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THN31 Secure Element version 1.0
2021-1-INF-4210
S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
BSI-DSZ-CC-0882-V2-2019
name THN31 Secure Element version 1.0 S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
scheme ES DE
status active archived
not_valid_after 06.01.2029 11.12.2024
not_valid_before 06.01.2024 11.12.2019
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_Certificado.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882V2c_pdf.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_INF-4210.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882V2a_pdf.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_ST_lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/0882V2b_pdf.pdf
manufacturer Beijing TsingTeng MicroSystem Co.,Ltd. Samsung Electronics Co., Ltd.
manufacturer_web https://www.tsingtengms.com/sy https://www.samsung.com
dgst 90e5b81740b63970 f97de67112a8125c
heuristics/cert_id 2021-1-INF-4210 BSI-DSZ-CC-0882-V2-2019
heuristics/cert_lab [] BSI
heuristics/extracted_versions 1.0 0, 32
heuristics/report_references/directly_referencing {} BSI-DSZ-CC-0882-2013
heuristics/report_references/indirectly_referencing {} BSI-DSZ-CC-0720-2011, BSI-DSZ-CC-0639-2010, BSI-DSZ-CC-0547-2009, BSI-DSZ-CC-0882-2013, BSI-DSZ-CC-0719-2011, BSI-DSZ-CC-0801-2012
heuristics/scheme_data
  • category: Smart Cards and similiar devices
  • certification_date: 06.01.2024
  • enhanced:
  • manufacturer: BEIJING TSINGTENG MICROSYSTEM CO.,LTD.
  • product: THN31 Secure Element version 1.0
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/1002-thn31-secure-element-version-1-0
heuristics/protection_profiles cf0f01bcd7be3e9c f6d23054061d72ba
maintenance_updates
protection_profile_links https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0035b.pdf
pdf_data/cert_filename 2021-01_Certificado.pdf 0882V2c_pdf.pdf
pdf_data/cert_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-0882-V2-2019: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-: 1
  • BSI:
    • BSI-CC-PP-0035-2007: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL5: 1
  • EAL:
    • EAL 2: 1
    • EAL 5: 2
    • EAL 5 augmented: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
  • ALC:
    • ALC_DVS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
pdf_data/cert_keywords/vendor
  • Samsung:
    • Samsung: 1
pdf_data/cert_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408: 2
    • ISO/IEC 18045: 2
pdf_data/cert_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 894051
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
  • /Author: Bundesamt für Sicherheit in der Informationstechnik
  • /CreationDate: D:20191216114820+01'00'
  • /Creator: Writer
  • /Keywords: S3CS9AB, 32-Bit, RISC, Microcontroller, Smart Cards, Samsung
  • /ModDate: D:20191216143837+01'00'
  • /Producer: LibreOffice 6.2
  • /Subject: S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated SoftwarefromSamsung Electronics
  • /Title: Certification Report BSI-DSZ-CC-0882-V2-2019
  • pdf_file_size_bytes: 289486
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2021-01_INF-4210.pdf 0882V2a_pdf.pdf
pdf_data/report_frontpage
  • DE:
  • DE:
    • cc_security_level: Common Criteria Part 3 conformant EAL 5 augmented by AVA_VAN.5 and ALC_DVS.2
    • cc_version: PP conformant plus product specific extensions Common Criteria Part 2 extended
    • cert_id: BSI-DSZ-CC-0882-V2-2019
    • cert_item: S3CS9AB 32-Bit RISC Microcontroller for Smart Cards, Revision 0 with specific IC Dedicated Software
    • cert_lab: BSI
    • developer: Samsung Electronics
    • match_rules: ['(BSI-DSZ-CC-.+?) (?:for|For) (.+?) from (.*)']
    • ref_protection_profiles: Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP-0035-2007
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-S-0201-2022: 1
  • ES:
    • 2021-1-INF-4210- v2: 1
  • DE:
    • BSI-DSZ-CC-0882-2013: 3
    • BSI-DSZ-CC-0882-V2-2019: 15
  • NL:
    • CC-0882-2013: 1
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 2
  • BSI:
    • BSI-CC-PP- 0035-2007: 1
    • BSI-CC-PP-0035-2007: 2
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL2: 2
    • EAL4: 2
    • EAL5: 8
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 1: 1
    • EAL 2: 2
    • EAL 2+: 1
    • EAL 4: 1
    • EAL 5: 7
    • EAL 5 augmented: 3
    • EAL 5+: 1
    • EAL 6: 1
    • EAL5: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 8
    • ALC_FLR: 3
    • ALC_LCD.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 9
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR: 2
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • AVA:
    • AVA_VAN.5: 4
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_COP.1: 2
    • FCS_RNG.1: 1
  • FDP:
    • FDP_ITT.1: 1
    • FDP_SDC.1: 1
  • FMT:
    • FMT_LIM.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/vendor
  • Samsung:
    • Samsung: 20
pdf_data/report_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 6
  • TUV:
    • TÜV Informationstechnik: 2
    • TÜViT: 4
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDES: 3
  • AES_competition:
    • AES:
      • AES: 6
  • DES:
    • 3DES:
      • TDEA: 1
      • Triple-DES: 1
    • DES:
      • DES: 4
pdf_data/report_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 4
pdf_data/report_keywords/hash_function
  • MD:
    • MD5:
      • MD5: 3
pdf_data/report_keywords/crypto_scheme
  • PKE:
    • PKE: 1
pdf_data/report_keywords/randomness
  • TRNG:
    • TRNG: 2
  • RNG:
    • RNG: 2
  • TRNG:
    • DTRNG: 9
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 3
  • OFB:
    • OFB: 1
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 2.1.0: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • malfunction: 1
  • other:
    • JIL: 1
  • FI:
    • DFA: 1
    • physical tampering: 1
  • SCA:
    • DPA: 1
    • SPA: 1
    • physical probing: 1
    • side-channel: 1
  • other:
    • JIL: 4
pdf_data/report_keywords/technical_report_id
  • BSI:
    • BSI 7148: 1
    • BSI TR-02102: 1
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/report_keywords/standard_id
  • ISO:
    • ISO/IEC 7816: 4
  • PKCS:
    • PKCS #1: 1
  • BSI:
    • AIS 25: 2
    • AIS 26: 1
    • AIS 31: 3
    • AIS 32: 1
    • AIS 34: 2
    • AIS 35: 2
    • AIS 36: 3
    • AIS 37: 1
    • AIS 38: 1
    • AIS 47: 1
    • AIS31: 3
  • ISO:
    • ISO/IEC 15408: 4
    • ISO/IEC 17065: 2
    • ISO/IEC 18045: 4
pdf_data/report_keywords/certification_process
  • ConfidentialDocument:
    • 16] SITE TECHNICAL AUDIT REPORT (STAR), PKL Co., Ltd., Cheonan, Version 4, 02- 12-2019, TÜViT (confidential document) [17] SITE TECHNICAL AUDIT REPORT (STAR), Toppan Photomasks Korea Ltd., Korea Icheon, Version 1: 1
    • IC Dedicated Software, BSI-DSZ-CC-0882-V2-2019, Version 2.2, 14-10- 2019, Samsung Electronics (confidential document) [7] Security IC Platform Protection Profile, Version 1.0, 15 June 2007, BSI-CC-PP- 0035-2007 [8: 1
    • Report Summary (ETR Summary), BSI-DSZ-CC-0882-V2, S3CS9AB Revision 0, Version 3, 02-12-2019, TÜViT (confidential document) [9] Security Target Lite of S3CS9AB 32-Bit RISC Microcontroller for Smart Cards with specific IC: 1
    • TÜViT (confidential document) 21 / 25 Certification Report BSI-DSZ-CC-0882-V2-2019 C. Excerpts from the Criteria For the: 1
    • being maintained, is not given any longer. In particular, prior to the dissemination of confidential documentation and information related to the TOE or resulting from the evaluation and certification: 1
    • evaluation according to AIS 36 for the Product S3CS9AB Revision 0, Version 3, 02-12-2019, TÜViT (confidential document) [11] SC100 Reference Manual, Version 0.0, 15-07-2013, Samsung Electronics [12] S3CS9AB 32-Bit CMOS: 1
pdf_data/report_metadata
pdf_data/st_filename 2021-01_ST_lite.pdf 0882V2b_pdf.pdf
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-PP-0035: 4
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 1
    • EAL5: 4
    • EAL5 augmented: 2
    • EAL5+: 31
  • EAL:
    • EAL 4: 1
    • EAL 4 augmented: 1
    • EAL 5: 2
    • EAL 5 augmented: 2
    • EAL5: 6
    • EAL5 augmented: 1
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE: 3
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 6
  • ADV:
    • ADV_ARC.1: 7
    • ADV_ARV: 1
    • ADV_FSP: 2
    • ADV_FSP.2: 1
    • ADV_FSP.4: 1
    • ADV_FSP.5: 3
    • ADV_IMP: 1
    • ADV_IMP.1: 2
    • ADV_INT.2: 1
    • ADV_TDS.3: 1
    • ADV_TDS.4: 1
    • ADV_VAN: 1
  • AGD:
    • AGD_OPE: 1
    • AGD_OPE.1: 2
    • AGD_PRE: 1
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC: 1
    • ALC_CMC.4: 1
    • ALC_CMS: 2
    • ALC_CMS.4: 1
    • ALC_CMS.5: 3
    • ALC_DEL: 1
    • ALC_DEL.1: 1
    • ALC_DVS: 1
    • ALC_DVS.1: 1
    • ALC_DVS.2: 7
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV: 1
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN: 1
    • AVA_VAN.5: 13
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 5
    • FCS_COP.1: 17
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 7
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_IFC.1: 5
    • FDP_ITC.1: 5
    • FDP_ITC.2: 5
    • FDP_ITT.1: 7
    • FDP_SDC.1: 6
    • FDP_SDC.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 4
  • FPT:
    • FPT_FLS.1: 7
    • FPT_FLS.1.1: 1
    • FPT_ITT.1: 7
    • FPT_PHP.3: 7
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT.2: 8
  • FAU:
    • FAU_GEN: 2
    • FAU_GEN.1: 1
    • FAU_SAS: 8
    • FAU_SAS.1: 12
    • FAU_SAS.1.1: 2
  • FCS:
    • FCS_CKM.1: 6
    • FCS_CKM.4: 4
    • FCS_COP: 8
    • FCS_COP.1: 9
    • FCS_RNG: 6
    • FCS_RNG.1: 15
    • FCS_RNG.1.1: 2
    • FCS_RNG.1.2: 2
  • FDP:
    • FDP_ACC: 1
    • FDP_ACC.1: 13
    • FDP_ACC.1.1: 1
    • FDP_ACF: 2
    • FDP_ACF.1: 9
    • FDP_ACF.1.1: 1
    • FDP_ACF.1.2: 1
    • FDP_ACF.1.3: 1
    • FDP_ACF.1.4: 1
    • FDP_IFC: 1
    • FDP_IFC.1: 18
    • FDP_IFC.1.1: 1
    • FDP_IFF.1: 3
    • FDP_ITC.1: 4
    • FDP_ITC.2: 4
    • FDP_ITT: 1
    • FDP_ITT.1: 17
    • FDP_ITT.1.1: 1
    • FDP_SDI.1: 1
  • FMT:
    • FMT_LIM: 8
    • FMT_LIM.1: 24
    • FMT_LIM.1.1: 2
    • FMT_LIM.2: 28
    • FMT_LIM.2.1: 2
    • FMT_MSA: 2
    • FMT_MSA.1: 9
    • FMT_MSA.1.1: 1
    • FMT_MSA.3: 10
    • FMT_MSA.3.1: 1
    • FMT_MSA.3.2: 1
    • FMT_SMF: 1
    • FMT_SMF.1: 6
    • FMT_SMF.1.1: 1
    • FMT_SMR.1: 6
  • FPT:
    • FPT_FLS: 1
    • FPT_FLS.1: 21
    • FPT_FLS.1.1: 1
    • FPT_ITT: 1
    • FPT_ITT.1: 15
    • FPT_ITT.1.1: 1
    • FPT_PHP: 3
    • FPT_PHP.3: 20
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT: 1
    • FRU_FLT.1: 1
    • FRU_FLT.2: 17
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 3
    • O.RSA-CRT: 6
    • O.TDES: 8
  • T:
    • T.RND: 2
  • O:
    • O.RND: 5
  • T:
    • T.RND: 5
pdf_data/st_keywords/vendor
  • Samsung:
    • Samsung: 2
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 29
      • Triple-DES: 4
    • DES:
      • DES: 1
  • AES_competition:
    • AES:
      • AES: 13
  • DES:
    • 3DES:
      • 3DES: 6
      • TDEA: 1
      • Triple-DES: 2
    • DES:
      • DES: 8
pdf_data/st_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 30
pdf_data/st_keywords/crypto_scheme
  • PKE:
    • PKE: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 6
  • TRNG:
    • TRNG: 3
  • RNG:
    • RND: 10
  • TRNG:
    • DTRNG: 19
    • TRNG: 2
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 4
  • CBC:
    • CBC: 2
  • ECB:
    • ECB: 4
  • OFB:
    • OFB: 2
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library 2.1.0: 1
  • NSS:
    • NSS: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 7
    • malfunction: 3
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 4
  • FI:
    • Malfunction: 24
    • malfunction: 11
    • physical tampering: 2
  • SCA:
    • DPA: 3
    • Leak-Inherent: 21
    • Physical Probing: 4
    • Physical probing: 2
    • SPA: 2
    • physical probing: 9
    • side-channel: 3
    • timing attacks: 1
  • other:
    • reverse engineering: 5
pdf_data/st_keywords/technical_report_id
  • BSI:
    • BSI TR-02102: 1
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 7816: 6
  • NIST:
    • NIST SP 800-38A: 1
    • NIST SP 800-67: 1
  • BSI:
    • AIS 31: 2
    • AIS31: 1
    • BSI-AIS31: 3
  • CC:
    • CCMB-2017-04-001: 3
    • CCMB-2017-04-002: 3
    • CCMB-2017-04-003: 3
    • CCMB-2017-04-004: 3
  • FIPS:
    • FIPS 197: 1
    • FIPS197: 1
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • on a single die. The THN31 secure element is in the scope of the TOE while the NFC controller is out of scope of the TOE. THN31 secure element (TOE) NFC controller The TOE is a secure element with two crypto: 1
    • out of scope: 1
pdf_data/st_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 754154
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 29
  • /Author: Junghyun KIM
  • /CreationDate: D:20191210200347+09'00'
  • /Creator: Microsoft® Word 2016
  • /Keywords: Security Lite Target of S3CS9AB
  • /ModDate: D:20191210200715+09'00'
  • /Producer: Microsoft® Word 2016
  • /Subject: Security Lite Target of S3CS9AB
  • /Title: Security Lite Target
  • pdf_file_size_bytes: 785729
  • pdf_hyperlinks: http://www.bsi.bund.de/
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 57
state/cert/pdf_hash Different Different
state/cert/txt_hash Different Different
state/report/pdf_hash Different Different
state/report/txt_hash Different Different
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state/st/txt_hash Different Different