This page was not yet optimized for use on mobile devices.
Comparing certificates Experimental feature
You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.
ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 CSA_CC_21006 |
Fuji Xerox ApeosPort-II C7500/C6500/C5400 DocuCentre-II C7500/C6500/C5400 Series Data Security Kit Controller ROM Ver2.0.1 JISEC-CC-CRP-C0079 |
|
---|---|---|
name | ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 | Fuji Xerox ApeosPort-II C7500/C6500/C5400 DocuCentre-II C7500/C6500/C5400 Series Data Security Kit Controller ROM Ver2.0.1 |
category | Boundary Protection Devices and Systems | Multi-Function Devices |
scheme | SG | JP |
status | active | archived |
not_valid_after | 08.07.2027 | 17.01.2013 |
not_valid_before | 08.07.2022 | 22.02.2007 |
cert_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf | |
report_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0079_ecvr.pdf |
st_link | https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf | |
manufacturer | ST Engineering Electronics | Fuji Xerox Co., Ltd. |
manufacturer_web | https://www.stengg.com | https://www.fujixerox.co.jp/eng/ |
security_level | EAL4+, AVA_VAN.5 | EAL2 |
dgst | 1dab1c190f3b92d2 | 51a63eb956fb5939 |
heuristics/cert_id | CSA_CC_21006 | JISEC-CC-CRP-C0079 |
heuristics/extracted_sars | AGD_OPE.1, ASE_ECD.1, ADV_FSP.4, ATE_DPT.1, ADV_TDS.3, ALC_DEL.1, ALC_CMS.4, ALC_DVS.1, ALC_LCD.1, ADV_ARC.1, ADV_IMP.1, ASE_SPD.1, ASE_INT.1, ASE_OBJ.2, ASE_CCL.1, ASE_REQ.2, ATE_IND.2, AVA_VAN.5, ASE_TSS.1, ATE_COV.2, ATE_FUN.1, ALC_CMC.4, AGD_PRE.1, ALC_TAT.1 | {} |
heuristics/extracted_versions | 2.2.1055 | 2.0.1 |
heuristics/scheme_data |
|
|
pdf_data/cert_filename | [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf | |
pdf_data/cert_keywords/cc_cert_id |
|
|
pdf_data/cert_keywords/cc_protection_profile_id | ||
pdf_data/cert_keywords/cc_security_level |
|
|
pdf_data/cert_keywords/cc_sar |
|
|
pdf_data/cert_keywords/cc_sfr | ||
pdf_data/cert_keywords/cc_claims | ||
pdf_data/cert_keywords/vendor | ||
pdf_data/cert_keywords/eval_facility |
|
|
pdf_data/cert_keywords/symmetric_crypto | ||
pdf_data/cert_keywords/asymmetric_crypto | ||
pdf_data/cert_keywords/pq_crypto | ||
pdf_data/cert_keywords/hash_function | ||
pdf_data/cert_keywords/crypto_scheme | ||
pdf_data/cert_keywords/crypto_protocol | ||
pdf_data/cert_keywords/randomness | ||
pdf_data/cert_keywords/cipher_mode | ||
pdf_data/cert_keywords/ecc_curve | ||
pdf_data/cert_keywords/crypto_engine | ||
pdf_data/cert_keywords/tls_cipher_suite | ||
pdf_data/cert_keywords/crypto_library | ||
pdf_data/cert_keywords/vulnerability | ||
pdf_data/cert_keywords/side_channel_analysis | ||
pdf_data/cert_keywords/technical_report_id | ||
pdf_data/cert_keywords/device_model | ||
pdf_data/cert_keywords/tee_name | ||
pdf_data/cert_keywords/os_name | ||
pdf_data/cert_keywords/cplc_data | ||
pdf_data/cert_keywords/ic_data_group | ||
pdf_data/cert_keywords/standard_id | ||
pdf_data/cert_keywords/javacard_version | ||
pdf_data/cert_keywords/javacard_api_const | ||
pdf_data/cert_keywords/javacard_packages | ||
pdf_data/cert_keywords/certification_process | ||
pdf_data/cert_metadata |
|
|
pdf_data/report_filename | [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf | c0079_ecvr.pdf |
pdf_data/report_keywords/cc_cert_id |
|
|
pdf_data/report_keywords/cc_security_level |
|
|
pdf_data/report_keywords/cc_sar |
|
|
pdf_data/report_keywords/cc_claims |
|
|
pdf_data/report_keywords/eval_facility |
|
|
pdf_data/report_keywords/standard_id |
|
|
pdf_data/report_metadata |
|
|
pdf_data/st_filename | [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf | |
pdf_data/st_keywords/cc_cert_id | ||
pdf_data/st_keywords/cc_protection_profile_id | ||
pdf_data/st_keywords/cc_security_level |
|
|
pdf_data/st_keywords/cc_sar |
|
|
pdf_data/st_keywords/cc_sfr |
|
|
pdf_data/st_keywords/cc_claims |
|
|
pdf_data/st_keywords/vendor | ||
pdf_data/st_keywords/eval_facility | ||
pdf_data/st_keywords/symmetric_crypto | ||
pdf_data/st_keywords/asymmetric_crypto | ||
pdf_data/st_keywords/pq_crypto | ||
pdf_data/st_keywords/hash_function | ||
pdf_data/st_keywords/crypto_scheme | ||
pdf_data/st_keywords/crypto_protocol | ||
pdf_data/st_keywords/randomness | ||
pdf_data/st_keywords/cipher_mode | ||
pdf_data/st_keywords/ecc_curve | ||
pdf_data/st_keywords/crypto_engine | ||
pdf_data/st_keywords/tls_cipher_suite | ||
pdf_data/st_keywords/crypto_library | ||
pdf_data/st_keywords/vulnerability | ||
pdf_data/st_keywords/side_channel_analysis | ||
pdf_data/st_keywords/technical_report_id | ||
pdf_data/st_keywords/device_model | ||
pdf_data/st_keywords/tee_name | ||
pdf_data/st_keywords/os_name | ||
pdf_data/st_keywords/cplc_data | ||
pdf_data/st_keywords/ic_data_group | ||
pdf_data/st_keywords/standard_id | ||
pdf_data/st_keywords/javacard_version | ||
pdf_data/st_keywords/javacard_api_const | ||
pdf_data/st_keywords/javacard_packages | ||
pdf_data/st_keywords/certification_process | ||
pdf_data/st_metadata |
|
|
state/cert/convert_garbage | True | False |
state/cert/convert_ok | True | False |
state/cert/download_ok | True | False |
state/cert/extract_ok | True | False |
state/cert/pdf_hash | Different | Different |
state/cert/txt_hash | Different | Different |
state/report/pdf_hash | Different | Different |
state/report/txt_hash | Different | Different |
state/st/convert_ok | True | False |
state/st/download_ok | True | False |
state/st/extract_ok | True | False |
state/st/pdf_hash | Different | Different |
state/st/txt_hash | Different | Different |