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DataDiodeX Modules v1.0.0
None 		NXP SN300 B5 Series - Secure Element version SN300_SE B5.1.002 JD
NSCIB-CC-2300083-01-CR
name DataDiodeX Modules v1.0.0 NXP SN300 B5 Series - Secure Element version SN300_SE B5.1.002 JD
category Boundary Protection Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme TR NL
not_valid_after 13.06.2028 19.09.2028
not_valid_before 13.06.2023 19.09.2023
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Dataflowx%20CC%20Certificate.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300083-01-Certificate.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Dataflowx%20CERTIFICATION%20REPORT.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300083-01-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/DataDiodeX_ST%20Lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300083-01-STlite_v0_5%20.pdf
manufacturer Dataflowx Teknoloji A.S. NXP Semiconductors
manufacturer_web https://www.dataflowx.com https://www.nxp.com/
security_level EAL4+, AVA_VAN.5 EAL6+, ALC_FLR.1, ASE_TSS.2
dgst f95a955d7fb33087 bb5f58677109f233
heuristics/cert_id NSCIB-CC-2300083-01-CR
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ATE_DPT.1, ASE_REQ.2, ALC_DVS.1, ADV_FSP.4, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_IMP.2, ADV_CMC.5, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions 1.0.0 5.1.002
heuristics/report_references/directly_referenced_by {} NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/report_references/indirectly_referenced_by {} NSCIB-CC-2400083-01-CR, NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/scheme_data
heuristics/st_references/directly_referenced_by {} NSCIB-CC-2400083-01-CR, NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/st_references/indirectly_referenced_by {} NSCIB-CC-2400083-01-CR, NSCIB-CC-2300099-01-CR, NSCIB-CC-2300100-01-CR
heuristics/protection_profiles {} cf0f01bcd7be3e9c
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename Dataflowx CC Certificate.pdf NSCIB-CC-2300083-01-Certificate.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2300083-01: 1
    • NSCIB-CC-2300083-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0084-: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL4: 1
  • EAL:
    • EAL2: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • AVA:
    • AVA_VAN.5: 1
  • ALC:
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 1
  • ASE:
    • ASE_TSS.2: 1
pdf_data/cert_keywords/cc_claims
  • A:
    • A.S: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_metadata
  • /CreationDate: D:20230620113433+03'00'
  • /ModDate: D:20230620113433+03'00'
  • pdf_file_size_bytes: 238422
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: Wim Ton
  • /CreationDate: D:20231024161948+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20231024161948+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 89688
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename Dataflowx CERTIFICATION REPORT.pdf NSCIB-CC-2300083-01-CR.pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-2300083-01-CR
    • cert_item: NXP SN300 B5 Series - Secure Element version SN300_SE B5.1.002 JD
    • cert_lab: TÜV Informationstechnik GmbH
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • NL:
    • NSCIB-2300083-01: 1
    • NSCIB-CC-2300083-01-CR: 13
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 4+: 3
    • EAL2: 1
    • EAL4+: 1
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL6+: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_IMP.1: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 6
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.2: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 13
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • BEAM:
    • BEAM Teknoloji: 3
  • TUV:
    • TÜV Informationstechnik: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • DES:
      • DES: 1
  • constructions:
    • MAC:
      • CBC-MAC: 1
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
    • ECDH:
      • ECDH: 1
    • ECDSA:
      • ECDSA: 1
  • FF:
    • DH:
      • Diffie-Hellman: 1
pdf_data/report_keywords/hash_function
  • MD:
    • MD5:
      • MD5: 1
  • SHA:
    • SHA2:
      • SHA256: 1
pdf_data/report_keywords/crypto_scheme
  • MAC:
    • MAC: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • Fault Injection: 3
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 1
    • JIL-AM: 2
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 17025: 2
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_keywords/javacard_packages
  • org:
    • org.tr: 1
pdf_data/report_metadata
  • /Author: TSE KSDB
  • /CreationDate: D:20230605110402+03'00'
  • /Creator: Microsoft® Word 2016
  • /ModDate: D:20230622143850+02'00'
  • /Producer: 3.0.1 (5.0.1)
  • pdf_file_size_bytes: 1574698
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 17
pdf_data/st_filename DataDiodeX_ST Lite.pdf NSCIB-CC-2300083-01-STlite_v0_5 .pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2300083-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
    • BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 7
    • EAL4 augmented: 1
  • EAL:
    • EAL4: 1
    • EAL5: 5
    • EAL6: 14
    • EAL6 augmented: 2
    • EAL6+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.4: 1
    • ADV_TDS.3: 1
  • AGD:
    • AGD_OPE.1: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.1: 1
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
  • ADV:
    • ADV_ARC.1: 5
    • ADV_CMC.5: 2
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 4
    • ADV_FSP.4: 4
    • ADV_FSP.5: 6
    • ADV_IMP: 1
    • ADV_IMP.1: 6
    • ADV_IMP.2: 5
    • ADV_INT.3: 2
    • ADV_SPM.1: 5
    • ADV_TDS: 1
    • ADV_TDS.1: 7
    • ADV_TDS.3: 3
    • ADV_TDS.4: 1
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE.1: 4
    • AGD_PRE.1: 4
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 4
    • ALC_CMC.5: 5
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.4: 2
    • ALC_CMS.5: 4
    • ALC_DEL.1: 2
    • ALC_DVS.2: 5
    • ALC_FLR: 1
    • ALC_FLR.1: 5
    • ALC_LCD.1: 3
    • ALC_TAT.1: 6
    • ALC_TAT.3: 2
  • ASE:
    • ASE_CCL: 2
    • ASE_CCL.1: 2
    • ASE_ECD: 1
    • ASE_ECD.1: 3
    • ASE_INT: 2
    • ASE_INT.1: 4
    • ASE_OBJ.2: 3
    • ASE_REQ: 2
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD: 2
    • ASE_SPD.1: 2
    • ASE_TSS: 2
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 2
    • ATE_COV.2: 2
    • ATE_COV.3: 4
    • ATE_DPT.1: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 5
    • ATE_FUN.2: 2
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_IFC.1: 2
    • FDP_IFC.2: 5
    • FDP_IFC.2.2: 1
    • FDP_IFF.1: 6
    • FDP_IFF.1.1: 1
    • FDP_IFF.1.2: 1
    • FDP_IFF.1.3: 1
    • FDP_IFF.1.4: 1
    • FDP_IFF.1.5: 1
  • FMT:
    • FMT_MSA.3: 1
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 6
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 7
    • FDP_ITT.1: 6
    • FDP_SDC: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 1
    • FDP_SDI: 4
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 5
    • FMT_LIM.2: 4
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT.1: 6
    • FPT_PHP.3: 6
  • FRU:
    • FRU_FLT.2: 8
  • FTP:
    • FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 1
    • O.RND_HW: 4
  • T:
    • T.RND: 1
    • T.RND_HW: 3
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 107
    • NXP Semiconductors: 29
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
    • RNG: 12
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • CFB:
    • CFB: 1
  • CTR:
    • CTR: 1
  • GCM:
    • GCM: 1
  • OFB:
    • OFB: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 5
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
    • CCMB-2017-04-004: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • ISO:
    • ISO/IEC 7816: 4
pdf_data/st_metadata
  • /Author: Dell
  • /CreationDate: D:20230622112358+03'00'
  • /Creator: Microsoft® Word Microsoft 365 için
  • /ModDate: D:20230622112358+03'00'
  • /Producer: Microsoft® Word Microsoft 365 için
  • /Subject: Security Target v0.1
  • /Title: Security Target v0.1
  • pdf_file_size_bytes: 539591
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 30
  • /Author: NXP B.V.
  • /CreationDate: D:20231019141135+01'00'
  • /Creator: DITA Open Toolkit 3.7
  • /Keywords: NXP, ASE, SN300 B5 Single Chip Secured (NFC) Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL6 augmented
  • /Producer: Apache FOP Version 2.6
  • /Subject: NXP SN300 B5 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 835909
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
state/cert/convert_garbage True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different