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MAWIS-Security Rev. 4.0
BSI-DSZ-CC-0496-V2-2025
NXP Secure Smart Card Controller P60x017/041PVD including IC Dedicated Software
BSI-DSZ-CC-0896-2014
name MAWIS-Security Rev. 4.0 NXP Secure Smart Card Controller P60x017/041PVD including IC Dedicated Software
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
status active archived
not_valid_after 23.01.2030 01.09.2019
not_valid_before 24.01.2025 11.08.2014
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0496V2c_pdf.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0496V2a_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0896a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0496V2b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0896b_pdf.pdf
manufacturer MOBA Mobile Automation AG NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.moba.de/ https://www.nxp.com
security_level ASE_SPD.1, ASE_OBJ.2, ASE_REQ.2, EAL1+ EAL6+, ALC_FLR.1, ASE_TSS.2
dgst c8c9125bad005bbe eb861b805ef948cd
heuristics/cert_id BSI-DSZ-CC-0496-V2-2025 BSI-DSZ-CC-0896-2014
heuristics/extracted_sars ASE_TSS.1, ADV_FSP.1, ALC_CMC.1, ASE_INT.1, ASE_SPD.1, AVA_VAN.1, ATE_IND.1, ASE_OBJ.2, AGD_OPE.1, ASE_ECD.1, ASE_REQ.2 ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, APE_ECD.1, ALC_FLR.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ADV_IMP.2, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions 4.0 -
heuristics/scheme_data
  • category: Other products
  • cert_id: BSI-DSZ-CC-0496-V2-2025
  • certification_date: 24.01.2025
  • enhanced:
    • applicant: MOBA Mobile Automation AG Kapellenstraße 15 65555 Limburg
    • assurance_level: EAL1,ASE_SPD.1,ASE_REQ.2,ASE_OBJ.2
    • certification_date: 24.01.2025
    • description: The TOE is the Waste Bin Identification Systems (WBIS) MAWIS-Security Rev 4.0. The TOE is evaluated and certified conform to the „Protection Profile Waste Bin Identification System (WBIS-PP), Version 1.04“. Waste Bin Identification Systems (WBIS) in the sense of this document are systems, which allow to identify waste bins by an ID-tag (e.g. an electronic chip, which is referred to as transponder) in order to determine how often a specific waste bin has been cleared. Note that this type of system does not identify the waste directly but the waste bin, which contains the waste for disposal. The TOE with its security functionality ensures validity, integrity and completeness of the protected data during storage in the vehicle and Transmission between physically separated parts of the TOE.
    • entries: [frozendict({'id': 'BSI-DSZ-CC-0496-V2-2025', 'description': 'The TOE is evaluated and certified conform to the „Protection Profile Waste Bin Identification System (WBIS-PP), Version 1.04“. Waste Bin Identification Systems (WBIS) in the sense of this document are systems, which allow to identify waste bins by an ID-tag (e.g. an electronic chip, which is referred to as transponder) in order to determine how often a specific waste bin has been cleared. Note that this type of system does not identify the waste directly but the waste bin, which contains the waste for disposal. The TOE with its security functionality ensures validity, integrity and completeness of the protected data during storage in the vehicle and Transmission between physically separated parts of the TOE.'}), frozendict({'id': 'BSI-DSZ-CC-0496-2017'})]
    • evaluation_facility: Deutsches Forschungszentrum für Künstliche Intelligenz GmbH
    • expiration_date: 23.01.2030
    • product: MAWIS-Security Rev. 4.0
    • protection_profile: Protection Profile Waste Bin Identification Systems (WBIS-PP), Version 1.04, 27 May 2004, BSI-PP-0010-2004
  • product: MAWIS-Security Rev. 4.0
  • url: https://www.bsi.bund.de/SharedDocs/Zertifikate_CC/CC/Sonstiges/0496.html
  • vendor: MOBA Mobile Automation AG
heuristics/protection_profiles f1e8c937d15e713a f6d23054061d72ba
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/WBIS-PPv1-04.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/cert_filename 0496V2c_pdf.pdf
pdf_data/cert_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0496-V2-2025: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0010-2004: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
pdf_data/cert_keywords/cc_sar
  • ASE:
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /Keywords: "Common Criteria, Certification, Zertifizierung, WBIS, Waste Bin Identification System, Müllbehälter-Identifikationssystem, MAWIS-Security Rev. 4.0, BSI-DSZ-CC-0496-V2-2025"
  • /Subject: Common Criteria, Certification, Zertifizierung, WBIS, Waste Bin Identification System, Müllbehälter-Identifikationssystem, MAWIS-Security Rev. 4.0, BSI-DSZ-CC-0496-V2-2025
  • /Title: Zertifikat BSI-DSZ-CC-0496-V2-2025
  • pdf_file_size_bytes: 386689
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 0496V2a_pdf.pdf 0896a_pdf.pdf
pdf_data/report_frontpage
  • DE:
    • cert_id: BSI-DSZ-CC-0496-V2-2025
    • cert_item: MAWIS-Security Rev. 4.0
    • cert_lab: BSI
    • developer: MOBA Mobile Automation AG
    • match_rules: ['(BSI-DSZ-CC-.+?) zu (.+?) der (.*)']
  • DE:
    • cert_id: BSI-DSZ-CC-0896-2014
    • cert_item: NXP Secure Smart Card Controller P60x017/041PVD including IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0496-V2-2025: 10
  • DE:
    • BSI-DSZ-CC-0896-2014: 22
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0010-2004: 1
    • BSI-PP-0010-: 1
    • BSI-PP-0010-2004: 1
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 5
    • EAL 2: 1
    • EAL 4: 1
  • EAL:
    • EAL 4: 2
    • EAL 5: 3
    • EAL 6: 4
    • EAL 6 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ASE:
    • ASE_OBJ.2: 4
    • ASE_REQ.2: 4
    • ASE_SPD.1: 4
  • AVA:
    • AVA_VAN.1: 1
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 2
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 1
    • ADV_INT.3: 2
    • ADV_SPM: 1
    • ADV_SPM.1: 2
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_TDS.5: 2
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 1
    • ALC_CMC.5: 3
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 3
    • ALC_FLR: 1
    • ALC_FLR.1: 6
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 1
    • ALC_TAT.3: 3
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 2
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 2
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 2
pdf_data/report_keywords/cc_claims
  • O:
    • O.C: 5
  • R:
    • R.O: 5
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 18
    • NXP Semiconductors: 21
pdf_data/report_keywords/eval_facility
  • DFKI:
    • DFKI: 3
  • TUV:
    • TÜV Informationstechnik: 4
    • TÜViT: 1
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDES: 3
      • Triple-DES: 2
    • DES:
      • DES: 3
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 2
pdf_data/report_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 8
pdf_data/report_keywords/side_channel_analysis
  • other:
    • JIL: 3
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7148: 1
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 32: 1
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 17065: 2
    • ISO/IEC 18045: 4
  • BSI:
    • AIS 25: 2
    • AIS 26: 1
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 2
    • AIS 37: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 05 August 2014, EVALUATION TECHNICAL REPORT SUMMARY (ETR SUMMARY), TÜV Informationstechnik GmbH, (confidential document) [10] ETR for composite evaluation according to AIS 36, Version 4, 28 July 2014, ETR FOR COMPOSITE: 1
    • Card Controller P60x017/041PVD Security Target, NXP Semiconductors, Business Unit Identification (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
    • ETR-COMP), TÜV Informationstechnik GmbH (confidential document) [11] Configuration list for the TOE NXP Secure Smart Card Controller P60x017/041PVD, Customer: 1
pdf_data/report_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20140825140519+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Smardcard"
  • /ModDate: D:20140825150613+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0896-2014
  • pdf_file_size_bytes: 1055872
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 38
pdf_data/st_filename 0496V2b_pdf.pdf 0896b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0896: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0010-2004: 2
  • BSI:
    • BSI-PP-0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 1+: 1
    • EAL1: 9
    • EAL1 augmented: 2
  • EAL:
    • EAL 6: 2
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL6: 36
    • EAL6 augmented: 3
    • EAL6+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_FSP.1: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.1: 1
  • ASE:
    • ASE_ECD.1: 2
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 5
    • ASE_REQ.1: 1
    • ASE_REQ.2: 5
    • ASE_SPD.1: 6
    • ASE_TSS.1: 1
  • ATE:
    • ATE_IND.1: 1
  • AVA:
    • AVA_VAN.1: 1
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.4: 3
    • ADV_FSP.5: 11
    • ADV_IMP: 1
    • ADV_IMP.2: 4
    • ADV_INT.3: 1
    • ADV_SPM: 2
    • ADV_SPM.1: 1
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 4
    • ALC_CMC.4: 3
    • ALC_CMC.5: 4
    • ALC_CMS: 4
    • ALC_CMS.4: 3
    • ALC_CMS.5: 5
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.1: 5
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.3: 4
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 2
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_DAU: 2
    • FDP_DAU.1: 8
    • FDP_DAU.1.1: 1
    • FDP_DAU.1.2: 1
    • FDP_ITT: 4
    • FDP_ITT.1: 1
    • FDP_ITT.5: 20
    • FDP_ITT.5.1: 2
    • FDP_SDI: 2
    • FDP_SDI.1: 9
    • FDP_SDI.1.1: 1
  • FPT:
    • FPT_FLS.1: 2
  • FRU:
    • FRU_FLT: 2
    • FRU_FLT.1: 8
    • FRU_FLT.1.1: 1
  • FAU:
    • FAU_SAS.1: 7
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 3
    • FCS_CKM.4: 2
    • FCS_COP.1: 12
    • FCS_COP.1.1: 1
    • FCS_RNG.1: 9
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 36
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 32
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_FLS.1: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 14
    • FDP_SDI.1: 1
    • FDP_SDI.2: 7
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 4
    • FMT_MSA.1: 24
    • FMT_MSA.1.1: 2
    • FMT_MSA.3: 20
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 19
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 13
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITT.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.CUST_RECONFIG: 6
    • O.EEPROM_INTEGRITY: 4
    • O.FM_FW: 9
    • O.INTEGRITY_CHK: 7
    • O.MEM_ACCESS: 8
    • O.RND: 3
    • O.SFR_ACCESS: 9
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 1
  • NXP:
    • NXP: 101
    • NXP Semiconductors: 33
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDEA: 3
      • TDES: 1
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 2
      • DES: 16
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 13
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/crypto_engine
  • SmartMX:
    • SmartMX: 1
    • SmartMX2: 22
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 13
    • fault injection: 3
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 12
    • Physical Probing: 2
    • physical probing: 1
    • side channel: 1
    • timing attacks: 2
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
  • ISO:
    • ISO/IEC 18000-63: 2
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-004: 2
  • FIPS:
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 14443: 20
    • ISO/IEC 18092: 2
    • ISO/IEC 7816: 24
    • ISO/IEC 7816-3: 1
pdf_data/st_metadata
  • /Author: Holz, Stephan
  • /Subject: Sicherheitsvorgaben nach WBIS-PP
  • /Title: MAWIS-Security, Rev. 4.0
  • pdf_file_size_bytes: 1129671
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 40
  • /Author: NXP Semiconductors
  • /CreationDate: D:20140114171434+01'00'
  • /Creator: Microsoft® Word 2010
  • /Keywords: CC Security Evaluation, Security Target, Functional Requirements, Security Functionality, Assurance Level EAL6+, P60D144PVA, P60D080PVA
  • /ModDate: D:20140114171434+01'00'
  • /Producer: Microsoft® Word 2010
  • /Subject: P60D144PVA
  • /Title: Security Target
  • pdf_file_size_bytes: 1002264
  • pdf_hyperlinks: http://www.nxp.com/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 78
state/cert/convert_ok True False
state/cert/download_ok True False
state/cert/extract_ok True False
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different