHA: 5
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 66
    • NXP Semiconductors: 27
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • 3DES:
      • 3DES: 13
      • TDES: 3
      • Triple-DES: 18
    • DES:
      • DEA: 1
      • DES: 34
  • constructions:
    • MAC:
      • CBC-MAC: 12
pdf_data/st_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 2
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA1:
      • SHA-1: 11
    • SHA2:
      • SHA-224: 9
      • SHA-256: 10
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 18
    • RNG: 41
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 17
  • ECB:
    • ECB: 11
pdf_data/st_keywords/crypto_engine
  • SmartMX:
    • SmartMX: 104
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library 2.6: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • DFA: 22
    • Malfunction: 13
    • fault induction: 1
    • fault injection: 1
    • malfunction: 3
  • SCA:
    • DPA: 12
    • Leak-Inherent: 12
    • Physical Probing: 2
    • SPA: 15
    • Timing attacks: 3
    • side channel: 19
    • side-channel: 11
    • timing attacks: 4
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS20: 2
    • AIS31: 2
  • CC:
    • CCMB-2009-07-004: 2
  • FIPS:
    • FIPS 180-2: 2
    • FIPS PUB 180-2: 1
    • FIPS PUB 197: 1
    • FIPS PUB 46-3: 2
    • FIPS PUB 81: 3
  • ISO:
    • ISO/IEC 9797-1: 1
  • PKCS:
    • PKCS #1: 6
pdf_data/st_metadata
  • /Author: Tan Kok Kheng
  • /CreationDate: D:20220526092514+08'00'
  • /Creator: Microsoft® Word for Microsoft 365
  • /ModDate: D:20220708070046+08'00'
  • /Producer: Microsoft® Word for Microsoft 365
  • /Title: Technical Manual Template
  • pdf_file_size_bytes: 516888
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
  • /Alternative descriptive title: Security Target Lite
  • /Author: Andreas Kühn, Markus Hinkelmann
  • /CertificationID: NSCIB-CC-11-31802
  • /Chip family: SmartMX
  • /Chip type: P5CC008V1A and P5CC012V1A
  • /Comments:
  • /Company: NXP Semiconductors / Brightsight
  • /Copyright date: 2012
  • /CreationDate: D:20120704150017+02'00'
  • /Creator: Acrobat PDFMaker 9.1 for Word
  • /Descriptive title: Security Target Lite
  • /Division: NXP Semiconductors
  • /Keywords: Crypto Library, SmartMX, P5CC008V1A, P5CC012V1A, NXP, EAL5+, AVA_VAN.5, Security Target, AES, DES, RSA, ECC over GF(p), SHA
  • /ModDate: D:20120704150104+02'00'
  • /Modification date: 4 Jul 2012
  • /Producer: Adobe PDF Library 9.0
  • /Revision: Rev. 1.1
  • /Security status: PUBLIC INFORMATION
  • /SourceModified: D:20120704125354
  • /Specification status: Evaluation documentation
  • /Status: accepted
  • /Subject: Common Criteria Evaluation of Crypto Library on SmartMX
  • /TOE long: Crypto Library V2.6 on P5CC008V1A and P5CC012V1A
  • /TOE short: Crypto Library on SmartMX
  • /Template date: 1 October 2006
  • /Template version: 2.8.1
  • /Title: Security Target - Crypto Library V2.7 on P5CC008V1A / P5CC012V1A
  • /docpath: I:\Workspace\CryptoLibP5\SmxCl\docs\02_sw_req_an
  • /philips_smx_cl_docpath: I:\SmartMX\P5_CryptoLib\SmxCl\docs\02_sw_req_an
  • /relBibilioPath: ..\Bibliography.doc
  • pdf_file_size_bytes: 374114
  • pdf_hyperlinks: http://www.nxp.com/, http://www.cacr.math.uwaterloo.ca/hac/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 49
state/cert/convert_garbage True False
state/cert/convert_ok True False
state/cert/download_ok True False
state/cert/extract_ok True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different