Comparing certificates Experimental feature

You are comparing two certificates. By default, only differing attributes are shown. Use the button below to show/hide all attributes.

Showing only differing attributes.
SAMSUNG SDS FIDO Server Solution V1.1
KECS-ISIS-0645-2015 		NXP SE310 Series - Secure Element version SE310_SE A0.1.000 J2
NSCIB-CC-2200031-02-CR
name SAMSUNG SDS FIDO Server Solution V1.1 NXP SE310 Series - Secure Element version SE310_SE A0.1.000 J2
category Access Control Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme KR NL
status archived active
not_valid_after 10.09.2020 19.11.2029
not_valid_before 10.09.2015 19.11.2024
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200031-02-Cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/KECS-CR-15-73%20SAMSUNG%20SDS%20FIDO%20Server%20Solution%20V1.1(eng).pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200031-02-CR.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SDS%20FIDO%20V1.1-ASE-V2.0_Lite_Eng.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200031-02-STLite_v011.pdf
manufacturer Samsung SDS NXP Semiconductors Germany GmbH
manufacturer_web https://www.sds.samsung.co.kr https://www.nxp.com
security_level EAL2 ALC_FLR.1, EAL5+, AVA_VAN.5, ASE_TSS.2, ALC_DVS.2
dgst 9c89a7c6b92a1326 e5231ad4da550a03
heuristics/cert_id KECS-ISIS-0645-2015 NSCIB-CC-2200031-02-CR
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions 1.1 0.1.000
heuristics/scheme_data
heuristics/st_references/directly_referencing {} NSCIB-CC-2200031-01-CR
heuristics/st_references/indirectly_referencing {} NSCIB-CC-2200031-01-CR
heuristics/protection_profiles {} cf0f01bcd7be3e9c
protection_profile_links {} https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf
pdf_data/cert_filename NSCIB-CC-2200031-02-Cert.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2200031-02: 1
    • NSCIB-CC-2200031-02: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL2: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 1
  • ASE:
    • ASE_TSS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • TUV:
    • TÜV Informationstechnik: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /Author: Denise Cater
  • /CreationDate: D:20241125122739+00'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20241125122739+00'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 88058
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename KECS-CR-15-73 SAMSUNG SDS FIDO Server Solution V1.1(eng).pdf NSCIB-CC-2200031-02-CR.pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-2200031-02-CR
    • cert_item: NXP SE310 Series - Secure Element, version SE310_SE A0.1.000 J2
    • cert_lab: TÜV Informationstechnik GmbH
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • KR:
    • KECS-ISIS-0645-2015: 1
  • NL:
    • NSCIB-2200031-02: 1
    • NSCIB-CC-2200031-02: 2
    • NSCIB-CC-2200031-02-CR: 11
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 4
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 2
    • ADV_FSP.2: 3
    • ADV_TDS.1: 3
  • AGD:
    • AGD_OPE.1: 2
    • AGD_PRE.1: 3
  • ALC:
    • ALC_CMC.2: 2
    • ALC_CMS.2: 2
    • ALC_DEL.1: 2
  • ASE:
    • ASE_CCL.1: 2
    • ASE_ECD.1: 3
    • ASE_INT.1: 3
    • ASE_OBJ.2: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 3
  • ATE:
    • ATE_COV.1: 3
    • ATE_FUN.1: 3
    • ATE_IND.2: 4
  • AVA:
    • AVA_VAN.2: 5
  • ALC:
    • ALC_DVS.2: 2
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.2: 2
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 3
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 4
  • NXP:
    • NXP: 10
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • KTC:
    • KTC: 4
  • TUV:
    • TÜV Informationstechnik: 3
pdf_data/report_keywords/crypto_protocol
  • TLS:
    • TLS:
      • TLS: 1
      • TLS1.2: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/side_channel_analysis
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 1
pdf_data/report_keywords/tee_name
  • other:
    • TEE: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 2
    • CCMB-2012-09-003: 2
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_metadata
  • /Author: 이은경
  • /CreationDate: D:20150910132516+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20150910132516+09'00'
  • /Producer: Microsoft® Word 2010
  • /Title: 평가단위보고서(ADV_ARC.1)
  • pdf_file_size_bytes: 601576
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 18
pdf_data/st_filename SDS FIDO V1.1-ASE-V2.0_Lite_Eng.pdf NSCIB-CC-2200031-02-STLite_v011.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2200031-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
    • BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL2: 7
  • EAL:
    • EAL4: 1
    • EAL5: 13
    • EAL5 augmented: 2
    • EAL5+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 12
    • ADV_FSP.1: 3
    • ADV_FSP.2: 16
    • ADV_TDS.1: 15
  • AGD:
    • AGD_OPE.1: 13
    • AGD_PRE.1: 9
  • ALC:
    • ALC_CMC.2: 9
    • ALC_CMS.1: 1
    • ALC_CMS.2: 7
    • ALC_DEL.1: 6
  • ASE:
    • ASE_CCL.1: 15
    • ASE_ECD: 2
    • ASE_ECD.1: 13
    • ASE_INT.1: 15
    • ASE_OBJ.2: 12
    • ASE_REQ.1: 2
    • ASE_REQ.2: 14
    • ASE_SPD.1: 9
    • ASE_TSS.1: 6
  • ATE:
    • ATE_COV.1: 7
    • ATE_FUN.1: 11
    • ATE_IND.2: 8
  • AVA:
    • AVA_VAN.2: 8
  • ADV:
    • ADV_ARC.1: 5
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.2: 3
    • ADV_FSP.4: 4
    • ADV_FSP.5: 5
    • ADV_IMP.1: 6
    • ADV_INT.2: 1
    • ADV_TDS.1: 5
    • ADV_TDS.3: 2
    • ADV_TDS.4: 3
  • AGD:
    • AGD_OPE.1: 4
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 2
    • ALC_CMS: 1
    • ALC_CMS.4: 2
    • ALC_CMS.5: 4
    • ALC_DEL.1: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR.1: 6
    • ALC_LCD.1: 3
    • ALC_TAT.1: 4
    • ALC_TAT.2: 2
  • ASE:
    • ASE_CCL: 2
    • ASE_CCL.1: 2
    • ASE_ECD: 1
    • ASE_ECD.1: 3
    • ASE_INT: 2
    • ASE_INT.1: 4
    • ASE_OBJ.2: 3
    • ASE_REQ: 2
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD: 2
    • ASE_SPD.1: 2
    • ASE_TSS: 2
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV.1: 1
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_DPT.3: 2
    • ATE_FUN.1: 7
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_AFL.1: 1
    • FAU_ARP.1: 7
    • FAU_ARP.1.1: 1
    • FAU_GEN.1: 10
    • FAU_GEN.1.2: 1
    • FAU_GEN.2: 7
    • FAU_GEN.2.1: 1
    • FAU_SAA.1: 7
    • FAU_SAA.1.1: 1
    • FAU_SAA.1.2: 1
    • FAU_SAR.1: 7
    • FAU_SAR.1.1: 1
    • FAU_SAR.3: 6
    • FAU_SAR.3.1: 1
    • FAU_SOS.1: 1
    • FAU_UAU.2: 1
    • FAU_UAU.7: 1
    • FAU_UID.2: 1
  • FCO:
    • FCO_NRO.1: 10
    • FCO_NRO.1.1: 1
    • FCO_NRO.1.2: 1
    • FCO_NRO.1.3: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 2
    • FCS_COP.1: 7
    • FCS_COP.1.1: 1
  • FDP:
    • FDP_ACC: 2
    • FDP_ACC.1: 25
    • FDP_ACC.1.1: 2
    • FDP_ACF: 2
    • FDP_ACF.1: 17
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 1
    • FDP_ITC.1: 2
    • FDP_ITC.2: 2
  • FIA:
    • FIA_AFL.1: 6
    • FIA_AFL.1.1: 1
    • FIA_AFL.1.2: 1
    • FIA_SOS.1: 5
    • FIA_UAU.1: 3
    • FIA_UAU.2: 6
    • FIA_UAU.2.1: 1
    • FIA_UAU.7: 5
    • FIA_UAU.7.1: 1
    • FIA_UID.1: 7
    • FIA_UID.2: 8
    • FIA_UID.2.1: 1
  • FMT:
    • FMT_CKM.4: 1
    • FMT_MOF.1: 9
    • FMT_MSA.1: 7
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 11
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF.1: 10
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 10
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPT:
    • FPT_STM.1: 3
    • FPT_TDC.1: 6
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 6
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 7
    • FDP_ITT.1: 6
    • FDP_SDC: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 1
    • FDP_SDI: 4
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 8
  • FTP:
    • FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims
  • A:
    • A.DBMS: 1
  • OE:
    • OE.DBMS: 1
  • O:
    • O.RND: 1
    • O.RND_HW: 4
  • T:
    • T.RND: 1
    • T.RND_HW: 3
pdf_data/st_keywords/vendor
  • Broadcom:
    • Broadcom: 4
  • Samsung:
    • Samsung: 65
  • NXP:
    • NXP: 109
    • NXP Semiconductors: 29
pdf_data/st_keywords/symmetric_crypto
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 1
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECDSA:
      • ECDSA: 6
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA2:
      • SHA-256: 1
      • SHA256: 4
pdf_data/st_keywords/crypto_protocol
  • TLS:
    • TLS:
      • TLS: 1
      • TLS v1.2: 2
      • TLS1.2: 5
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 2
    • RNG: 12
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • CFB:
    • CFB: 1
  • CTR:
    • CTR: 1
  • GCM:
    • GCM: 2
  • OFB:
    • OFB: 1
pdf_data/st_keywords/ecc_curve
  • NIST:
    • secp256k1: 2
    • secp256r1: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 5
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
  • RFC:
    • RFC3447: 3
    • RFC4055: 5
    • RFC4056: 3
    • RFC5480: 2
  • X509:
    • X.509: 1
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS 140-3: 2
pdf_data/st_metadata
  • /Author: dmin
  • /CreationDate: D:20160517153225+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20160517153225+09'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 1233838
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 59
  • /Author: NXP B.V.
  • /CreationDate: D:20230522142545+02'00'
  • /Creator: DITA Open Toolkit 3.3.1
  • /Keywords: NXP, ASE, SE310 Single Chip Secure Element , Single Chip Secure Element , Common Criteria, EAL5 augmented
  • /Producer: Apache FOP Version 2.3
  • /Subject: NXP SE310 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 495971
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 36
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different