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MAWIS-Security Rev. 4.0
BSI-DSZ-CC-0496-V2-2025 		NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
NSCIB-CC-2200030-01-CR
name MAWIS-Security Rev. 4.0 NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
category Other Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme DE NL
not_valid_after 23.01.2030 14.06.2028
not_valid_before 24.01.2025 14.06.2023
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0496V2c_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-01-Cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0496V2a_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-01-CR_v2.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0496V2b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-01-STLite_v09.pdf
manufacturer MOBA Mobile Automation AG NXP Semiconductors Germany GmbH
manufacturer_web https://www.moba.de/ https://www.nxp.com
security_level ASE_SPD.1, ASE_OBJ.2, ASE_REQ.2, EAL1+ ALC_FLR.1, EAL5+, AVA_VAN.5, ASE_TSS.2, ALC_DVS.2
dgst c8c9125bad005bbe b14fd214504ca5ef
heuristics/cert_id BSI-DSZ-CC-0496-V2-2025 NSCIB-CC-2200030-01-CR
heuristics/cert_lab BSI
heuristics/extracted_sars ASE_TSS.1, ADV_FSP.1, ALC_CMC.1, ASE_INT.1, ASE_SPD.1, AVA_VAN.1, ATE_IND.1, ASE_OBJ.2, AGD_OPE.1, ASE_ECD.1, ASE_REQ.2 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions 4.0 2.1.001
heuristics/report_references/directly_referenced_by {} NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
heuristics/report_references/indirectly_referenced_by {} NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
heuristics/scheme_data
  • category: Other products
  • cert_id: BSI-DSZ-CC-0496-V2-2025
  • certification_date: 24.01.2025
  • enhanced:
    • applicant: MOBA Mobile Automation AG Kapellenstraße 15 65555 Limburg
    • assurance_level: EAL1,ASE_SPD.1,ASE_REQ.2,ASE_OBJ.2
    • certification_date: 24.01.2025
    • description: The TOE is the Waste Bin Identification Systems (WBIS) MAWIS-Security Rev 4.0. The TOE is evaluated and certified conform to the „Protection Profile Waste Bin Identification System (WBIS-PP), Version 1.04“. Waste Bin Identification Systems (WBIS) in the sense of this document are systems, which allow to identify waste bins by an ID-tag (e.g. an electronic chip, which is referred to as transponder) in order to determine how often a specific waste bin has been cleared. Note that this type of system does not identify the waste directly but the waste bin, which contains the waste for disposal. The TOE with its security functionality ensures validity, integrity and completeness of the protected data during storage in the vehicle and Transmission between physically separated parts of the TOE.
    • entries: [frozendict({'id': 'BSI-DSZ-CC-0496-V2-2025', 'description': 'The TOE is evaluated and certified conform to the „Protection Profile Waste Bin Identification System (WBIS-PP), Version 1.04“. Waste Bin Identification Systems (WBIS) in the sense of this document are systems, which allow to identify waste bins by an ID-tag (e.g. an electronic chip, which is referred to as transponder) in order to determine how often a specific waste bin has been cleared. Note that this type of system does not identify the waste directly but the waste bin, which contains the waste for disposal. The TOE with its security functionality ensures validity, integrity and completeness of the protected data during storage in the vehicle and Transmission between physically separated parts of the TOE.'}), frozendict({'id': 'BSI-DSZ-CC-0496-2017'})]
    • evaluation_facility: Deutsches Forschungszentrum für Künstliche Intelligenz GmbH
    • expiration_date: 23.01.2030
    • product: MAWIS-Security Rev. 4.0
    • protection_profile: Protection Profile Waste Bin Identification Systems (WBIS-PP), Version 1.04, 27 May 2004, BSI-PP-0010-2004
  • product: MAWIS-Security Rev. 4.0
  • url: https://www.bsi.bund.de/SharedDocs/Zertifikate_CC/CC/Sonstiges/0496.html
  • vendor: MOBA Mobile Automation AG
heuristics/st_references/directly_referenced_by {} NSCIB-CC-2200030-02-CR, NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
heuristics/st_references/indirectly_referenced_by {} NSCIB-CC-2200030-02-CR, NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
heuristics/protection_profiles f1e8c937d15e713a cf0f01bcd7be3e9c
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/WBIS-PPv1-04.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename 0496V2c_pdf.pdf NSCIB-CC-2200030-01-Cert.pdf
pdf_data/cert_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0496-V2-2025: 1
  • NL:
    • NSCIB-2200030-01: 1
    • NSCIB-CC-2200030-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0010-2004: 1
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 1: 1
  • EAL:
    • EAL2: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ASE:
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 1
  • ASE:
    • ASE_TSS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_metadata
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /Keywords: "Common Criteria, Certification, Zertifizierung, WBIS, Waste Bin Identification System, Müllbehälter-Identifikationssystem, MAWIS-Security Rev. 4.0, BSI-DSZ-CC-0496-V2-2025"
  • /Subject: Common Criteria, Certification, Zertifizierung, WBIS, Waste Bin Identification System, Müllbehälter-Identifikationssystem, MAWIS-Security Rev. 4.0, BSI-DSZ-CC-0496-V2-2025
  • /Title: Zertifikat BSI-DSZ-CC-0496-V2-2025
  • pdf_file_size_bytes: 386689
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /Author: Denise Cater
  • /CreationDate: D:20230717111142+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20230717111142+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 90734
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 0496V2a_pdf.pdf NSCIB-CC-2200030-01-CR_v2.pdf
pdf_data/report_frontpage
  • DE:
    • cert_id: BSI-DSZ-CC-0496-V2-2025
    • cert_item: MAWIS-Security Rev. 4.0
    • cert_lab: BSI
    • developer: MOBA Mobile Automation AG
    • match_rules: ['(BSI-DSZ-CC-.+?) zu (.+?) der (.*)']
  • NL:
  • DE:
  • NL:
    • cert_id: NSCIB-CC-2200030-01-CR
    • cert_item: NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
    • cert_lab: TÜV Informationstechnik GmbH
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0496-V2-2025: 10
  • NL:
    • NSCIB-2200030-01: 1
    • NSCIB-CC-2200030-01-CR: 12
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0010-2004: 1
    • BSI-PP-0010-: 1
    • BSI-PP-0010-2004: 1
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL 1: 5
    • EAL 2: 1
    • EAL 4: 1
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 1
pdf_data/report_keywords/cc_sar
  • ALC:
    • ALC_FLR: 1
  • ASE:
    • ASE_OBJ.2: 4
    • ASE_REQ.2: 4
    • ASE_SPD.1: 4
  • AVA:
    • AVA_VAN.1: 1
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_DVS.2: 2
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.2: 2
  • AVA:
    • AVA_VAN.5: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 13
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • DFKI:
    • DFKI: 3
  • TUV:
    • TÜV Informationstechnik: 2
pdf_data/report_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • DES:
      • DES: 1
  • constructions:
    • MAC:
      • CBC-MAC: 1
pdf_data/report_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
    • ECDH:
      • ECDH: 1
    • ECDSA:
      • ECDSA: 1
  • FF:
    • DH:
      • Diffie-Hellman: 1
pdf_data/report_keywords/crypto_scheme
  • MAC:
    • MAC: 1
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • DFA: 1
    • Fault Injection: 3
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 1
    • JIL-AM: 2
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7148: 1
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 2
pdf_data/report_keywords/standard_id
  • BSI:
    • AIS 32: 1
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 17065: 2
    • ISO/IEC 18045: 4
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_metadata
pdf_data/st_filename 0496V2b_pdf.pdf NSCIB-CC-2200030-01-STLite_v09.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2200030-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0010-2004: 2
  • BSI:
    • BSI-CC-PP-0084-2014: 1
    • BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL 1+: 1
    • EAL1: 9
    • EAL1 augmented: 2
  • EAL:
    • EAL4: 1
    • EAL5: 13
    • EAL5 augmented: 2
    • EAL5+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_FSP.1: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.1: 1
  • ASE:
    • ASE_ECD.1: 2
    • ASE_INT.1: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 5
    • ASE_REQ.1: 1
    • ASE_REQ.2: 5
    • ASE_SPD.1: 6
    • ASE_TSS.1: 1
  • ATE:
    • ATE_IND.1: 1
  • AVA:
    • AVA_VAN.1: 1
  • ADV:
    • ADV_ARC.1: 5
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.2: 3
    • ADV_FSP.4: 4
    • ADV_FSP.5: 5
    • ADV_IMP.1: 6
    • ADV_INT.2: 1
    • ADV_TDS.1: 5
    • ADV_TDS.3: 2
    • ADV_TDS.4: 3
  • AGD:
    • AGD_OPE.1: 4
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 2
    • ALC_CMS: 1
    • ALC_CMS.4: 2
    • ALC_CMS.5: 4
    • ALC_DEL.1: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR.1: 6
    • ALC_LCD.1: 3
    • ALC_TAT.1: 4
    • ALC_TAT.2: 2
  • ASE:
    • ASE_CCL: 2
    • ASE_CCL.1: 2
    • ASE_ECD: 1
    • ASE_ECD.1: 3
    • ASE_INT: 2
    • ASE_INT.1: 4
    • ASE_OBJ.2: 3
    • ASE_REQ: 2
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD: 2
    • ASE_SPD.1: 2
    • ASE_TSS: 2
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV.1: 1
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_DPT.3: 2
    • ATE_FUN.1: 7
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FDP:
    • FDP_DAU: 2
    • FDP_DAU.1: 8
    • FDP_DAU.1.1: 1
    • FDP_DAU.1.2: 1
    • FDP_ITT: 4
    • FDP_ITT.1: 1
    • FDP_ITT.5: 20
    • FDP_ITT.5.1: 2
    • FDP_SDI: 2
    • FDP_SDI.1: 9
    • FDP_SDI.1.1: 1
  • FPT:
    • FPT_FLS.1: 2
  • FRU:
    • FRU_FLT: 2
    • FRU_FLT.1: 8
    • FRU_FLT.1.1: 1
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 6
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 7
    • FDP_ITT.1: 6
    • FDP_SDC: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 1
    • FDP_SDI: 4
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 8
  • FTP:
    • FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 1
    • O.RND_HW: 4
  • T:
    • T.RND: 1
    • T.RND_HW: 3
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 1
  • NXP:
    • NXP: 111
    • NXP Semiconductors: 29
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
    • RNG: 12
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • CFB:
    • CFB: 1
  • CTR:
    • CTR: 1
  • GCM:
    • GCM: 2
  • OFB:
    • OFB: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 5
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
  • ISO:
    • ISO/IEC 18000-63: 2
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS 140-3: 2
  • ISO:
    • ISO/IEC 7816: 4
pdf_data/st_metadata
  • /Author: Holz, Stephan
  • /Subject: Sicherheitsvorgaben nach WBIS-PP
  • /Title: MAWIS-Security, Rev. 4.0
  • pdf_file_size_bytes: 1129671
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 40
  • /Author: NXP B.V.
  • /CreationDate: D:20230509104646+02'00'
  • /Creator: DITA Open Toolkit 3.3.1
  • /Keywords: NXP, ASE, SN300 B2 Single Chip Secured (NFC) Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL5 augmented
  • /Producer: Apache FOP Version 2.3
  • /Subject: NXP SN300 B2 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 846702
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 37
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