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ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 CSA_CC_21006 |
ePass V3 TD sur composants P5CD081V1A, en configuration BAC et AA ANSSI-CC-2014/03 |
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name | ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 | ePass V3 TD sur composants P5CD081V1A, en configuration BAC et AA |
category | Boundary Protection Devices and Systems | ICs, Smart Cards and Smart Card-Related Devices and Systems |
scheme | SG | FR |
status | active | archived |
not_valid_after | 08.07.2027 | 01.09.2019 |
not_valid_before | 08.07.2022 | 20.02.2014 |
cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf | |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC_2014-03fr.pdf |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-cible_2014-03en.pdf |
manufacturer | ST Engineering Electronics | Oberthur Technologies / NXP Semiconductors GmbH |
manufacturer_web | https://www.stengg.com | https://www.oberthur.com/ |
security_level | AVA_VAN.5, EAL4+ | ALC_CMS.5, ALC_DVS.2, ATE_DPT.3, ALC_TAT.2, ADV_INT.2, ADV_TDS.4, EAL4+, ADV_FSP.5 |
dgst | 1dab1c190f3b92d2 | a8096717cc4e18fb |
heuristics/cert_id | CSA_CC_21006 | ANSSI-CC-2014/03 |
heuristics/cert_lab | [] | SERMA |
heuristics/extracted_sars | AVA_VAN.5, ADV_ARC.1, ATE_COV.2, ASE_TSS.1, AGD_OPE.1, ATE_DPT.1, ADV_IMP.1, ALC_DVS.1, ASE_REQ.2, ALC_TAT.1, AGD_PRE.1, ASE_CCL.1, ATE_IND.2, ALC_CMS.4, ASE_ECD.1, ADV_TDS.3, ALC_DEL.1, ASE_OBJ.2, ADV_FSP.4, ASE_INT.1, ASE_SPD.1, ATE_FUN.1, ALC_CMC.4, ALC_LCD.1 | ATE_DPT.3, ADV_INT.2, ADV_TDS.4, ALC_TAT.2, AVA_VAN.5, ASE_TSS.2, ADV_FSP.5, ALC_CMS.5, ALC_DVS.2 |
heuristics/extracted_versions | 2.2.1055 | - |
heuristics/report_references/directly_referencing | {} | BSI-DSZ-CC-0857-2013, BSI-DSZ-CC-0555-2009 |
heuristics/report_references/indirectly_referencing | {} | BSI-DSZ-CC-0857-2013, BSI-DSZ-CC-0555-2009 |
heuristics/st_references/directly_referencing | {} | BSI-DSZ-CC-0555-2009 |
heuristics/st_references/indirectly_referencing | {} | BSI-DSZ-CC-0555-2009 |
heuristics/protection_profiles | {} | 60455fc9564e2545 |
protection_profile_links | {} | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0055b.pdf |
pdf_data/cert_filename | [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf | |
pdf_data/cert_keywords/cc_cert_id |
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pdf_data/cert_keywords/cc_protection_profile_id | ||
pdf_data/cert_keywords/cc_security_level |
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pdf_data/cert_keywords/cc_sfr | ||
pdf_data/cert_keywords/cc_claims | ||
pdf_data/cert_keywords/vendor | ||
pdf_data/cert_keywords/eval_facility |
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pdf_data/cert_keywords/symmetric_crypto | ||
pdf_data/cert_keywords/asymmetric_crypto | ||
pdf_data/cert_keywords/pq_crypto | ||
pdf_data/cert_keywords/hash_function | ||
pdf_data/cert_keywords/crypto_scheme | ||
pdf_data/cert_keywords/crypto_protocol | ||
pdf_data/cert_keywords/randomness | ||
pdf_data/cert_keywords/cipher_mode | ||
pdf_data/cert_keywords/ecc_curve | ||
pdf_data/cert_keywords/crypto_engine | ||
pdf_data/cert_keywords/tls_cipher_suite | ||
pdf_data/cert_keywords/crypto_library | ||
pdf_data/cert_keywords/vulnerability | ||
pdf_data/cert_keywords/side_channel_analysis | ||
pdf_data/cert_keywords/technical_report_id | ||
pdf_data/cert_keywords/device_model | ||
pdf_data/cert_keywords/tee_name | ||
pdf_data/cert_keywords/os_name | ||
pdf_data/cert_keywords/cplc_data | ||
pdf_data/cert_keywords/ic_data_group | ||
pdf_data/cert_keywords/standard_id | ||
pdf_data/cert_keywords/javacard_version | ||
pdf_data/cert_keywords/javacard_api_const | ||
pdf_data/cert_keywords/javacard_packages | ||
pdf_data/cert_keywords/certification_process | ||
pdf_data/cert_metadata |
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pdf_data/report_filename | [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf | ANSSI-CC_2014-03fr.pdf |
pdf_data/report_frontpage |
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pdf_data/report_keywords/cc_cert_id |
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pdf_data/report_keywords/cc_protection_profile_id |
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pdf_data/report_keywords/cc_security_level |
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pdf_data/report_keywords/cc_sar |
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pdf_data/report_keywords/cc_claims |
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pdf_data/report_keywords/vendor |
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pdf_data/report_keywords/eval_facility |
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pdf_data/report_keywords/symmetric_crypto |
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pdf_data/report_keywords/asymmetric_crypto |
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pdf_data/report_keywords/standard_id |
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pdf_data/report_metadata |
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pdf_data/st_filename | [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf | ANSSI-CC-cible_2014-03en.pdf |
pdf_data/st_keywords/cc_cert_id |
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pdf_data/st_keywords/cc_protection_profile_id |
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pdf_data/st_keywords/cc_security_level |
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pdf_data/st_keywords/cc_sar |
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pdf_data/st_keywords/cc_sfr |
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pdf_data/st_keywords/cc_claims |
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pdf_data/st_keywords/vendor |
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pdf_data/st_keywords/eval_facility |
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pdf_data/st_keywords/symmetric_crypto |
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pdf_data/st_keywords/asymmetric_crypto |
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pdf_data/st_keywords/hash_function |
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pdf_data/st_keywords/crypto_scheme |
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pdf_data/st_keywords/cipher_mode |
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pdf_data/st_keywords/side_channel_analysis |
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pdf_data/st_keywords/technical_report_id |
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pdf_data/st_keywords/ic_data_group |
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pdf_data/st_keywords/standard_id |
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pdf_data/st_keywords/certification_process |
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pdf_data/st_metadata |
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state/cert/convert_garbage | True | False |
state/cert/convert_ok | True | False |
state/cert/download_ok | True | False |
state/cert/extract_ok | True | False |
state/cert/pdf_hash | Different | Different |
state/cert/txt_hash | Different | Different |
state/report/pdf_hash | Different | Different |
state/report/txt_hash | Different | Different |
state/st/pdf_hash | Different | Different |
state/st/txt_hash | Different | Different |