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Hitachi Unified Storage 110 Microprogram Version:0917/A
JISEC-CC-CRP-C0421 		NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s) each including IC Dedicated Software
BSI-DSZ-CC-0855-2013
name Hitachi Unified Storage 110 Microprogram Version:0917/A NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s) each including IC Dedicated Software
category Access Control Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme JP DE
not_valid_after 09.01.2019 01.09.2019
not_valid_before 12.12.2013 04.04.2013
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0421_erpt.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0855a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/c0421_est.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0855b_pdf.pdf
manufacturer Hitachi, Ltd. NXP Semiconductors Germany GmbH Business Line Identification
manufacturer_web https://www.hitachi.com/ https://www.nxp.com
security_level EAL2 EAL5+, ALC_DVS.1, ASE_TSS.2, AVA_VAN.5
dgst c855912a0bee12b9 4a2d9278fc67ffec
heuristics/cert_id JISEC-CC-CRP-C0421 BSI-DSZ-CC-0855-2013
heuristics/cert_lab [] BSI
heuristics/extracted_sars ASE_TSS.1, ADV_TDS.1, ASE_INT.1, ALC_CMC.2, ATE_IND.2, ALC_DEL.1, ATE_COV.1, AGD_OPE.1, ADV_ARC.1, AVA_VAN.2, ASE_CCL.1, ASE_REQ.2 ASE_INT.1, ALC_CMC.4, ASE_ECD.1, APE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_FLR.3, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, APE_REQ.2, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, APE_CCL.1, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, ALC_DVS.1, APE_INT.1, APE_SPD.1, ATE_IND.2, APE_OBJ.2, ASE_CCL.1, ADV_SPM.1
heuristics/extracted_versions 0917, 110 -
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0771-2011
heuristics/scheme_data
  • cert_id: JISEC-CC-CRP-C0421
  • certification_date: 01.12.2013
  • claim: EAL2
  • enhanced:
    • assurance_level: EAL2
    • cc_version: 3.1 Release3
    • cert_link: https://www.ipa.go.jp/en/security/c0421_eimg.pdf
    • description: PRODUCT DESCRIPTION Description of TOE This TOE is a control program (software) operating in the disk array “Hitachi Unified Storage 110” that is a storage product. The TOE controls accesses to its storage areas from host computers connected to the disk array. The TOE does not have assumed threats. Security functions of TOE satisfy the assumed organizational security policy and are provided to customers. TOE security functionality Three kinds of main security functions of this TOE exist as follows. - Exclusive control of storage areaFunction to access control to storage area according to requests from host computer. - Account AuthenticationUser's login facility and control of access to each function of the TOE. - AuditAudit log function that records event of administrative operations.
    • evaluation_facility: ECSEC Laboratory Inc. Evaluation Center
    • product: Hitachi Unified Storage 110 Microprogram
    • product_type: Storage System control software
    • report_link: https://www.ipa.go.jp/en/security/c0421_erpt.pdf
    • target_link: https://www.ipa.go.jp/en/security/c0421_est.pdf
    • toe_version: 0917/A
    • vendor: Hitachi, Ltd.
  • expiration_date: 01.01.2019
  • supplier: Hitachi, Ltd.
  • toe_japan_name: Hitachi Unified Storage 110 Microprogram0917/A
  • toe_overseas_link: https://www.ipa.go.jp/en/security/jisec/software/certified-cert/c0421_it2418.html
  • toe_overseas_name: Hitachi Unified Storage 110 Microprogram0917/A
heuristics/protection_profiles {} f6d23054061d72ba
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/report_filename c0421_erpt.pdf 0855a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cert_id: BSI-DSZ-CC-0855-2013
    • cert_item: NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s) each including IC Dedicated Software
    • cert_lab: BSI
    • developer: NXP Semiconductors Germany GmbH
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
pdf_data/report_keywords/cc_cert_id
  • JP:
    • CRP-C0421-01: 1
    • Certification No. C0421: 1
  • DE:
    • BSI-DSZ-CC-0771-2011: 3
    • BSI-DSZ-CC-0855-2013: 21
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0035-2007: 4
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 4
  • EAL:
    • EAL 4: 3
    • EAL 5: 7
    • EAL 5 augmented: 3
    • EAL1: 7
    • EAL2: 3
    • EAL3: 4
    • EAL4: 7
    • EAL5: 7
    • EAL5+: 1
    • EAL6: 4
    • EAL7: 4
  • ITSEC:
    • ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 1
    • ADV_FSP.2: 1
    • ADV_FSP.3: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 2
    • ADV_FSP.6: 1
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_IMP.2: 1
    • ADV_INT: 1
    • ADV_INT.1: 1
    • ADV_INT.2: 2
    • ADV_INT.3: 1
    • ADV_SPM: 1
    • ADV_SPM.1: 1
    • ADV_TDS: 1
    • ADV_TDS.1: 1
    • ADV_TDS.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 2
    • ADV_TDS.5: 1
    • ADV_TDS.6: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.1: 1
    • ALC_CMC.2: 1
    • ALC_CMC.3: 1
    • ALC_CMC.4: 2
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.1: 1
    • ALC_CMS.2: 1
    • ALC_CMS.3: 1
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 2
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.2: 1
    • ALC_FLR.3: 1
    • ALC_LCD.1: 2
    • ALC_LCD.2: 1
    • ALC_TAT: 1
    • ALC_TAT.1: 1
    • ALC_TAT.2: 3
    • ALC_TAT.3: 1
  • APE:
    • APE_CCL.1: 1
    • APE_ECD.1: 1
    • APE_INT.1: 1
    • APE_OBJ.1: 1
    • APE_OBJ.2: 1
    • APE_REQ.1: 1
    • APE_REQ.2: 1
    • APE_SPD.1: 1
  • ASE:
    • ASE_CCL: 1
    • ASE_CCL.1: 1
    • ASE_ECD: 1
    • ASE_ECD.1: 1
    • ASE_INT: 1
    • ASE_INT.1: 1
    • ASE_OBJ: 1
    • ASE_OBJ.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.1: 1
    • ASE_REQ.2: 1
    • ASE_SPD: 1
    • ASE_SPD.1: 1
    • ASE_TSS: 1
    • ASE_TSS.1: 1
    • ASE_TSS.2: 5
  • ATE:
    • ATE_COV: 1
    • ATE_COV.1: 1
    • ATE_COV.2: 1
    • ATE_COV.3: 1
    • ATE_DPT: 1
    • ATE_DPT.1: 1
    • ATE_DPT.2: 1
    • ATE_DPT.3: 2
    • ATE_DPT.4: 1
    • ATE_FUN: 1
    • ATE_FUN.1: 1
    • ATE_FUN.2: 1
    • ATE_IND: 1
    • ATE_IND.1: 1
    • ATE_IND.2: 1
    • ATE_IND.3: 1
  • AVA:
    • AVA_VAN: 2
    • AVA_VAN.1: 1
    • AVA_VAN.2: 1
    • AVA_VAN.3: 1
    • AVA_VAN.4: 1
    • AVA_VAN.5: 6
pdf_data/report_keywords/cc_claims
  • A:
    • A.S: 1
  • O:
    • O.C: 2
  • R:
    • R.O: 2
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 18
    • NXP Semiconductors: 22
  • Philips:
    • Philips: 3
pdf_data/report_keywords/eval_facility
  • ECSEC:
    • ECSEC Laboratory: 3
  • BrightSight:
    • Brightsight: 4
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDES: 1
      • Triple-DES: 4
    • DES:
      • DES: 4
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 3
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • physical tampering: 2
  • SCA:
    • DPA: 3
    • SPA: 2
    • physical probing: 1
    • side channel: 1
    • timing attack: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7125: 2
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2009-07-001: 2
    • CCMB-2009-07-002: 2
    • CCMB-2009-07-003: 2
    • CCMB-2009-07-004: 2
  • ISO:
    • ISO/IEC15408: 10
  • BSI:
    • AIS 25: 2
    • AIS 26: 2
    • AIS 31: 2
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 3
    • AIS 37: 1
    • AIS 38: 1
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • November 2012 (confidential document) [12] P5CC008V1A and P5CC012V1A, Guidance, Delivery and Operation Manual, NXP Semiconductors: 1
    • November 2012, NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s), NXP Semiconductors (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007 [8: 1
    • P5CC012 V1A/V1A(s) each including IC Dedicated Software, v1.1, Brightsight, 6 February 2013 (confidential document) [10] ETR for composite evaluation according to AIS 36, NXP Secure Smart Card Controllers P5CC008: 1
    • V1A/V1A(s) each including IC Dedicated Software, v1.1, Brightsight, 6 February 2013 (confidential document) [11] NXP Secure Smart Card Controllers P5CC008, P5CC012 V1A/V1A(s), Configuration List, Rev. 1.0: 1
pdf_data/report_metadata
  • /CreationDate: D:20140529133557+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20140529133629+09'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 509194
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 36
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20130412100319+02'00'
  • /Creator: Writer
  • /Keywords: "Common Criteria, Certification, Zertifizierung, Smart Card"
  • /ModDate: D:20130412101415+02'00'
  • /Producer: LibreOffice 3.6
  • /Subject: Common Criteria Certification
  • /Title: Certification Report BSI-DSZ-CC-0855-2013
  • pdf_file_size_bytes: 1019142
  • pdf_hyperlinks: https://www.bsi.bund.de/zertifizierung, https://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
pdf_data/st_filename c0421_est.pdf 0855b_pdf.pdf
pdf_data/st_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0855: 62
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP- 0035: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL2: 2
  • EAL:
    • EAL 5: 3
    • EAL 5 augmented: 1
    • EAL4: 3
    • EAL4 augmented: 1
    • EAL5: 32
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_TDS.1: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.2: 1
    • ALC_DEL.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.2: 1
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 4
    • ADV_FSP.4: 3
    • ADV_FSP.5: 11
    • ADV_IMP: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 4
    • ALC_CMS.4: 3
    • ALC_CMS.5: 5
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 4
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 3
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 12
    • FAU_GEN.1.1: 1
    • FAU_GEN.1.2: 1
    • FAU_GEN.2: 6
    • FAU_GEN.2.1: 1
    • FAU_SAR: 2
    • FAU_SAR.1: 8
    • FAU_SAR.1.1: 1
    • FAU_SAR.1.2: 1
    • FAU_SAR.2: 4
    • FAU_SAR.2.1: 1
    • FAU_STG: 2
    • FAU_STG.1: 8
    • FAU_STG.1.1: 1
    • FAU_STG.1.2: 1
    • FAU_STG.3: 1
    • FAU_STG.4: 4
    • FAU_STG.4.1: 1
  • FDP:
    • FDP_ACC: 2
    • FDP_ACC.1: 12
    • FDP_ACC.1.1: 1
    • FDP_ACF.1: 6
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC.1: 2
  • FIA:
    • FIA_ATD.1: 11
    • FIA_ATD.1.1: 1
    • FIA_SOS.1: 7
    • FIA_SOS.1.1: 1
    • FIA_UAU: 6
    • FIA_UAU.1: 8
    • FIA_UAU.1.1: 1
    • FIA_UAU.1.2: 1
    • FIA_UAU.2: 5
    • FIA_UAU.2.1: 1
    • FIA_UAU.5: 8
    • FIA_UAU.5.1: 1
    • FIA_UAU.5.2: 1
    • FIA_UID.1: 16
    • FIA_UID.1.1: 1
    • FIA_UID.1.2: 1
    • FIA_UID.2: 7
    • FIA_UID.2.1: 1
    • FIA_USB.1: 7
    • FIA_USB.1.1: 1
    • FIA_USB.1.2: 1
    • FIA_USB.1.3: 1
  • FMT:
    • FMT_MOF: 1
    • FMT_MOF.1: 10
    • FMT_MOF.1.1: 1
    • FMT_MSA: 1
    • FMT_MSA.1: 11
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 13
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_MTD: 2
    • FMT_MTD.1: 8
    • FMT_MTD.1.1: 1
    • FMT_REV.1: 8
    • FMT_REV.1.1: 1
    • FMT_REV.1.2: 1
    • FMT_SMF.1: 14
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 19
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPT:
    • FPT_STM.1: 10
    • FPT_STM.1.1: 1
  • FRU:
    • FRU_RSA.1: 8
    • FRU_RSA.1.1: 1
  • FTA:
    • FTA_SSL.3: 8
    • FTA_SSL.3.1: 1
  • FAU:
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 3
    • FCS_CKM.4: 2
    • FCS_COP.1: 11
    • FCS_COP.1.1: 1
    • FCS_RNG.1: 4
    • FCS_RNG.1.1: 3
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC.1: 30
    • FDP_ACC.1.1: 2
    • FDP_ACF.1: 28
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 8
    • FDP_ITC.1: 3
    • FDP_ITC.2: 3
    • FDP_ITT.1: 6
  • FMT:
    • FMT_LIM.1: 3
    • FMT_LIM.2: 3
    • FMT_MSA.1: 11
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 10
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF.1: 12
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 4
  • FPT:
    • FPT_FLS.1: 7
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 7
pdf_data/st_keywords/cc_claims
  • O:
    • O.CUST_RECONFIG: 5
    • O.MEM_ACCESS: 6
    • O.MF_FW: 7
    • O.RND: 3
    • O.SFR_ACCESS: 8
  • T:
    • T.RND: 2
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 70
    • NXP Semiconductors: 39
  • Philips:
    • Philips: 4
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDEA: 3
      • Triple-DEA: 1
      • Triple-DES: 9
    • DES:
      • DEA: 2
      • DES: 26
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECC:
      • ECC: 2
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 8
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • malfunction: 1
  • FI:
    • Malfunction: 10
    • fault injection: 4
    • malfunction: 2
    • physical tampering: 1
  • SCA:
    • DPA: 2
    • Leak-Inherent: 12
    • Physical Probing: 2
    • physical probing: 1
    • timing attacks: 2
pdf_data/st_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC15408: 12
  • CC:
    • CCMB-2009-07-001: 1
    • CCMB-2009-07-002: 2
    • CCMB-2009-07-003: 2
    • CCMB-2009-07-004: 2
  • FIPS:
    • FIPS PUB 46: 1
    • FIPS PUB 46-3: 3
  • ISO:
    • ISO/IEC 14443: 2
    • ISO/IEC 7816: 8
pdf_data/st_metadata
  • /Author: ODA-USER
  • /CreationDate: D:2014052817405909'00'
  • /Creator: PrimoPDF http://www.primopdf.com/
  • /ModDate: D:2014052817405909'00'
  • /Producer: PrimoPDF
  • /Title: Microsoft Word - HUS110_ST.doc
  • pdf_file_size_bytes: 433611
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 48
  • /Author: NXP Semiconductors
  • /CreationDate: D:20121129111746+01'00'
  • /Creator: Acrobat PDFMaker 9.1 for Word
  • /Keywords: CC; Security Evaluation; Security Target Lite; Functional Requirements; Security Functionality; Assurance Level; P5CC008; P5CC012 V1A/ V1A(s)
  • /ModDate: D:20121129112750+01'00'
  • /Producer: Adobe PDF Library 9.0
  • /Subject: Security Target Lite
  • /Title: Security Target Lite P5CC008, P5CC012 V1A/ V1A(s
  • pdf_file_size_bytes: 450431
  • pdf_hyperlinks: mailto:[email protected], http://www.nxp.com/
  • pdf_is_encrypted: True
  • pdf_number_of_pages: 61
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