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	THN31 Secure Element version 1.0 2021-1-INF-4210	Samsung SP of S3B512C revision 3 2021-23-INF-4038
name	THN31 Secure Element version 1.0	Samsung SP of S3B512C revision 3
category	ICs, Smart Cards and Smart Card-Related Devices and Systems	ICs, Smart Cards and Smart Card-Related Devices and Systems
scheme	ES	ES
status	active	active
not_valid_after	06.01.2029	08.04.2028
not_valid_before	06.01.2024	08.04.2023
cert_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_Certificado.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23_Certificado.pdf
report_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_INF-4210.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20INF-4038.pdf
st_link	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-01_ST_lite.pdf	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/epfiles/2021-23%20ST_Lite.pdf
manufacturer	Beijing TsingTeng MicroSystem Co.,Ltd.	Samsung Electronics Co., Ltd.
manufacturer_web	https://www.tsingtengms.com/sy	https://www.samsung.com
security_level	EAL5+, ALC_DVS.2, AVA_VAN.5	EAL2
dgst	90e5b81740b63970	95f760528ffedd31
heuristics/cert_id	2021-1-INF-4210	2021-23-INF-4038
heuristics/cert_lab	[]	[]
heuristics/cpe_matches	{}	{}
heuristics/verified_cpe_matches	{}	{}
heuristics/related_cves	{}	{}
heuristics/direct_transitive_cves	{}	{}
heuristics/indirect_transitive_cves	{}	{}
heuristics/extracted_sars	ASE_INT.1, ALC_DVS.2, ALC_CMC.4, ASE_ECD.1, ADV_IMP.1, ATE_COV.2, ASE_TSS.1, ASE_SPD.1, ALC_CMS.5, AVA_VAN.5, ALC_DEL.1, ALC_LCD.1, ADV_FSP.5, AGD_OPE.1, ADV_INT.2, AGD_PRE.1, ATE_FUN.1, ATE_DPT.3, ADV_ARC.1, ASE_OBJ.2, ADV_TDS.4, ALC_TAT.2, ASE_REQ.2, ATE_IND.2, ASE_CCL.1	ASE_INT.1, AVA_VAN.2, ADV_FSP.2, ASE_ECD.1, ASE_TSS.1, ASE_SPD.1, ALC_DEL.1, AGD_OPE.1, AGD_PRE.1, ALC_CMS.2, ADV_TDS.1, ATE_FUN.1, ATE_COV.1, ADV_ARC.1, ASE_OBJ.2, ASE_REQ.2, ALC_CMC.2, ATE_IND.2, ASE_CCL.1
heuristics/extracted_versions	1.0	3
heuristics/prev_certificates	{}	{}
heuristics/next_certificates	{}	{}
heuristics/report_references/directly_referenced_by	{}	{}
heuristics/report_references/directly_referencing	{}	{}
heuristics/report_references/indirectly_referenced_by	{}	{}
heuristics/report_references/indirectly_referencing	{}	{}
heuristics/scheme_data	category: Smart Cards and similiar devices certification_date: 06.01.2024 enhanced: category: Smart Cards and similiar devices cc_version: Common Criteria 3.1 release 5 cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1909 certification_date: 06.01.2024 description: The TOE consists of hardware and IC dedicated software. The hardware is based on a 32-bit secure CPU with ROM (Non-Volatile Read-Only Memory), NVM (Non-volatile Programmable Memory) and RAM (Volatile Memory). The hardware of the TOE also incorporates communication peripherals and cryptographic coprocessors for execution and acceleration of symmetric and asymmetric cryptographic algorithms. The IC dedicated software consists of boot code and two libraries of cryptographic services. evaluation_facility: Applus Laboratories level: EAL5 + ALC_DVS.2 + AVA_VAN.5 manufacturer: BEIJING TSINGTENG MICROSYSTEM CO.,LTD. report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1935 status: Certified target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1908 type: Product manufacturer: BEIJING TSINGTENG MICROSYSTEM CO.,LTD. product: THN31 Secure Element version 1.0 product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/1002-thn31-secure-element-version-1-0	category: Biometric Devices certification_date: 08.04.2023 enhanced: category: Biometric Devices cc_version: Common Criteria 3.1 release 5 cert_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1701 certification_date: 08.04.2023 description: The SP of S3B512C single-chip CMOS micro-controller is designed and packaged specifically for "Biometric Smart Card" applications. The Cortex-M33 CPU architecture of the SP of S3B512C microcontrollerfollows the Harvard style, that is, it has separate program memory and data memory. Both instruction and data can be fetched simultaneously without causing a stall, using separate paths for memory access. The main security features of the SP of S3B512C integrated circuit are: Secure fingerprint image capture and feature extraction provided by TOE SP firmware, integrity protected. Access control of Users to Flash memory positions where SP firmware is executed. TOE Unique Identification Countermeasures to avoid attackers reproduction of fingerprint data. An AES hardware block supporting AES encryption and decryption with 128-bit, 192-bit and 256-bit keys in ECB mode. The AES block supports encryption of fingerprint features to be sent to SE of S3B512C. Note SE (Secure Element) is not TOE. evaluation_facility: Applus Laboratories level: EAL2 manufacturer: Samsung Electronics Co., Ltd report_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1702 status: Certified target_link: https://oc.ccn.cni.es/en/component/djcatalog2/?format=raw&task=download&fid=1700 type: Product manufacturer: Samsung Electronics Co., Ltd product: Samsung SP of S3B512C revision 3 product_link: https://oc.ccn.cni.es/en/certified-products/certified-products/974-samsung-sp-of-s3b512c-revision-3
heuristics/st_references/directly_referenced_by	{}	{}
heuristics/st_references/directly_referencing	{}	{}
heuristics/st_references/indirectly_referenced_by	{}	{}
heuristics/st_references/indirectly_referencing	{}	{}
heuristics/protection_profiles	cf0f01bcd7be3e9c	{}
maintenance_updates
protection_profiles
protection_profile_links	https://www.commoncriteriaportal.org/nfs/ccpfiles/files/ppfiles/pp0084b_pdf.pdf	{}
pdf_data/cert_filename	2021-01_Certificado.pdf	2021-23_Certificado.pdf
pdf_data/cert_frontpage
pdf_data/cert_keywords/cc_cert_id
pdf_data/cert_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-: 1
pdf_data/cert_keywords/cc_security_level	EAL: EAL 2: 1 EAL5: 1	EAL: EAL 2: 1 EAL 4: 1 EAL2: 1
pdf_data/cert_keywords/cc_sar	ALC: ALC_DVS.2: 1 ALC_FLR: 1 AVA: AVA_VAN.5: 1	ALC: ALC_FLR: 2
pdf_data/cert_keywords/cc_sfr
pdf_data/cert_keywords/cc_claims	O: O.E: 1	O: O.E: 1 T: T.I: 1
pdf_data/cert_keywords/vendor		Samsung: Samsung: 3
pdf_data/cert_keywords/eval_facility	Applus: Applus Laboratories: 1	Applus: Applus Laboratories: 1
pdf_data/cert_keywords/symmetric_crypto
pdf_data/cert_keywords/asymmetric_crypto
pdf_data/cert_keywords/pq_crypto
pdf_data/cert_keywords/hash_function
pdf_data/cert_keywords/crypto_scheme
pdf_data/cert_keywords/crypto_protocol
pdf_data/cert_keywords/randomness
pdf_data/cert_keywords/cipher_mode
pdf_data/cert_keywords/ecc_curve
pdf_data/cert_keywords/crypto_engine
pdf_data/cert_keywords/tls_cipher_suite
pdf_data/cert_keywords/crypto_library
pdf_data/cert_keywords/vulnerability
pdf_data/cert_keywords/side_channel_analysis
pdf_data/cert_keywords/technical_report_id
pdf_data/cert_keywords/device_model
pdf_data/cert_keywords/tee_name
pdf_data/cert_keywords/os_name
pdf_data/cert_keywords/cplc_data
pdf_data/cert_keywords/ic_data_group
pdf_data/cert_keywords/standard_id
pdf_data/cert_keywords/javacard_version
pdf_data/cert_keywords/javacard_api_const
pdf_data/cert_keywords/javacard_packages
pdf_data/cert_keywords/certification_process
pdf_data/cert_metadata	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 894051 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 2	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 913137 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 2
pdf_data/report_filename	2021-01_INF-4210.pdf	2021-23 INF-4038.pdf
pdf_data/report_frontpage
pdf_data/report_keywords/cc_cert_id	DE: BSI-DSZ-CC-S-0201-2022: 1 ES: 2021-1-INF-4210- v2: 1	ES: 2021-23-INF-4038- v1: 1
pdf_data/report_keywords/cc_protection_profile_id	BSI: BSI-CC-PP-0084-2014: 2
pdf_data/report_keywords/cc_security_level	EAL: EAL1: 1 EAL2: 2 EAL4: 2 EAL5: 8 ITSEC: ITSEC Evaluation: 1	EAL: EAL 1: 1 EAL 2: 1 EAL 4: 2 EAL2: 8 ITSEC: ITSEC Evaluation: 1
pdf_data/report_keywords/cc_sar	ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_IMP.1: 1 ADV_TDS.4: 1 AGD: AGD_OPE.1: 1 ALC: ALC_CMC.4: 1 ALC_DEL.1: 1 ALC_DVS.2: 8 ALC_FLR: 3 ALC_LCD.1: 1 ASE: ASE_CCL.1: 1 ASE_INT.1: 1 ASE_REQ.2: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_FUN.1: 1 AVA: AVA_VAN.5: 9	ADV: ADV_ARC.1: 1 ADV_TDS.1: 1 AGD: AGD_OPE.1: 1 ALC: ALC_CMC.2: 1 ALC_DEL.1: 1 ALC_FLR: 2 ASE: ASE_CCL.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_SPD.1: 1 ATE: ATE_COV.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.2: 1
pdf_data/report_keywords/cc_sfr	FAU: FAU_SAS.1: 1 FCS: FCS_COP.1: 2 FCS_RNG.1: 1 FDP: FDP_ITT.1: 1 FDP_SDC.1: 1 FMT: FMT_LIM.1: 1 FPT: FPT_FLS.1: 1 FPT_ITT.1: 1 FPT_PHP.3: 1 FRU: FRU_FLT.2: 1
pdf_data/report_keywords/cc_claims
pdf_data/report_keywords/vendor		Samsung: Samsung: 14
pdf_data/report_keywords/eval_facility	Applus: Applus Laboratories: 6	Applus: Applus Laboratories: 4
pdf_data/report_keywords/symmetric_crypto	DES: 3DES: TDES: 3	AES_competition: AES: AES: 7
pdf_data/report_keywords/asymmetric_crypto	RSA: RSA-CRT: 4
pdf_data/report_keywords/pq_crypto
pdf_data/report_keywords/hash_function	MD: MD5: MD5: 3
pdf_data/report_keywords/crypto_scheme	PKE: PKE: 1
pdf_data/report_keywords/crypto_protocol		PGP: PGP: 1
pdf_data/report_keywords/randomness	TRNG: TRNG: 2
pdf_data/report_keywords/cipher_mode		ECB: ECB: 2
pdf_data/report_keywords/ecc_curve
pdf_data/report_keywords/crypto_engine
pdf_data/report_keywords/tls_cipher_suite
pdf_data/report_keywords/crypto_library	Generic: Crypto Library 2.1.0: 1
pdf_data/report_keywords/vulnerability
pdf_data/report_keywords/side_channel_analysis	FI: malfunction: 1 other: JIL: 1
pdf_data/report_keywords/technical_report_id
pdf_data/report_keywords/device_model
pdf_data/report_keywords/tee_name	IBM: SE: 1	IBM: SE: 5
pdf_data/report_keywords/os_name
pdf_data/report_keywords/cplc_data
pdf_data/report_keywords/ic_data_group
pdf_data/report_keywords/standard_id	ISO: ISO/IEC 7816: 4 PKCS: PKCS #1: 1
pdf_data/report_keywords/javacard_version
pdf_data/report_keywords/javacard_api_const
pdf_data/report_keywords/javacard_packages
pdf_data/report_keywords/certification_process
pdf_data/report_metadata	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 387742 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 17	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 394885 pdf_hyperlinks: https://www.sogis.eu/, http://www.commoncriteriaportal.org/ pdf_is_encrypted: False pdf_number_of_pages: 13
pdf_data/st_filename	2021-01_ST_lite.pdf	2021-23 ST_Lite.pdf
pdf_data/st_frontpage
pdf_data/st_keywords/cc_cert_id
pdf_data/st_keywords/cc_protection_profile_id	BSI: BSI-CC-PP- 0084-2014: 1 BSI-CC-PP-0084-2014: 1
pdf_data/st_keywords/cc_security_level	EAL: EAL4: 1 EAL5: 4 EAL5 augmented: 2 EAL5+: 31	EAL: EAL2: 5
pdf_data/st_keywords/cc_sar	ADV: ADV_ARC.1: 1 ADV_FSP.5: 1 ADV_IMP.1: 1 ADV_INT.2: 1 ADV_TDS.4: 1 AGD: AGD_OPE: 3 AGD_OPE.1: 1 AGD_PRE: 1 AGD_PRE.1: 1 ALC: ALC_CMC.4: 1 ALC_CMS.5: 1 ALC_DEL.1: 1 ALC_DVS.2: 6 ALC_LCD.1: 1 ALC_TAT.2: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.2: 1 ATE_DPT.3: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.5: 6	ADV: ADV_ARC: 1 ADV_ARC.1: 1 ADV_FSP.2: 1 ADV_TDS.1: 1 AGD: AGD_OPE.1: 1 AGD_PRE.1: 1 ALC: ALC_CMC.2: 1 ALC_CMS.2: 1 ALC_DEL.1: 1 ASE: ASE_CCL.1: 1 ASE_ECD.1: 1 ASE_INT.1: 1 ASE_OBJ.2: 1 ASE_REQ.2: 1 ASE_SPD.1: 1 ASE_TSS.1: 1 ATE: ATE_COV.1: 1 ATE_FUN.1: 1 ATE_IND.2: 1 AVA: AVA_VAN.2: 1
pdf_data/st_keywords/cc_sfr	FAU: FAU_SAS.1: 6 FAU_SAS.1.1: 1 FCS: FCS_CKM.1: 5 FCS_CKM.4: 5 FCS_COP.1: 17 FCS_COP.1.1: 2 FCS_RNG.1: 7 FCS_RNG.1.1: 1 FCS_RNG.1.2: 1 FDP: FDP_IFC.1: 5 FDP_ITC.1: 5 FDP_ITC.2: 5 FDP_ITT.1: 7 FDP_SDC.1: 6 FDP_SDC.1.1: 1 FDP_SDI.1: 1 FDP_SDI.2: 6 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FMT: FMT_LIM.1: 4 FMT_LIM.2: 4 FPT: FPT_FLS.1: 7 FPT_FLS.1.1: 1 FPT_ITT.1: 7 FPT_PHP.3: 7 FPT_PHP.3.1: 1 FRU: FRU_FLT.2: 8	FAU: FAU_GEN: 2 FAU_GEN.1: 1 FAU_SAS: 9 FAU_SAS.1: 12 FAU_SAS.1.1: 2 FCS: FCS_CKM: 1 FCS_CKM.1: 4 FCS_CKM.4: 7 FCS_CKM.4.1: 1 FCS_COP: 1 FCS_COP.1: 6 FCS_COP.1.1: 1 FDP: FDP_ACC: 1 FDP_ACC.1: 15 FDP_ACC.1.1: 1 FDP_ACF: 2 FDP_ACF.1: 7 FDP_ACF.1.1: 1 FDP_ACF.1.2: 1 FDP_ACF.1.3: 1 FDP_ACF.1.4: 1 FDP_IFC.1: 10 FDP_ITC: 2 FDP_ITC.1: 10 FDP_ITC.1.1: 1 FDP_ITC.1.2: 1 FDP_ITC.1.3: 1 FDP_ITC.2: 4 FDP_ITT: 1 FDP_ITT.1: 6 FDP_ITT.1.1: 1 FDP_RIP: 1 FDP_RIP.1: 1 FDP_RIP.2: 6 FDP_RIP.2.1: 1 FDP_SDI: 1 FDP_SDI.1: 1 FDP_SDI.2: 6 FDP_SDI.2.1: 1 FDP_SDI.2.2: 1 FDP_UCT: 1 FDP_UCT.1: 6 FDP_UCT.1.1: 1 FDP_UIT: 1 FDP_UIT.1: 6 FDP_UIT.1.1: 1 FDP_UIT.1.2: 1 FMT: FMT_MSA: 2 FMT_MSA.1: 9 FMT_MSA.1.1: 1 FMT_MSA.3: 11 FMT_MSA.3.1: 1 FMT_MSA.3.2: 1 FMT_SMF.1: 3 FMT_SMR.1: 6 FPT: FPT_ITT: 1 FPT_ITT.1: 6 FPT_ITT.1.1: 1 FTP: FTP_ITC.1: 4 FTP_TRP: 1 FTP_TRP.1: 10 FTP_TRP.1.1: 1 FTP_TRP.1.2: 1 FTP_TRP.1.3: 1
pdf_data/st_keywords/cc_claims	O: O.RND: 3 O.RSA-CRT: 6 O.TDES: 8 T: T.RND: 2	O: O.AES: 10
pdf_data/st_keywords/vendor		Samsung: Samsung: 20
pdf_data/st_keywords/eval_facility
pdf_data/st_keywords/symmetric_crypto	DES: 3DES: TDEA: 1 TDES: 29 Triple-DES: 4 DES: DES: 1	AES_competition: AES: AES: 36
pdf_data/st_keywords/asymmetric_crypto	RSA: RSA-CRT: 30	ECC: ECC: ECC: 4
pdf_data/st_keywords/pq_crypto
pdf_data/st_keywords/hash_function
pdf_data/st_keywords/crypto_scheme	PKE: PKE: 1	MAC: MAC: 2
pdf_data/st_keywords/crypto_protocol		PGP: PGP: 1
pdf_data/st_keywords/randomness	RNG: RND: 5 RNG: 6 TRNG: TRNG: 3	RNG: RNG: 1
pdf_data/st_keywords/cipher_mode	CBC: CBC: 1 ECB: ECB: 4	ECB: ECB: 3
pdf_data/st_keywords/ecc_curve
pdf_data/st_keywords/crypto_engine
pdf_data/st_keywords/tls_cipher_suite
pdf_data/st_keywords/crypto_library	Generic: Crypto Library 2.1.0: 1
pdf_data/st_keywords/vulnerability
pdf_data/st_keywords/side_channel_analysis	FI: Malfunction: 7 malfunction: 3 physical tampering: 1 SCA: Leak-Inherent: 5 Physical Probing: 2 physical probing: 4
pdf_data/st_keywords/technical_report_id
pdf_data/st_keywords/device_model
pdf_data/st_keywords/tee_name	IBM: SE: 1	IBM: SE: 70
pdf_data/st_keywords/os_name
pdf_data/st_keywords/cplc_data
pdf_data/st_keywords/ic_data_group
pdf_data/st_keywords/standard_id	CC: CCMB-2012-09-001: 1 CCMB-2012-09-002: 1 CCMB-2012-09-003: 1 CCMB-2012-09-004: 1 ISO: ISO/IEC 7816: 6 NIST: NIST SP 800-38A: 1 NIST SP 800-67: 1	CC: CCMB-2017-04-001: 1 CCMB-2017-04-002: 1 CCMB-2017-04-003: 1 CCMB-2017-04-004: 1 FIPS: FIPS 197: 1 FIPS197: 1
pdf_data/st_keywords/javacard_version
pdf_data/st_keywords/javacard_api_const
pdf_data/st_keywords/javacard_packages
pdf_data/st_keywords/certification_process	OutOfScope: on a single die. The THN31 secure element is in the scope of the TOE while the NFC controller is out of scope of the TOE. THN31 secure element (TOE) NFC controller The TOE is a secure element with two crypto: 1 out of scope: 1
pdf_data/st_metadata	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 754154 pdf_hyperlinks: {} pdf_is_encrypted: False pdf_number_of_pages: 29	/Author: /CreationDate: /Creator: /Keywords: /ModDate: /Producer: /Subject: /Title: /Trapped: pdf_file_size_bytes: 1418253 pdf_hyperlinks: mailto:[email protected] pdf_is_encrypted: False pdf_number_of_pages: 51
state/cert/convert_garbage	False	False
state/cert/convert_ok	True	True
state/cert/download_ok	True	True
state/cert/extract_ok	True	True
state/cert/pdf_hash	Different	Different
state/cert/txt_hash	Different	Different
state/report/convert_garbage	False	False
state/report/convert_ok	True	True
state/report/download_ok	True	True
state/report/extract_ok	True	True
state/report/pdf_hash	Different	Different
state/report/txt_hash	Different	Different
state/st/convert_garbage	False	False
state/st/convert_ok	True	True
state/st/download_ok	True	True
state/st/extract_ok	True	True
state/st/pdf_hash	Different	Different
state/st/txt_hash	Different	Different