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SAMSUNG SDS FIDO Server Solution V1.1
KECS-ISIS-0645-2015 		Cortex M35P r1p1
NSCIB-CC-201210-CR
name SAMSUNG SDS FIDO Server Solution V1.1 Cortex M35P r1p1
category Access Control Devices and Systems ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme KR NL
not_valid_after 10.09.2020 13.02.2025
not_valid_before 10.09.2015 13.02.2020
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/CC-20-201210.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/KECS-CR-15-73%20SAMSUNG%20SDS%20FIDO%20Server%20Solution%20V1.1(eng).pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/Certification%20Report%20NSCIB-CC-201210-CR%20v1.1.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/SDS%20FIDO%20V1.1-ASE-V2.0_Lite_Eng.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/[M35P-STL]%20arm_cortex_m35p_r1p1_security_target_lite_v1.1.pdf
manufacturer Samsung SDS Arm Limited
manufacturer_web https://www.sds.samsung.co.kr https://www.arm.com
security_level EAL2 EAL6+, ASE_TSS.2, ALC_FLR.1
dgst 9c89a7c6b92a1326 b53ae4936ad0c24b
heuristics/cert_id KECS-ISIS-0645-2015 NSCIB-CC-201210-CR
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ADV_TDS.5, ASE_ECD.1, ALC_FLR.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ALC_TAT.3, ATE_FUN.2, ADV_FSP.5, AGD_OPE.1, AGD_PRE.1, ATE_DPT.3, ADV_ARC.1, ALC_CMC.5, ADV_IMP.2, ASE_OBJ.2, ASE_TSS.2, ASE_REQ.2, ADV_INT.3, ATE_IND.2, ASE_CCL.1, ATE_COV.3, ADV_SPM.1
heuristics/extracted_versions 1.1 -
heuristics/scheme_data
pdf_data/cert_filename CC-20-201210.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • CC-20-201210: 1
pdf_data/cert_keywords/cc_protection_profile_id
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL6: 1
    • EAL6 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_FLR.1: 1
  • ASE:
    • ASE_TSS.2: 1
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims
pdf_data/cert_keywords/vendor
pdf_data/cert_keywords/eval_facility
  • BrightSight:
    • Brightsight: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata
  • /CreationDate: D:20200213160301+01'00'
  • /Creator: NL-ARN-SAL-C
  • /ModDate: D:20200213160614+01'00'
  • /Producer: KONICA MINOLTA bizhub C300i
  • pdf_file_size_bytes: 169972
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename KECS-CR-15-73 SAMSUNG SDS FIDO Server Solution V1.1(eng).pdf Certification Report NSCIB-CC-201210-CR v1.1.pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-201210-CR
    • cert_item: Cortex M35P r1p1
    • cert_lab: Brightsight
    • developer: Arm Limited
pdf_data/report_keywords/cc_cert_id
  • KR:
    • KECS-ISIS-0645-2015: 1
  • NL:
    • NSCIB-CC-201210-CR: 13
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL2: 4
  • EAL:
    • EAL 6: 1
    • EAL 6 augmented: 1
    • EAL4: 1
    • EAL4+: 2
    • EAL6: 5
    • EAL6 augmented: 3
    • EAL6+: 3
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 2
    • ADV_FSP.2: 3
    • ADV_TDS.1: 3
  • AGD:
    • AGD_OPE.1: 2
    • AGD_PRE.1: 3
  • ALC:
    • ALC_CMC.2: 2
    • ALC_CMS.2: 2
    • ALC_DEL.1: 2
  • ASE:
    • ASE_CCL.1: 2
    • ASE_ECD.1: 3
    • ASE_INT.1: 3
    • ASE_OBJ.2: 2
    • ASE_REQ.2: 2
    • ASE_SPD.1: 2
    • ASE_TSS.1: 3
  • ATE:
    • ATE_COV.1: 3
    • ATE_FUN.1: 3
    • ATE_IND.2: 4
  • AVA:
    • AVA_VAN.2: 5
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.1: 1
    • ASE_TSS.2: 1
  • AVA:
    • AVA_VAN.5: 2
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 4
pdf_data/report_keywords/eval_facility
  • KTC:
    • KTC: 4
  • BrightSight:
    • Brightsight: 2
pdf_data/report_keywords/crypto_protocol
  • TLS:
    • TLS:
      • TLS: 1
      • TLS1.2: 2
pdf_data/report_keywords/randomness
  • RNG:
    • RNG: 1
pdf_data/report_keywords/side_channel_analysis
  • other:
    • JIL: 3
    • JIL-AAPS: 3
    • JIL-COMP: 3
pdf_data/report_keywords/tee_name
  • other:
    • TEE: 1
pdf_data/report_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 2
    • CCMB-2012-09-003: 2
    • CCMB-2012-09-004: 1
pdf_data/report_metadata
  • /Author: 이은경
  • /CreationDate: D:20150910132516+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20150910132516+09'00'
  • /Producer: Microsoft® Word 2010
  • /Title: 평가단위보고서(ADV_ARC.1)
  • pdf_file_size_bytes: 601576
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 18
pdf_data/st_filename SDS FIDO V1.1-ASE-V2.0_Lite_Eng.pdf [M35P-STL] arm_cortex_m35p_r1p1_security_target_lite_v1.1.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL2: 7
  • EAL:
    • EAL4: 1
    • EAL4 augmented: 1
    • EAL6: 11
    • EAL6 augmented: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 12
    • ADV_FSP.1: 3
    • ADV_FSP.2: 16
    • ADV_TDS.1: 15
  • AGD:
    • AGD_OPE.1: 13
    • AGD_PRE.1: 9
  • ALC:
    • ALC_CMC.2: 9
    • ALC_CMS.1: 1
    • ALC_CMS.2: 7
    • ALC_DEL.1: 6
  • ASE:
    • ASE_CCL.1: 15
    • ASE_ECD: 2
    • ASE_ECD.1: 13
    • ASE_INT.1: 15
    • ASE_OBJ.2: 12
    • ASE_REQ.1: 2
    • ASE_REQ.2: 14
    • ASE_SPD.1: 9
    • ASE_TSS.1: 6
  • ATE:
    • ATE_COV.1: 7
    • ATE_FUN.1: 11
    • ATE_IND.2: 8
  • AVA:
    • AVA_VAN.2: 8
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_FSP: 1
    • ADV_FSP.5: 1
    • ADV_IMP: 1
    • ADV_IMP.2: 1
    • ADV_INT.3: 1
    • ADV_SPM.1: 9
    • ADV_TDS.5: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 1
    • AGD_PRE: 2
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.5: 1
    • ALC_CMS: 1
    • ALC_CMS.5: 1
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.2: 2
    • ALC_FLR.1: 7
    • ALC_LCD.1: 1
    • ALC_TAT.3: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.2: 8
  • ATE:
    • ATE_COV: 1
    • ATE_COV.3: 1
    • ATE_DPT.3: 1
    • ATE_FUN.2: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 2
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_AFL.1: 1
    • FAU_ARP.1: 7
    • FAU_ARP.1.1: 1
    • FAU_GEN.1: 10
    • FAU_GEN.1.2: 1
    • FAU_GEN.2: 7
    • FAU_GEN.2.1: 1
    • FAU_SAA.1: 7
    • FAU_SAA.1.1: 1
    • FAU_SAA.1.2: 1
    • FAU_SAR.1: 7
    • FAU_SAR.1.1: 1
    • FAU_SAR.3: 6
    • FAU_SAR.3.1: 1
    • FAU_SOS.1: 1
    • FAU_UAU.2: 1
    • FAU_UAU.7: 1
    • FAU_UID.2: 1
  • FCO:
    • FCO_NRO.1: 10
    • FCO_NRO.1.1: 1
    • FCO_NRO.1.2: 1
    • FCO_NRO.1.3: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 2
    • FCS_COP.1: 7
    • FCS_COP.1.1: 1
  • FDP:
    • FDP_ACC: 2
    • FDP_ACC.1: 25
    • FDP_ACC.1.1: 2
    • FDP_ACF: 2
    • FDP_ACF.1: 17
    • FDP_ACF.1.1: 2
    • FDP_ACF.1.2: 2
    • FDP_ACF.1.3: 2
    • FDP_ACF.1.4: 2
    • FDP_IFC.1: 1
    • FDP_ITC.1: 2
    • FDP_ITC.2: 2
  • FIA:
    • FIA_AFL.1: 6
    • FIA_AFL.1.1: 1
    • FIA_AFL.1.2: 1
    • FIA_SOS.1: 5
    • FIA_UAU.1: 3
    • FIA_UAU.2: 6
    • FIA_UAU.2.1: 1
    • FIA_UAU.7: 5
    • FIA_UAU.7.1: 1
    • FIA_UID.1: 7
    • FIA_UID.2: 8
    • FIA_UID.2.1: 1
  • FMT:
    • FMT_CKM.4: 1
    • FMT_MOF.1: 9
    • FMT_MSA.1: 7
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 11
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF.1: 10
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 10
    • FMT_SMR.1.1: 1
    • FMT_SMR.1.2: 1
  • FPT:
    • FPT_STM.1: 3
    • FPT_TDC.1: 6
    • FPT_TDC.1.1: 1
    • FPT_TDC.1.2: 1
  • FDP:
    • FDP_ACC: 22
    • FDP_ACC.1: 11
    • FDP_ACC.2: 10
    • FDP_ACF: 22
    • FDP_ACF.1: 23
    • FDP_IFC.1: 11
    • FDP_ITT.1: 6
  • FMT:
    • FMT_MSA: 39
    • FMT_MSA.1: 10
    • FMT_MSA.3: 15
    • FMT_SMF: 18
    • FMT_SMF.1: 10
    • FMT_SMR.1: 11
  • FPT:
    • FPT_FLS.1: 9
    • FPT_ITT.1: 4
  • FRU:
    • FRU_FLT.2: 7
pdf_data/st_keywords/cc_claims
  • A:
    • A.DBMS: 1
  • OE:
    • OE.DBMS: 1
  • T:
    • T.RND: 3
pdf_data/st_keywords/vendor
  • Broadcom:
    • Broadcom: 4
  • Samsung:
    • Samsung: 65
pdf_data/st_keywords/asymmetric_crypto
  • ECC:
    • ECDSA:
      • ECDSA: 6
pdf_data/st_keywords/hash_function
  • SHA:
    • SHA2:
      • SHA-256: 1
      • SHA256: 4
pdf_data/st_keywords/crypto_scheme
  • MAC:
    • MAC: 2
pdf_data/st_keywords/crypto_protocol
  • TLS:
    • TLS:
      • TLS: 1
      • TLS v1.2: 2
      • TLS1.2: 5
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 4
pdf_data/st_keywords/ecc_curve
  • NIST:
    • secp256k1: 2
    • secp256r1: 2
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 15
    • malfunction: 2
  • SCA:
    • Leak-Inherent: 6
    • Physical Probing: 2
    • side channel: 1
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 97
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
  • RFC:
    • RFC3447: 3
    • RFC4055: 5
    • RFC4056: 3
    • RFC5480: 2
  • X509:
    • X.509: 1
  • CC:
    • CCMB-2017-04-001: 1
    • CCMB-2017-04-002: 1
    • CCMB-2017-04-003: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • 205 in [PP84] This refinement in [PP84] is out of scope for the TOE because it refers to the CMS refinement. 206 in [PP84] This refinement in [PP84] is out: 1
    • 240 in [PP84] This refinement refers to configuration in Phase 2 or Phase 7. This refinement is out of scope for the TOE. 241 in [PP84] This refinement refers to downloading of embedded software. This: 1
    • This refinement refers to operating conditions. This refinement is regarded out of scope for the TOE. ADV_IMP 223 in [PP84] It must be checked that the provided implementation: 1
    • This refinement relates to requirements concerting embedded software. This requirement is regarded out of scope for the TOE. 235 in [PP84] Guidance documents must not contain security relevant details which are: 1
    • contribute to SFRs. This refinement is regarded out of scope for the TOE. 217 in [PP84] The Functional Specification is expected to refer to mechanisms. 218 in: 1
    • is out of scope for the TOE. AVA_VAN 245 in [PP84] The vulnerability analysis shall include a justification for the: 1
    • must be tested under different operating conditions within the specified ranges. This refinement is out of scope for the TOE. 227 in [PP84] This refinement relates to physical testing. This refinement is out of: 1
    • out of scope: 12
    • to test software delivered but not available in the operational phase. This refinement is regarded out of scope for the TOE. 216 in [PP84] This refinement refers to features that do not provide functionality but: 1
    • to the development and production of the TOE. ALC_CMS 199 in [PP84] This refinement in [PP84] is out of scope for the TOE because it relates to consumer software that can be part of manufacturing and delivery: 1
    • transitions of power save modes if provided by the TOE. 210 in [PP84] This refinement in [PP84] is out of scope for the TOE because it relates to test features used in wafer testing. ADV_FSP 215 in [PP84] This: 1
pdf_data/st_metadata
  • /Author: dmin
  • /CreationDate: D:20160517153225+09'00'
  • /Creator: Microsoft® Word 2010
  • /ModDate: D:20160517153225+09'00'
  • /Producer: Microsoft® Word 2010
  • pdf_file_size_bytes: 1233838
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 59
state/cert/convert_garbage False True
state/cert/convert_ok False True
state/cert/download_ok False True
state/cert/extract_ok False True
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
state/st/pdf_hash Different Different
state/st/txt_hash Different Different