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Comparing certificates Experimental feature

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	M/Chip Select v2.0.5.2 Application ANSSI-CC-2001/22	Samsung S3CC9P9 microcontroller ANSSI-CC-2004/06
name	M/Chip Select v2.0.5.2 Application	Samsung S3CC9P9 microcontroller
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	FR	FR
status	archived	archived
not_valid_after	01.09.2019	01.09.2019
not_valid_before	01.01.2001	11.05.2004
cert_link	None	None
report_link	https://www.commoncriteriaportal.org/files/epfiles/2001_22.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2004_06.pdf
st_link	https://www.commoncriteriaportal.org/files/epfiles/	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/cible2004_06.pdf
manufacturer	Mondex International Ltd	Samsung Electronics Co., Ltd.
manufacturer_web		https://www.samsung.com
security_level	AVA_VLA.2, EAL1+	ADV_IMP.2, EAL4+, ALC_DVS.2, AVA_VLA.4
dgst	cb2462180d97ed8c	473ea605d6a40ef5
heuristics/cert_id	ANSSI-CC-2001/22	ANSSI-CC-2004/06
heuristics/cert_lab	[]	[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_ENV.1, ADV_RCR.1, ADV_FSP.1, AVA_VLA.2, ASE_INT.1, ASE_SRE.1, ASE_TSS.1, ASE_OBJ.1, AGD_USR.1, ATE_IND.1, AGD_ADM.1, ASE_REQ.1, ASE_PPC.1, ASE_DES.1	ASE_ENV.1, ADV_RCR.1, ASE_INT.1, ADV_HLD.2, AGD_USR.1, ALC_DVS.2, ASE_REQ.1, ASE_PPC.1, ASE_DES.1, AVA_SOF.1, ATE_COV.2, ASE_TSS.1, ALC_TAT.1, AVA_MSU.2, AGD_ADM.1, ALC_LCD.1, ADV_DVS.2, ATE_FUN.1, ADV_IMP.2, ATE_DPT.1, ADV_FSP.1, AVA_VLA.4, ASE_SRE.1, ASE_OBJ.1, ATE_IND.2, ADV_LLD.1, ADV_SPM.1
heuristics/extracted_versions	2.0.5.2	-
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	ANSSI-CC-2002/25
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	ANSSI-CC-2002/25
heuristics/scheme_data
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	{}	{}
maintenance_updates
protection_profiles
protection_profile_links	{}	{}
pdf_data/cert_filename	None	None
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
pdf_data/cert_keywords/cc_sar
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
pdf_data/report_filename	2001_22.pdf	2004_06.pdf
pdf_data/report_frontpage	FR:	FR:
pdf_data/report_keywords/cc_cert_id	FR: Rapport de certification 2001/22: 3	FR: Rapport de certification 2002/25: 1 Rapport de certification 2004/06: 13
pdf_data/report_keywords/cc_protection_profile_id
pdf_data/report_keywords/cc_security_level	EAL: EAL1: 4	EAL: EAL1: 1 EAL3: 1 EAL4: 1 EAL4+: 1 EAL41: 1 EAL5: 1 EAL7: 2 ITSEC: ITSEC E6 et: 1
pdf_data/report_keywords/cc_sar	ACM: ACM_CAP.1: 1 ADO: ADO_IGS.1: 2 ADV: ADV_FSP.1: 1 ADV_RCR.1: 1 AGD: AGD_ADM.1: 1 AGD_USR.1: 1 ASE: ASE_DES.1: 1 ASE_ENV.1: 1 ASE_INT.1: 1 ASE_OBJ.1: 1 ASE_PPC.1: 1 ASE_REQ.1: 1 ASE_SRE.1: 1 ASE_TSS.1: 1 ATE: ATE_IND.1: 1 AVA: AVA_VLA.2: 5	ACM: ACM_AUT: 1 ACM_AUT.1: 2 ACM_CAP: 1 ACM_CAP.4: 2 ACM_SCP: 1 ACM_SCP.2: 1 ADO: ADO_DEL: 1 ADO_DEL.2: 2 ADO_IGS: 1 ADO_IGS.1: 1 ADV: ADV_FSP: 1 ADV_FSP.2: 1 ADV_HLD: 1 ADV_HLD.2: 1 ADV_IMP: 1 ADV_IMP.2: 3 ADV_INT: 1 ADV_LLD: 1 ADV_LLD.1: 1 ADV_RCR: 1 ADV_RCR.1: 1 ADV_SPM: 1 ADV_SPM.1: 1 AGD: AGD_ADM: 1 AGD_ADM.1: 1 AGD_USR: 1 AGD_USR.1: 1 ALC: ALC_DVS: 1 ALC_DVS.2: 4 ALC_FLR: 2 ALC_LCD.1: 1 ALC_TAT: 1 ALC_TAT.1: 1 ASE: ASE_DES.1: 1 ASE_ENV.1: 1 ASE_INT.1: 1 ASE_OBJ.1: 1 ASE_PPC.1: 1 ASE_REQ.1: 1 ASE_SRE.1: 1 ASE_TSS.1: 1 ATE: ATE_COV: 1 ATE_COV.2: 1 ATE_DPT: 1 ATE_DPT.1: 1 ATE_FUN: 1 ATE_FUN.1: 1 ATE_IND: 1 ATE_IND.2: 1 AVA: AVA_CCA: 1 AVA_MSU: 1 AVA_MSU.2: 1 AVA_SOF: 1 AVA_SOF.1: 1 AVA_VLA: 1 AVA_VLA.4: 3
pdf_data/report_keywords/cc_sfr		FAU: FAU_SAA.1: 2 FCS: FCS_CKM.1: 2 FCS_COP.1: 2 FDP: FDP_ACC.2: 2 FDP_ACF.1: 2 FDP_IFC.1: 2 FDP_IFF.1: 2 FDP_SDI.1: 2 FIA: FIA_ATD.1: 2 FIA_UAU.2: 2 FIA_UID.2: 2 FMT: FMT_MOF.1: 2 FMT_MSA.1: 2 FMT_MSA.3: 2 FMT_SMR.1: 2 FPR: FPR_UNO.1: 2 FPT: FPT_PHP.2: 2 FPT_PHP.3: 2 FPT_TST.1: 2
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor	Infineon: Infineon: 1 Infineon Technologies AG: 1	Samsung: Samsung: 10
pdf_data/report_keywords/eval_facility		Serma: SERMA: 3
pdf_data/report_keywords/symmetric_crypto	DES: DES: DES: 1	DES: DES: DES: 4
pdf_data/report_keywords/asymmetric_crypto
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function
pdf_data/report_keywords/crypto_scheme
pdf_data/report_keywords/crypto_protocol
pdf_data/report_keywords/randomness
pdf_data/report_keywords/cipher_mode
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	CC: CCIMB-99-031: 1 CCIMB-99-032: 1 CCIMB-99-033: 1	CC: CCIMB-99-031: 1 CCIMB-99-032: 1 CCIMB-99-033: 1 ISO: ISO/IEC 15408:1999: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: blad /CreationDate: D:20011019120110 /Creator: FrameMaker 6.0 /ModDate: D:20011019120227+02'00' /Producer: Acrobat Distiller 4.05 for Windows /Title: RapportCertification.book pdf_file_size_bytes: 127795 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 13	/Author: DCSSI /CreationDate: D:20040517150819+02'00' /Creator: Acrobat PDFMaker 5.0 pour Word /ModDate: D:20040517150839+03'00' /Producer: Acrobat Distiller 5.0 (Windows) /Subject: Micro-circuit SAMSUNG S3CC9P9 /Title: Rapport de certification 2004/06 pdf_file_size_bytes: 656869 pdf_hyperlinks: {} pdf_is_encrypted: True pdf_number_of_pages: 26
pdf_data/st_filename		cible2004_06.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id
pdf_data/st_keywords/cc_security_level		EAL: EAL 4: 2 EAL 4 augmented: 1 EAL4: 12 EAL4 augmented: 1
pdf_data/st_keywords/cc_sar		ACM: ACM_AUT: 2 ACM_CAP: 3 ACM_SCP: 2 ADO: ADO_DEL: 2 ADO_IGS: 3 ADV: ADV_DVS.2: 1 ADV_FSP: 3 ADV_FSP.1: 1 ADV_HLD: 2 ADV_HLD.2: 1 ADV_IMP: 2 ADV_IMP.1: 2 ADV_IMP.2: 5 ADV_LLD: 2 ADV_LLD.1: 2 ADV_RCR: 3 ADV_RCR.1: 1 ADV_SPM: 2 AGD: AGD_ADM: 3 AGD_ADM.1: 1 AGD_USR: 3 ALC: ALC_DVS: 2 ALC_DVS.1: 1 ALC_DVS.2: 4 ALC_FLR: 2 ALC_LCD: 2 ALC_TAT: 2 ALC_TAT.1: 1 ATE: ATE_COV: 2 ATE_DPT: 2 ATE_FUN: 2 ATE_IND: 2 AVA: AVA_MSU: 2 AVA_SOF: 2 AVA_VLA: 2 AVA_VLA.4: 6
pdf_data/st_keywords/cc_sfr		FAU: FAU_GEN: 1 FAU_GEN.1: 2 FAU_SAA.1: 7 FCS: FCS_CKM.1: 8 FCS_CKM.4: 7 FCS_COP.1: 8 FDP: FDP_ACC.1: 1 FDP_ACC.2: 5 FDP_ACF.1: 6 FDP_IFC.1: 6 FDP_IFF.1: 6 FDP_ITC.1: 3 FDP_SDI.1: 5 FIA: FIA_ATD.1: 7 FIA_UAU.2: 8 FIA_UID.1: 1 FIA_UID.2: 8 FMT: FMT_MOF.1: 7 FMT_MSA.1: 6 FMT_MSA.2: 3 FMT_MSA.3: 7 FMT_SMR.1: 7 FPR: FPR_UNO: 1 FPR_UNO.1: 4 FPT: FPT_AMT.1: 2 FPT_PHP.2: 5 FPT_PHP.3: 5 FPT_TST.1: 8
pdf_data/st_keywords/cc_claims		A: A.DEV_ORG: 2 A.DLV: 1 A.DLV_AUDIT: 2 A.DLV_PROTECT: 2 A.DLV_RESP: 2 A.KEY_DEST: 3 A.SOFT_ARCHI: 2 A.USE_DIAG: 2 A.USE_PROD: 2 A.USE_SYS: 2 A.USE_TEST: 2 O: O.CLON: 3 O.CRYPTO: 3 O.DESIGN: 1 O.DESIGN_ACS: 2 O.DEV_DIS: 4 O.DEV_TOOLS: 3 O.DIS_: 3 O.DIS_ME: 1 O.DIS_MECHANISM: 4 O.DIS_MEMORY: 3 O.DLV_AUDIT: 1 O.DLV_PROTECT: 2 O.DLV_RESP: 2 O.DSOFT: 1 O.DSOFT_ACS: 2 O.FLAW: 3 O.IC_DLV: 2 O.KEY_: 1 O.KEY_DEST: 3 O.MASK: 1 O.MASK_FAB: 2 O.MECH: 1 O.MECH_ACS: 2 O.MOD_: 2 O.MOD_MEMORY: 5 O.OPER: 1 O.OPERATE: 7 O.SOFT: 1 O.SOFT_ACS: 2 O.SOFT_DLV: 2 O.SOFT_MECH: 1 O.TA: 1 O.TAMPER: 3 O.TEST_OPERATE: 2 O.TI: 1 O.TI_ACS: 1 O.TOE_PRT: 3 O.USE_DIAG: 1 O.USE_SYS: 2 T: T.CLON: 12 T.DIS_DEL: 5 T.DIS_DESIGN: 10 T.DIS_DSOFT: 8 T.DIS_INFO: 4 T.DIS_PHOTOMASK: 6 T.DIS_SOFT: 7 T.DIS_TEST: 5 T.DIS_TOOLS: 5 T.MOD_DEL: 5 T.MOD_DESIGN: 10 T.MOD_DSOFT: 9 T.MOD_PHOTOMASK: 5 T.MOD_SOFT: 10 T.T_DEL: 6 T.T_PHOTOMASK: 6 T.T_PRODUCT: 7 T.T_SAMPLE: 8
pdf_data/st_keywords/vendor		Samsung: Samsung: 6
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto		DES: DES: DES: 13
pdf_data/st_keywords/asymmetric_crypto
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function		SHA: SHA1: SHA-1: 2
pdf_data/st_keywords/crypto_scheme
pdf_data/st_keywords/crypto_protocol
pdf_data/st_keywords/randomness
pdf_data/st_keywords/cipher_mode
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis		FI: Physical Tampering: 1 physical tampering: 5 other: reverse engineering: 1
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id		FIPS: FIPS 186: 1 FIPS 46-2: 2
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process		OutOfScope: Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation: 1 a smart card embedded software and an IC dedicated software (Test ROM code). The former is out of scope of the evaluation, while the latter is within the scope of the evaluation. 10 To allow the: 1 out of scope: 1
pdf_data/st_metadata		/CreationDate: D:20040221110009 /Creator: AdobePS5.dll Version 5.0.1 /ModDate: D:20040221110011+09'00' /Producer: Acrobat Distiller 4.0 for Windows /Title: Microsoft Word - ST C9P9 v1.2_FEB 21_.doc pdf_file_size_bytes: 651062 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 58
state/cert/convert_garbage	False	False
state/cert/convert_ok	False	False
state/cert/download_ok	False	False
state/cert/extract_ok	False	False
state/cert/pdf_hash	Equal	Equal
state/cert/txt_hash	Equal	Equal
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	False	True
state/st/download_ok	False	True
state/st/extract_ok	False	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different