This page was not yet optimized for use on mobile devices.

Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.

	THD88/M2064 Secure Microcontroller With Crypto Library SERTIT-074	NXP SE310 Series - Secure Element version SE310_SE A0.1.000 J2 NSCIB-CC-2200031-02-CR
name	THD88/M2064 Secure Microcontroller With Crypto Library	NXP SE310 Series - Secure Element version SE310_SE A0.1.000 J2
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	NO	NL
status	archived	active
not_valid_after	09.12.2020	19.11.2029
not_valid_before	09.12.2015	19.11.2024
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/20160806_S74_C_v2.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200031-02-Cert.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/20160608_S-074_CR_v.2.0_Tongfang.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200031-02-CR.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[08450][THD88][ST%20Lite][V1.1]%20THD88-M2064%20EAL4+%20ST_Lite.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200031-02-STLite_v011.pdf
manufacturer	Beijing Tongfang Microelectronics Co., Ltd.	NXP Semiconductors Germany GmbH
manufacturer_web	https://www.tsinghuaic.com/	https://www.nxp.com
security_level	ALC_FLR.2, ATE_DPT.2, EAL4+, AVA_VAN.5	ALC_FLR.1, EAL5+, AVA_VAN.5, ASE_TSS.2, ALC_DVS.2
dgst	f336e1fd6f8d5222	e5231ad4da550a03
heuristics/cert_id	SERTIT-074	NSCIB-CC-2200031-02-CR
heuristics/cert_lab	[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, ASE_SPD.1, ATE_DPT.2, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.4, ATE_FUN.1, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.3, ALC_FLR.2, ASE_REQ.2, ADV_FSP.4, ATE_IND.2, ASE_CCL.1	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions	-	0.1.000
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data		cert_id: NSCIB-CC-2200031-02-CR cert_link: https://trustcb.com/download/?wpdmdl=4630 certification_date: 19.11.2024 developer: NXP Semiconductors GmbH evaluation_facility: TÜV Informationstechnik level: EAL5 + ALC_DVS.2, ALC_FLR.1, ASE_TSS.2, and AVA_VAN.5 product: NXP SE310 Series - Secure Element version SE310_SE A0.1.000 J2 report_link: https://trustcb.com/download/?wpdmdl=4631 status: Issued target_link: https://trustcb.com/download/?wpdmdl=4633
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	NSCIB-CC-2200031-01-CR
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	NSCIB-CC-2200031-01-CR
heuristics/protection_profiles	{}	cf0f01bcd7be3e9c
maintenance_updates
protection_profiles
protection_profile_links	{}	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename	20160806_S74_C_v2.pdf	NSCIB-CC-2200031-02-Cert.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id	NO: SERTIT-074: 2	NL: NSCIB-2200031-02: 1 NSCIB-CC-2200031-02: 1
pdf_data/cert_keywords/cc_protection_profile_id		BSI: BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level	EAL: EAL 2: 1 EAL 4: 2 EAL 4 augmented: 1	EAL: EAL2: 1 EAL5: 1 EAL5 augmented: 1 EAL7: 1
pdf_data/cert_keywords/cc_sar	ALC: ALC_DVS.2: 1 ALC_FLR: 1 ATE: ATE_DPT.2: 1 AVA: AVA_VAN.5: 1	ALC: ALC_DVS.2: 1 ALC_FLR: 1 ALC_FLR.1: 1 ALC_FLR.3: 1 ASE: ASE_TSS.2: 1 AVA: AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor		NXP: NXP: 1 NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility	BrightSight: Brightsight: 1	TUV: TÜV Informationstechnik: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id		ISO: ISO/IEC 15408-1: 2 ISO/IEC 18045: 4 ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/CreationDate: D:20170222114542Z00'00' /ModDate: D:20170222114542Z00'00' /Producer: Mac OS X 10.12.3 Quartz PDFContext pdf_file_size_bytes: 731810 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1	/Author: Denise Cater /CreationDate: D:20241125122739+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20241125122739+00'00' /Producer: Microsoft® Word 2021 /Title: NSCIB Certificate pdf_file_size_bytes: 88058 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 1
pdf_data/report_filename	20160608_S-074_CR_v.2.0_Tongfang.pdf	NSCIB-CC-2200031-02-CR.pdf
pdf_data/report_frontpage	NL:	NL: cert_id: NSCIB-CC-2200031-02-CR cert_item: NXP SE310 Series - Secure Element, version SE310_SE A0.1.000 J2 cert_lab: TÜV Informationstechnik GmbH developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id	NO: SERTIT-074: 15	NL: NSCIB-2200031-02: 1 NSCIB-CC-2200031-02: 2 NSCIB-CC-2200031-02-CR: 11
pdf_data/report_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 16	BSI: BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level	EAL: EAL 2: 1 EAL 4: 3 EAL 4 augmented: 1 EAL 4+: 14 EAL1: 1 EAL4: 1 EAL7: 1	EAL: EAL 5: 1 EAL 5 augmented: 1 EAL4: 1 EAL5: 1 EAL5 augmented: 1 EAL5+: 1
pdf_data/report_keywords/cc_sar	ADV: ADV_ARC.1: 1 ADV_FSP.4: 1 ADV_IMP.1: 1 ADV_TDS.3: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS.4: 1 ALC_DEL.1: 1 ALC_DVS.2: 4 ALC_FLR: 1 ALC_LCD.1: 1 ALC_TAT.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.2: 4 ATE_FUN.1: 1 ATE_IND: 1 ATE_IND.2: 1 AVA: AVA_VAN.5: 4	ALC: ALC_DVS.2: 2 ALC_FLR.1: 2 ASE: ASE_TSS.2: 2 AVA: AVA_VAN: 1 AVA_VAN.5: 3
pdf_data/report_keywords/cc_sfr	FAU: FAU_SAS.1: 3 FCS: FCS_COP.1: 3 FCS_RNG.1: 2 FDP: FDP_IFC.1: 1 FDP_ITT.1: 1 FDP_SDC.1: 3 FDP_SDI.2: 2 FMT: FMT_LIM.1: 2 FMT_LIM.2: 2 FPT: FPT_FLS.1: 1 FPT_ITT.1: 1 FPT_PHP.3: 1 FRU: FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor		NXP: NXP: 10 NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility	BrightSight: Brightsight: 1	TUV: TÜV Informationstechnik: 3
pdf_data/report_keywords/symmetric_crypto	DES: 3DES: TDES: 1 DES: DES: 3
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness	RNG: RNG: 1	RNG: RNG: 1
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: Fault Injection: 1 SCA: DPA: 1 SPA: 1 other: JIL: 2	SCA: side-channel: 1 other: JIL: 2 JIL-AAPS: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	CC: CCMB-2012-09-001: 1 CCMB-2012-09-002: 1 CCMB-2012-09-003: 1 CCMB-2012-09-004: 1 ISO: ISO/IEC 14443: 2 ISO/IEC 15408: 2 ISO/IEC 7816: 2	ISO: ISO/IEC 7816: 2
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: Ulrich Isachsen /CreationDate: D:20170222114910Z00'00' /Creator: Microsoft® Word 2010 /ModDate: D:20170222114910Z00'00' /Producer: Mac OS X 10.12.3 Quartz PDFContext /Title: tittel pdf_file_size_bytes: 650500 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 16	/Author: sjon /CreationDate: D:20241125122853+00'00' /Creator: Microsoft® Word 2021 /ModDate: D:20241125122853+00'00' /Producer: Microsoft® Word 2021 /Title: Certification Report pdf_file_size_bytes: 266327 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/, https://trustcb.com/common-criteria/nscib/, https://nscib.nl/, mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 11
pdf_data/st_filename	[08450][THD88][ST Lite][V1.1] THD88-M2064 EAL4 ST_Lite.pdf	NSCIB-CC-2200031-02-STLite_v011.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id		NL: NSCIB-2200031-01: 1
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-CC-PP- 0084-2014: 1 BSI-CC-PP-0084-2014: 1	BSI: BSI-CC-PP-0084-2014: 1 BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 2 EAL4 augmented: 2 EAL4+: 1	EAL: EAL4: 1 EAL5: 13 EAL5 augmented: 2 EAL5+: 3
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC.1: 1 ADV_FSP.4: 1 ADV_IMP.1: 1 ADV_TDS.3: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS.4: 1 ALC_DEL.1: 1 ALC_DVS.2: 3 ALC_LCD.1: 1 ALC_TAT.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.2: 3 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.5: 3	ADV: ADV_ARC.1: 5 ADV_CMS.4: 1 ADV_CMS.5: 1 ADV_FSP: 1 ADV_FSP.1: 2 ADV_FSP.2: 3 ADV_FSP.4: 4 ADV_FSP.5: 5 ADV_IMP.1: 6 ADV_INT.2: 1 ADV_TDS.1: 5 ADV_TDS.3: 2 ADV_TDS.4: 3 AGD: AGD_OPE.1: 4 AGD_PRE.1: 2 ALC: ALC_CMC.4: 2 ALC_CMS: 1 ALC_CMS.4: 2 ALC_CMS.5: 4 ALC_DEL.1: 2 ALC_DVS.1: 1 ALC_DVS.2: 5 ALC_FLR.1: 6 ALC_LCD.1: 3 ALC_TAT.1: 4 ALC_TAT.2: 2 ASE: ASE_CCL: 2 ASE_CCL.1: 2 ASE_ECD: 1 ASE_ECD.1: 3 ASE_INT: 2 ASE_INT.1: 4 ASE_OBJ.2: 3 ASE_REQ: 2 ASE_REQ.1: 2 ASE_REQ.2: 2 ASE_SPD: 2 ASE_SPD.1: 2 ASE_TSS: 2 ASE_TSS.2: 6 ATE: ATE_COV.1: 1 ATE_COV.2: 2 ATE_DPT.1: 1 ATE_DPT.3: 2 ATE_FUN.1: 7 ATE_IND.2: 1 AVA: AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr	FAU: FAU_SAS.1: 6 FAU_SAS.1.1: 1 FCS: FCS_CKM.1: 5 FCS_CKM.4: 5 FCS_COP.1: 14 FCS_COP.1.1: 2 FCS_RNG: 1 FCS_RNG.1: 6 FCS_RNG.1.1: 1 FCS_RNG.1.2: 1 FDP: FDP_IFC.1: 4 FDP_ITC.1: 5 FDP_ITC.2: 5 FDP_ITT.1: 6 FDP_SDC.1: 5 FDP_SDC.1.1: 1 FDP_SDI.1: 2 FDP_SDI.2: 6 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FMT: FMT_LIM.1: 3 FMT_LIM.2: 2 FPT: FPT_FLS.1: 7 FPT_FLS.1.1: 1 FPT_ITT.1: 6 FPT_PHP.3: 7 FPT_PHP.3.1: 1 FRU: FRU_FLT.2: 7	FAU: FAU_SAS: 1 FAU_SAS.1: 5 FAU_SAS.1.1: 1 FCS: FCS_RNG: 6 FCS_RNG.1: 3 FDP: FDP_IFC.1: 7 FDP_ITT.1: 6 FDP_SDC: 1 FDP_SDC.1: 5 FDP_SDC.1.1: 1 FDP_SDI: 4 FDP_SDI.1: 1 FDP_SDI.2: 3 FMT: FMT_LIM: 1 FMT_LIM.1: 4 FMT_LIM.2: 3 FPT: FPT_FLS.1: 8 FPT_ITT.1: 6 FPT_PHP.3: 7 FRU: FRU_FLT.2: 8 FTP: FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims	O: O.RND: 3 O.RSA: 4 O.TDES: 6 T: T.RND: 2	O: O.RND: 1 O.RND_HW: 4 T: T.RND: 1 T.RND_HW: 3
pdf_data/st_keywords/vendor		NXP: NXP: 109 NXP Semiconductors: 29
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	DES: 3DES: TDEA: 1 TDES: 16 Triple-DES: 4 DES: DES: 7	AES_competition: AES: AES: 2 DES: DES: DES: 1
pdf_data/st_keywords/asymmetric_crypto		ECC: ECC: ECC: 1
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function	SHA: SHA1: SHA1: 1
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RND: 5 RNG: 6 TRNG: TRNG: 2	RNG: RND: 2 RNG: 12
pdf_data/st_keywords/cipher_mode	CBC: CBC: 1 ECB: ECB: 2	CBC: CBC: 1 CFB: CFB: 1 CTR: CTR: 1 GCM: GCM: 2 OFB: OFB: 1
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library	Generic: Crypto Library 1.2: 2
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 7 malfunction: 2 physical tampering: 1 SCA: Leak-Inherent: 5 Physical Probing: 2 physical probing: 3	FI: Malfunction: 5 malfunction: 1 SCA: Leak-Inherent: 5 Physical Probing: 2 physical probing: 2 side channel: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	CC: CCMB-2012-09-001: 1 CCMB-2012-09-002: 1 CCMB-2012-09-003: 1 CCMB-2012-09-004: 1 ISO: ISO/IEC 14443: 4 ISO/IEC 7816: 4 NIST: NIST SP 800-38A: 1 NIST SP 800-67: 1	BSI: AIS31: 1 CC: CCMB-2017-04-001: 2 CCMB-2017-04-002: 2 CCMB-2017-04-003: 2 CCMB-2017-04-004: 2 FIPS: FIPS 140-3: 2
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
pdf_data/st_metadata	/Author: Jan Blonk /CreationDate: D:20151211143810+01'00' /Creator: Microsoft® Word 2013 /ModDate: D:20151211143810+01'00' /Producer: Microsoft® Word 2013 /Title: THD88 Dual Interface Smart Card Chip pdf_file_size_bytes: 796693 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 26	/Author: NXP B.V. /CreationDate: D:20230522142545+02'00' /Creator: DITA Open Toolkit 3.3.1 /Keywords: NXP, ASE, SE310 Single Chip Secure Element , Single Chip Secure Element , Common Criteria, EAL5 augmented /Producer: Apache FOP Version 2.3 /Subject: NXP SE310 Series - Secure Element /Title: Security Target Lite pdf_file_size_bytes: 495971 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 36
state/cert/convert_garbage	True	False
state/cert/convert_ok	True	True
state/cert/download_ok	True	True
state/cert/extract_ok	True	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different