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THN31 Secure Element version 1.0
2021-1-INF-4210 		NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
NSCIB-CC-2200030-01-CR
name THN31 Secure Element version 1.0 NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
scheme ES NL
not_valid_after 06.01.2029 14.06.2028
not_valid_before 06.01.2024 14.06.2023
cert_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_Certificado.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-01-Cert.pdf
report_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_INF-4210.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-01-CR_v2.pdf
st_link https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_ST_lite.pdf https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/NSCIB-CC-2200030-01-STLite_v09.pdf
manufacturer Beijing TsingTeng MicroSystem Co.,Ltd. NXP Semiconductors Germany GmbH
manufacturer_web https://www.tsingtengms.com/sy https://www.nxp.com
security_level EAL5+, ALC_DVS.2, AVA_VAN.5 ALC_FLR.1, EAL5+, AVA_VAN.5, ASE_TSS.2, ALC_DVS.2
dgst 90e5b81740b63970 b14fd214504ca5ef
heuristics/cert_id 2021-1-INF-4210 NSCIB-CC-2200030-01-CR
heuristics/cert_lab []
heuristics/extracted_sars ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ATE_IND.2, ASE_CCL.1 ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ALC_FLR.1, ADV_CMS.5, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ALC_TAT.2, ASE_TSS.2, ADV_TDS.4, ASE_REQ.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions 1.0 2.1.001
heuristics/report_references/directly_referenced_by {} NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
heuristics/report_references/indirectly_referenced_by {} NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
heuristics/scheme_data
  • category: Smart Cards and similiar devices
  • certification_date: 06.01.2024
  • enhanced:
  • manufacturer: BEIJING TSINGTENG MICROSYSTEM CO.,LTD.
  • product: THN31 Secure Element version 1.0
  • product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/1002-thn31-secure-element-version-1-0
heuristics/st_references/directly_referenced_by {} NSCIB-CC-2200030-02-CR, NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
heuristics/st_references/indirectly_referenced_by {} NSCIB-CC-2200030-02-CR, NSCIB-CC-2200043-05-CR, NSCIB-CC-2200041-02-CR
pdf_data/cert_filename 2021-01_Certificado.pdf NSCIB-CC-2200030-01-Cert.pdf
pdf_data/cert_keywords/cc_cert_id
  • NL:
    • NSCIB-2200030-01: 1
    • NSCIB-CC-2200030-01: 1
pdf_data/cert_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-: 1
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/cert_keywords/cc_security_level
  • EAL:
    • EAL 2: 1
    • EAL5: 1
  • EAL:
    • EAL2: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL7: 1
pdf_data/cert_keywords/cc_sar
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
  • AVA:
    • AVA_VAN.5: 1
  • ALC:
    • ALC_DVS.2: 1
    • ALC_FLR: 1
    • ALC_FLR.1: 1
    • ALC_FLR.3: 1
  • ASE:
    • ASE_TSS.2: 1
  • AVA:
    • AVA_VAN.5: 1
pdf_data/cert_keywords/cc_claims
  • O:
    • O.E: 1
pdf_data/cert_keywords/vendor
  • NXP:
    • NXP: 1
    • NXP Semiconductors: 1
pdf_data/cert_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 1
  • TUV:
    • TÜV Informationstechnik: 1
pdf_data/cert_keywords/standard_id
  • ISO:
    • ISO/IEC 15408-1: 2
    • ISO/IEC 18045: 4
    • ISO/IEC 18045:2008: 1
pdf_data/cert_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 894051
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 2
  • /Author: Denise Cater
  • /CreationDate: D:20230717111142+01'00'
  • /Creator: Microsoft® Word 2021
  • /ModDate: D:20230717111142+01'00'
  • /Producer: Microsoft® Word 2021
  • /Title: NSCIB Certificate
  • pdf_file_size_bytes: 90734
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 1
pdf_data/report_filename 2021-01_INF-4210.pdf NSCIB-CC-2200030-01-CR_v2.pdf
pdf_data/report_frontpage
  • NL:
  • NL:
    • cert_id: NSCIB-CC-2200030-01-CR
    • cert_item: NXP SN300 B2 Series - Secure Element version SN300_SE B2.1.001 JB
    • cert_lab: TÜV Informationstechnik GmbH
    • developer: NXP Semiconductors Germany GmbH
pdf_data/report_keywords/cc_cert_id
  • DE:
    • BSI-DSZ-CC-S-0201-2022: 1
  • ES:
    • 2021-1-INF-4210- v2: 1
  • NL:
    • NSCIB-2200030-01: 1
    • NSCIB-CC-2200030-01-CR: 12
pdf_data/report_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP-0084-2014: 2
  • BSI:
    • BSI-CC-PP-0084-2014: 1
pdf_data/report_keywords/cc_security_level
  • EAL:
    • EAL1: 1
    • EAL2: 2
    • EAL4: 2
    • EAL5: 8
  • ITSEC:
    • ITSEC Evaluation: 1
  • EAL:
    • EAL 5: 1
    • EAL 5 augmented: 1
    • EAL4: 1
    • EAL5: 1
    • EAL5 augmented: 1
    • EAL5+: 1
pdf_data/report_keywords/cc_sar
  • ADV:
    • ADV_ARC: 1
    • ADV_ARC.1: 1
    • ADV_IMP.1: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 8
    • ALC_FLR: 3
    • ALC_LCD.1: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_INT.1: 1
    • ASE_REQ.2: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_FUN.1: 1
  • AVA:
    • AVA_VAN.5: 9
  • ADV:
    • ADV_IMP: 1
  • ALC:
    • ALC_DVS.2: 2
    • ALC_FLR.1: 2
  • ASE:
    • ASE_TSS.2: 2
  • AVA:
    • AVA_VAN.5: 2
pdf_data/report_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 1
  • FCS:
    • FCS_COP.1: 2
    • FCS_RNG.1: 1
  • FDP:
    • FDP_ITT.1: 1
    • FDP_SDC.1: 1
  • FMT:
    • FMT_LIM.1: 1
  • FPT:
    • FPT_FLS.1: 1
    • FPT_ITT.1: 1
    • FPT_PHP.3: 1
  • FRU:
    • FRU_FLT.2: 1
pdf_data/report_keywords/vendor
  • NXP:
    • NXP: 13
    • NXP Semiconductors: 3
pdf_data/report_keywords/eval_facility
  • Applus:
    • Applus Laboratories: 6
  • TUV:
    • TÜV Informationstechnik: 2
pdf_data/report_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDES: 3
  • AES_competition:
    • AES:
      • AES: 1
  • DES:
    • DES:
      • DES: 1
  • constructions:
    • MAC:
      • CBC-MAC: 1
pdf_data/report_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 4
  • ECC:
    • ECC:
      • ECC: 1
    • ECDH:
      • ECDH: 1
    • ECDSA:
      • ECDSA: 1
  • FF:
    • DH:
      • Diffie-Hellman: 1
pdf_data/report_keywords/hash_function
  • MD:
    • MD5:
      • MD5: 3
pdf_data/report_keywords/crypto_scheme
  • PKE:
    • PKE: 1
  • MAC:
    • MAC: 1
pdf_data/report_keywords/randomness
  • TRNG:
    • TRNG: 2
  • RNG:
    • RNG: 1
  • TRNG:
    • TRNG: 1
pdf_data/report_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 1
pdf_data/report_keywords/crypto_library
  • Generic:
    • Crypto Library 2.1.0: 1
pdf_data/report_keywords/side_channel_analysis
  • FI:
    • malfunction: 1
  • other:
    • JIL: 1
  • FI:
    • DFA: 1
    • Fault Injection: 3
  • SCA:
    • side-channel: 1
  • other:
    • JIL: 2
    • JIL-AAPS: 1
    • JIL-AM: 2
pdf_data/report_keywords/tee_name
  • IBM:
    • SE: 1
  • IBM:
    • SE: 2
pdf_data/report_keywords/standard_id
  • ISO:
    • ISO/IEC 7816: 4
  • PKCS:
    • PKCS #1: 1
  • ISO:
    • ISO/IEC 7816: 2
pdf_data/report_metadata
pdf_data/st_filename 2021-01_ST_lite.pdf NSCIB-CC-2200030-01-STLite_v09.pdf
pdf_data/st_keywords/cc_cert_id
  • NL:
    • NSCIB-2200030-01: 1
pdf_data/st_keywords/cc_protection_profile_id
  • BSI:
    • BSI-CC-PP- 0084-2014: 1
    • BSI-CC-PP-0084-2014: 1
  • BSI:
    • BSI-CC-PP-0084-2014: 1
    • BSI-PP-0084-2014: 2
pdf_data/st_keywords/cc_security_level
  • EAL:
    • EAL4: 1
    • EAL5: 4
    • EAL5 augmented: 2
    • EAL5+: 31
  • EAL:
    • EAL4: 1
    • EAL5: 13
    • EAL5 augmented: 2
    • EAL5+: 3
pdf_data/st_keywords/cc_sar
  • ADV:
    • ADV_ARC.1: 1
    • ADV_FSP.5: 1
    • ADV_IMP.1: 1
    • ADV_INT.2: 1
    • ADV_TDS.4: 1
  • AGD:
    • AGD_OPE: 3
    • AGD_OPE.1: 1
    • AGD_PRE: 1
    • AGD_PRE.1: 1
  • ALC:
    • ALC_CMC.4: 1
    • ALC_CMS.5: 1
    • ALC_DEL.1: 1
    • ALC_DVS.2: 6
    • ALC_LCD.1: 1
    • ALC_TAT.2: 1
  • ASE:
    • ASE_CCL.1: 1
    • ASE_ECD.1: 1
    • ASE_INT.1: 1
    • ASE_OBJ.2: 1
    • ASE_REQ.2: 1
    • ASE_SPD.1: 1
    • ASE_TSS.1: 1
  • ATE:
    • ATE_COV.2: 1
    • ATE_DPT.3: 1
    • ATE_FUN.1: 1
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 6
  • ADV:
    • ADV_ARC.1: 5
    • ADV_CMS.4: 1
    • ADV_CMS.5: 1
    • ADV_FSP: 1
    • ADV_FSP.1: 2
    • ADV_FSP.2: 3
    • ADV_FSP.4: 4
    • ADV_FSP.5: 5
    • ADV_IMP.1: 6
    • ADV_INT.2: 1
    • ADV_TDS.1: 5
    • ADV_TDS.3: 2
    • ADV_TDS.4: 3
  • AGD:
    • AGD_OPE.1: 4
    • AGD_PRE.1: 2
  • ALC:
    • ALC_CMC.4: 2
    • ALC_CMS: 1
    • ALC_CMS.4: 2
    • ALC_CMS.5: 4
    • ALC_DEL.1: 2
    • ALC_DVS.1: 1
    • ALC_DVS.2: 5
    • ALC_FLR.1: 6
    • ALC_LCD.1: 3
    • ALC_TAT.1: 4
    • ALC_TAT.2: 2
  • ASE:
    • ASE_CCL: 2
    • ASE_CCL.1: 2
    • ASE_ECD: 1
    • ASE_ECD.1: 3
    • ASE_INT: 2
    • ASE_INT.1: 4
    • ASE_OBJ.2: 3
    • ASE_REQ: 2
    • ASE_REQ.1: 2
    • ASE_REQ.2: 2
    • ASE_SPD: 2
    • ASE_SPD.1: 2
    • ASE_TSS: 2
    • ASE_TSS.2: 6
  • ATE:
    • ATE_COV.1: 1
    • ATE_COV.2: 2
    • ATE_DPT.1: 1
    • ATE_DPT.3: 2
    • ATE_FUN.1: 7
    • ATE_IND.2: 1
  • AVA:
    • AVA_VAN.5: 5
pdf_data/st_keywords/cc_sfr
  • FAU:
    • FAU_SAS.1: 6
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_CKM.1: 5
    • FCS_CKM.4: 5
    • FCS_COP.1: 17
    • FCS_COP.1.1: 2
    • FCS_RNG.1: 7
    • FCS_RNG.1.1: 1
    • FCS_RNG.1.2: 1
  • FDP:
    • FDP_IFC.1: 5
    • FDP_ITC.1: 5
    • FDP_ITC.2: 5
    • FDP_ITT.1: 7
    • FDP_SDC.1: 6
    • FDP_SDC.1.1: 1
    • FDP_SDI.1: 1
    • FDP_SDI.2: 6
    • FDP_SDI.2.1: 1
    • FDP_SDI.2.2: 1
  • FMT:
    • FMT_LIM.1: 4
    • FMT_LIM.2: 4
  • FPT:
    • FPT_FLS.1: 7
    • FPT_FLS.1.1: 1
    • FPT_ITT.1: 7
    • FPT_PHP.3: 7
    • FPT_PHP.3.1: 1
  • FRU:
    • FRU_FLT.2: 8
  • FAU:
    • FAU_SAS: 1
    • FAU_SAS.1: 5
    • FAU_SAS.1.1: 1
  • FCS:
    • FCS_RNG: 6
    • FCS_RNG.1: 3
  • FDP:
    • FDP_IFC.1: 7
    • FDP_ITT.1: 6
    • FDP_SDC: 1
    • FDP_SDC.1: 5
    • FDP_SDC.1.1: 1
    • FDP_SDI: 4
    • FDP_SDI.1: 1
    • FDP_SDI.2: 3
  • FMT:
    • FMT_LIM: 1
    • FMT_LIM.1: 4
    • FMT_LIM.2: 3
  • FPT:
    • FPT_FLS.1: 8
    • FPT_ITT.1: 6
    • FPT_PHP.3: 7
  • FRU:
    • FRU_FLT.2: 8
  • FTP:
    • FTP_FLS.1: 1
pdf_data/st_keywords/cc_claims
  • O:
    • O.RND: 3
    • O.RSA-CRT: 6
    • O.TDES: 8
  • T:
    • T.RND: 2
  • O:
    • O.RND: 1
    • O.RND_HW: 4
  • T:
    • T.RND: 1
    • T.RND_HW: 3
pdf_data/st_keywords/vendor
  • NXP:
    • NXP: 111
    • NXP Semiconductors: 29
pdf_data/st_keywords/symmetric_crypto
  • DES:
    • 3DES:
      • TDEA: 1
      • TDES: 29
      • Triple-DES: 4
    • DES:
      • DES: 1
  • AES_competition:
    • AES:
      • AES: 2
  • DES:
    • DES:
      • DES: 1
pdf_data/st_keywords/asymmetric_crypto
  • RSA:
    • RSA-CRT: 30
  • ECC:
    • ECC:
      • ECC: 1
pdf_data/st_keywords/crypto_scheme
  • PKE:
    • PKE: 1
pdf_data/st_keywords/randomness
  • RNG:
    • RND: 5
    • RNG: 6
  • TRNG:
    • TRNG: 3
  • RNG:
    • RND: 2
    • RNG: 12
pdf_data/st_keywords/cipher_mode
  • CBC:
    • CBC: 1
  • ECB:
    • ECB: 4
  • CBC:
    • CBC: 1
  • CFB:
    • CFB: 1
  • CTR:
    • CTR: 1
  • GCM:
    • GCM: 2
  • OFB:
    • OFB: 1
pdf_data/st_keywords/crypto_library
  • Generic:
    • Crypto Library 2.1.0: 1
pdf_data/st_keywords/side_channel_analysis
  • FI:
    • Malfunction: 7
    • malfunction: 3
    • physical tampering: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 4
  • FI:
    • Malfunction: 5
    • malfunction: 1
  • SCA:
    • Leak-Inherent: 5
    • Physical Probing: 2
    • physical probing: 2
    • side channel: 1
pdf_data/st_keywords/tee_name
  • IBM:
    • SE: 1
pdf_data/st_keywords/standard_id
  • CC:
    • CCMB-2012-09-001: 1
    • CCMB-2012-09-002: 1
    • CCMB-2012-09-003: 1
    • CCMB-2012-09-004: 1
  • ISO:
    • ISO/IEC 7816: 6
  • NIST:
    • NIST SP 800-38A: 1
    • NIST SP 800-67: 1
  • BSI:
    • AIS31: 1
  • CC:
    • CCMB-2017-04-001: 2
    • CCMB-2017-04-002: 2
    • CCMB-2017-04-003: 2
    • CCMB-2017-04-004: 2
  • FIPS:
    • FIPS 140-3: 2
  • ISO:
    • ISO/IEC 7816: 4
pdf_data/st_keywords/certification_process
  • OutOfScope:
    • on a single die. The THN31 secure element is in the scope of the TOE while the NFC controller is out of scope of the TOE. THN31 secure element (TOE) NFC controller The TOE is a secure element with two crypto: 1
    • out of scope: 1
pdf_data/st_metadata
  • /Author:
  • /CreationDate:
  • /Creator:
  • /Keywords:
  • /ModDate:
  • /Producer:
  • /Subject:
  • /Title:
  • /Trapped:
  • pdf_file_size_bytes: 754154
  • pdf_hyperlinks: {}
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 29
  • /Author: NXP B.V.
  • /CreationDate: D:20230509104646+02'00'
  • /Creator: DITA Open Toolkit 3.3.1
  • /Keywords: NXP, ASE, SN300 B2 Single Chip Secured (NFC) Controller Series, Single Chip Secure Element and NFC Controller, Common Criteria, EAL5 augmented
  • /Producer: Apache FOP Version 2.3
  • /Subject: NXP SN300 B2 Series - Secure Element
  • /Title: Security Target Lite
  • pdf_file_size_bytes: 846702
  • pdf_hyperlinks: mailto:[email protected]
  • pdf_is_encrypted: False
  • pdf_number_of_pages: 37
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state/report/pdf_hash Different Different
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