Comparing certificates Experimental feature

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Showing only differing attributes.
NXP SN300 Series - Secure Element SN300_SE B1.1 J9
NSCIB-CC-2300122-01-CR 		NXP SN300 Series - Secure Element SN300_SE B1.1 J9
NSCIB-CC-0441513-CR
not_valid_after 04.12.2028 13.05.2027
not_valid_before 04.12.2023 13.05.2022
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300122-01-Cert.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB%20certificate%20CC-22-0441513.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300122-01-CR.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0441513-CR-2.0.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2300122-01-ST-Lite_v104.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-0441513-STLite_v103.pdf
manufacturer NXP Semiconductors Germany GmbH NXP Semiconductors
manufacturer_web https://www.nxp.com https://www.nxp.com/
dgst c7190ae339b364a2 7393be2e1e01defd
heuristics/cert_id NSCIB-CC-2300122-01-CR NSCIB-CC-0441513-CR
heuristics/report_references/directly_referenced_by NSCIB-CC-2200029-03-CR NSCIB-CC-0441505-CR2
heuristics/report_references/indirectly_referenced_by NSCIB-CC-2200029-03-CR NSCIB-CC-0441505-CR2
heuristics/scheme_data
heuristics/st_references/directly_referenced_by NSCIB-CC-2200029-03-CR NSCIB-CC-0441505-CR2
heuristics/st_references/indirectly_referenced_by NSCIB-CC-2200029-03-CR NSCIB-CC-0441505-CR2
pdf_data/cert_filename NSCIB-CC-2300122-01-Cert.pdf NSCIB certificate CC-22-0441513.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-22-0441513: 1
    • NSCIB-2300122-01: 1
    • NSCIB-CC-2300122-01: 1
  • NL:
    • CC-22-0441513: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL4: 1
    • EAL4 augmented: 1
    • EAL7: 1
  • EAL:
    • EAL 7: 1
    • EAL4: 1
    • EAL4 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.3: 1
  • AVA:
    • AVA_VAN.5: 1
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR.3: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
  • NXP:
    • NXP: 1
    • NXP Semiconductors N.V: 1
pdf_data/cert_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
  • ISO:
    • ISO/IEC 15408-1: 1
    • ISO/IEC 15408-2: 1
    • ISO/IEC 15408-3: 1
    • ISO/IEC 18045: 2
pdf_data/cert_metadata
  • /Author: Haak
  • /CreationDate: D:20231213165447+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20231213165447+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 91845
  • pdf_hyperlinks: https://www.tuv-nederland.nl/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
  • /CreationDate: D:20220520103241+01'00'
  • /Creator: C458-M
  • /ModDate: D:20220520113421+02'00'
  • /Producer: KONICA MINOLTA bizhub C458
  • /Title: C458-M&S22052010321
  • pdf_file_size_bytes: 83133
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename NSCIB-CC-2300122-01-CR.pdf NSCIB-CC-0441513-CR-2.0.pdf
pdf_data/report_frontpage
  • NL:
    • cert_id: NSCIB-CC-2300122-01-CR
    • cert_item: NXP SN300 Series - Secure Element SN300_SE B1.1 J9
    • cert_lab: SGS Brightsight B.V.
    • developer: NXP Semiconductors Germany
  • NL:
    • cert_id: NSCIB-CC-0441513-CR
    • cert_item: NXP SN300 Series - Secure Element SN300_SE B1.1 J9
    • cert_lab: SGS Brightsight B.V.
    • developer: NXP Semiconductors N.V
pdf_data/report_keywords/cc_cert_id
  • NL:
    • CC-22-0441513: 1
    • NSCIB-2300122-01: 1
    • NSCIB-CC-2300122-01-CR: 11
  • NL:
    • NSCIB-CC-0441513-CR: 11
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 13
    • NXP Semiconductors: 3
  • NXP:
    • NXP: 13
    • NXP Semiconductors N.V: 3
pdf_data/report_keywords/eval_facility
  • BrightSight:
    • Brightsight: 3
  • SGS:
    • SGS: 3
    • SGS Brightsight: 3
  • BrightSight:
    • Brightsight: 2
  • SGS:
    • SGS: 2
    • SGS Brightsight: 2
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 1
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 2
    • JIL-AM: 2
pdf_data/report_metadata
  • /CreationDate: D:20220712074002Z00'00'
  • /Creator: Word
  • /ModDate: D:20220712074002Z00'00'
  • /Producer: macOS Version 12.4 (Build 21F79) Quartz PDFContext
  • /Title: Microsoft Word - NSCIB-CC-0441513-CR-2.0+DC.doc
  • pdf_file_size_bytes: 282629
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 11
pdf_data/st_filename NSCIB-CC-2300122-01-ST-Lite_v104.pdf NSCIB-CC-0441513-STLite_v103.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2300122-01: 1
  • NL:
    • NSCIB-CC-0441513: 1
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 6
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 7
    • FDP_ITT.1: 6
    • FDP_SDC: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 1
    • FDP_SDI: 4
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 8
  • FTP:
    • FTP_FLS.1: 1
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 7
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 9
    • FDP_ITT.1: 8
    • FDP_SDC: 1
    • FDP_SDC.1: 6
    • FDP_SDC.1.1: 1
    • FDP_SDI: 5
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 5
    • FMT_LIM.2: 4
  • FPT:
    • FPT_FLS.1: 10
    • FPT_ITT.1: 8
    • FPT_PHP.3: 10
  • FRU:
    • FRU_FLT.2: 10
  • FTP:
    • FTP_FLS.1: 1
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 108
    • NXP Semiconductors: 29
  • NXP:
    • NXP: 110
    • NXP Semiconductors: 29
pdf_data/st_metadata
  • /Author: NXP B.V.
  • /CreationDate: D:20231025165048+02'00'
  • /Creator: DITA Open Toolkit 3.3.1
  • /Keywords: NXP, ASE, SN300 Single Chip Secure Element and NFC Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL4 augmented
  • /Producer: Apache FOP Version 2.3
  • /Subject: NXP SN300 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 1321495
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
  • /Author: NXP B.V.
  • /CreationDate: D:20220510213843+02'00'
  • /Creator: DITA Open Toolkit 3.3.1
  • /Keywords: NXP, ASE, SN300 Single Chip Secure Element and NFC Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL4 augmented
  • /Producer: Apache FOP Version 2.3
  • /Subject: NXP SN300 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 1325942
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 37
state/cert/convert_garbage False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different