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ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055
CSA_CC_21006 		SPass NX V1.0 on S3CT9KW/S3CT9KC/S3CT9K9
KECS-ISIS-0394-2012
name ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 SPass NX V1.0 on S3CT9KW/S3CT9KC/S3CT9K9
category Boundary Protection Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme SG KR
status active archived
not_valid_after 08.07.2027 01.06.2019
not_valid_before 08.07.2022 15.06.2012
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/KECS-ISIS-0394-2012%20SPass%20NX%20V1.0%20on%20S3CT9KW-KC-K9(eng).pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Samsung_SDS_SPass_NX_V1.0_ST_Lite(En).pdf
manufacturer ST Engineering Electronics Samsung SDS
manufacturer_web https://www.stengg.com https://www.sds.samsung.co.kr
security_level EAL4+, AVA_VAN.5 ADV_IMP.2, AVA_VAN.5, EAL4+, ATE_DPT.2, ALC_CMS.5, ALC_TAT.2, ALC_DVS.2
dgst 1dab1c190f3b92d2 b76da2b11051b7a9
heuristics/cert_id CSA_CC_21006 KECS-ISIS-0394-2012
heuristics/extracted_sars AGD_OPE.1, ASE_ECD.1, ADV_FSP.4, ATE_DPT.1, ADV_TDS.3, ALC_DEL.1, ALC_CMS.4, ALC_DVS.1, ALC_LCD.1, ADV_ARC.1, ADV_IMP.1, ASE_SPD.1, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_IND.2, AVA_VAN.5, ASE_TSS.1, ATE_COV.2, ATE_FUN.1, ALC_CMC.4, AGD_PRE.1, ALC_TAT.1 AGD_OPE.1, ALC_CMS.5, ALC_TAT.2, ASE_ECD.1, ADV_FSP.4, ADV_TDS.3, ALC_DEL.1, ADV_IMP.2, ALC_LCD.1, ADV_ARC.1, ASE_SPD.1, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_IND.2, AVA_VAN.5, ASE_TSS.1, ATE_COV.2, ATE_FUN.1, ALC_DVS.2, ALC_CMC.4, AGD_PRE.1, ATE_DPT.2
heuristics/extracted_versions 2.2.1055 1.0
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0639-2010
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0547-2009, BSI-DSZ-CC-0639-2010
heuristics/scheme_data
heuristics/st_references/directly_referencing {} BSI-DSZ-CC-0639-2010
heuristics/st_references/indirectly_referencing {} BSI-DSZ-CC-0639-2010
heuristics/protection_profiles {} 4bfe1a1aff1207a4
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/20110221143918.pdf
pdf_data/cert_filename [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf
pdf_data/cert_keywords/cc_cert_id
  • SG:
    • CSA_CC_21006: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
    • EAL 4 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • An:
    • An Security: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /CreationDate: D:20220708024530+08'00'
  • /ModDate: D:20220711181729+08'00'
  • pdf_file_size_bytes: 495889
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf KECS-ISIS-0394-2012 SPass NX V1.0 on S3CT9KW-KC-K9(eng).pdf
pdf_data/report_keywords/cc_cert_id
  • SG:
    • CSA_CC_21006: 2
  • DE:
    • BSI-DSZ-CC-0639-2010: 3
    • BSI-DSZ-CC-0639-2010-MA-01: 1
  • KR:
    • KECS-ISIS-0394-2012: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4+: 1
  • EAL:
    • EAL4: 2
    • EAL4 augmented: 2
    • EAL4+: 2
    • EAL5+: 1
    • EAL6: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ATE:
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_VAN: 3
    • AVA_VAN.5: 4
  • ADV:
    • ADV_ARC.1: 2
    • ADV_FSP.4: 3
    • ADV_IMP.2: 5
    • ADV_TDS.3: 3
  • AGD:
    • AGD_OPE.1: 2
    • AGD_PRE.1: 3
  • ALC:
    • ALC_CMC.4: 2
    • ALC_CMS.5: 5
    • ALC_DEL.1: 2
    • ALC_DVS.2: 6
    • ALC_LCD.1: 2
    • ALC_TAT.2: 5
  • ASE:
    • ASE_CCL.1: 2
    • ASE_ECD.1: 3
    • ASE_INT.1: 3
    • ASE_OBJ.2: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 3
  • ATE:
    • ATE_COV.2: 3
    • ATE_DPT.2: 6
    • ATE_FUN.1: 2
    • ATE_IND.2: 4
  • AVA:
    • AVA_VAN.5: 8
pdf_data/report_keywords/cc_claims
  • OE:
    • OE.NETWORK: 1
    • OE.PHYSICAL: 1
    • OE.USER: 1
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 14
pdf_data/report_keywords/eval_facility
  • An:
    • An Security: 3
  • TTA:
    • TTA: 4
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 2
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 4
  • FF:
    • DH:
      • DH: 1
pdf_data/report_keywords/randomness
  • TRNG:
    • TRNG: 3
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • fault injection: 1
  • SCA:
    • side-channel: 2
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-004: 1
    • CCMB-2018-04-003: 1
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 18045: 4
  • BSI:
    • AIS 34: 1
  • CC:
    • CCMB-2009-07-001: 2
    • CCMB-2009-07-003: 2
    • CCMB-2009-07-004: 1
  • ICAO:
    • ICAO: 12
  • ISO:
    • ISO/IEC 14443: 4
    • ISO/IEC 7816: 2
    • ISO/IEC 7816-4: 1
  • PKCS:
    • PKCS#3: 1
pdf_data/report_metadata
  • /Author: 이은경
  • /CreationDate: D:20121023175646+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20121023175646+09'00'
  • /Producer: Microsoft® Word 2010
  • /Title: 평가단위보고서(ADV_ARC.1)
  • pdf_file_size_bytes: 637703
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 25
pdf_data/st_filename [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf Samsung_SDS_SPass_NX_V1.0_ST_Lite(En).pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0639-2010: 2
    • BSI-DSZ-CC-0639-2010-MA-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035-2007: 3
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4+: 3
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 16
    • EAL4 augmented: 2
    • EAL4+: 7
    • EAL5+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ADV:
    • ADV_ARC.1: 4
    • ADV_FSP.4: 2
    • ADV_IMP.1: 2
    • ADV_IMP.2: 15
    • ADV_TDS.3: 3
  • AGD:
    • AGD_OPE.1: 3
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 13
    • ALC_DEL.1: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 16
    • ALC_LCD.1: 2
    • ALC_TAT.1: 2
    • ALC_TAT.2: 13
  • ASE:
    • ASE_CCL.1: 2
    • ASE_ECD.1: 2
    • ASE_INT.1: 2
    • ASE_OBJ.2: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 2
  • ATE:
    • ATE_COV.2: 2
    • ATE_DPT.1: 2
    • ATE_DPT.2: 15
    • ATE_FUN.1: 3
    • ATE_IND.2: 2
  • AVA:
    • AVA_VAN.4: 4
    • AVA_VAN.5: 18
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 2
    • FDP_IFC.2: 9
    • FDP_IFC.2.1: 1
    • FDP_IFC.2.2: 1
    • FDP_IFF: 1
    • FDP_IFF.1: 8
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
  • FMT:
    • FMT_MSA.3: 3
  • FCS:
    • FCS_CKM.1: 38
    • FCS_CKM.1.1: 3
    • FCS_CKM.2: 19
    • FCS_CKM.2.1: 5
    • FCS_CKM.4: 20
    • FCS_CKM.4.1: 2
    • FCS_COP.1: 36
    • FCS_COP.1.1: 9
    • FCS_RNG: 3
    • FCS_RNG.1: 9
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 11
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 8
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_DAU.1: 4
    • FDP_DAU.1.1: 1
    • FDP_DAU.1.2: 1
    • FDP_IFC.1: 7
    • FDP_ITC.1: 18
    • FDP_ITC.2: 18
    • FDP_ITT.1: 2
    • FDP_RIP.1: 5
    • FDP_RIP.1.1: 1
    • FDP_UCT.1: 5
    • FDP_UCT.1.1: 1
    • FDP_UIT.1: 5
    • FDP_UIT.1.1: 1
    • FDP_UIT.1.2: 2
  • FIA:
    • FIA_AFL.1: 10
    • FIA_AFL.1.1: 3
    • FIA_AFL.1.2: 3
    • FIA_UAU: 4
    • FIA_UAU.1: 28
    • FIA_UAU.1.1: 6
    • FIA_UAU.1.2: 6
    • FIA_UAU.4: 4
    • FIA_UAU.4.1: 1
    • FIA_UAU.5: 5
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 2
    • FIA_UID: 2
    • FIA_UID.1: 22
    • FIA_UID.1.1: 2
    • FIA_UID.1.2: 3
  • FMT:
    • FMT_CKM.4: 3
    • FMT_MOF.1: 9
    • FMT_MOF.1.1: 3
    • FMT_MSA.1: 5
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 7
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD.1: 17
    • FMT_MTD.1.1: 5
    • FMT_MTD.3: 5
    • FMT_MTD.3.1: 2
    • FMT_SMF.1: 20
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 13
    • FMT_SMR.1.1: 2
    • FMT_SMR.1.2: 1
  • FPR:
    • FPR_UNO.1: 4
    • FPR_UNO.1.1: 1
  • FPT:
    • FPT_FLS.1: 5
    • FPT_FLS.1.1: 1
    • FPT_ITC.1: 4
    • FPT_ITC.1.1: 1
    • FPT_ITI.1: 6
    • FPT_ITI.1.1: 1
    • FPT_ITI.1.2: 1
    • FPT_ITT.1: 2
    • FPT_PHP.3: 5
    • FPT_PHP.3.1: 1
    • FPT_TST.1: 5
    • FPT_TST.1.1: 1
    • FPT_TST.1.2: 2
    • FPT_TST.1.3: 2
  • FTP:
    • FTP_ITC.1: 4
    • FTP_TRP.1: 4
pdf_data/st_keywords/cc_claims
  • A:
    • A.NETWORK: 4
    • A.PHYSICAL: 4
    • A.USER: 3
  • O:
    • O.ONEWAY: 2
  • OE:
    • OE.NETWORK: 3
    • OE.PHYSICAL: 3
    • OE.USER: 3
  • T:
    • T.RCVDATALEAK: 1
  • O:
    • O.AA: 6
    • O.BAC: 2
    • O.EAC: 5
  • OE:
    • OE.PKI: 3
  • T:
    • T.EAC-CA: 1
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 100
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 9
  • DES:
    • 3DES:
      • 3DES: 3
      • TDES: 8
    • DES:
      • DES: 2
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 5
    • ECDH:
      • ECDH: 8
    • ECDSA:
      • ECDSA: 12
  • FF:
    • DH:
      • DH: 13
      • Diffie-Hellman: 3
  • RSA:
    • RSAPSS: 1
pdf_data/st_keywords/hash_function
  • JH:
    • JH: 1
  • SHA:
    • SHA1:
      • SHA-1: 9
    • SHA2:
      • SHA-224: 3
      • SHA-256: 8
      • SHA-384: 4
      • SHA-512: 3
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 47
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 1
  • TRNG:
    • TRNG: 6
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 4
    • malfunction: 7
  • SCA:
    • DPA: 4
    • SPA: 4
    • physical probing: 1
    • side channel: 1
  • other:
    • Reverse Engineering: 1
    • reverse engineering: 2
pdf_data/st_keywords/tee_name
  • IBM:
    • SSC: 13
pdf_data/st_keywords/ic_data_group
  • EF:
    • EF.COM: 6
    • EF.DG1: 2
    • EF.DG14: 1
    • EF.DG15: 1
    • EF.DG16: 2
    • EF.DG2: 2
    • EF.DG3: 2
    • EF.DG4: 2
    • EF.SOD: 3
pdf_data/st_keywords/standard_id
  • BSI:
    • AIS20: 1
    • AIS31: 3
  • CC:
    • CCMB-2009-07-001: 2
    • CCMB-2009-07-002: 2
    • CCMB-2009-07-003: 2
  • ICAO:
    • ICAO: 22
  • ISO:
    • ISO/IEC 10118-3: 1
    • ISO/IEC 11770-2: 2
    • ISO/IEC 14443: 4
    • ISO/IEC 14443-4: 2
    • ISO/IEC 15946-2: 1
    • ISO/IEC 15946-3: 1
    • ISO/IEC 18033-3: 2
    • ISO/IEC 7816: 4
    • ISO/IEC 9796-2: 1
    • ISO/IEC 9797-1: 2
  • NIST:
    • NIST SP 800-38B: 1
  • PKCS:
    • PKCS#1: 1
    • PKCS#3: 2
pdf_data/st_metadata
  • /Author: Tan Kok Kheng
  • /CreationDate: D:20220526092514+08'00'
  • /Creator: Microsoft® Word for Microsoft 365
  • /ModDate: D:20220708070046+08'00'
  • /Producer: Microsoft® Word for Microsoft 365
  • /Title: Technical Manual Template
  • pdf_file_size_bytes: 516888
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
  • /Author: SmartCard
  • /CreationDate: D:20120719113755+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20120719113755+09'00'
  • /Producer: Microsoft® Word 2010
  • /Subject: Security Target
  • /Title: Single Evaluation Report
  • pdf_file_size_bytes: 1629013
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 94
state/cert/convert_garbage True False
state/cert/convert_ok True False
state/cert/download_ok True False
state/cert/extract_ok True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different