Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
Hitachi Unified Storage 110 Microprogram Version:0917/A
JISEC-CC-CRP-C0421
NXP Secure Smart Card Controller P60x017/041PVD including IC Dedicated Software
BSI-DSZ-CC-0896-2014
name Hitachi Unified Storage 110 Microprogram Version:0917/A NXP Secure Smart Card Controller P60x017/041PVD including IC Dedicated Software
category Access Control Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 09.01.2019 01.09.2019
not_valid_before 12.12.2013 11.08.2014
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0421_erpt.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0896a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0421_est.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0896b_pdf.pdf
manufacturer Hitachi, Ltd. NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.hitachi.com/ https://www.nxp.com
security_level EAL2 EAL6+, ALC_FLR.1, ASE_TSS.2
dgst c855912a0bee12b9 eb861b805ef948cd
heuristics/cert_id JISEC-CC-CRP-C0421 BSI-DSZ-CC-0896-2014
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_TSS.1, ADV_TDS.1, ASE_INT.1, ALC_CMC.2, ATE_IND.2, ALC_DEL.1, ATE_COV.1, AGD_OPE.1, ADV_ARC.1, AVA_VAN.2, ASE_CCL.1, ASE_REQ.2 ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, APE_ECD.1, ALC_FLR.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ADV_IMP.2, ALC_CMC.5, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions 0917, 110 -
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0421
  • certification_date: 01.12.2013
  • claim: EAL2
  • enhanced:
    • assurance_level: EAL2
    • cc_version: 3.1 Release3
    • cert_link: https://www.ipa.go.jp/en/security/c0421_eimg.pdf
    • description: PRODUCT DESCRIPTION Description of TOE This TOE is a control program (software) operating in the disk array “Hitachi Unified Storage 110” that is a storage product. The TOE controls accesses to its storage areas from host computers connected to the disk array. The TOE does not have assumed threats. Security functions of TOE satisfy the assumed organizational security policy and are provided to customers. TOE security functionality Three kinds of main security functions of this TOE exist as follows. - Exclusive control of storage areaFunction to access control to storage area according to requests from host computer. - Account AuthenticationUser's login facility and control of access to each function of the TOE. - AuditAudit log function that records event of administrative operations.
    • evaluation_facility: ECSEC Laboratory Inc. Evaluation Center
    • product: Hitachi Unified Storage 110 Microprogram
    • product_type: Storage System control software
    • report_link: https://www.ipa.go.jp/en/security/c0421_erpt.pdf
    • target_link: https://www.ipa.go.jp/en/security/c0421_est.pdf
    • toe_version: 0917/A
    • vendor: Hitachi, Ltd.
  • expiration_date: 01.01.2019
  • supplier: Hitachi, Ltd.
  • toe_japan_name: Hitachi Unified Storage 110 Microprogram0917/A
  • toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0421_it2418.html
  • toe_overseas_name: Hitachi Unified Storage 110 Microprogram0917/A
heuristics/protection_profiles {} f6d23054061d72ba
maintenance_updates
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename c0421_erpt.pdf 0896a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0896-2014
    • cert_item: NXP Secure Smart Card Controller P60x017/041PVD including IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • CRP-C0421-01: 1
    • Certification No. C0421: 1
  • DE:
    • BSI-DSZ-CC-0896-2014: 22
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 4
  • EAL:
    • EAL 4: 2
    • EAL 5: 3
    • EAL 6: 4
    • EAL 6 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 2
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 1
    • ADV_INT.3: 2
    • ADV_SPM: 1
    • ADV_SPM.1: 2
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_TDS.5: 2
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 1
    • ALC_CMC.5: 3
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 3
    • ALC_FLR: 1
    • ALC_FLR.1: 6
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 1
    • ALC_TAT.3: 3
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 2
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 2
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 2
pdf_data/report_keywords/cc_claims
  • A:
    • A.S: 1
  • O:
    • O.C: 5
  • R:
    • R.O: 5
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 18
    • NXP Semiconductors: 21
pdf_data/report_keywords/eval_facility
  • ECSEC:
    • ECSEC Laboratory: 3
  • TUV:
    • TÜV Informationstechnik: 4
    • TÜViT: 1
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDES: 3
      • Triple-DES: 2
    • DES:
      • DES: 3
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 2
pdf_data/report_keywords/crypto_engine
  • SmartMX:
    • SmartMX2: 8
pdf_data/report_keywords/side_channel_analysis
  • other:
    • JIL: 3
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2009-07-001: 2
    • CCMB-2009-07-002: 2
    • CCMB-2009-07-003: 2
    • CCMB-2009-07-004: 2
  • ISO:
    • ISO/IEC15408: 10
  • BSI:
    • AIS 25: 2
    • AIS 26: 1
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 2
    • AIS 37: 1
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 05 August 2014, EVALUATION TECHNICAL REPORT SUMMARY (ETR SUMMARY), TÜV Informationstechnik GmbH, (confidential document) [10] ETR for composite evaluation according to AIS 36, Version 4, 28 July 2014, ETR FOR COMPOSITE: 1
    • Card Controller P60x017/041PVD Security Target, NXP Semiconductors, Business Unit Identification (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
    • ETR-COMP), TÜV Informationstechnik GmbH (confidential document) [11] Configuration list for the TOE NXP Secure Smart Card Controller P60x017/041PVD, Customer: 1
pdf_data/report_metadata
  • /CreationDate: D:20140529133557+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20140529133629+09'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 509194
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 36
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20140825140519+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Smardcard"
  • /ModDate: D:20140825150613+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0896-2014
  • pdf_file_size_bytes: 1055872
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, http://www.commoncriteriaportal.org/, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 38
pdf_data/st_filename c0421_est.pdf 0896b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0896: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL2: 2
  • EAL:
    • EAL 6: 2
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL4+: 1
    • EAL6: 36
    • EAL6 augmented: 3
    • EAL6+: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_TDS.1: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.2: 1
    • ALC_DEL.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.2: 1
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.4: 3
    • ADV_FSP.5: 11
    • ADV_IMP: 1
    • ADV_IMP.2: 4
    • ADV_INT.3: 1
    • ADV_SPM: 2
    • ADV_SPM.1: 1
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 4
    • ALC_CMC.4: 3
    • ALC_CMC.5: 4
    • ALC_CMS: 4
    • ALC_CMS.4: 3
    • ALC_CMS.5: 5
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 1
    • ALC_FLR.1: 5
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV: 1
    • ATE_COV.3: 4
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 2
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 12
    • FAU_GEN.1.1: 1
    • FAU_GEN.1.2: 1
    • FAU_GEN.2: 6
    • FAU_GEN.2.1: 1
    • FAU_SAR: 2
    • FAU_SAR.1: 8
    • FAU_SAR.1.1: 1
    • FAU_SAR.1.2: 1
    • FAU_SAR.2: 4
    • FAU_SAR.2.1: 1
    • FAU_STG: 2
    • FAU_STG.1: 8
    • FAU_STG.1.1: 1
    • FAU_STG.1.2: 1
    • FAU_STG.3: 1
    • FAU_STG.4: 4
    • FAU_STG.4.1: 1
  • FDP:
    • FDP_ACC: 2
    • FDP_ACC.1: 12
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 6
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 2
  • FIA:
    • FIA_ATD.1: 11
    • FIA_ATD.1.1: 1
    • FIA_SOS.1: 7
    • FIA_SOS.1.1: 1
    • FIA_UAU: 6
    • FIA_UAU.1: 8
    • FIA_UAU.1.1: 1
    • FIA_UAU.1.2: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 8
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 16
    • FIA_UID.1.1: 1
    • FIA_UID.1.2: 1
    • FIA_UID.2: 7
    • FIA_UID.2.1: 1
    • FIA_USB.1: 7
    • FIA_USB.1.1: 1
    • FIA_USB.1.2: 1
    • FIA_USB.1.3: 1
  • FMT:
    • FMT_MOF: 1
    • FMT_MOF.1: 10
    • FMT_MOF.1.1: 1
    • FMT_MSA: 1
    • FMT_MSA.1: 11
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD: 2
    • FMT_MTD.1: 8
    • FMT_MTD.1.1: 1
    • FMT_REV.1: 8
    • FMT_REV.1.1: 1
    • FMT_REV.1.2: 1
    • FMT_SMF.1: 14
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 19
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPT:
    • FPT_STM.1: 10
    • FPT_STM.1.1: 1
  • FRU:
    • FRU_RSA.1: 8
    • FRU_RSA.1.1: 1
  • FTA:
    • FTA_SSL.3: 8
    • FTA_SSL.3.1: 1
  • FAU:
    • FAU_SAS.1: 7
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 3
    • FCS_CKM.4: 2
    • FCS_COP.1: 12
    • FCS_COP.1.1: 1
    • FCS_RNG.1: 9
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 36
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 32
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_FLS.1: 1
    • FDP_IFC.1: 11
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 14
    • FDP_SDI.1: 1
    • FDP_SDI.2: 7
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 4
    • FMT_MSA.1: 24
    • FMT_MSA.1.1: 2
    • FMT_MSA.3: 20
    • FMT_MSA.3.1: 2
    • FMT_MSA.3.2: 2
    • FMT_SMF.1: 19
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 8
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 13
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
  • FTP:
    • FTP_ITT.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.CUST_RECONFIG: 6
    • O.EEPROM_INTEGRITY: 4
    • O.FM_FW: 9
    • O.INTEGRITY_CHK: 7
    • O.MEM_ACCESS: 8
    • O.RND: 3
    • O.SFR_ACCESS: 9
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 101
    • NXP Semiconductors: 33
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDEA: 3
      • TDES: 1
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 2
      • DES: 16
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 13
  • TRNG:
    • TRNG: 1
pdf_data/st_keywords/crypto_engine
  • SmartMX:
    • SmartMX: 1
    • SmartMX2: 22
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • malfunction: 1
  • FI:
    • Malfunction: 13
    • fault injection: 3
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 12
    • Physical Probing: 2
    • physical probing: 1
    • side channel: 1
    • timing attacks: 2
pdf_data/st_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC15408: 12
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-004: 2
  • FIPS:
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 14443: 20
    • ISO/IEC 18092: 2
    • ISO/IEC 7816: 24
    • ISO/IEC 7816-3: 1
pdf_data/st_metadata
  • /Author: ODA-USER
  • /CreationDate: D:2014052817405909'00'
  • /Creator: PrimoPDF http://www.primopdf.com/
  • /ModDate: D:2014052817405909'00'
  • /Producer: PrimoPDF
  • /Title: Microsoft Word - HUS110_ST.doc
  • pdf_file_size_bytes: 433611
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 48
  • /Author: NXP Semiconductors
  • /CreationDate: D:20140114171434+01'00'
  • /Creator: Microsoft® Word 2010
  • /Keywords: CC Security Evaluation, Security Target, Functional Requirements, Security Functionality, Assurance Level EAL6+, P60D144PVA, P60D080PVA
  • /ModDate: D:20140114171434+01'00'
  • /Producer: Microsoft® Word 2010
  • /Subject: P60D144PVA
  • /Title: Security Target
  • pdf_file_size_bytes: 1002264
  • pdf_hyperlinks: http://www.nxp.com/, mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 78
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different