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MS6001 embarquant la bibliothèque cryptographique Toolbox version 06.04.01.07 et la bibliothèque Wear Levelling version 06.03.02.02 (révision E) ( ANSSI-CC-2018/02-R01)
None 		Samsung S3CC9PB microcontroller (reference S3CC9PBX01)
ANSSI-CC-2002/25
name MS6001 embarquant la bibliothèque cryptographique Toolbox version 06.04.01.07 et la bibliothèque Wear Levelling version 06.03.02.02 (révision E) ( ANSSI-CC-2018/02-R01) Samsung S3CC9PB microcontroller (reference S3CC9PBX01)
status active archived
not_valid_after 30.03.2030 01.09.2019
not_valid_before 30.03.2025 01.01.2002
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/certificat-CC-2018_02-R01fr.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-CC-2018_02-R01fr.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2002_25.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/ANSSI-cible-CC-2018_02-R01.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2002_25.pdf
manufacturer SEALSQ France Samsung Electronics Co., Ltd.
manufacturer_web https://www.sealsq.com/ https://www.samsung.com
security_level EAL5+, ALC_DVS.2, AVA_VAN.5 ADV_IMP.2, EAL4+, ALC_DVS.2, AVA_VLA.4
dgst ec30d9d5e231d788 9aa2895387590839
heuristics/cert_id ANSSI-CC-2002/25
heuristics/extracted_sars ALC_DVS.2, AVA_VAN.5 ATE_COV.2, ADV_RCR.1, AVA_VLA.4, ALC_TAT.1, AVA_MSU.2, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_FSP.2, ADV_IMP.2, ATE_DPT.1, AVA_SOF.1, ADV_SPM.1
heuristics/extracted_versions 06.04.01.07, 06.03.02.02 -
heuristics/report_references/directly_referenced_by {} ANSSI-CC-2004/08, ANSSI-CC-2004/06, ANSSI-CC-2004/07
heuristics/report_references/indirectly_referenced_by {} ANSSI-CC-2004/08, ANSSI-CC-2004/06, ANSSI-CC-2004/07
heuristics/protection_profiles cf0f01bcd7be3e9c {}
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf {}
pdf_data/report_filename 2002_25.pdf
pdf_data/report_frontpage
  • FR:
  • FR:
pdf_data/report_keywords/cc_cert_id
  • FR:
    • Rapport de certification 2002/25: 4
pdf_data/report_keywords/cc_protection_profile_id
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
    • EAL 4: 5
    • EAL 7: 1
    • EAL1: 1
    • EAL4: 3
    • EAL7: 1
pdf_data/report_keywords/cc_sar
  • ACM:
    • ACM_AUT.1: 1
    • ACM_CAP.4: 1
    • ACM_SCP.2: 1
  • ADO:
    • ADO_DEL.2: 1
    • ADO_IGS.1: 1
  • ADV:
    • ADV_FSP.2: 1
    • ADV_HLD.2: 1
    • ADV_IMP.2: 6
    • ADV_LLD.1: 1
    • ADV_RCR.1: 1
    • ADV_SPM.1: 1
  • AGD:
    • AGD_ADM.1: 1
    • AGD_USR.1: 1
  • ALC:
    • ALC_DVS.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.1: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_MSU.2: 1
    • AVA_SOF.1: 1
    • AVA_VLA.4: 8
pdf_data/report_keywords/cc_sfr
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 17
pdf_data/report_keywords/eval_facility
  • Serma:
    • Serma Technologies: 3
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 4
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id
  • CC:
    • CCIMB-99-031: 1
    • CCIMB-99-032: 1
    • CCIMB-99-033: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata
  • /Author: SGDN/DCSSI
  • /CreationDate: D:20030107150647Z00'00'
  • /Creator: FrameMaker 6.0
  • /ModDate: D:20030107155953Z00'00'
  • /Producer: Acrobat Distiller 5.0 (Windows)
  • /Subject: Samsung S3CC9PB microcontroller
  • /Title: Rapport de certification 2002-25
  • pdf_file_size_bytes: 240469
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 15
pdf_data/st_filename cible2002_25.pdf
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL4: 2
    • EAL4 augmented: 1
pdf_data/st_keywords/cc_sar
  • ACM:
    • ACM_AUT: 2
    • ACM_CAP: 2
    • ACM_SCP: 2
  • ADO:
    • ADO_DEL: 2
    • ADO_IGS: 2
  • ADV:
    • ADV_FSP: 2
    • ADV_HLD: 2
    • ADV_IMP: 2
    • ADV_IMP.2: 1
    • ADV_LLD: 2
    • ADV_RCR: 2
    • ADV_SPM: 2
  • AGD:
    • AGD_ADM: 2
    • AGD_USR: 2
  • ALC:
    • ALC_DVS: 2
    • ALC_DVS.2: 1
    • ALC_FLR: 2
    • ALC_LCD: 2
    • ALC_TAT: 2
  • ATE:
    • ATE_COV: 2
    • ATE_DPT: 2
    • ATE_FUN: 2
    • ATE_IND: 1
  • AVA:
    • AVA_MSU: 2
    • AVA_SOF: 2
    • AVA_VLA: 2
    • AVA_VLA.4: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAA.1: 1
  • FCS:
    • FCS_CKM.1: 2
    • FCS_CKM.4: 2
    • FCS_COP.1: 2
  • FDP:
    • FDP_ACC.2: 1
    • FDP_ACF.1: 2
    • FDP_IFC.1: 1
    • FDP_IFF.1: 2
    • FDP_SDI.1: 1
  • FIA:
    • FIA_ATD.1: 1
    • FIA_UAU.2: 2
    • FIA_UID.2: 2
  • FMT:
    • FMT_MOF.1: 2
    • FMT_MSA.1: 2
    • FMT_MSA.3: 2
    • FMT_SMR.1: 2
  • FPR:
    • FPR_UNO.1: 1
  • FPT:
    • FPT_PHP.2: 1
    • FPT_PHP.3: 1
    • FPT_TST.1: 2
pdf_data/st_keywords/cc_claims
  • A:
    • A.DEV_ORG: 1
    • A.DLV: 1
    • A.DLV_AUDIT: 1
    • A.DLV_PROTECT: 1
    • A.DLV_RESP: 1
    • A.KEY_DEST: 2
    • A.SOFT_ARCHI: 1
    • A.USE_DIAG: 1
    • A.USE_PROD: 1
    • A.USE_SYS: 1
    • A.USE_TEST: 1
  • O:
    • O.CLON: 1
    • O.CRYPTO: 2
    • O.DESIGN_ACS: 1
    • O.DEV_DIS: 1
    • O.DEV_TOOLS: 1
    • O.DIS_MECHANISM: 1
    • O.DIS_MEMORY: 1
    • O.DLV_AUDIT: 1
    • O.DLV_PROTECT: 1
    • O.DLV_RESP: 1
    • O.DSOFT_ACS: 1
    • O.FLAW: 1
    • O.IC_DLV: 1
    • O.KEY_DEST: 2
    • O.MASK_FAB: 1
    • O.MECH_ACS: 1
    • O.MOD_MEMORY: 1
    • O.OPERATE: 1
    • O.SOFT_ACS: 1
    • O.SOFT_DLV: 1
    • O.SOFT_MECH: 1
    • O.TAMPER: 1
    • O.TEST_OPERATE: 1
    • O.TOE_PRT: 1
    • O.USE_DIAG: 1
    • O.USE_SYS: 1
  • T:
    • T.CLON: 2
    • T.DIS_DEL: 2
    • T.DIS_DESIGN: 2
    • T.DIS_DSOFT: 2
    • T.DIS_INFO: 1
    • T.DIS_PHOTOMAS: 1
    • T.DIS_PHOTOMASK: 1
    • T.DIS_SOFT: 1
    • T.DIS_TEST: 1
    • T.DIS_TOOLS: 1
    • T.MOD_DEL: 2
    • T.MOD_DESIGN: 1
    • T.MOD_DSOFT: 1
    • T.MOD_PHOTOMA: 1
    • T.MOD_SOFT: 2
    • T.T_DEL: 2
    • T.T_PHOTOMASK: 2
    • T.T_PRODUCT: 2
    • T.T_SAMPLE: 2
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • DES:
      • DES: 6
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
pdf_data/st_keywords/cipher_mode
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • physical tampering: 6
  • other:
    • reverse engineering: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1
    • a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. The TOE submitted to the: 1
    • out of scope: 1
pdf_data/st_metadata
  • /CreationDate: D:20021129145359
  • /ModDate: D:20021129145400+09'00'
  • /Producer: Acrobat Distiller 4.0 for Windows
  • pdf_file_size_bytes: 267011
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 31
state/report/convert_ok False True
state/report/download_ok False True
state/report/extract_ok False True
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/convert_ok False True
state/st/download_ok False True
state/st/extract_ok False True
state/st/pdf_hash Different Different
state/st/txt_hash Different Different