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ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055
CSA_CC_21006 		Virtual Machine of ID Motion V1 G231 mask with AMD 122v1
ANSSI-CC-2013/11
name ST Engineering Data Diode Model 5282, version 2.2.1055 & Model 5283 version 2.2.1055 Virtual Machine of ID Motion V1 G231 mask with AMD 122v1
category Boundary Protection Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme SG FR
status active archived
not_valid_after 08.07.2027 01.09.2019
not_valid_before 08.07.2022 29.03.2013
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283%20CC%20Certificate_signed.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[CER]%20Certificate%20Report%20-%20ST%20Engineering%20Data%20Diode%20model%205282%20and%205283.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-2013_11_fr.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[DD]%20STEng%20Data%20Diode%20Security%20Target_v4.0_EAL4.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/anssi-cc-cible-2013_11en.pdf
manufacturer ST Engineering Electronics Gemalto / Trusted Labs
manufacturer_web https://www.stengg.com https://www.gemalto.com
security_level AVA_VAN.5, EAL4+ EAL7
dgst 1dab1c190f3b92d2 32f420aa3f6ca59c
heuristics/cert_id CSA_CC_21006 ANSSI-CC-2013/11
heuristics/extracted_sars AVA_VAN.5, ADV_ARC.1, ATE_COV.2, ASE_TSS.1, AGD_OPE.1, ATE_DPT.1, ADV_IMP.1, ALC_DVS.1, ASE_REQ.2, ALC_TAT.1, AGD_PRE.1, ASE_CCL.1, ATE_IND.2, ALC_CMS.4, ASE_ECD.1, ADV_TDS.3, ALC_DEL.1, ASE_OBJ.2, ADV_FSP.4, ASE_INT.1, ASE_SPD.1, ATE_FUN.1, ALC_CMC.4, ALC_LCD.1 ATE_DPT.4, ALC_LCD.2, ADV_IMP.2, ATE_COV.3, ALC_TAT.3, AVA_VAN.5, ADV_INT.3, ADV_SPM.1, ALC_CMC.5, ADV_FSP.6, ADV_TDS.6, ATE_FUN.2, ADV_COMP.1, ALC_DVS.2
heuristics/extracted_versions 2.2.1055 -
heuristics/report_references/directly_referencing {} ANSSI-CC-2012/85
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0728-2011, BSI-DSZ-CC-0640-2010, ANSSI-CC-2012/85, BSI-DSZ-CC-0813-2012
heuristics/st_references/directly_referencing {} BSI-DSZ-CC-0640-2010, BSI-DSZ-CC-0606-2010
heuristics/st_references/indirectly_referencing {} BSI-DSZ-CC-0640-2010, BSI-DSZ-CC-0606-2010
pdf_data/cert_filename [CER] ST Engineering Data Diode model 5282 and 5283 CC Certificate_signed.pdf
pdf_data/cert_keywords/cc_cert_id
  • SG:
    • CSA_CC_21006: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL 4: 1
    • EAL 4 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • An:
    • An Security: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /CreationDate: D:20220708024530+08'00'
  • /ModDate: D:20220711181729+08'00'
  • pdf_file_size_bytes: 495889
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename [CER] Certificate Report - ST Engineering Data Diode model 5282 and 5283.pdf ANSSI-CC-2013_11_fr.pdf
pdf_data/report_frontpage
  • FR:
  • FR:
pdf_data/report_keywords/cc_cert_id
  • SG:
    • CSA_CC_21006: 2
  • FR:
    • ANSSI-CC-2012/85: 5
    • ANSSI-CC-2013/11: 18
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 2
    • EAL 4 augmented: 1
    • EAL4+: 1
  • EAL:
    • EAL 1: 1
    • EAL 3: 1
    • EAL 5: 1
    • EAL 7: 3
    • EAL4: 2
    • EAL7: 2
  • ITSEC:
    • ITSEC E6 Elevé: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ATE:
    • ATE_FUN: 2
    • ATE_IND: 2
  • AVA:
    • AVA_VAN: 3
    • AVA_VAN.5: 4
  • ADV:
    • ADV_ARC: 1
    • ADV_FSP: 1
    • ADV_IMP: 1
    • ADV_INT: 1
    • ADV_SPM: 1
    • ADV_TDS: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_PRE: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMS: 1
    • ALC_DEL: 1
    • ALC_DVS: 1
    • ALC_FLR: 2
    • ALC_TAT: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_ECD: 1
    • ASE_INT: 1
    • ASE_OBJ: 1
    • ASE_REQ: 1
    • ASE_SPD: 1
    • ASE_TSS: 1
  • ATE:
    • ATE_COV: 1
    • ATE_DPT: 1
    • ATE_FUN: 1
    • ATE_IND: 1
  • AVA:
    • AVA_VAN: 2
pdf_data/report_keywords/cc_claims
  • OE:
    • OE.NETWORK: 1
    • OE.PHYSICAL: 1
    • OE.USER: 1
pdf_data/report_keywords/vendor
  • Gemalto:
    • Gemalto: 9
  • Infineon:
    • Infineon: 1
pdf_data/report_keywords/eval_facility
  • An:
    • An Security: 3
  • TrustedLabs:
    • Trusted Labs: 3
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 2
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-004: 1
    • CCMB-2018-04-003: 1
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 18045: 4
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 1
    • CCMB-2009-07-003: 1
    • CCMB-2009-07-004: 1
pdf_data/report_metadata
  • /Author: torno
  • /CreationDate: D:20130304090501+02'00'
  • /Creator: PDFCreator Version 0.9.0
  • /Keywords:
  • /ModDate: D:20130304090501+02'00'
  • /Producer: AFPL Ghostscript 8.53
  • /Subject:
  • /Title: ANSSI-CC-2013_11_fr
  • pdf_file_size_bytes: 166636
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 17
pdf_data/st_filename [DD] STEng Data Diode Security Target_v4.0_EAL4.pdf anssi-cc-cible-2013_11en.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0606-2010: 8
    • BSI-DSZ-CC-0640-2010: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4+: 3
  • EAL:
    • EAL5+: 1
    • EAL7: 4
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ADV:
    • ADV_COMP.1: 1
    • ADV_FSP.6: 2
    • ADV_IMP.2: 2
    • ADV_INT.3: 2
    • ADV_SPM.1: 2
    • ADV_TDS.6: 2
  • ALC:
    • ALC_CMC.5: 2
    • ALC_DVS.2: 2
    • ALC_LCD.2: 2
    • ALC_TAT.3: 2
  • ATE:
    • ATE_COV.3: 2
    • ATE_DPT.4: 2
    • ATE_FUN.2: 2
  • AVA:
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 2
    • FDP_IFC.2: 9
    • FDP_IFC.2.1: 1
    • FDP_IFC.2.2: 1
    • FDP_IFF: 1
    • FDP_IFF.1: 8
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
  • FMT:
    • FMT_MSA.3: 3
  • FAU:
    • FAU_ACC.2: 1
    • FAU_ARP: 3
    • FAU_ARP.1: 4
    • FAU_ARP.1.1: 1
    • FAU_GEN.1: 4
    • FAU_SAA: 3
    • FAU_SAA.1: 5
    • FAU_SAA.1.1: 1
    • FAU_SAA.1.2: 1
    • FAU_SAS.1: 1
  • FCS:
    • FCS_CKM.1: 1
    • FCS_COP.1: 2
    • FCS_RND.1: 1
  • FDP:
    • FDP_ACC: 3
    • FDP_ACC.1: 4
    • FDP_ACC.2: 6
    • FDP_ACC.2.1: 2
    • FDP_ACC.2.2: 1
    • FDP_ACF: 3
    • FDP_ACF.1: 9
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 1
    • FDP_ITT.1: 1
    • FDP_ROL: 3
    • FDP_ROL.1: 3
    • FDP_ROL.1.1: 1
    • FDP_ROL.1.2: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 1
  • FMT:
    • FMT_LIM.1: 1
    • FMT_LIM.2: 1
    • FMT_MSA.1: 1
    • FMT_MSA.3: 3
    • FMT_SMF.1: 1
  • FPT:
    • FPT_FLS: 3
    • FPT_FLS.1: 8
    • FPT_FLS.1.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
    • FPT_RCV: 3
    • FPT_RCV.4: 5
    • FPT_RCV.4.1: 1
    • FPT_TST.2: 1
  • FRU:
    • FRU_FLT.2: 1
    • FRU_RSA: 3
    • FRU_RSA.1: 4
    • FRU_RSA.1.1: 1
pdf_data/st_keywords/cc_claims
  • A:
    • A.NETWORK: 4
    • A.PHYSICAL: 4
    • A.USER: 3
  • O:
    • O.ONEWAY: 2
  • OE:
    • OE.NETWORK: 3
    • OE.PHYSICAL: 3
    • OE.USER: 3
  • T:
    • T.RCVDATALEAK: 1
  • A:
    • A.APPLI_CONT: 1
    • A.CIPHER: 1
    • A.CLON: 1
    • A.DECIPHER: 1
    • A.DIS_MEMORY: 1
    • A.LOAD: 2
    • A.MOD_MEMORY: 1
    • A.OPERATE: 1
    • A.REMOVE: 1
    • A.SECURITY: 2
    • A.SIDE: 1
    • A.TAMPER_ES: 2
  • O:
    • O.APPLI_DEV: 3
    • O.CIPHER: 1
    • O.DECIPHER: 1
    • O.DEV_DIS_ES: 4
    • O.DLV_DATA: 4
    • O.EFECT_REMOVE: 1
    • O.EFFECT_LOAD: 3
    • O.EFFECT_REMOVE: 3
    • O.FLAW: 1
    • O.INIT_ACS: 3
    • O.LOAD: 2
    • O.REMOVE: 1
    • O.RESOURCE: 3
    • O.RND: 1
    • O.ROLLBACK: 2
    • O.SAMPLE_ACS: 1
    • O.SECURITY: 1
    • O.SEGREGATE: 3
    • O.SIDE: 3
    • O.TAMPER_ES: 5
  • OSP:
    • OSP.CIPHER: 1
    • OSP.CONF-ALU: 1
  • T:
    • T.APP_CORR: 3
    • T.APP_DISC: 3
    • T.APP_MOD: 4
    • T.APP_READ: 3
    • T.APP_REMOVE: 4
    • T.DEL_REMOVE: 4
    • T.DIS_DATA: 6
    • T.DIS_TEST_ES: 2
    • T.ERR_REMOVE: 3
    • T.LOAD_APP: 4
    • T.LOAD_MAN: 2
    • T.LOAD_MOD: 2
    • T.LOAD_OTHER: 2
    • T.MOD: 2
    • T.MOD_DATA: 4
    • T.MOD_EXE: 4
    • T.MOD_LOAD: 2
    • T.MOD_SHARE: 2
    • T.MOD_TSF: 3
    • T.RESOURCES: 2
    • T.RND: 1
    • T.T_CMD: 4
    • T.T_ES: 2
    • T.T_TOOLS: 2
pdf_data/st_keywords/vendor
  • Gemalto:
    • Gemalto: 318
  • Infineon:
    • Infineon: 2
    • Infineon Technologies: 5
  • Thales:
    • Thales: 1
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • 3DES: 2
    • DES:
      • DES: 4
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 3
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 3
    • Physical Probing: 2
    • physical probing: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • for secure loading and execution of smartcard applications. Note that cryptographic primitives are out of scope. 1.5.4 Smartcard Product Life Cycle The Smartcard product life-cycle is decomposed into seven: 1
    • out of scope: 3
    • the other subsystems of the MULTOS OS and some following ROMed applications (these elements are out of scope of the TOE): Mel applications and modules ROMed: - MPCOS V3.7 - Pin Server Application (PSA) v1.0: 1
    • these elements are out of scope of the TOE): Mel applications and modules ROMed: - MPCOS V3.7 - Pin Server Application (PSA: 1
    • to the context in which the security functions take place. Note that cryptographic primitives are out of scope. Table 12 shows how these security functions satisfy the TOE security functional requirements. 7.1: 1
pdf_data/st_metadata
  • /Author: Tan Kok Kheng
  • /CreationDate: D:20220526092514+08'00'
  • /Creator: Microsoft® Word for Microsoft 365
  • /ModDate: D:20220708070046+08'00'
  • /Producer: Microsoft® Word for Microsoft 365
  • /Title: Technical Manual Template
  • pdf_file_size_bytes: 516888
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 19
state/cert/convert_garbage True False
state/cert/convert_ok True False
state/cert/download_ok True False
state/cert/extract_ok True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different