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ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 CSA_CC_21006 |
NXP Crypto Library V3.1.x on P6021y VB NSCIB-CC-23-66030-CR |
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name | ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 | NXP Crypto Library V3.1.x on P6021y VB |
category | Boundary Protection Devices and Systems | ICs, Smart Cards and Smart Card-Related Devices and Systems |
scheme | SG | NL |
not_valid_after | 08.07.2027 | 16.02.2028 |
not_valid_before | 08.07.2022 | 16.02.2023 |
cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-23-66030%20-%20Cert.pdf |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-23-66030%20-%20CR.pdf |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-23-66030%20-ST%20v2.0.pdf |
manufacturer | ST Engineering Electronics | NXP Semiconductors Germany GmbH, Business Unit Security and Connectivity |
manufacturer_web | https://www.stengg.com | https://www.nxp.com |
security_level | EAL4+, AVA_VAN.5 | ASE_TSS.2, EAL6+, ALC_FLR.1 |
dgst | 1dab1c190f3b92d2 | d36f35db1f16a072 |
heuristics/cert_id | CSA_CC_21006 | NSCIB-CC-23-66030-CR |
heuristics/cert_lab | [] | |
heuristics/extracted_sars | AGD_OPE.1, ASE_ECD.1, ADV_FSP.4, ATE_DPT.1, ADV_TDS.3, ALC_DEL.1, ALC_CMS.4, ALC_DVS.1, ALC_LCD.1, ADV_ARC.1, ADV_IMP.1, ASE_SPD.1, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_IND.2, AVA_VAN.5, ASE_TSS.1, ATE_COV.2, ATE_FUN.1, ALC_CMC.4, AGD_PRE.1, ALC_TAT.1 | ALC_FLR.1, ASE_TSS.2, AGD_OPE.1, ALC_CMS.5, ASE_ECD.1, ALC_TAT.3, ALC_DEL.1, ALC_CMC.5, ADV_IMP.2, ALC_LCD.1, ADV_ARC.1, ASE_SPD.1, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_DPT.3, ATE_IND.2, ADV_SPM.1, AVA_VAN.5, ALC_DVS.2, ADV_TDS.5, ADV_FSP.5, AGD_PRE.1, ADV_INT.3, ATE_FUN.2, ATE_COV.3 |
heuristics/extracted_versions | 2.2.1055 | 3.1 |
heuristics/report_references/directly_referencing | {} | BSI-DSZ-CC-1072-V5-2022 |
heuristics/report_references/indirectly_referencing | {} | BSI-DSZ-CC-1072-V5-2022, BSI-DSZ-CC-0955-V2-2016, BSI-DSZ-CC-0955-2016, BSI-DSZ-CC-1072-V2-2019, BSI-DSZ-CC-1072-2018, BSI-DSZ-CC-1072-V4-2021, BSI-DSZ-CC-1072-V3-2019 |
heuristics/scheme_data |
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heuristics/protection_profiles | {} | cf0f01bcd7be3e9c |
maintenance_updates |
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protection_profile_links | {} | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf |
pdf_data/cert_filename | [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf | NSCIB-CC-23-66030 - Cert.pdf |
pdf_data/cert_keywords/cc_cert_id |
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pdf_data/cert_keywords/cc_protection_profile_id |
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pdf_data/cert_keywords/cc_security_level |
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pdf_data/cert_keywords/cc_sar |
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pdf_data/cert_keywords/cc_claims |
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pdf_data/cert_keywords/vendor |
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pdf_data/cert_keywords/eval_facility |
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pdf_data/cert_keywords/standard_id |
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pdf_data/cert_metadata |
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pdf_data/report_filename | [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf | NSCIB-CC-23-66030 - CR.pdf |
pdf_data/report_frontpage |
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pdf_data/report_keywords/cc_cert_id |
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pdf_data/report_keywords/cc_protection_profile_id |
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pdf_data/report_keywords/cc_security_level |
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pdf_data/report_keywords/cc_sar |
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pdf_data/report_keywords/cc_claims |
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pdf_data/report_keywords/vendor |
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pdf_data/report_keywords/eval_facility |
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pdf_data/report_keywords/symmetric_crypto |
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pdf_data/report_keywords/asymmetric_crypto |
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pdf_data/report_keywords/hash_function |
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pdf_data/report_keywords/crypto_scheme |
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pdf_data/report_keywords/randomness |
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pdf_data/report_keywords/cipher_mode |
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pdf_data/report_keywords/crypto_engine |
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pdf_data/report_keywords/side_channel_analysis |
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pdf_data/report_keywords/standard_id |
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pdf_data/report_keywords/certification_process |
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pdf_data/report_metadata |
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pdf_data/st_filename | [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf | NSCIB-CC-23-66030 -ST v2.0.pdf |
pdf_data/st_keywords/cc_cert_id |
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pdf_data/st_keywords/cc_protection_profile_id |
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pdf_data/st_keywords/cc_security_level |
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pdf_data/st_keywords/cc_sar |
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pdf_data/st_keywords/cc_sfr |
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pdf_data/st_keywords/cc_claims |
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pdf_data/st_keywords/vendor |
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pdf_data/st_keywords/symmetric_crypto |
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pdf_data/st_keywords/asymmetric_crypto |
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pdf_data/st_keywords/hash_function |
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pdf_data/st_keywords/crypto_scheme |
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pdf_data/st_keywords/randomness |
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pdf_data/st_keywords/cipher_mode |
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pdf_data/st_keywords/crypto_engine |
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pdf_data/st_keywords/crypto_library |
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pdf_data/st_keywords/side_channel_analysis |
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pdf_data/st_keywords/standard_id |
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pdf_data/st_metadata |
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state/cert/convert_garbage | True | False |
state/cert/pdf_hash | Different | Different |
state/cert/txt_hash | Different | Different |
state/report/pdf_hash | Different | Different |
state/report/txt_hash | Different | Different |
state/st/pdf_hash | Different | Different |
state/st/txt_hash | Different | Different |