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	NEC V-WAY 64 V3.0 (µPD79216000) microcontroller ANSSI-CC-2004/19	Samsung S3CC9PB microcontroller (reference S3CC9PBX01) ANSSI-CC-2002/25
name	NEC V-WAY 64 V3.0 (µPD79216000) microcontroller	Samsung S3CC9PB microcontroller (reference S3CC9PBX01)
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	FR	FR
status	archived	archived
not_valid_after	01.09.2019	01.09.2019
not_valid_before	16.09.2004	01.01.2002
cert_link	None	None
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_19en.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2002_25.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_19.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2002_25.pdf
manufacturer	NEC SCAC / NEC	Samsung Electronics Co., Ltd.
manufacturer_web	https://www.nec.com/	https://www.samsung.com
security_level	ADV_IMP.2, EAL4+, ALC_DVS.2, AVA_VLA.4	ADV_IMP.2, EAL4+, ALC_DVS.2, AVA_VLA.4
dgst	d63e43c952b37c32	9aa2895387590839
heuristics/cert_id	ANSSI-CC-2004/19	ANSSI-CC-2002/25
heuristics/cert_lab	[]	[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_ENV.1, ADV_RCR.1, ASE_INT.1, ADV_HLD.2, AGD_USR.1, ALC_DVS.2, ASE_REQ.1, ASE_PPC.1, ASE_DES.1, AVA_SOF.1, ADV_FSP.2, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, AVA_MSU.2, AGD_ADM.1, ALC_LCD.1, ATE_FUN.1, ADV_IMP.2, ATE_DPT.1, AVA_VLA.4, ASE_SRE.1, ASE_OBJ.1, ATE_IND.2, ADV_LLD.1, ADV_SPM.1	ATE_COV.2, ADV_RCR.1, AVA_VLA.4, ALC_TAT.1, AVA_MSU.2, ADV_HLD.2, ATE_FUN.1, AGD_USR.1, ATE_IND.2, AGD_ADM.1, ADV_LLD.1, ALC_DVS.2, ALC_LCD.1, ADV_FSP.2, ADV_IMP.2, ATE_DPT.1, AVA_SOF.1, ADV_SPM.1
heuristics/extracted_versions	3.0	-
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	ANSSI-CC-2004/08, ANSSI-CC-2004/06, ANSSI-CC-2004/07
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	ANSSI-CC-2004/08, ANSSI-CC-2004/06, ANSSI-CC-2004/07
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	{}
maintenance_updates
protection_profiles
protection_profile_links	{}	{}
pdf_data/cert_filename	None	None
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
pdf_data/cert_keywords/cc_sar
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
pdf_data/report_filename	2004_19en.pdf	2002_25.pdf
pdf_data/report_frontpage	FR:	FR:
pdf_data/report_keywords/cc_cert_id		FR: Rapport de certification 2002/25: 4
pdf_data/report_keywords/cc_protection_profile_id
pdf_data/report_keywords/cc_security_level	EAL: EAL1: 1 EAL3: 1 EAL4: 2 EAL4+: 1 EAL41: 1 EAL5: 1 EAL7: 1	EAL: EAL 1: 1 EAL 4: 5 EAL 7: 1 EAL1: 1 EAL4: 3 EAL7: 1
pdf_data/report_keywords/cc_sar	ACM: ACM_AUT: 1 ACM_AUT.1: 6 ACM_CAP: 1 ACM_CAP.4: 6 ACM_SCP: 1 ACM_SCP.2: 1 ADO: ADO_DEL: 1 ADO_DEL.2: 6 ADO_IGS: 1 ADO_IGS.1: 1 ADV: ADV_FSP: 1 ADV_FSP.2: 1 ADV_HLD: 1 ADV_HLD.2: 1 ADV_IMP: 1 ADV_IMP.2: 3 ADV_INT: 1 ADV_LLD: 1 ADV_LLD.1: 1 ADV_RCR: 1 ADV_RCR.1: 1 ADV_SPM: 1 ADV_SPM.1: 1 AGD: AGD_ADM: 1 AGD_ADM.1: 1 AGD_USR: 1 AGD_USR.1: 1 ALC: ALC_DVS: 1 ALC_DVS.2: 8 ALC_FLR: 1 ALC_LCD.1: 1 ALC_TAT: 1 ALC_TAT.1: 1 ASE: ASE_DES.1: 1 ASE_ENV.1: 1 ASE_INT.1: 1 ASE_OBJ.1: 1 ASE_PPC.1: 1 ASE_REQ.1: 1 ASE_SRE.1: 1 ASE_TSS.1: 1 ATE: ATE_COV: 1 ATE_COV.2: 1 ATE_DPT: 1 ATE_DPT.1: 1 ATE_FUN: 1 ATE_FUN.1: 1 ATE_IND: 1 ATE_IND.2: 1 AVA: AVA_CCA: 1 AVA_MSU: 1 AVA_MSU.2: 1 AVA_SOF: 1 AVA_SOF.1: 1 AVA_VLA: 1 AVA_VLA.4: 3	ACM: ACM_AUT.1: 1 ACM_CAP.4: 1 ACM_SCP.2: 1 ADO: ADO_DEL.2: 1 ADO_IGS.1: 1 ADV: ADV_FSP.2: 1 ADV_HLD.2: 1 ADV_IMP.2: 6 ADV_LLD.1: 1 ADV_RCR.1: 1 ADV_SPM.1: 1 AGD: AGD_ADM.1: 1 AGD_USR.1: 1 ALC: ALC_DVS.2: 6 ALC_LCD.1: 1 ALC_TAT.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_MSU.2: 1 AVA_SOF.1: 1 AVA_VLA.4: 8
pdf_data/report_keywords/cc_sfr	FAU: FAU_SAA.1: 1 FCS: FCS_COP.1: 1 FDP: FDP_ACC.2: 1 FDP_ACF.1: 1 FDP_IFC.1: 1 FDP_IFF.1: 1 FDP_SDI.1: 1 FIA: FIA_ATD.1: 1 FIA_UAU.2: 1 FIA_UID.2: 1 FMT: FMT_MOF.1: 1 FMT_MSA.1: 1 FMT_MSA.3: 1 FMT_SMR.1: 1 FPR: FPR_UNO.1: 1 FPT: FPT_PHP.2: 1 FPT_PHP.3: 1 FPT_TST.1: 1
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor	STMicroelectronics: STM: 1	Samsung: Samsung: 17
pdf_data/report_keywords/eval_facility		Serma: Serma Technologies: 3
pdf_data/report_keywords/symmetric_crypto	DES: DES: DES: 1	DES: DES: DES: 4
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis		FI: physical tampering: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id		CC: CCIMB-99-031: 1 CCIMB-99-032: 1 CCIMB-99-033: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: bousson /CreationDate: D:20040916184830+02'00' /Creator: PScript5.dll Version 5.2 /ModDate: D:20040916184830+02'00' /Producer: Acrobat Distiller 5.0.5 (Windows) /Title: Microsoft Word - certification report 2004_19.doc pdf_file_size_bytes: 320957 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 27	/Author: SGDN/DCSSI /CreationDate: D:20030107150647Z00'00' /Creator: FrameMaker 6.0 /ModDate: D:20030107155953Z00'00' /Producer: Acrobat Distiller 5.0 (Windows) /Subject: Samsung S3CC9PB microcontroller /Title: Rapport de certification 2002-25 pdf_file_size_bytes: 240469 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 15
pdf_data/st_filename	cible2004_19.pdf	cible2002_25.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 4 EAL4 augmented: 2	EAL: EAL 4: 1 EAL 4 augmented: 1 EAL4: 2 EAL4 augmented: 1
pdf_data/st_keywords/cc_sar	ACM: ACM_AUT.1: 1 ACM_CAP.4: 1 ACM_SCP.2: 1 ADO: ADO_DEL.2: 1 ADO_IGS.1: 1 ADV: ADV_FSP.2: 1 ADV_HLD.2: 1 ADV_IMP.2: 4 ADV_LLD.1: 1 ADV_RCR.1: 1 ADV_SPM.1: 1 AGD: AGD_ADM.1: 1 AGD_USR.1: 1 ALC: ALC_DVS.2: 4 ALC_LCD.1: 1 ALC_TAT.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_MSU.2: 1 AVA_SOF.1: 1 AVA_VLA.4: 4	ACM: ACM_AUT: 2 ACM_CAP: 2 ACM_SCP: 2 ADO: ADO_DEL: 2 ADO_IGS: 2 ADV: ADV_FSP: 2 ADV_HLD: 2 ADV_IMP: 2 ADV_IMP.2: 1 ADV_LLD: 2 ADV_RCR: 2 ADV_SPM: 2 AGD: AGD_ADM: 2 AGD_USR: 2 ALC: ALC_DVS: 2 ALC_DVS.2: 1 ALC_FLR: 2 ALC_LCD: 2 ALC_TAT: 2 ATE: ATE_COV: 2 ATE_DPT: 2 ATE_FUN: 2 ATE_IND: 1 AVA: AVA_MSU: 2 AVA_SOF: 2 AVA_VLA: 2 AVA_VLA.4: 1
pdf_data/st_keywords/cc_sfr	FAU: FAU_SAA.1: 2 FCS: FCS_COP.1: 3 FDP: FDP_ACC.2: 2 FDP_ACF.1: 3 FDP_IFC.1: 2 FDP_IFF.1: 2 FDP_SDI.1: 2 FIA: FIA_ATD.1: 2 FIA_UAU.2: 2 FIA_UID.2: 2 FMT: FMT_MOF.1: 2 FMT_MSA.1: 2 FMT_MSA.3: 2 FMT_SMR.1: 2 FPR: FPR_UNO.1: 2 FPT: FPT_PHP.2: 2 FPT_PHP.3: 2 FPT_TST.1: 2	FAU: FAU_SAA.1: 1 FCS: FCS_CKM.1: 2 FCS_CKM.4: 2 FCS_COP.1: 2 FDP: FDP_ACC.2: 1 FDP_ACF.1: 2 FDP_IFC.1: 1 FDP_IFF.1: 2 FDP_SDI.1: 1 FIA: FIA_ATD.1: 1 FIA_UAU.2: 2 FIA_UID.2: 2 FMT: FMT_MOF.1: 2 FMT_MSA.1: 2 FMT_MSA.3: 2 FMT_SMR.1: 2 FPR: FPR_UNO.1: 1 FPT: FPT_PHP.2: 1 FPT_PHP.3: 1 FPT_TST.1: 2
pdf_data/st_keywords/cc_claims	A: A.DEV_ORG: 1 A.DLV_AUDIT: 1 A.DLV_PROTECT: 1 A.DLV_RESP: 1 A.SOFT_ARCHI: 1 A.USE_DIAG: 1 A.USE_PROD: 1 A.USE_SYS: 1 A.USE_TEST: 1 O: O.CLON: 1 O.CRYPTO: 2 O.DESIGN_ACS: 1 O.DEV_DIS: 1 O.DEV_TOOLS: 1 O.DIS_MECHAN: 1 O.DIS_MEMORY: 1 O.DLV_AUDIT: 1 O.DLV_PROTECT: 1 O.DLV_RESP: 1 O.DSOFT_ACS: 1 O.FLAW: 1 O.IC_DLV: 1 O.MASK_FAB: 1 O.MECH_ACS: 1 O.MOD_MEMORY: 1 O.OPERATE: 1 O.SOFT_ACS: 1 O.SOFT_DLV: 1 O.SOFT_MECH: 1 O.TAMPER: 1 O.TEST_OPERATE: 1 O.TI_ACS: 1 O.TOE_PRT: 1 O.USE_DIAG: 1 O.USE_SYS: 1 T: T.CLON: 2 T.DIS_DEL: 2 T.DIS_DESIGN: 2 T.DIS_DSOFT: 2 T.DIS_INFO: 2 T.DIS_PHMASK: 2 T.DIS_SOFT: 2 T.DIS_TEST: 2 T.DIS_TOOLS: 2 T.MOD_DEL: 2 T.MOD_DESIGN: 2 T.MOD_DSOFT: 2 T.MOD_PHMASK: 2 T.MOD_SOFT: 2 T.T_DEL: 2 T.T_PHMASK: 2 T.T_PRODUCT: 2 T.T_SAMPLE: 2	A: A.DEV_ORG: 1 A.DLV: 1 A.DLV_AUDIT: 1 A.DLV_PROTECT: 1 A.DLV_RESP: 1 A.KEY_DEST: 2 A.SOFT_ARCHI: 1 A.USE_DIAG: 1 A.USE_PROD: 1 A.USE_SYS: 1 A.USE_TEST: 1 O: O.CLON: 1 O.CRYPTO: 2 O.DESIGN_ACS: 1 O.DEV_DIS: 1 O.DEV_TOOLS: 1 O.DIS_MECHANISM: 1 O.DIS_MEMORY: 1 O.DLV_AUDIT: 1 O.DLV_PROTECT: 1 O.DLV_RESP: 1 O.DSOFT_ACS: 1 O.FLAW: 1 O.IC_DLV: 1 O.KEY_DEST: 2 O.MASK_FAB: 1 O.MECH_ACS: 1 O.MOD_MEMORY: 1 O.OPERATE: 1 O.SOFT_ACS: 1 O.SOFT_DLV: 1 O.SOFT_MECH: 1 O.TAMPER: 1 O.TEST_OPERATE: 1 O.TOE_PRT: 1 O.USE_DIAG: 1 O.USE_SYS: 1 T: T.CLON: 2 T.DIS_DEL: 2 T.DIS_DESIGN: 2 T.DIS_DSOFT: 2 T.DIS_INFO: 1 T.DIS_PHOTOMAS: 1 T.DIS_PHOTOMASK: 1 T.DIS_SOFT: 1 T.DIS_TEST: 1 T.DIS_TOOLS: 1 T.MOD_DEL: 2 T.MOD_DESIGN: 1 T.MOD_DSOFT: 1 T.MOD_PHOTOMA: 1 T.MOD_SOFT: 2 T.T_DEL: 2 T.T_PHOTOMASK: 2 T.T_PRODUCT: 2 T.T_SAMPLE: 2
pdf_data/st_keywords/vendor		Samsung: Samsung: 1
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	DES: DES: DES: 15	DES: DES: DES: 6
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness	RNG: RNG: 6
pdf_data/st_keywords/cipher_mode	CBC: CBC: 1 ECB: ECB: 1
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Physical tampering: 1 fault injection: 1 physical tampering: 5 SCA: DPA: 1 other: reverse engineering: 3	FI: physical tampering: 6 other: reverse engineering: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	FIPS: FIPS PUB 46-2: 2 FIPS140-2: 1 PKCS: PKCS #1: 1 PKCS 1: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process		OutOfScope: Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1 a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. The TOE submitted to the: 1 out of scope: 1
pdf_data/st_metadata	/Author: Jean-Francois LEON /CreationDate: D:20040730163633+02'00' /Creator: Acrobat PDFMaker 5.0 pour Word /ModDate: D:20040730163937+03'00' /Producer: Acrobat Distiller 5.0.5 (Windows) /Title: Common Criteria pdf_file_size_bytes: 1700318 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 45	/CreationDate: D:20021129145359 /ModDate: D:20021129145400+09'00' /Producer: Acrobat Distiller 4.0 for Windows pdf_file_size_bytes: 267011 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 31
state/cert/convert_garbage	False	False
state/cert/convert_ok	False	False
state/cert/download_ok	False	False
state/cert/extract_ok	False	False
state/cert/pdf_hash	Equal	Equal
state/cert/txt_hash	Equal	Equal
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different